JP7302364B2 - Connector terminal materials and connector terminals - Google Patents

Connector terminal materials and connector terminals Download PDF

Info

Publication number
JP7302364B2
JP7302364B2 JP2019143826A JP2019143826A JP7302364B2 JP 7302364 B2 JP7302364 B2 JP 7302364B2 JP 2019143826 A JP2019143826 A JP 2019143826A JP 2019143826 A JP2019143826 A JP 2019143826A JP 7302364 B2 JP7302364 B2 JP 7302364B2
Authority
JP
Japan
Prior art keywords
silver
plating layer
plating
layer
tin alloy
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2019143826A
Other languages
Japanese (ja)
Other versions
JP2021025086A (en
Inventor
圭栄 樽谷
賢治 久保田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Materials Corp
Original Assignee
Mitsubishi Materials Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Materials Corp filed Critical Mitsubishi Materials Corp
Priority to JP2019143826A priority Critical patent/JP7302364B2/en
Publication of JP2021025086A publication Critical patent/JP2021025086A/en
Application granted granted Critical
Publication of JP7302364B2 publication Critical patent/JP7302364B2/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Landscapes

  • Electroplating Methods And Accessories (AREA)

Description

本発明は、微摺動が発生する自動車や民生機器等の電気配線の接続に使用される有用な皮膜が設けられたコネクタ用端子材及びコネクタ用端子に関する。 TECHNICAL FIELD The present invention relates to a connector terminal material provided with a film and a connector terminal which are useful for connecting electrical wiring in automobiles, consumer equipment, and the like, where microsliding occurs.

従来、自動車等の電気配線の接続に用いられるコネクタが知られている。この車載用コネクタ(車載用端子)には、メス端子に設けられた接触片が、メス端子内に挿入されたオス端子に所定の接触圧を有して接触することで、電気的に接続されるように設計された端子対を備えるものが用いられている。このようなコネクタ(端子)として、一般的に銅または銅合金板上に錫めっきを施し、リフロー処理を行った錫めっき付き端子が多く用いられていた。しかし、近年、自動車の高電流・高電圧化に伴い、より電流を多く流すことができる耐熱・耐摩耗性に優れた貴金属めっきを施した端子の用途が増加している。 2. Description of the Related Art Conventionally, connectors used for connecting electrical wiring in automobiles and the like are known. In this in-vehicle connector (in-vehicle terminal), a contact piece provided on a female terminal is electrically connected by contacting a male terminal inserted into the female terminal with a predetermined contact pressure. are used with terminal pairs designed to As such connectors (terminals), tin-plated terminals, which are obtained by plating a copper or copper alloy plate with tin and performing a reflow treatment, have generally been used. However, in recent years, with the increase in current and voltage in automobiles, the use of precious metal-plated terminals, which are excellent in heat resistance and wear resistance and which allow more current to flow, is increasing.

このような耐熱性及び耐摩耗性が求められる車載用端子のめっきとして、例えば、特許文献1に記載のように銀めっきを端子に施す方法がある。この点、銀めっき層は、加熱によって銀の結晶粒径が肥大化するため硬度が低下する。この硬度が低下すると、同時に耐摩耗性も低下して、銀めっき層が摩耗し易くなるため、その対策として銀めっき層の膜厚を厚くすることが考えられるが、コスト面での問題がある。また、銀めっき層の下地にニッケルめっき層を用いた場合、ニッケルめっき層の酸化によって銀めっき層が剥離する問題もある。
一方、特許文献2のように、アンチモンを銀めっき層に添加することで、銀めっき層中の結晶粒を微細化し、銀めっき層の硬度を高くすることも考えられる。しかし、初期硬度は高いものの、加熱によって銀めっき層中のアンチモンがめっき層最表面に濃化して硬度が低下し、さらに表層のアンチモンが酸化して接触抵抗が増大する。さらに、ニッケルめっき層を下地として用いていた場合、加熱によってニッケルめっき層と銀めっき層との間にニッケル酸化物が生成され、このニッケル酸化物が原因となりめっき層が剥離することがあった。
As a method of plating a vehicle-mounted terminal that requires such heat resistance and wear resistance, there is a method of applying silver plating to the terminal as described in Patent Document 1, for example. In this regard, the hardness of the silver-plated layer decreases due to the enlargement of the crystal grain size of silver due to heating. When this hardness decreases, the wear resistance also decreases at the same time, making the silver plating layer more susceptible to wear. As a countermeasure, increasing the film thickness of the silver plating layer is conceivable, but there is a problem in terms of cost. . Moreover, when a nickel plating layer is used as a base of the silver plating layer, there is also a problem that the silver plating layer peels off due to oxidation of the nickel plating layer.
On the other hand, as in Patent Document 2, it is conceivable to add antimony to the silver plating layer to refine crystal grains in the silver plating layer and increase the hardness of the silver plating layer. However, although the initial hardness is high, the antimony in the silver plating layer concentrates on the outermost surface of the plating layer due to heating, which lowers the hardness, and the antimony in the surface layer is oxidized to increase the contact resistance. Furthermore, when a nickel-plated layer is used as an underlayer, nickel oxide is generated between the nickel-plated layer and the silver-plated layer by heating, and the nickel oxide may cause peeling of the plated layer.

また、特許文献3のように、銀めっき層と錫めっき層とを順に積層してリフロー処理することにより表面を合金化する手法もあるが、加熱処理によって酸化膜が生成するため、接続信頼性が低下する。
そこで、特許文献4のように、基材に対して直接銀錫合金めっきを施してめっき層全体の組成を均一に保つことが考えられている。
In addition, as in Patent Document 3, there is a technique in which a silver plating layer and a tin plating layer are laminated in order and subjected to reflow treatment to alloy the surface. decreases.
Therefore, as in Patent Document 4, it has been considered to apply silver-tin alloy plating directly to the base material to keep the composition of the entire plating layer uniform.

特開2008-169408号公報Japanese Patent Application Laid-Open No. 2008-169408 特開2009-79250公報Japanese Patent Application Laid-Open No. 2009-79250 特開2017-79143公報Japanese Patent Application Laid-Open No. 2017-79143 特開2015-183216号公報JP 2015-183216 A

特許文献4の銀錫めっき層は、ニッケルめっき層上に直接均一に成膜させるためには、銀錫合金めっきを施す前に銀ストライクめっきを施す方が望ましい。しかし、ニッケルと銀は相互拡散し難く、さらに合金化した銀錫めっき層は非常に硬いため、摺動時に、密着の弱いニッケルめっき層と銀ストライクめっき層との界面から剥離する恐れがある。 In order to directly and uniformly form the silver-tin plating layer of Patent Document 4 on the nickel plating layer, it is preferable to apply silver strike plating before applying silver-tin alloy plating. However, since nickel and silver are difficult to interdiffusion, and the alloyed silver-tin plating layer is very hard, there is a risk that it will peel off from the interface between the nickel plating layer and the silver strike plating layer, which have weak adhesion, during sliding.

本発明は、このような事情に鑑みてなされたもので、銀錫合金めっき層の密着性を高めて、耐摩耗性及び耐熱性を向上できるコネクタ用端子材及びコネクタ用端子を提供することを目的とする。 It is an object of the present invention to provide a terminal material for a connector and a terminal for a connector in which the adhesiveness of the silver-tin alloy plating layer can be enhanced to improve wear resistance and heat resistance. aim.

