JP2021025086A - Terminal material for connector, and connector terminal - Google Patents

Terminal material for connector, and connector terminal Download PDF

Info

Publication number
JP2021025086A
JP2021025086A JP2019143826A JP2019143826A JP2021025086A JP 2021025086 A JP2021025086 A JP 2021025086A JP 2019143826 A JP2019143826 A JP 2019143826A JP 2019143826 A JP2019143826 A JP 2019143826A JP 2021025086 A JP2021025086 A JP 2021025086A
Authority
JP
Japan
Prior art keywords
plating layer
silver
tin alloy
connector
nickel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2019143826A
Other languages
Japanese (ja)
Other versions
JP7302364B2 (en
Inventor
圭栄 樽谷
Yoshie Tarutani
圭栄 樽谷
賢治 久保田
Kenji Kubota
賢治 久保田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Materials Corp
Original Assignee
Mitsubishi Materials Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Materials Corp filed Critical Mitsubishi Materials Corp
Priority to JP2019143826A priority Critical patent/JP7302364B2/en
Publication of JP2021025086A publication Critical patent/JP2021025086A/en
Application granted granted Critical
Publication of JP7302364B2 publication Critical patent/JP7302364B2/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Abstract

To provide a terminal material for a connector, capable of enhancing adhesion of a silver tin alloy-plating layer to improve abrasion resistance and heat resistance, and to provide a connector terminal.SOLUTION: A terminal material for a connector includes: a base material, at least a surface of which consists of copper or a copper alloy; a nickel plating layer formed on a surface of the base material; an intermediate plating layer formed on the nickel plating layer; and a silver tin alloy-plating layer formed on the intermediate plating layer, wherein the intermediate plating layer comprises 90 mass% or more of one of Cu, Pd, Co, and Mn, the film thickness of the intermediate plating layer is 0.02 μm or more, the silver tin alloy-plating layer contains Ag in a range of 70 at.% or more and 85 at.% or less and mainly comprises a silver tin-based intermetallic compound, and the film thickness of the silver tin-plating layer is 0.5 μm or more and 5 μm or less.SELECTED DRAWING: Figure 1

Description

本発明は、微摺動が発生する自動車や民生機器等の電気配線の接続に使用される有用な皮膜が設けられたコネクタ用端子材及びコネクタ用端子に関する。 The present invention relates to a connector terminal material and a connector terminal provided with a useful film used for connecting electrical wiring of automobiles, consumer devices, etc. in which fine sliding occurs.

従来、自動車等の電気配線の接続に用いられるコネクタが知られている。この車載用コネクタ(車載用端子)には、メス端子に設けられた接触片が、メス端子内に挿入されたオス端子に所定の接触圧を有して接触することで、電気的に接続されるように設計された端子対を備えるものが用いられている。このようなコネクタ(端子)として、一般的に銅または銅合金板上に錫めっきを施し、リフロー処理を行った錫めっき付き端子が多く用いられていた。しかし、近年、自動車の高電流・高電圧化に伴い、より電流を多く流すことができる耐熱・耐摩耗性に優れた貴金属めっきを施した端子の用途が増加している。 Conventionally, connectors used for connecting electrical wiring of automobiles and the like are known. A contact piece provided on the female terminal is electrically connected to the vehicle-mounted connector (vehicle-mounted terminal) by contacting the male terminal inserted in the female terminal with a predetermined contact pressure. Those with a pair of terminals designed to be used are used. As such a connector (terminal), a tin-plated terminal in which a copper or copper alloy plate is tin-plated and reflowed is generally used. However, in recent years, with the increase in current and voltage of automobiles, the use of precious metal-plated terminals having excellent heat resistance and wear resistance, which can pass a larger current, is increasing.

このような耐熱性及び耐摩耗性が求められる車載用端子のめっきとして、例えば、特許文献1に記載のように銀めっきを端子に施す方法がある。この点、銀めっき層は、加熱によって銀の結晶粒径が肥大化するため硬度が低下する。この硬度が低下すると、同時に耐摩耗性も低下して、銀めっき層が摩耗し易くなるため、その対策として銀めっき層の膜厚を厚くすることが考えられるが、コスト面での問題がある。また、銀めっき層の下地にニッケルめっき層を用いた場合、ニッケルめっき層の酸化によって銀めっき層が剥離する問題もある。
一方、特許文献2のように、アンチモンを銀めっき層に添加することで、銀めっき層中の結晶粒を微細化し、銀めっき層の硬度を高くすることも考えられる。しかし、初期硬度は高いものの、加熱によって銀めっき層中のアンチモンがめっき層最表面に濃化して硬度が低下し、さらに表層のアンチモンが酸化して接触抵抗が増大する。さらに、ニッケルめっき層を下地として用いていた場合、加熱によってニッケルめっき層と銀めっき層との間にニッケル酸化物が生成され、このニッケル酸化物が原因となりめっき層が剥離することがあった。
As plating for in-vehicle terminals that are required to have such heat resistance and wear resistance, for example, there is a method of applying silver plating to the terminals as described in Patent Document 1. In this respect, the hardness of the silver-plated layer is lowered because the crystal grain size of silver is enlarged by heating. When this hardness decreases, the wear resistance also decreases, and the silver plating layer tends to wear. Therefore, it is conceivable to increase the film thickness of the silver plating layer as a countermeasure, but there is a problem in terms of cost. .. Further, when the nickel plating layer is used as the base of the silver plating layer, there is a problem that the silver plating layer is peeled off due to the oxidation of the nickel plating layer.
On the other hand, as in Patent Document 2, it is also conceivable to add antimony to the silver-plated layer to make the crystal grains in the silver-plated layer finer and increase the hardness of the silver-plated layer. However, although the initial hardness is high, the antimony in the silver plating layer is concentrated on the outermost surface of the plating layer by heating to reduce the hardness, and the antimony on the surface layer is oxidized to increase the contact resistance. Further, when the nickel plating layer is used as a base, nickel oxide is generated between the nickel plating layer and the silver plating layer by heating, and the nickel oxide may cause the plating layer to peel off.