本発明のコネクタ用端子材は、少なくとも表面が銅又は銅合金からなる基材と、該基材の表面に形成されたニッケルめっき層と、該ニッケルめっき層上の少なくとも一部に形成された中間めっき層と、該中間めっき層の上に形成された銀錫合金めっき層とを備え、前記中間めっき層は、Cu,Pd,Co,Mnのいずれか一種を主成分として含有し、前記中間めっき層の膜厚が0.02μm以上であり、前記銀錫合金めっき層は、Agを70at%以上85at%以下の範囲で含み、前記銀錫合金めっき層の膜厚は0.5μm以上5μm以下である。 The terminal material for a connector of the present invention comprises a base material having at least a surface made of copper or a copper alloy, a nickel plating layer formed on the surface of the base material, and an intermediate layer formed on at least a part of the nickel plating layer. A plated layer and a silver-tin alloy plated layer formed on the intermediate plated layer, the intermediate plated layer containing any one of Cu, Pd, Co, and Mn as a main component, and the intermediate plated layer The thickness of the layer is 0.02 μm or more, the silver-tin alloy plating layer contains Ag in the range of 70 at % or more and 85 at % or less, and the thickness of the silver-tin alloy plating layer is 0.5 μm or more and 5 μm or less. be.

このコネクタ用端子材は、硬い銀錫合金層により、優れた耐摩耗性を有する。この場合、基材の表面にニッケルめっき層が形成されているので、高温環境下での基材からのCu成分の拡散を防止し、銀錫合金めっき層の性能低下を抑制する。ニッケルめっき層の膜厚は0.5μm以上2.0μm以下であるとよい。
また、このニッケルめっき層の上に中間層としてCu,Pd,Co,Mnのいずれか一種を主成分として含有する中間層が形成されているので、これらの間の密着性が良好となり、銀錫合金めっき層の耐摩耗性を有効に発揮させることができる。この中間めっき層の膜厚は0.02μm未満では全面に均質に成膜されないため、耐摩耗性向上の効果が低下し、銀錫合金めっき層が剥がれやすくなる。なお、加工性の面から中間めっき層の膜厚は0.5μm以下とするのが好ましい。
なお、銀錫合金めっき層中のAgが70at%未満では、加熱後の接触抵抗が増加し、Agが85at%を超えると、硬い銀錫合金に対する軟らかい銀の割合が増えるため、耐摩耗性が低下する。また全面に均一な成膜が困難となる。
銀錫系金属間化合物としては、AgSn及びAgSnの金属間化合物を例示できる。
銀錫合金めっき層が0.5μm未満では、コネクタとして使用する際の耐摩耗性向上の効果に乏しくなる。5μmを超える膜厚としても問題はないが、コストと加工性の面から5μm以下とするのが好ましい。
This connector terminal material has excellent wear resistance due to the hard silver-tin alloy layer. In this case, since the nickel plating layer is formed on the surface of the base material, diffusion of the Cu component from the base material in a high-temperature environment is prevented, and performance deterioration of the silver-tin alloy plating layer is suppressed. The film thickness of the nickel plating layer is preferably 0.5 μm or more and 2.0 μm or less.
Further, since an intermediate layer containing any one of Cu, Pd, Co, and Mn as a main component is formed on the nickel plating layer as an intermediate layer, the adhesion between them is improved, and silver tin The wear resistance of the alloy plating layer can be effectively exhibited. If the film thickness of the intermediate plating layer is less than 0.02 μm, the film cannot be formed uniformly over the entire surface, so that the effect of improving wear resistance is reduced, and the silver-tin alloy plating layer tends to come off. From the standpoint of workability, the thickness of the intermediate plated layer is preferably 0.5 μm or less.
If the Ag content in the silver-tin alloy plating layer is less than 70 at%, the contact resistance after heating increases. descend. In addition, it becomes difficult to form a uniform film over the entire surface.
Examples of silver-tin-based intermetallic compounds include intermetallic compounds of Ag 3 Sn and Ag 4 Sn.
If the silver-tin alloy plating layer is less than 0.5 μm, the effect of improving wear resistance when used as a connector is poor. Although there is no problem even if the film thickness exceeds 5 μm, it is preferable to set the film thickness to 5 μm or less in terms of cost and workability.

コネクタ用端子材の一つの態様として、前記銀錫合金めっき層の上に純度99質量%以上のAgからなる銀めっき層が0.1μm以上2.0μm以下の膜厚で形成されているとよい。 As one aspect of the connector terminal material, a silver plating layer made of Ag with a purity of 99% by mass or more may be formed on the silver-tin alloy plating layer with a thickness of 0.1 μm or more and 2.0 μm or less. .

このコネクタ用端子材は、銀錫合金めっき層の上に銀めっき層が形成されているので、加熱環境下においても表面が酸化しにくく、接触抵抗の増大を抑制できる。また、比較的硬い銀錫合金めっき層の上に、この銀錫合金めっき層より軟質の銀めっき層が形成されているので、滑り性が向上し、コネクタとして使用する際の着脱抵抗が小さくなる効果もある。銀めっき層の膜厚が0.1μm未満では薄すぎるため、加熱後の接触抵抗の増大を抑制する効果が低く、早期に摩耗して消失し易い。2.0μmを超える厚さでは、軟らかい銀めっき層が厚いため、摩擦係数が増大する。 Since the silver-plated layer is formed on the silver-tin alloy-plated layer in this connector terminal material, the surface is not easily oxidized even in a heated environment, and an increase in contact resistance can be suppressed. In addition, since a silver-plated layer that is softer than the silver-tin alloy layer is formed on the relatively hard silver-tin alloy-plated layer, the slipperiness is improved and the connection/disconnection resistance when used as a connector is reduced. There is also an effect. If the film thickness of the silver plating layer is less than 0.1 μm, it is too thin, so the effect of suppressing the increase in contact resistance after heating is low, and the silver plating layer is likely to be worn away early. If the thickness exceeds 2.0 μm, the soft silver plating layer is thick and the coefficient of friction increases.

本発明のコネクタ用端子材からなるコネクタ用端子において、相手方コネクタ用端子との接点部分の表面が前記銀錫合金めっき層又は前記銀めっき層からなるものとするとよい。 In the connector terminal made of the connector terminal material of the present invention, the surface of the contact portion with the mating connector terminal may be made of the silver-tin alloy plating layer or the silver plating layer.

本発明によれば、銀錫合金めっき層の密着性を高められ、コネクタ用端子材の耐摩耗性及び耐熱性を向上できる。 ADVANTAGE OF THE INVENTION According to this invention, the adhesiveness of a silver tin alloy plating layer can be improved, and the abrasion resistance and heat resistance of a terminal material for connectors can be improved.

本発明の一実施形態に係るコネクタ用端子材を模式的に示す断面図である。BRIEF DESCRIPTION OF THE DRAWINGS It is sectional drawing which shows typically the terminal material for connectors which concerns on one Embodiment of this invention. 実施例における加熱前のコネクタ用端子材の断面の走査イオン顕微鏡(SIM)像である。It is a scanning ion microscope (SIM) image of the cross section of the terminal material for connectors before heating in an Example.

以下、本発明の実施形態について図面を用いて説明する。
[コネクタ用端子材の構成]
図1は一実施形態のコネクタ用端子材の断面を模式的に示したものである。このコネクタ用端子材1は、少なくとも表面が銅又は銅合金からなる板状の基材2と、該基材2の表面に被覆されたニッケル又はニッケル合金からなるニッケルめっき層3と、ニッケルめっき層3の一部の表面に形成された中間めっき層4と、中間めっき層4の上に形成された銀錫合金めっき層5と、この銀錫合金めっき層5の上に形成された銀めっき層6とを備えている。
An embodiment of the present invention will be described below with reference to the drawings.
[Configuration of terminal material for connector]
FIG. 1 schematically shows a cross section of a connector terminal material according to one embodiment. This connector terminal material 1 includes a plate-like base material 2 whose surface is at least made of copper or a copper alloy, a nickel plating layer 3 made of nickel or a nickel alloy coated on the surface of the base material 2, and a nickel plating layer. 3, a silver-tin alloy plating layer 5 formed on the intermediate plating layer 4, and a silver-plating layer formed on the silver-tin alloy plating layer 5. 6.

基材2は、銅または銅合金からなるものであれば、特に、その組成が限定されるものではない。また、母材の表面に銅又は銅合金からなる銅めっき層が施されためっき材により構成されてもよい。この場合、母材としては銅以外の金属材料であってもよい。 The composition of the base material 2 is not particularly limited as long as it is made of copper or a copper alloy. Alternatively, it may be composed of a plated material in which a copper-plated layer made of copper or a copper alloy is applied to the surface of the base material. In this case, the base material may be a metal material other than copper.

ニッケルめっき層3は、基材2上にニッケル又はニッケル合金めっきを施すことにより被覆される。このニッケルめっき層3は、その上に被覆される銀錫合金めっき層5への基材2からのCu及び合金成分の拡散を抑制する機能を有する。このニッケルめっき層3の厚さは、0.5μm以上2.0μm以下であることが好ましい。ニッケルめっき層3の厚さが0.5μm未満であると、高温環境下では銅又は銅合金からなる基材2から銅及び合金成分が上層のめっき層を拡散することによりコネクタ用端子材1の表面の接触抵抗値が大きくなり、耐熱性が低下する可能性があり、2.0μmを超えると、曲げ加工時に割れが発生する可能性がある。なお、ニッケルめっき層3は、ニッケル又はニッケル合金からなるものであれば、特に、その組成が限定されるものではない。 The nickel plating layer 3 is coated by plating the base material 2 with nickel or a nickel alloy. This nickel plating layer 3 has a function of suppressing the diffusion of Cu and alloy components from the substrate 2 into the silver-tin alloy plating layer 5 coated thereon. The thickness of this nickel plating layer 3 is preferably 0.5 μm or more and 2.0 μm or less. When the thickness of the nickel plating layer 3 is less than 0.5 μm, copper and alloy components diffuse from the base material 2 made of copper or a copper alloy into the upper plating layer in a high-temperature environment, whereby the connector terminal material 1 is formed. There is a possibility that the contact resistance value of the surface will increase and the heat resistance will decrease, and if it exceeds 2.0 μm, cracks may occur during bending. The composition of the nickel plating layer 3 is not particularly limited as long as it is made of nickel or a nickel alloy.

中間めっき層4は、Cu,Pd,Co,Mnのいずれか一種を主成分として含有する。この中間めっき層4は、ニッケルめっき層3と銀錫合金めっき層5の両方にに対して密着性が良好で耐摩耗性が向上する。この中間めっき層4の膜厚は0.02μm以上であり、0.02μm未満では全面に均質に成膜されないため、耐摩耗性向上の効果が低下し、銀錫合金めっき層が剥がれやすくなる。なお、特に限定されないが、コストと加工性の面から中間めっき層4の膜厚は0.5μm以下とするのが好ましい。なお、この中間めっき層4におけるCu,Pd,Co,Mnの含有量は特に限定されるものではないが、90質量%以上あるとよい。 The intermediate plated layer 4 contains one of Cu, Pd, Co and Mn as a main component. The intermediate plated layer 4 has good adhesion to both the nickel plated layer 3 and the silver-tin alloy plated layer 5, thereby improving wear resistance. The film thickness of the intermediate plating layer 4 is 0.02 μm or more. If the thickness is less than 0.02 μm, the film cannot be uniformly formed on the entire surface. Although not particularly limited, the film thickness of the intermediate plated layer 4 is preferably 0.5 μm or less in terms of cost and workability. The contents of Cu, Pd, Co, and Mn in the intermediate plating layer 4 are not particularly limited, but preferably 90% by mass or more.

銀錫合金めっき層5は、中間めっき層4上に後述する銀ストライクめっきが施された後、その上面に被覆される。この銀錫合金めっき層5は、AgSn及びAgSnの金属間化合物を主成分とし、Agを70at%以上85at%以下の範囲で含んでいる。このような金属間化合物を含んでいるため、耐摩耗性が向上する。 The silver-tin alloy plating layer 5 is coated on the upper surface of the intermediate plating layer 4 after silver strike plating, which will be described later, is applied. This silver-tin alloy plating layer 5 is mainly composed of intermetallic compounds of Ag 3 Sn and Ag 4 Sn and contains Ag in a range of 70 at % or more and 85 at % or less. Since it contains such an intermetallic compound, wear resistance is improved.

また、銀錫合金めっき層5は、その上に形成される軟らかい銀めっき層6を支持して、コネクタとして使用する際に耐摩耗性を向上させる効果がある。この銀錫合金めっき層5の厚さは、0.5μm以上5μm以下であることが好ましい。銀錫合金めっき層5が0.5μm未満であると、耐摩耗性向上の効果に乏しくなる。5μmを超える膜厚としても問題はないが、加工性の面から5μm以下とするのが好ましい。 In addition, the silver-tin alloy plating layer 5 has the effect of supporting the soft silver plating layer 6 formed thereon and improving wear resistance when used as a connector. The thickness of the silver-tin alloy plating layer 5 is preferably 0.5 μm or more and 5 μm or less. If the silver-tin alloy plating layer 5 is less than 0.5 μm, the effect of improving the wear resistance becomes poor. There is no problem even if the film thickness exceeds 5 μm, but it is preferable to set the film thickness to 5 μm or less from the standpoint of workability.