また、特許文献3のように、銀めっき層と錫めっき層とを順に積層してリフロー処理することにより表面を合金化する手法もあるが、加熱処理によって酸化膜が生成するため、接続信頼性が低下する。
そこで、特許文献4のように、基材に対して直接銀錫合金めっきを施してめっき層全体の組成を均一に保つことが考えられている。
Further, as in Patent Document 3, there is also a method of alloying the surface by laminating a silver plating layer and a tin plating layer in order and performing a reflow treatment, but since an oxide film is formed by the heat treatment, connection reliability Decreases.
Therefore, as in Patent Document 4, it is considered to directly apply silver-tin alloy plating to the base material to keep the composition of the entire plating layer uniform.

特開2008−169408号公報Japanese Unexamined Patent Publication No. 2008-169408 特開2009−79250公報JP-A-2009-79250 特開2017−79143公報JP-A-2017-79143 特開2015−183216号公報JP-A-2015-183216

特許文献4の銀錫めっき層は、ニッケルめっき層上に直接均一に成膜させるためには、銀錫合金めっきを施す前に銀ストライクめっきを施す方が望ましい。しかし、ニッケルと銀は相互拡散し難く、さらに合金化した銀錫めっき層は非常に硬いため、摺動時に、密着の弱いニッケルめっき層と銀ストライクめっき層との界面から剥離する恐れがある。 The silver-tin plating layer of Patent Document 4 is preferably subjected to silver strike plating before the silver-tin alloy plating in order to form a uniform film directly on the nickel plating layer. However, nickel and silver are difficult to diffuse to each other, and the alloyed silver-tin plating layer is very hard, so that there is a risk of peeling from the interface between the nickel plating layer and the silver strike plating layer, which have weak adhesion, during sliding.

本発明は、このような事情に鑑みてなされたもので、銀錫合金めっき層の密着性を高めて、耐摩耗性及び耐熱性を向上できるコネクタ用端子材及びコネクタ用端子を提供することを目的とする。 The present invention has been made in view of such circumstances, and provides a connector terminal material and a connector terminal capable of improving the adhesion of the silver-tin alloy plating layer to improve wear resistance and heat resistance. The purpose.

本発明のコネクタ用端子材は、少なくとも表面が銅又は銅合金からなる基材と、該基材の表面に形成されたニッケルめっき層と、該ニッケルめっき層上の少なくとも一部に形成された中間めっき層と、該中間めっき層の上に形成された銀錫合金めっき層とを備え、前記中間めっき層は、Cu,Pd,Co,Mnのいずれか一種を主成分として含有し、前記中間めっき層の膜厚が0.02μm以上であり、前記銀錫合金めっき層は、Agを70at%以上85at%以下の範囲で含み、前記銀錫合金めっき層の膜厚は0.5μm以上5μm以下である。 The terminal material for a connector of the present invention has at least an intermediate surface formed on a base material made of copper or a copper alloy, a nickel plating layer formed on the surface of the base material, and at least a part thereof on the nickel plating layer. The intermediate plating layer includes a plating layer and a silver-tin alloy plating layer formed on the intermediate plating layer, and the intermediate plating layer contains any one of Cu, Pd, Co, and Mn as a main component, and the intermediate plating. The thickness of the layer is 0.02 μm or more, the silver-tin alloy plating layer contains Ag in the range of 70 at% or more and 85 at% or less, and the thickness of the silver-tin alloy plating layer is 0.5 μm or more and 5 μm or less. is there.

このコネクタ用端子材は、硬い銀錫合金層により、優れた耐摩耗性を有する。この場合、基材の表面にニッケルめっき層が形成されているので、高温環境下での基材からのCu成分の拡散を防止し、銀錫合金めっき層の性能低下を抑制する。ニッケルめっき層の膜厚は0.5μm以上2.0μm以下であるとよい。
また、このニッケルめっき層の上に中間層としてCu,Pd,Co,Mnのいずれか一種を主成分として含有する中間層が形成されているので、これらの間の密着性が良好となり、銀錫合金めっき層の耐摩耗性を有効に発揮させることができる。この中間めっき層の膜厚は0.02μm未満では全面に均質に成膜されないため、耐摩耗性向上の効果が低下し、銀錫合金めっき層が剥がれやすくなる。なお、加工性の面から中間めっき層の膜厚は0.5μm以下とするのが好ましい。
なお、銀錫合金めっき層中のAgが70at%未満では、加熱後の接触抵抗が増加し、Agが85at%を超えると、硬い銀錫合金に対する軟らかい銀の割合が増えるため、耐摩耗性が低下する。また全面に均一な成膜が困難となる。
銀錫系金属間化合物としては、AgSn及びAgSnの金属間化合物を例示できる。
銀錫合金めっき層が0.5μm未満では、コネクタとして使用する際の耐摩耗性向上の効果に乏しくなる。5μmを超える膜厚としても問題はないが、コストと加工性の面から5μm以下とするのが好ましい。
This connector terminal material has excellent wear resistance due to the hard silver-tin alloy layer. In this case, since the nickel plating layer is formed on the surface of the base material, diffusion of the Cu component from the base material in a high temperature environment is prevented, and the performance deterioration of the silver-tin alloy plating layer is suppressed. The thickness of the nickel plating layer is preferably 0.5 μm or more and 2.0 μm or less.
Further, since an intermediate layer containing any one of Cu, Pd, Co, and Mn as a main component is formed on the nickel plating layer as an intermediate layer, the adhesion between them is improved, and silver tin is obtained. The wear resistance of the alloy plating layer can be effectively exhibited. If the film thickness of the intermediate plating layer is less than 0.02 μm, the film is not uniformly formed on the entire surface, so that the effect of improving the wear resistance is reduced and the silver-tin alloy plating layer is easily peeled off. From the viewpoint of workability, the film thickness of the intermediate plating layer is preferably 0.5 μm or less.
If the Ag in the silver-tin alloy plating layer is less than 70 at%, the contact resistance after heating increases, and if the Ag exceeds 85 at%, the ratio of soft silver to the hard silver-tin alloy increases, so that the wear resistance is improved. descend. In addition, it becomes difficult to form a uniform film on the entire surface.
Examples of the silver-tin-based intermetallic compound include Ag 3 Sn and Ag 4 Sn intermetallic compounds.
If the silver-tin alloy plating layer is less than 0.5 μm, the effect of improving the wear resistance when used as a connector becomes poor. There is no problem even if the film thickness exceeds 5 μm, but it is preferably 5 μm or less from the viewpoint of cost and workability.

コネクタ用端子材の一つの態様として、前記銀錫合金めっき層の上に純度99質量%以上のAgからなる銀めっき層が0.1μm以上2.0μm以下の膜厚で形成されているとよい。 As one aspect of the terminal material for a connector, it is preferable that a silver plating layer made of Ag having a purity of 99% by mass or more is formed on the silver-tin alloy plating layer with a film thickness of 0.1 μm or more and 2.0 μm or less. ..

このコネクタ用端子材は、銀錫合金めっき層の上に銀めっき層が形成されているので、加熱環境下においても表面が酸化しにくく、接触抵抗の増大を抑制できる。また、比較的硬い銀錫合金めっき層の上に、この銀錫合金めっき層より軟質の銀めっき層が形成されているので、滑り性が向上し、コネクタとして使用する際の着脱抵抗が小さくなる効果もある。銀めっき層の膜厚が0.1μm未満では薄すぎるため、加熱後の接触抵抗の増大を抑制する効果が低く、早期に摩耗して消失し易い。2.0μmを超える厚さでは、軟らかい銀めっき層が厚いため、摩擦係数が増大する。 Since the silver plating layer is formed on the silver-tin alloy plating layer of this connector terminal material, the surface is less likely to be oxidized even in a heating environment, and an increase in contact resistance can be suppressed. Further, since the silver plating layer softer than this silver tin alloy plating layer is formed on the relatively hard silver tin alloy plating layer, the slipperiness is improved and the attachment / detachment resistance when used as a connector is reduced. There is also an effect. If the film thickness of the silver-plated layer is less than 0.1 μm, it is too thin, so that the effect of suppressing the increase in contact resistance after heating is low, and the silver-plated layer is easily worn away at an early stage. If the thickness exceeds 2.0 μm, the friction coefficient increases because the soft silver-plated layer is thick.

本発明のコネクタ用端子材からなるコネクタ用端子において、相手方コネクタ用端子との接点部分の表面が前記銀錫合金めっき層又は前記銀めっき層からなるものとするとよい。 In the connector terminal made of the connector terminal material of the present invention, the surface of the contact portion with the connector terminal of the other party may be made of the silver-tin alloy plating layer or the silver plating layer.

本発明によれば、銀錫合金めっき層の密着性を高められ、コネクタ用端子材の耐摩耗性及び耐熱性を向上できる。 According to the present invention, the adhesion of the silver-tin alloy plating layer can be enhanced, and the wear resistance and heat resistance of the terminal material for the connector can be improved.

本発明の一実施形態に係るコネクタ用端子材を模式的に示す断面図である。It is sectional drawing which shows typically the terminal material for a connector which concerns on one Embodiment of this invention. 実施例における加熱前のコネクタ用端子材の断面の走査イオン顕微鏡(SIM)像である。It is a scanning ion microscope (SIM) image of the cross section of the terminal material for a connector before heating in an Example.

以下、本発明の実施形態について図面を用いて説明する。
[コネクタ用端子材の構成]
図1は一実施形態のコネクタ用端子材の断面を模式的に示したものである。このコネクタ用端子材1は、少なくとも表面が銅又は銅合金からなる板状の基材2と、該基材2の表面に被覆されたニッケル又はニッケル合金からなるニッケルめっき層3と、ニッケルめっき層3の一部の表面に形成された中間めっき層4と、中間めっき層4の上に形成された銀錫合金めっき層5と、この銀錫合金めっき層5の上に形成された銀めっき層6とを備えている。
Hereinafter, embodiments of the present invention will be described with reference to the drawings.
[Structure of terminal material for connector]
FIG. 1 schematically shows a cross section of a terminal material for a connector according to an embodiment. The terminal material 1 for a connector has at least a plate-shaped base material 2 whose surface is made of copper or a copper alloy, a nickel plating layer 3 made of nickel or a nickel alloy coated on the surface of the base material 2, and a nickel plating layer. An intermediate plating layer 4 formed on a part of the surface of 3, a silver-tin alloy plating layer 5 formed on the intermediate plating layer 4, and a silver-tin alloy plating layer 5 formed on the silver-tin alloy plating layer 5. It is equipped with 6.

基材2は、銅または銅合金からなるものであれば、特に、その組成が限定されるものではない。また、母材の表面に銅又は銅合金からなる銅めっき層が施されためっき材により構成されてもよい。この場合、母材としては銅以外の金属材料であってもよい。 The composition of the base material 2 is not particularly limited as long as it is made of copper or a copper alloy. Further, it may be composed of a plating material having a copper plating layer made of copper or a copper alloy on the surface of the base material. In this case, the base material may be a metal material other than copper.

ニッケルめっき層3は、基材2上にニッケル又はニッケル合金めっきを施すことにより被覆される。このニッケルめっき層3は、その上に被覆される銀錫合金めっき層5への基材2からのCu及び合金成分の拡散を抑制する機能を有する。このニッケルめっき層3の厚さは、0.5μm以上2.0μm以下であることが好ましい。ニッケルめっき層3の厚さが0.5μm未満であると、高温環境下では銅又は銅合金からなる基材2から銅及び合金成分が上層のめっき層を拡散することによりコネクタ用端子材1の表面の接触抵抗値が大きくなり、耐熱性が低下する可能性があり、2.0μmを超えると、曲げ加工時に割れが発生する可能性がある。なお、ニッケルめっき層3は、ニッケル又はニッケル合金からなるものであれば、特に、その組成が限定されるものではない。 The nickel plating layer 3 is coated by applying nickel or nickel alloy plating on the base material 2. The nickel plating layer 3 has a function of suppressing diffusion of Cu and alloy components from the base material 2 into the silver-tin alloy plating layer 5 coated therein. The thickness of the nickel plating layer 3 is preferably 0.5 μm or more and 2.0 μm or less. When the thickness of the nickel plating layer 3 is less than 0.5 μm, the copper and alloy components diffuse from the base material 2 made of copper or a copper alloy to the upper plating layer under a high temperature environment, so that the terminal material 1 for the connector The contact resistance value of the surface may increase and the heat resistance may decrease, and if it exceeds 2.0 μm, cracks may occur during bending. The composition of the nickel plating layer 3 is not particularly limited as long as it is made of nickel or a nickel alloy.