銀めっき層6は、加熱環境下においても表面が酸化しにくく、接触抵抗の増大を抑制できる。この銀めっき層6は、純度99質量%以上、好ましくは99.9質量%以上の純銀からなる。純度が99質量%以上としたのは、銀めっき層6のAg濃度が99質量%未満であると不純物が多く含まれることとなり、接触抵抗が高くなるからである。
銀めっき層6の膜厚は0.1μm以上2.0μm以下である。銀めっき層6の膜厚が0.1μm未満では薄すぎるため、早期に摩耗して消失し易い。2.0μmを超える膜厚では、軟らかい銀めっき層6が厚くなるため、摩擦係数が増大する。
The surface of the silver plating layer 6 is not easily oxidized even in a heating environment, and an increase in contact resistance can be suppressed. This silver plating layer 6 is made of pure silver with a purity of 99% by mass or more, preferably 99.9% by mass or more. The reason why the purity is set to 99% by mass or more is that if the Ag concentration of the silver plating layer 6 is less than 99% by mass, a large amount of impurities will be contained, resulting in an increase in contact resistance.
The film thickness of the silver plating layer 6 is 0.1 μm or more and 2.0 μm or less. If the film thickness of the silver plating layer 6 is less than 0.1 μm, it is too thin and is likely to be worn out early and disappear. When the film thickness exceeds 2.0 μm, the soft silver plating layer 6 becomes thick, so the coefficient of friction increases.

次に、このコネクタ用端子材1の製造方法について説明する。このコネクタ用端子材1の製造方法は、基材2となる銅又は銅合金からなる板材を洗浄する前処理工程と、ニッケルめっき層3を基材2に形成するニッケルめっき層形成工程と、ニッケルめっき層3上に中間めっき層4を形成する中間めっき層形成工程と、中間めっき層4上に銀ストライクめっきを施す銀ストライクめっき工程と、銀ストライクめっきの後に銀錫合金めっき層5を形成する銀錫合金めっき層形成工程と、銀めっき層6を銀錫合金めっき層5上に形成する銀めっき層形成工程と、を備える。 Next, a method for manufacturing the connector terminal material 1 will be described. The method for manufacturing the connector terminal material 1 includes a pretreatment step of washing a plate material made of copper or a copper alloy to be the base material 2, a nickel plating layer forming step of forming the nickel plating layer 3 on the base material 2, and a nickel plating layer forming step. An intermediate plating layer forming step of forming an intermediate plating layer 4 on the plating layer 3, a silver strike plating step of applying silver strike plating on the intermediate plating layer 4, and a silver-tin alloy plating layer 5 formed after the silver strike plating. A silver-tin alloy plating layer forming step and a silver-plating layer forming step of forming the silver plating layer 6 on the silver-tin alloy plating layer 5 are provided.

[前処理工程]
まず、基材2として、銅又は銅合金からなる板材を用意し、この板材に脱脂、酸洗等をすることによって表面を清浄する前処理を行う。
[Pretreatment process]
First, a plate material made of copper or a copper alloy is prepared as the base material 2, and pretreatment is performed to clean the surface of the plate material by degreasing, pickling, or the like.

[ニッケルめっき層形成工程]
この基材2の表面の少なくとも一部に対して、ニッケル又はニッケル合金めっきを施してニッケルめっき層3を基材2に形成する。例えば、スルファミン酸ニッケル300g/L、塩化ニッケル30g/L、ホウ酸30g/Lからなるニッケルめっき液を用いて、浴温45℃、電流密度3A/dmの条件下でニッケルめっきを施して形成される。なお、ニッケル層3を形成するニッケルめっきは、緻密なニッケル主体の膜が得られるものであれば特に限定されず、公知のワット浴を用いて電気めっきにより形成してもよい。
[Nickel plating layer forming step]
At least part of the surface of the base material 2 is plated with nickel or a nickel alloy to form a nickel plating layer 3 on the base material 2 . For example, using a nickel plating solution containing 300 g/L of nickel sulfamate, 30 g/L of nickel chloride, and 30 g/L of boric acid, nickel plating is performed under the conditions of a bath temperature of 45° C. and a current density of 3 A/dm 2 to form. be done. The nickel plating for forming the nickel layer 3 is not particularly limited as long as a dense nickel-based film can be obtained, and may be formed by electroplating using a known Watt bath.

[中間めっき層形成工程]
基材2に形成されたニッケルめっき層3の表面に5質量%~10質量%の硫酸水溶液を用いて活性化処理を行った後、中間めっき層4を形成する。この中間めっき層4形成のためのめっき浴は、均一に成膜できれば、浴種は問わない。中間めっき層4が銅めっき層であれば硫酸銅浴、パラジウムめっき層であれば塩化パラジウム等のパラジウム化合物を含むめっき浴、コバルトめっき層であれば硫酸コバルトを含むめっき浴、マンガンめっき層であれば硫酸マンガンを含むめっき浴など、その金属種に代表的なめっき浴を用いればよい。
[Intermediate plating layer forming step]
An intermediate plating layer 4 is formed after the surface of the nickel plating layer 3 formed on the substrate 2 is subjected to an activation treatment using a 5% to 10% by weight sulfuric acid aqueous solution. A plating bath for forming the intermediate plating layer 4 may be of any type as long as it can form a uniform film. If the intermediate plating layer 4 is a copper plating layer, it is a copper sulfate bath; if it is a palladium plating layer, it is a plating bath containing a palladium compound such as palladium chloride; if it is a cobalt plating layer, it is a plating bath containing cobalt sulfate; A typical plating bath for the metal species, such as a plating bath containing manganese sulfate, may be used.

[銀ストライクめっき工程]
中間めっき層4の表面に銀めっきを短時間施して薄い銀めっき層を形成する。この場合の銀めっきとしては銀ストライクめっきが好ましい。この銀ストライクめっきを施すためのめっき液の組成は、ノーシアン浴(シアン化物であるシアン化銀、シアン化銀カリウム、シアン化ナトリウム、シアン化カリウム等を含まないめっき浴)であれば特に限定されないが、メタンスルホン酸銀浴を主体としたものが望ましい。この銀ストライクめっきにより形成される銀ストライクめっき層は、その後に銀錫合金めっき層が形成されることにより、層としての識別は困難になる。
[Silver strike plating process]
Silver plating is applied to the surface of the intermediate plating layer 4 for a short time to form a thin silver plating layer. Silver strike plating is preferable as the silver plating in this case. The composition of the plating solution for applying this silver strike plating is not particularly limited as long as it is a non-cyanide bath (a plating bath that does not contain cyanide such as silver cyanide, potassium silver cyanide, sodium cyanide, potassium cyanide, etc.). A bath mainly composed of a silver methanesulfonate bath is desirable. The silver strike plating layer formed by this silver strike plating becomes difficult to distinguish as a layer because a silver-tin alloy plating layer is formed thereafter.