中間めっき層4は、Cu,Pd,Co,Mnのいずれか一種を主成分として含有する。この中間めっき層4は、ニッケルめっき層3と銀錫合金めっき層5の両方にに対して密着性が良好で耐摩耗性が向上する。この中間めっき層4の膜厚は0.02μm以上であり、0.02μm未満では全面に均質に成膜されないため、耐摩耗性向上の効果が低下し、銀錫合金めっき層が剥がれやすくなる。なお、特に限定されないが、コストと加工性の面から中間めっき層4の膜厚は0.5μm以下とするのが好ましい。なお、この中間めっき層4におけるCu,Pd,Co,Mnの含有量は特に限定されるものではないが、90質量%以上あるとよい。 The intermediate plating layer 4 contains any one of Cu, Pd, Co, and Mn as a main component. The intermediate plating layer 4 has good adhesion to both the nickel plating layer 3 and the silver-tin alloy plating layer 5, and the wear resistance is improved. The film thickness of the intermediate plating layer 4 is 0.02 μm or more, and if it is less than 0.02 μm, the film is not uniformly formed on the entire surface, so that the effect of improving the wear resistance is reduced and the silver-tin alloy plating layer is easily peeled off. Although not particularly limited, the film thickness of the intermediate plating layer 4 is preferably 0.5 μm or less from the viewpoint of cost and workability. The content of Cu, Pd, Co, and Mn in the intermediate plating layer 4 is not particularly limited, but is preferably 90% by mass or more.

銀錫合金めっき層5は、中間めっき層4上に後述する銀ストライクめっきが施された後、その上面に被覆される。この銀錫合金めっき層5は、AgSn及びAgSnの金属間化合物を主成分とし、Agを70at%以上85at%以下の範囲で含んでいる。このような金属間化合物を含んでいるため、耐摩耗性が向上する。 The silver-tin alloy plating layer 5 is coated on the upper surface of the intermediate plating layer 4 after being subjected to silver strike plating described later. The silver-tin alloy plating layer 5 contains an intermetallic compound of Ag 3 Sn and Ag 4 Sn as a main component, and contains Ag in the range of 70 at% or more and 85 at% or less. Since it contains such an intermetallic compound, wear resistance is improved.

また、銀錫合金めっき層5は、その上に形成される軟らかい銀めっき層6を支持して、コネクタとして使用する際に耐摩耗性を向上させる効果がある。この銀錫合金めっき層5の厚さは、0.5μm以上5μm以下であることが好ましい。銀錫合金めっき層5が0.5μm未満であると、耐摩耗性向上の効果に乏しくなる。5μmを超える膜厚としても問題はないが、加工性の面から5μm以下とするのが好ましい。 Further, the silver-tin alloy plating layer 5 has an effect of supporting the soft silver plating layer 6 formed on the silver-tin alloy plating layer 5 and improving the wear resistance when used as a connector. The thickness of the silver-tin alloy plating layer 5 is preferably 0.5 μm or more and 5 μm or less. If the silver-tin alloy plating layer 5 is less than 0.5 μm, the effect of improving the wear resistance becomes poor. There is no problem even if the film thickness exceeds 5 μm, but it is preferably 5 μm or less from the viewpoint of workability.

銀めっき層6は、加熱環境下においても表面が酸化しにくく、接触抵抗の増大を抑制できる。この銀めっき層6は、純度99質量%以上、好ましくは99.9質量%以上の純銀からなる。純度が99質量%以上としたのは、銀めっき層6のAg濃度が99質量%未満であると不純物が多く含まれることとなり、接触抵抗が高くなるからである。
銀めっき層6の膜厚は0.1μm以上2.0μm以下である。銀めっき層6の膜厚が0.1μm未満では薄すぎるため、早期に摩耗して消失し易い。2.0μmを超える膜厚では、軟らかい銀めっき層6が厚くなるため、摩擦係数が増大する。
The surface of the silver-plated layer 6 is less likely to be oxidized even in a heating environment, and an increase in contact resistance can be suppressed. The silver-plated layer 6 is made of pure silver having a purity of 99% by mass or more, preferably 99.9% by mass or more. The purity is set to 99% by mass or more because if the Ag concentration of the silver plating layer 6 is less than 99% by mass, a large amount of impurities are contained and the contact resistance becomes high.
The film thickness of the silver plating layer 6 is 0.1 μm or more and 2.0 μm or less. If the film thickness of the silver plating layer 6 is less than 0.1 μm, it is too thin, so that it easily wears and disappears at an early stage. If the film thickness exceeds 2.0 μm, the soft silver plating layer 6 becomes thick, so that the coefficient of friction increases.

次に、このコネクタ用端子材1の製造方法について説明する。このコネクタ用端子材1の製造方法は、基材2となる銅又は銅合金からなる板材を洗浄する前処理工程と、ニッケルめっき層3を基材2に形成するニッケルめっき層形成工程と、ニッケルめっき層3上に中間めっき層4を形成する中間めっき層形成工程と、中間めっき層4上に銀ストライクめっきを施す銀ストライクめっき工程と、銀ストライクめっきの後に銀錫合金めっき層5を形成する銀錫合金めっき層形成工程と、銀めっき層6を銀錫合金めっき層5上に形成する銀めっき層形成工程と、を備える。 Next, a method of manufacturing the terminal material 1 for the connector will be described. The method for manufacturing the terminal material 1 for a connector includes a pretreatment step for cleaning a plate material made of copper or a copper alloy as a base material 2, a nickel plating layer forming step for forming a nickel plating layer 3 on the base material 2, and nickel. An intermediate plating layer forming step of forming an intermediate plating layer 4 on the plating layer 3, a silver strike plating step of applying silver strike plating on the intermediate plating layer 4, and a silver-tin alloy plating layer 5 being formed after the silver strike plating. It includes a silver-tin alloy plating layer forming step and a silver plating layer forming step of forming the silver plating layer 6 on the silver-tin alloy plating layer 5.

[前処理工程]
まず、基材2として、銅又は銅合金からなる板材を用意し、この板材に脱脂、酸洗等をすることによって表面を清浄する前処理を行う。
[Pretreatment process]
First, as the base material 2, a plate material made of copper or a copper alloy is prepared, and the surface is cleaned by degreasing, pickling, or the like.

[ニッケルめっき層形成工程]
この基材2の表面の少なくとも一部に対して、ニッケル又はニッケル合金めっきを施してニッケルめっき層3を基材2に形成する。例えば、スルファミン酸ニッケル300g/L、塩化ニッケル30g/L、ホウ酸30g/Lからなるニッケルめっき液を用いて、浴温45℃、電流密度3A/dmの条件下でニッケルめっきを施して形成される。なお、ニッケル層3を形成するニッケルめっきは、緻密なニッケル主体の膜が得られるものであれば特に限定されず、公知のワット浴を用いて電気めっきにより形成してもよい。
[Nickel plating layer forming process]
At least a part of the surface of the base material 2 is plated with nickel or a nickel alloy to form a nickel plating layer 3 on the base material 2. For example, it is formed by performing nickel plating under the conditions of a bath temperature of 45 ° C. and a current density of 3 A / dm 2 using a nickel plating solution composed of nickel sulfamate 300 g / L, nickel chloride 30 g / L, and borate 30 g / L. Will be done. The nickel plating for forming the nickel layer 3 is not particularly limited as long as a dense nickel-based film can be obtained, and may be formed by electroplating using a known watt bath.

[中間めっき層形成工程]
基材2に形成されたニッケルめっき層3の表面に5質量%〜10質量%の硫酸水溶液を用いて活性化処理を行った後、中間めっき層4を形成する。この中間めっき層4形成のためのめっき浴は、均一に成膜できれば、浴種は問わない。中間めっき層4が銅めっき層であれば硫酸銅浴、パラジウムめっき層であれば塩化パラジウム等のパラジウム化合物を含むめっき浴、コバルトめっき層であれば硫酸コバルトを含むめっき浴、マンガンめっき層であれば硫酸マンガンを含むめっき浴など、その金属種に代表的なめっき浴を用いればよい。
[Intermediate plating layer forming process]
The surface of the nickel plating layer 3 formed on the base material 2 is activated with a 5% by mass to 10% by mass sulfuric acid aqueous solution, and then the intermediate plating layer 4 is formed. The plating bath for forming the intermediate plating layer 4 may be of any type as long as it can form a uniform film. If the intermediate plating layer 4 is a copper plating layer, it may be a copper sulfate bath, if it is a palladium plating layer, it may be a plating bath containing a palladium compound such as palladium chloride, if it is a cobalt plating layer, it may be a plating bath containing cobalt sulfate, or a manganese plating layer. For example, a plating bath typical of the metal species, such as a plating bath containing manganese sulfate, may be used.

[銀ストライクめっき工程]
中間めっき層4の表面に銀めっきを短時間施して薄い銀めっき層を形成する。この場合の銀めっきとしては銀ストライクめっきが好ましい。この銀ストライクめっきを施すためのめっき液の組成は、ノーシアン浴(シアン化物であるシアン化銀、シアン化銀カリウム、シアン化ナトリウム、シアン化カリウム等を含まないめっき浴)であれば特に限定されないが、メタンスルホン酸銀浴を主体としたものが望ましい。この銀ストライクめっきにより形成される銀ストライクめっき層は、その後に銀錫合金めっき層が形成されることにより、層としての識別は困難になる。
[Silver strike plating process]
The surface of the intermediate plating layer 4 is silver-plated for a short time to form a thin silver-plated layer. As the silver plating in this case, silver strike plating is preferable. The composition of the plating solution for performing this silver strike plating is not particularly limited as long as it is a no-cyanide bath (a plating bath containing no cyanide such as silver cyanide, silver potassium cyanide, sodium cyanide, potassium cyanide, etc.). It is desirable to use a silver cyanide bath as the main component. The silver strike plating layer formed by the silver strike plating becomes difficult to identify as a layer because the silver-tin alloy plating layer is formed thereafter.

[銀錫合金めっき層形成工程]
そして、銀ストライクめっきを施した後に銀錫合金めっきを施して銀錫合金めっき層5を形成する。この銀錫合金めっきのためのめっき浴としては、例えば、メタンスルホン酸、メタンスルホン酸錫、メタンスルホン酸銀、硫黄を含有した有機添加剤を含む組成とする。具体的には、メタンスルホン酸濃度を40g/L、Ag濃度を40g/Lを超えて90g/L以下、Sn濃度を5〜35g/Lの範囲で調整した銀錫合金めっき液を用いるとよい。なお、この銀錫合金めっき液は、シアン化銀、シアン化銀カリウム、シアン化ナトリウム、シアン化カリウム等のシアン化物を含んでいない。また、錫陽極は、AgとPt/Ti(チタン製板に白金を被覆した)不溶性電極との両方を用い、これらの面積は、陰極の2倍以上、AgとPt/Tiの電流配分はAg:Pt/Ti=4:1とすることが好ましい。さらに、浴温は40℃〜60℃、電流密度1〜15A/dmとし、銀錫合金めっき層5を形成する。
[Silver-tin alloy plating layer forming process]
Then, after the silver strike plating is performed, the silver-tin alloy plating is performed to form the silver-tin alloy plating layer 5. The plating bath for this silver-tin alloy plating has, for example, a composition containing an organic additive containing methanesulfonic acid, tin methanesulfonic acid, silver methanesulfonic acid, and sulfur. Specifically, it is preferable to use a silver-tin alloy plating solution having a methanesulfonic acid concentration of 40 g / L, an Ag concentration of more than 40 g / L and 90 g / L or less, and a Sn concentration of 5 to 35 g / L. .. This silver-tin alloy plating solution does not contain cyanide such as silver cyanide, potassium silver cyanide, sodium cyanide, and potassium cyanide. Further, as the tin anode, both Ag and Pt / Ti (titanium plate coated with platinum) insoluble electrode are used, these areas are more than twice as large as the cathode, and the current distribution of Ag and Pt / Ti is Ag. : Pt / Ti = 4: 1 is preferable. Further, the bath temperature is 40 ° C. to 60 ° C., the current density is 1 to 15 A / dm 2 , and the silver-tin alloy plating layer 5 is formed.