[銀錫合金めっき層形成工程]
そして、銀ストライクめっきを施した後に銀錫合金めっきを施して銀錫合金めっき層5を形成する。この銀錫合金めっきのためのめっき浴としては、例えば、メタンスルホン酸、メタンスルホン酸錫、メタンスルホン酸銀、硫黄を含有した有機添加剤を含む組成とする。具体的には、メタンスルホン酸濃度を40g/L、Ag濃度を40g/Lを超えて90g/L以下、Sn濃度を5~35g/Lの範囲で調整した銀錫合金めっき液を用いるとよい。なお、この銀錫合金めっき液は、シアン化銀、シアン化銀カリウム、シアン化ナトリウム、シアン化カリウム等のシアン化物を含んでいない。また、錫陽極は、AgとPt/Ti(チタン製板に白金を被覆した)不溶性電極との両方を用い、これらの面積は、陰極の2倍以上、AgとPt/Tiの電流配分はAg:Pt/Ti=4:1とすることが好ましい。さらに、浴温は40℃~60℃、電流密度1~15A/dmとし、銀錫合金めっき層5を形成する。
[Silver-tin alloy plating layer forming process]
After applying silver strike plating, silver-tin alloy plating is applied to form the silver-tin alloy plating layer 5 . A plating bath for this silver-tin alloy plating has a composition containing, for example, methanesulfonic acid, tin methanesulfonate, silver methanesulfonate, and an organic additive containing sulfur. Specifically, it is preferable to use a silver-tin alloy plating solution having a methanesulfonic acid concentration of 40 g/L, an Ag concentration of more than 40 g/L and 90 g/L or less, and an Sn concentration of 5 to 35 g/L. . This silver-tin alloy plating solution does not contain cyanides such as silver cyanide, potassium silver cyanide, sodium cyanide and potassium cyanide. Also, the tin anode uses both Ag and Pt/Ti (platinum coated titanium plate) insoluble electrodes, the area of which is more than twice that of the cathode, and the current distribution between Ag and Pt/Ti is Ag : Pt/Ti=4:1 is preferred. Furthermore, the bath temperature is set to 40° C. to 60° C. and the current density is set to 1 to 15 A/dm 2 to form the silver-tin alloy plating layer 5 .

[銀めっき層形成工程]
銀錫合金めっき層5の上に、銀めっきを施して銀めっき層6を形成する。この銀めっきのためのめっき浴の組成は、特に限定されないが、例えば、シアン化銀カリウム(K[Ag(CN)]30g/L~60g/L、シアン化カリウム(KCN)120g/L~160g/L、炭酸カリウム(KCO)10g/L~20g/L、めっき層中に取り込まれやすい有機添加剤からなるめっき浴が好適である。有機添加剤としては、例えば、2,2チオエタノールなどのチオアルコール類、ベンゾチアゾール類、ベンゾトリアゾールなどのアゾール類、イミダゾールなどのイミダゾール類を用いることができる。この有機添加剤の添加濃度は0.1g/L以上10g/L以下とするのがよい。メタンスルホン酸、またはヨウ化カリウムと主体にしたノーシアン浴も使用可能である。
そして、この銀めっき浴に対してアノードとして純銀板を用いて、浴温10℃以上40℃以下、電流密度1A/dm以上10A/dm以下の条件下で銀めっきを1秒~7分程度施すことにより銀めっき層6が形成される。
[Silver plating layer forming step]
A silver plating layer 6 is formed on the silver-tin alloy plating layer 5 by applying silver plating. The composition of the plating bath for this silver plating is not particularly limited. L, potassium carbonate (K 2 CO 3 ) 10 g/L to 20 g/L, and an organic additive that is easily incorporated into the plating layer, such as 2,2 thioethanol. Thioalcohols such as benzothiazoles, azoles such as benzotriazole, and imidazoles such as imidazole can be used. No cyanide baths based on methanesulfonic acid or potassium iodide can also be used.
Then, using a pure silver plate as an anode for this silver plating bath, silver plating is performed for 1 second to 7 minutes under the conditions of a bath temperature of 10° C. or higher and 40° C. or lower and a current density of 1 A/dm 2 or higher and 10 A/dm 2 or lower. A silver plating layer 6 is formed by applying to a certain extent.

このようにして基材2の表面にニッケルめっき層3が形成され、その表面の少なくとも一部に形成された中間めっき層4の上に、銀錫合金めっき層5及び銀めっき層6が順次形成されたコネクタ用端子材1に対して、プレス加工等を施し、接点として用いられる部分の表面に銀めっき層6が配置されるコネクタ用端子を形成する。 Thus, the nickel plating layer 3 is formed on the surface of the base material 2, and the silver-tin alloy plating layer 5 and the silver plating layer 6 are sequentially formed on the intermediate plating layer 4 formed on at least a part of the surface. Pressing or the like is applied to the connector terminal material 1 thus formed to form a connector terminal in which a silver plating layer 6 is arranged on the surface of a portion used as a contact.

本実施形態では、表面に銀めっき層6が形成されているので、加熱環境下においても表面が酸化しにくい。このため、150℃で250時間加熱後でも接触抵抗が1mΩ以下と小さく、耐熱性を向上できる。
銀錫合金めっき層5が形成されているため、表層から酸素が透過せず、加熱試験でニッケルめっき層3から剥離することを抑制できる。なお、銀錫合金めっき層5中のAgが70at%未満では、加熱後の接触抵抗が低下し、Agが85at%を超えると銀錫合金めっき層の粒径が大きくなり、耐摩耗性が低下する。
In this embodiment, since the silver plating layer 6 is formed on the surface, the surface is not easily oxidized even in a heating environment. Therefore, even after heating at 150° C. for 250 hours, the contact resistance is as low as 1 mΩ or less, and the heat resistance can be improved.
Since the silver-tin alloy plating layer 5 is formed, oxygen does not permeate from the surface layer, and peeling from the nickel plating layer 3 in the heating test can be suppressed. If the Ag content in the silver-tin alloy plating layer 5 is less than 70 at%, the contact resistance after heating decreases, and if the Ag content exceeds 85 at%, the grain size of the silver-tin alloy plating layer increases, resulting in a decrease in wear resistance. do.

なお、実施形態では、基材2表面のニッケルめっき層3の上の一部に中間めっき層4、銀錫合金めっき層5、銀めっき層6を形成したが、本発明の端子材としては、基材2の表面の全面に各めっき層が積層されていてもよい。中間めっき層4、銀錫合金めっき層5、銀めっき層6は、少なくとも端子材の表面の一部、具体的にはコネクタ用端子として接点部となる部分に形成されていればよい。 In the embodiment, the intermediate plating layer 4, the silver-tin alloy plating layer 5, and the silver plating layer 6 are formed partially on the nickel plating layer 3 on the surface of the substrate 2. However, the terminal material of the present invention includes: Each plating layer may be laminated on the entire surface of the substrate 2 . The intermediate plated layer 4, the silver-tin alloy plated layer 5, and the silver plated layer 6 may be formed at least on a portion of the surface of the terminal material, specifically, on a portion that serves as a contact portion as a connector terminal.

銅合金からなる厚さ0.25mmの基材上にニッケルめっきを施して、膜厚1.0μmのニッケルめっき層を形成し、該ニッケルめっき層を形成した試料に対して、5質量%の硫酸水溶液を用いてニッケルめっき層表面を清浄化する活性化処理を行った。この活性化処理後に、ニッケルめっき層が被覆された基材に対して、中間めっき、銀ストライクめっき、銀錫合金めっき層及び銀めっき層を順に形成した各試料(試料1~10)を作製した。この際、銀錫合金めっき液におけるAgの量(g/L)、Snの量(g/L)は、表1に示す値とした。 A base material made of a copper alloy and having a thickness of 0.25 mm was plated with nickel to form a nickel plating layer having a thickness of 1.0 μm. An activation treatment was performed to clean the surface of the nickel plating layer using an aqueous solution. After this activation treatment, intermediate plating, silver strike plating, silver-tin alloy plating layer and silver plating layer were sequentially formed on the base material coated with the nickel plating layer to prepare each sample (samples 1 to 10). . At this time, the amount of Ag (g/L) and the amount of Sn (g/L) in the silver-tin alloy plating solution were the values shown in Table 1.