[銀めっき層形成工程]
銀錫合金めっき層5の上に、銀めっきを施して銀めっき層6を形成する。この銀めっきのためのめっき浴の組成は、特に限定されないが、例えば、シアン化銀カリウム(K[Ag(CN)]30g/L〜60g/L、シアン化カリウム(KCN)120g/L〜160g/L、炭酸カリウム(KCO)10g/L〜20g/L、めっき層中に取り込まれやすい有機添加剤からなるめっき浴が好適である。有機添加剤としては、例えば、2,2チオエタノールなどのチオアルコール類、ベンゾチアゾール類、ベンゾトリアゾールなどのアゾール類、イミダゾールなどのイミダゾール類を用いることができる。この有機添加剤の添加濃度は0.1g/L以上10g/L以下とするのがよい。メタンスルホン酸、またはヨウ化カリウムと主体にしたノーシアン浴も使用可能である。
そして、この銀めっき浴に対してアノードとして純銀板を用いて、浴温10℃以上40℃以下、電流密度1A/dm以上10A/dm以下の条件下で銀めっきを1秒〜7分程度施すことにより銀めっき層6が形成される。
[Silver plating layer forming process]
Silver plating is applied on the silver-tin alloy plating layer 5 to form the silver plating layer 6. The composition of the plating bath for this silver plating is not particularly limited, but for example, silver potassium cyanide (K [Ag (CN) 2 ] 30 g / L to 60 g / L, potassium cyanide (KCN) 120 g / L to 160 g / A plating bath consisting of L, potassium carbonate (K 2 CO 3 ) 10 g / L to 20 g / L, and an organic additive that is easily incorporated into the plating layer is preferable. As the organic additive, for example, 2,2 thioethanol Thioalcohols such as, benzothiazoles, azoles such as benzotriazole, and imidazoles such as imidazole can be used. The addition concentration of this organic additive should be 0.1 g / L or more and 10 g / L or less. Good. A nosian bath based on methanesulfonic acid or potassium iodide can also be used.
Then, using a pure silver plate as an anode for this silver plating bath, silver plating is performed for 1 second to 7 minutes under the conditions of a bath temperature of 10 ° C. or higher and 40 ° C. or lower and a current density of 1 A / dm 2 or higher and 10 A / dm 2 or lower. The silver plating layer 6 is formed by applying the degree.

このようにして基材2の表面にニッケルめっき層3が形成され、その表面の少なくとも一部に形成された中間めっき層4の上に、銀錫合金めっき層5及び銀めっき層6が順次形成されたコネクタ用端子材1に対して、プレス加工等を施し、接点として用いられる部分の表面に銀めっき層6が配置されるコネクタ用端子を形成する。 In this way, the nickel plating layer 3 is formed on the surface of the base material 2, and the silver-tin alloy plating layer 5 and the silver plating layer 6 are sequentially formed on the intermediate plating layer 4 formed on at least a part of the surface thereof. The terminal material 1 for a connector is subjected to press processing or the like to form a terminal for a connector in which a silver plating layer 6 is arranged on the surface of a portion used as a contact.

本実施形態では、表面に銀めっき層6が形成されているので、加熱環境下においても表面が酸化しにくい。このため、150℃で250時間加熱後でも接触抵抗が1mΩ以下と小さく、耐熱性を向上できる。
銀錫合金めっき層5が形成されているため、表層から酸素が透過せず、加熱試験でニッケルめっき層3から剥離することを抑制できる。なお、銀錫合金めっき層5中のAgが70at%未満では、加熱後の接触抵抗が低下し、Agが85at%を超えると銀錫合金めっき層の粒径が大きくなり、耐摩耗性が低下する。
In the present embodiment, since the silver plating layer 6 is formed on the surface, the surface is less likely to be oxidized even in a heating environment. Therefore, the contact resistance is as small as 1 mΩ or less even after heating at 150 ° C. for 250 hours, and the heat resistance can be improved.
Since the silver-tin alloy plating layer 5 is formed, oxygen does not permeate from the surface layer, and it is possible to suppress peeling from the nickel plating layer 3 in the heating test. If the Ag in the silver-tin alloy plating layer 5 is less than 70 at%, the contact resistance after heating decreases, and if the Ag exceeds 85 at%, the particle size of the silver-tin alloy plating layer increases and the wear resistance decreases. To do.

なお、実施形態では、基材2表面のニッケルめっき層3の上の一部に中間めっき層4、銀錫合金めっき層5、銀めっき層6を形成したが、本発明の端子材としては、基材2の表面の全面に各めっき層が積層されていてもよい。中間めっき層4、銀錫合金めっき層5、銀めっき層6は、少なくとも端子材の表面の一部、具体的にはコネクタ用端子として接点部となる部分に形成されていればよい。 In the embodiment, the intermediate plating layer 4, the silver-tin alloy plating layer 5, and the silver plating layer 6 are formed on a part of the nickel plating layer 3 on the surface of the base material 2, but the terminal material of the present invention is used. Each plating layer may be laminated on the entire surface of the base material 2. The intermediate plating layer 4, the silver-tin alloy plating layer 5, and the silver plating layer 6 may be formed at least on a part of the surface of the terminal material, specifically, on a portion serving as a contact portion as a connector terminal.

銅合金からなる厚さ0.25mmの基材上にニッケルめっきを施して、膜厚1.0μmのニッケルめっき層を形成し、該ニッケルめっき層を形成した試料に対して、5質量%の硫酸水溶液を用いてニッケルめっき層表面を清浄化する活性化処理を行った。この活性化処理後に、ニッケルめっき層が被覆された基材に対して、中間めっき、銀ストライクめっき、銀錫合金めっき層及び銀めっき層を順に形成した各試料(試料1〜10)を作製した。この際、銀錫合金めっき液におけるAgの量(g/L)、Snの量(g/L)は、表1に示す値とした。 Nickel plating is performed on a base material having a thickness of 0.25 mm made of a copper alloy to form a nickel plating layer having a thickness of 1.0 μm, and 5% by mass of sulfuric acid is used with respect to the sample on which the nickel plating layer is formed. An activation treatment was performed to clean the surface of the nickel plating layer using an aqueous solution. After this activation treatment, each sample (samples 1 to 10) in which an intermediate plating, a silver strike plating, a silver-tin alloy plating layer, and a silver plating layer were formed in this order on a base material coated with a nickel plating layer was prepared. .. At this time, the amount of Ag (g / L) and the amount of Sn (g / L) in the silver-tin alloy plating solution were the values shown in Table 1.

また、比較のため、ニッケルめっき層の上に中間めっき層を形成しなかったものも作製した(試料19〜21)。これら試料は、銀錫合金めっき層のみ膜厚1μmで形成し、銀めっき層を形成しなかったもの(試料18)、銀錫合金めっき層及び銀めっき層をそれぞれ膜厚0.5μmで積層したもの(試料19)、銀錫合金めっき層を形成せずに銀めっき層のみ膜厚1μmで形成したもの(試料20)、アンチモンが添加された銀合金めっき層を膜厚1μmで形成したもの(試料21)とした。
なお、各めっきの条件は以下のとおりとした。
Further, for comparison, those in which the intermediate plating layer was not formed on the nickel plating layer were also prepared (Samples 19 to 21). In these samples, only the silver-tin alloy plating layer was formed with a thickness of 1 μm and no silver plating layer was formed (Sample 18), and the silver-tin alloy plating layer and the silver plating layer were laminated with a thickness of 0.5 μm, respectively. (Sample 19), only the silver plating layer formed with a thickness of 1 μm without forming the silver-tin alloy plating layer (Sample 20), and the silver alloy plating layer to which antimony was added formed with a thickness of 1 μm (Sample 20). It was used as sample 21).
The conditions for each plating were as follows.

<ニッケルめっき条件>
・めっき浴組成
スルファミン酸ニッケル:300g/L
塩化ニッケル:30g/L
ホウ酸:30g/L
・浴温:45℃
・電流密度:3A/dm
<Nickel plating conditions>
-Plating bath composition Nickel sulfamate: 300 g / L
Nickel chloride: 30 g / L
Boric acid: 30 g / L
・ Bath temperature: 45 ° C
-Current density: 3A / dm 2

<銅めっき条件>
・めっき浴組成
硫酸銅5水和物 250g/L
硫酸 50g/L
・浴温:50℃
・電流密度:3A/dm
・アノード:リン含有銅
<Copper plating conditions>
-Plating bath composition Copper sulfate pentahydrate 250 g / L
Sulfuric acid 50g / L
・ Bath temperature: 50 ℃
-Current density: 3A / dm 2
・ Anode: Phosphorus-containing copper

<パラジウムめっき条件>
・めっき浴組成
塩化パラジウム 17g/L
リン酸アンモニウム 100ml/L
塩化アンモニウム 25g/L
・浴温:30℃
・電流密度:1A/dm
・アノード:Pt/Ti(チタン製板に白金を被覆した不溶性電極)
<Palladium plating conditions>
・ Plating bath composition Palladium chloride 17 g / L
Ammonium phosphate 100 ml / L
Ammonium chloride 25 g / L
・ Bath temperature: 30 ℃
・ Current density: 1A / dm 2
-Anode: Pt / Ti (insoluble electrode made of titanium coated with platinum)

<コバルトめっき条件>
・めっき浴組成
硫酸コバルト7水和物 140g/L
ホウ酸 40g/L
・浴温:30℃
・電流密度:1A/dm
・アノード:Pt/Ti
<Cobalt plating conditions>
-Plating bath composition Cobalt sulfate heptahydrate 140 g / L
Boric acid 40g / L
・ Bath temperature: 30 ℃
・ Current density: 1A / dm 2
・ Anode: Pt / Ti

<マンガンめっき条件>
・めっき浴組成
硫酸マンガン 200g/L
硫酸アンモニウム 100g/L
・浴温:30℃
・電流密度:8A/dm
・アノード:Pt/Ti
<Manganese plating conditions>
・ Plating bath composition Manganese sulfate 200g / L
Ammonium sulfate 100 g / L
・ Bath temperature: 30 ℃
・ Current density: 8A / dm 2
・ Anode: Pt / Ti

<銀ストライクめっき条件>
・めっき浴組成
大和化成株式会社製ダイシルバー使用
・浴温:25℃
・電流密度:1A/dm
・アノード:Ir/Ti
(チタン製板にイリジウム酸化物(IrO)を被覆した不溶性電極)
<Silver strike plating conditions>
・ Plating bath composition Daiwa Kasei Co., Ltd. die silver used ・ Bath temperature: 25 ℃
・ Current density: 1A / dm 2
・ Anode: Ir / Ti
(Insoluble electrode in which a titanium plate is coated with iridium oxide (IrO 2))

<銀錫合金めっき条件>
・めっき浴組成
メタンスルホン酸:40g/L
メタンスルホン酸錫:13〜91g/L
メタンスルホン酸銀:75〜170g/L
有機添加剤:5mg/L
・浴温:50℃
・電流密度:1〜15A/dm
<Silver-tin alloy plating conditions>
-Plating bath composition Methanesulfonic acid: 40 g / L
Tin methanesulfonate: 13-91 g / L
Silver methanesulfonate: 75-170 g / L
Organic additive: 5 mg / L
・ Bath temperature: 50 ℃
-Current density: 1 to 15 A / dm 2

<銀めっき条件>
・めっき浴組成
シアン化銀カリウム:55g/L
シアン化カリウム:130g/L
炭酸カリウム:15g/L
非イオン性界面活性剤:1g/L
2,2チオエタノール:5g/L
・浴温:25℃
・電流密度:5A/dm
・アノード: 純銀板
<Silver plating conditions>
-Plating bath composition Silver cyanide potassium: 55 g / L
Potassium cyanide: 130 g / L
Potassium carbonate: 15 g / L
Nonionic surfactant: 1 g / L
2,2 thioethanol: 5 g / L
・ Bath temperature: 25 ℃
・ Current density: 5A / dm 2
・ Anode: Sterling silver plate

なお、試料21のアンチモン入り銀合金めっき層は、日進化成株式会社製のアンチモンが添加されたニッシンブライトN浴を用いて、光沢銀めっきを実施することにより作製した。めっき浴の組成は、標準組成を用い、浴温25℃、電流密度5A/dmとし、アノードとして純銀板を用い、膜厚1μmの銀合金めっき層(AgSb合金層)を形成した。 The antimony-containing silver alloy plating layer of Sample 21 was prepared by performing glossy silver plating using a Nissin Bright N bath to which antimony was added, which was manufactured by Nikkei Seisei Co., Ltd. The composition of the plating bath was a standard composition, a bath temperature of 25 ° C., a current density of 5 A / dm 2, and a pure silver plate as an anode to form a silver alloy plating layer (AgSb alloy layer) having a thickness of 1 μm.