また、比較のため、ニッケルめっき層の上に中間めっき層を形成しなかったものも作製した(試料19~21)。これら試料は、銀錫合金めっき層のみ膜厚1μmで形成し、銀めっき層を形成しなかったもの(試料18)、銀錫合金めっき層及び銀めっき層をそれぞれ膜厚0.5μmで積層したもの(試料19)、銀錫合金めっき層を形成せずに銀めっき層のみ膜厚1μmで形成したもの(試料20)、アンチモンが添加された銀合金めっき層を膜厚1μmで形成したもの(試料21)とした。
なお、各めっきの条件は以下のとおりとした。
For comparison, samples were also produced without forming an intermediate plating layer on the nickel plating layer (Samples 19 to 21). These samples consisted only of a silver-tin alloy plated layer with a film thickness of 1 μm, without forming a silver-plated layer (sample 18), and a silver-tin alloy plated layer and a silver-plated layer with a film thickness of 0.5 μm each. (Sample 19), only a silver plating layer was formed with a thickness of 1 μm without forming a silver-tin alloy plating layer (Sample 20), and a silver alloy plating layer to which antimony was added was formed with a thickness of 1 μm (Sample 20). Sample 21).
In addition, the conditions of each plating were as follows.

<ニッケルめっき条件>
・めっき浴組成
スルファミン酸ニッケル:300g/L
塩化ニッケル:30g/L
ホウ酸:30g/L
・浴温:45℃
・電流密度:3A/dm
<Nickel plating conditions>
・Plating bath composition Nickel sulfamate: 300 g / L
Nickel chloride: 30g/L
Boric acid: 30g/L
・Bath temperature: 45℃
・Current density: 3 A/dm 2

<銅めっき条件>
・めっき浴組成
硫酸銅5水和物 250g/L
硫酸 50g/L
・浴温:50℃
・電流密度:3A/dm
・アノード:リン含有銅
<Copper plating conditions>
・Plating bath composition Copper sulfate pentahydrate 250g/L
Sulfuric acid 50g/L
・Bath temperature: 50℃
・Current density: 3 A/dm 2
・Anode: Phosphorus-containing copper

<パラジウムめっき条件>
・めっき浴組成
塩化パラジウム 17g/L
リン酸アンモニウム 100ml/L
塩化アンモニウム 25g/L
・浴温:30℃
・電流密度:1A/dm
・アノード:Pt/Ti(チタン製板に白金を被覆した不溶性電極)
<Palladium plating conditions>
・Plating bath composition Palladium chloride 17g/L
Ammonium phosphate 100ml/L
Ammonium chloride 25g/L
・Bath temperature: 30℃
・Current density: 1 A/dm 2
・Anode: Pt/Ti (Insoluble electrode made by coating a titanium plate with platinum)

<コバルトめっき条件>
・めっき浴組成
硫酸コバルト7水和物 140g/L
ホウ酸 40g/L
・浴温:30℃
・電流密度:1A/dm
・アノード:Pt/Ti
<Cobalt plating conditions>
・Plating bath composition Cobalt sulfate heptahydrate 140g/L
Boric acid 40g/L
・Bath temperature: 30℃
・Current density: 1 A/dm 2
・Anode: Pt/Ti

<マンガンめっき条件>
・めっき浴組成
硫酸マンガン 200g/L
硫酸アンモニウム 100g/L
・浴温:30℃
・電流密度:8A/dm
・アノード:Pt/Ti
<Manganese plating conditions>
・Plating bath composition manganese sulfate 200g/L
Ammonium sulfate 100g/L
・Bath temperature: 30℃
・Current density: 8 A/dm 2
・Anode: Pt/Ti

<銀ストライクめっき条件>
・めっき浴組成
大和化成株式会社製ダイシルバー使用
・浴温:25℃
・電流密度:1A/dm
・アノード:Ir/Ti
(チタン製板にイリジウム酸化物(IrO)を被覆した不溶性電極)
<Silver strike plating conditions>
・Plating bath composition Daiwa Kasei Co., Ltd. Daisilver use ・Bath temperature: 25 ° C
・Current density: 1 A/dm 2
Anode: Ir/Ti
(Insoluble electrode in which titanium plate is coated with iridium oxide (IrO 2 ))

<銀錫合金めっき条件>
・めっき浴組成
メタンスルホン酸:40g/L
メタンスルホン酸錫:13~91g/L
メタンスルホン酸銀:75~170g/L
有機添加剤:5mg/L
・浴温:50℃
・電流密度:1~15A/dm
<Silver-tin alloy plating conditions>
・Plating bath composition methanesulfonic acid: 40 g / L
Tin methanesulfonate: 13-91g/L
Silver methanesulfonate: 75-170g/L
Organic additive: 5mg/L
・Bath temperature: 50℃
・Current density: 1 to 15 A/dm 2

<銀めっき条件>
・めっき浴組成
シアン化銀カリウム:55g/L
シアン化カリウム:130g/L
炭酸カリウム:15g/L
非イオン性界面活性剤:1g/L
2,2チオエタノール:5g/L
・浴温:25℃
・電流密度:5A/dm
・アノード: 純銀板
<Silver plating conditions>
・Plating bath composition Potassium silver cyanide: 55 g / L
Potassium cyanide: 130g/L
Potassium carbonate: 15g/L
Nonionic surfactant: 1 g/L
2,2 thioethanol: 5 g/L
・Bath temperature: 25℃
・Current density: 5 A/dm 2
・Anode: pure silver plate

なお、試料21のアンチモン入り銀合金めっき層は、日進化成株式会社製のアンチモンが添加されたニッシンブライトN浴を用いて、光沢銀めっきを実施することにより作製した。めっき浴の組成は、標準組成を用い、浴温25℃、電流密度5A/dmとし、アノードとして純銀板を用い、膜厚1μmの銀合金めっき層(AgSb合金層)を形成した。 The antimony-containing silver alloy plating layer of sample 21 was produced by bright silver plating using Nissin Bright N bath containing antimony (manufactured by Nisshin Seisaku Co., Ltd.). A standard composition of the plating bath was used at a bath temperature of 25° C. and a current density of 5 A/dm 2 , and a pure silver plate was used as the anode to form a silver alloy plating layer (AgSb alloy layer) having a thickness of 1 μm.

得られた試料について、銀錫合金めっき層中のAg含有量、銀錫合金めっき層の膜厚、銀めっき層の膜厚を測定し、中間めっき層の膜厚、接触抵抗を測定し、かつ耐摩耗性を評価した。 For the obtained sample, the Ag content in the silver-tin alloy plating layer, the thickness of the silver-tin alloy plating layer, and the thickness of the silver plating layer were measured, the thickness of the intermediate plating layer and the contact resistance were measured, and Abrasion resistance was evaluated.

[銀錫合金めっき中のAg含有量]
収束イオンビーム装置(FIB)にてめっき材を加工して断面試料を作製し、銀錫合金めっき中のAg含有量(at%)は、日本電子株式会社製の電子線マイクロアナライザー:EPMA(型番JXA-8530F)を用いて、加速電圧10kVで各試料の断面を測定した。
[Ag content in silver-tin alloy plating]
A cross-sectional sample is prepared by processing the plated material with a focused ion beam device (FIB), and the Ag content (at%) in the silver-tin alloy plating is measured using an electron probe microanalyzer manufactured by JEOL Ltd.: EPMA (model number JXA-8530F) was used to measure the cross section of each sample at an acceleration voltage of 10 kV.

[各めっき層の膜厚]
収束イオンビーム装置(FIB)にてめっき材を加工して断面試料を作製し、その断面表面を走査イオン顕微鏡(SIM)で観察し、得られたSIM像から膜厚(μm)を測定し、得られた数値を膜厚とした。
[Film thickness of each plating layer]
The plated material is processed with a focused ion beam device (FIB) to prepare a cross-sectional sample, the cross-sectional surface is observed with a scanning ion microscope (SIM), and the film thickness (μm) is measured from the obtained SIM image, The obtained numerical value was taken as the film thickness.

[接触抵抗]
加熱前の各試料及び150℃で250時間加熱後の各試料のそれぞれを60mm×10mmの試験片に切り出し、平板サンプルをオス端子の代用とし、この平板サンプルに曲率半径3mmの凸加工を行ったサンプルをメス端子の代用とした。これらを加熱前及び150℃で250時間加熱後について、それぞれ接触抵抗(mΩ)を測定した。測定に際しては、ブルカー・エイエックスエス株式会社の摩擦摩耗試験機(UMT-Tribolab)を用い、水平に設置したオス端子試験片にメス試験片の凸面を接触させ、オス端子試験片を20Nの荷重をかけた時の接触抵抗値を4端子法により測定した。
[Contact resistance]
Each sample before heating and each sample after heating at 150° C. for 250 hours were each cut into a test piece of 60 mm×10 mm. The sample was used as a substitute for the female terminal. The contact resistance (mΩ) was measured before heating and after heating at 150° C. for 250 hours. For the measurement, a friction wear tester (UMT-Tribolab) of Bruker AXS Co., Ltd. is used, the convex surface of the female test piece is brought into contact with the horizontally installed male terminal test piece, and the male terminal test piece is subjected to a load of 20N. The contact resistance value was measured by the 4-probe method when the pressure was applied.

[耐摩耗性]
各試料を60mm×10mmの試験片に切り出し、平板サンプルをオス端子の代用とし、この平板サンプルに曲率半径3mmの凸加工を行ったサンプルをメス端子の代用とした。摺動試験は、ブルカー・エイエックスエス株式会社の摩擦摩耗試験機(UMT-Tribolab)を用い、水平に設置したオス端子試験片にメス試験片の凸面を接触させ、2Nの荷重を負荷した状態で、オス端子試験片を水平に移動距離5mm、摺動速度1Hzで摺動させた。摺動試験後に凸加工サンプルの下地(ニッケル層)が露出しているか否かで耐摩耗性を判定した。この際、摺動試験後に下地が露出していないものを良好「A」、摺動試験後に下地が露出しているものを不可「B」とした。
[Abrasion resistance]
Each sample was cut into a test piece of 60 mm×10 mm, and the flat plate sample was used as a substitute for the male terminal, and the sample obtained by subjecting the flat plate sample to convex processing with a radius of curvature of 3 mm was used as a substitute for the female terminal. In the sliding test, a friction wear tester (UMT-Tribolab) manufactured by Bruker AXS Co., Ltd. is used, and the male terminal test piece placed horizontally is brought into contact with the convex surface of the female test piece, and a load of 2N is applied. Then, the male terminal test piece was slid horizontally at a moving distance of 5 mm and a sliding speed of 1 Hz. After the sliding test, the wear resistance was determined by whether or not the base (nickel layer) of the convex processed sample was exposed. At this time, the case where the substrate was not exposed after the sliding test was evaluated as "Good", and the case where the substrate was exposed after the sliding test was evaluated as "B".

これらの結果を表1及び表2に示す。表中「-」は、めっきを実施しなかった、あるいは成膜できなかったために測定、評価しなかったことを示す。 These results are shown in Tables 1 and 2. "-" in the table indicates that plating was not carried out or film formation was not possible, so that measurement and evaluation were not carried out.

Figure 0007302364000001
Figure 0007302364000001

Figure 0007302364000002
Figure 0007302364000002

表1及び表2から明らかなように、中間めっき層の膜厚が0.02μm以上であり、銀錫合金めっき層が、Agを70at%以上85at%以下の範囲で含んでおり、銀錫合金めっき層の膜厚が0.5μm以上5μm以下である試料1~4,7,8,10,11,13~17は、加熱後の接触抵抗が2mΩ以下と良好で、耐摩耗性も良好であった。これらのうち、最表面に銀めっき層を0.1μm以上2μm以下の膜厚で形成した試料8,10,11,13~17は、銀めっき層を形成しなかった試料1~4、銀めっき層の膜厚が0.1μmであった試料7に比べて、加熱後の接触抵抗値が低く、加熱環境下における使用に適していることがわかる。
図2は試料13のSIM像であり、基材(Base Materialと表記)表面のニッケルめっき層(Niと表記)の上に、中間めっき層としてCuからなる層(Cuと表記)、銀錫合金めっき層(AgSnと表記)、銀めっき層(Agと表記)が形成されている。
これに対して、試料5は、銀錫合金めっき層の膜厚が0.4μmと小さいため、耐摩耗性が劣っていた。
試料6は、銀錫合金めっき層中のSnの含有量が多い(Agの含有量が少ない)ため、加熱によって拡散したSnが最表層に酸化膜を形成して接触抵抗が増加している。
試料9は、銀錫合金めっき層中のAg含有量が87at%であったことから、銀錫合金めっき層の結晶粒の大きさが極端にばらついて、均一な成膜ができなかった。
試料12は、中間めっき層の膜厚が0.01μmであったため、耐摩耗性に劣っていた。
中間めっき層を形成しなかった試料18~21は、耐摩耗性に劣っていた。
As is clear from Tables 1 and 2, the film thickness of the intermediate plating layer is 0.02 μm or more, the silver-tin alloy plating layer contains Ag in the range of 70 at % or more and 85 at % or less, and the silver-tin alloy Samples 1 to 4, 7, 8, 10, 11, and 13 to 17, in which the film thickness of the plating layer is 0.5 μm or more and 5 μm or less, have good contact resistance of 2 mΩ or less after heating and good wear resistance. there were. Among these, samples 8, 10, 11, and 13 to 17, in which a silver plating layer was formed on the outermost surface with a thickness of 0.1 μm or more and 2 μm or less, were samples 1 to 4, in which no silver plating layer was formed, and silver plating. Compared to Sample 7, which had a layer thickness of 0.1 μm, the contact resistance value after heating was lower, indicating that it is suitable for use in a heated environment.
FIG. 2 is a SIM image of sample 13. A layer made of Cu (represented as Cu) as an intermediate plating layer on a nickel plating layer (represented as Ni) on the surface of a base material (represented as Base Material), a silver-tin alloy A plated layer (denoted as AgSn) and a silver plated layer (denoted as Ag) are formed.
On the other hand, in sample 5, since the film thickness of the silver-tin alloy plating layer was as small as 0.4 μm, the wear resistance was inferior.
In sample 6, the Sn content in the silver-tin alloy plating layer is high (the Ag content is low), so the Sn diffused by heating forms an oxide film on the outermost layer, increasing the contact resistance.
Since the Ag content in the silver-tin alloy plating layer of sample 9 was 87 at %, the size of crystal grains in the silver-tin alloy plating layer was extremely varied, and a uniform film could not be formed.
Sample 12 was inferior in wear resistance because the film thickness of the intermediate plating layer was 0.01 μm.
Samples 18 to 21, in which no intermediate plating layer was formed, were inferior in wear resistance.

1 コネクタ用端子材
2 基材
3 ニッケルめっき層
4 中間めっき層
5 銀錫合金めっき層
6 銀めっき層
1 Terminal material for connector 2 Base material 3 Nickel plating layer 4 Intermediate plating layer 5 Silver-tin alloy plating layer 6 Silver plating layer

Claims (4)

少なくとも表面が銅又は銅合金からなる基材と、該基材の表面に形成されたニッケルめっき層と、該ニッケルめっき層の上に形成された中間めっき層と、該中間めっき層の上に形成された銀錫合金めっき層とを備え、前記中間めっき層は、Pd,Co,Mnのいずれか一種を主成分として含有し、前記中間めっき層の膜厚が0.02μm以上であり、前記銀錫合金めっき層は、Agを70at%以上85at%以下の範囲で含み、前記銀錫合金めっき層の膜厚は0.5μm以上5μm以下であることを特徴とするコネクタ用端子材。 A substrate having at least a surface made of copper or a copper alloy, a nickel plating layer formed on the surface of the substrate, an intermediate plating layer formed on the nickel plating layer, and a layer formed on the intermediate plating layer and a silver-tin alloy plating layer, wherein the intermediate plating layer contains any one of Pd , Co, and Mn as a main component, the thickness of the intermediate plating layer is 0.02 μm or more, and the A terminal material for a connector, wherein the silver-tin alloy plating layer contains Ag in a range of 70 at % or more and 85 at % or less, and the thickness of the silver-tin alloy plating layer is 0.5 μm or more and 5 μm or less. 前記銀錫合金めっき層の上に純度99質量%以上のAgからなる銀めっき層が0.1μm以上2.0μm以下の膜厚で形成されていることを特徴とする請求項1に記載のコネクタ用端子材。 2. The connector according to claim 1, wherein a silver plating layer made of Ag having a purity of 99% by mass or more is formed on the silver-tin alloy plating layer with a thickness of 0.1 μm or more and 2.0 μm or less. terminal material. 請求項1に記載のコネクタ用端子材からなるコネクタ用端子であって、相手方コネクタ用端子との接点部分の表面が前記銀錫合金めっき層からなることを特徴とするコネクタ用端子。 2. A connector terminal made of the connector terminal material according to claim 1, wherein the surface of the contact portion with the mating connector terminal is made of the silver-tin alloy plating layer. 請求項2に記載のコネクタ用端子材からなるコネクタ用端子であって、相手方コネクタ用端子との接点部分の表面が前記銀めっき層からなることを特徴とするコネクタ用端子。 3. A connector terminal made of the connector terminal material according to claim 2, wherein a surface of a contact portion with a mating connector terminal is formed of the silver plating layer.
JP2019143826A 2019-08-05 2019-08-05 Connector terminal materials and connector terminals Active JP7302364B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2019143826A JP7302364B2 (en) 2019-08-05 2019-08-05 Connector terminal materials and connector terminals

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2019143826A JP7302364B2 (en) 2019-08-05 2019-08-05 Connector terminal materials and connector terminals

Publications (2)

Publication Number Publication Date
JP2021025086A JP2021025086A (en) 2021-02-22
JP7302364B2 true JP7302364B2 (en) 2023-07-04

Family

ID=74663703

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2019143826A Active JP7302364B2 (en) 2019-08-05 2019-08-05 Connector terminal materials and connector terminals

Country Status (1)

Country Link
JP (1) JP7302364B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2024033075A (en) * 2022-08-30 2024-03-13 モレックス エルエルシー Connector and connector pair

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011198683A (en) 2010-03-23 2011-10-06 Mitsubishi Materials Corp Connection terminal for connector, and method for manufacturing the same
JP2016056422A (en) 2014-09-11 2016-04-21 株式会社オートネットワーク技術研究所 Member for terminal and method for manufacturing the same, and terminal for connector

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58221291A (en) * 1982-06-16 1983-12-22 Furukawa Electric Co Ltd:The Silver coated copper material for electrical connection

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011198683A (en) 2010-03-23 2011-10-06 Mitsubishi Materials Corp Connection terminal for connector, and method for manufacturing the same
JP2016056422A (en) 2014-09-11 2016-04-21 株式会社オートネットワーク技術研究所 Member for terminal and method for manufacturing the same, and terminal for connector

Also Published As

Publication number Publication date
JP2021025086A (en) 2021-02-22

Similar Documents

Publication Publication Date Title
JP5280957B2 (en) Conductive member and manufacturing method thereof
US8101285B2 (en) Metallic material for a connecting part and a method of producing the same
JP4402132B2 (en) Reflow Sn plating material and electronic component using the same
TW201732839A (en) Tin-plated copper terminal material, terminal, and wire terminal part structure
CN110997985A (en) Silver-coated membrane terminal material and silver-coated membrane terminal
EP3751667A1 (en) Electrical terminal
JP5325734B2 (en) Conductive member and manufacturing method thereof
JP7302364B2 (en) Connector terminal materials and connector terminals
JP4247256B2 (en) Cu-Zn-Sn alloy tin-plated strip
JP7302248B2 (en) Connector terminal materials and connector terminals
JP6930327B2 (en) Anti-corrosion terminal material and its manufacturing method, anti-corrosion terminal and electric wire terminal structure
JP6743998B1 (en) Connector terminal material and connector terminal
JP7313600B2 (en) Connector terminal materials and connector terminals
JP7040544B2 (en) Terminal material for connectors
JP7059877B2 (en) Terminal material for connectors and terminals for connectors
JP7162341B2 (en) Method for manufacturing plated laminate and plated laminate
JP2020117770A (en) Terminal material for connector, and terminal for connector
JP2018016878A (en) Manufacturing method of tin plating copper terminal material
JP2020128575A (en) Terminal material for connector, terminal for connector, and method of producing terminal material for connector
JP5442385B2 (en) Conductive member and manufacturing method thereof
US11901659B2 (en) Terminal material for connectors
JP7380448B2 (en) Corrosion-proof terminal material for aluminum core wire and its manufacturing method, corrosion-proof terminal and electric wire terminal structure
JP2022119436A (en) Anti-corrosion terminal material for aluminum core wire, anti-corrosion terminal, and electric wire terminal structure
JP2020056057A (en) Terminal material for connector, terminal for connector, and manufacturing method of terminal material for connector
JP2020117769A (en) Terminal material for connector, and terminal for connector

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20220331

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20230213

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20230221

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20230421

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20230523

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20230605

R150 Certificate of patent or registration of utility model

Ref document number: 7302364

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150