得られた試料について、銀錫合金めっき層中のAg含有量、銀錫合金めっき層の膜厚、銀めっき層の膜厚を測定し、中間めっき層の膜厚、接触抵抗を測定し、かつ耐摩耗性を評価した。 For the obtained sample, the Ag content in the silver-tin alloy plating layer, the film thickness of the silver-tin alloy plating layer, the film thickness of the silver plating layer were measured, the film thickness of the intermediate plating layer, and the contact resistance were measured. Abrasion resistance was evaluated.

[銀錫合金めっき中のAg含有量]
収束イオンビーム装置(FIB)にてめっき材を加工して断面試料を作製し、銀錫合金めっき中のAg含有量(at%)は、日本電子株式会社製の電子線マイクロアナライザー:EPMA(型番JXA−8530F)を用いて、加速電圧10kVで各試料の断面を測定した。
[Ag content in silver-tin alloy plating]
A cross-sectional sample is prepared by processing the plating material with a focused ion beam device (FIB), and the Ag content (at%) in the silver-tin alloy plating is the electron probe microanalyzer manufactured by Nippon Denshi Co., Ltd .: EPMA (model number). Using JXA-8530F), the cross section of each sample was measured at an acceleration voltage of 10 kV.

[各めっき層の膜厚]
収束イオンビーム装置(FIB)にてめっき材を加工して断面試料を作製し、その断面表面を走査イオン顕微鏡(SIM)で観察し、得られたSIM像から膜厚(μm)を測定し、得られた数値を膜厚とした。
[Film thickness of each plating layer]
A plated material is processed with a focused ion beam device (FIB) to prepare a cross-sectional sample, the cross-sectional surface is observed with a scanning ion microscope (SIM), and the film thickness (μm) is measured from the obtained SIM image. The obtained value was taken as the film thickness.

[接触抵抗]
加熱前の各試料及び150℃で250時間加熱後の各試料のそれぞれを60mm×10mmの試験片に切り出し、平板サンプルをオス端子の代用とし、この平板サンプルに曲率半径3mmの凸加工を行ったサンプルをメス端子の代用とした。これらを加熱前及び150℃で250時間加熱後について、それぞれ接触抵抗(mΩ)を測定した。測定に際しては、ブルカー・エイエックスエス株式会社の摩擦摩耗試験機(UMT−Tribolab)を用い、水平に設置したオス端子試験片にメス試験片の凸面を接触させ、オス端子試験片を20Nの荷重をかけた時の接触抵抗値を4端子法により測定した。
[Contact resistance]
Each sample before heating and each sample after heating at 150 ° C. for 250 hours were cut into test pieces of 60 mm × 10 mm, and a flat plate sample was used as a substitute for a male terminal, and this flat plate sample was subjected to convex processing with a radius of curvature of 3 mm. The sample was used as a substitute for the female terminal. The contact resistance (mΩ) was measured before heating and after heating at 150 ° C. for 250 hours. For the measurement, a friction and wear tester (UMT-Tribolab) manufactured by Bruker AXS Corporation was used to bring the convex surface of the female test piece into contact with the horizontally installed male terminal test piece, and the male terminal test piece was loaded with a load of 20 N. The contact resistance value at the time of applying was measured by the 4-terminal method.

[耐摩耗性]
各試料を60mm×10mmの試験片に切り出し、平板サンプルをオス端子の代用とし、この平板サンプルに曲率半径3mmの凸加工を行ったサンプルをメス端子の代用とした。摺動試験は、ブルカー・エイエックスエス株式会社の摩擦摩耗試験機(UMT−Tribolab)を用い、水平に設置したオス端子試験片にメス試験片の凸面を接触させ、2Nの荷重を負荷した状態で、オス端子試験片を水平に移動距離5mm、摺動速度1Hzで摺動させた。摺動試験後に凸加工サンプルの下地(ニッケル層)が露出しているか否かで耐摩耗性を判定した。この際、摺動試験後に下地が露出していないものを良好「A」、摺動試験後に下地が露出しているものを不可「B」とした。
[Abrasion resistance]
Each sample was cut into a test piece of 60 mm × 10 mm, and a flat plate sample was used as a substitute for a male terminal, and a sample obtained by subjecting this flat plate sample to a convex processing with a radius of curvature of 3 mm was used as a substitute for a female terminal. For the sliding test, a friction and wear tester (UMT-Tribolab) manufactured by Bruker AS Corporation was used, and the convex surface of the female test piece was brought into contact with the horizontally installed male terminal test piece, and a load of 2N was applied. Then, the male terminal test piece was slid horizontally at a moving distance of 5 mm and a sliding speed of 1 Hz. After the sliding test, the wear resistance was judged by whether or not the base (nickel layer) of the convex processed sample was exposed. At this time, the one in which the base was not exposed after the sliding test was rated as good "A", and the one in which the base was exposed after the sliding test was rated as "B".

これらの結果を表1及び表2に示す。表中「−」は、めっきを実施しなかった、あるいは成膜できなかったために測定、評価しなかったことを示す。 These results are shown in Tables 1 and 2. "-" In the table indicates that the measurement or evaluation was not performed because the plating was not performed or the film could not be formed.

表1及び表2から明らかなように、中間めっき層の膜厚が0.02μm以上であり、銀錫合金めっき層が、Agを70at%以上85at%以下の範囲で含んでおり、銀錫合金めっき層の膜厚が0.5μm以上5μm以下である試料1〜4,7,8,10,11,13〜17は、加熱後の接触抵抗が2mΩ以下と良好で、耐摩耗性も良好であった。これらのうち、最表面に銀めっき層を0.1μm以上2μm以下の膜厚で形成した試料8,10,11,13〜17は、銀めっき層を形成しなかった試料1〜4、銀めっき層の膜厚が0.1μmであった試料7に比べて、加熱後の接触抵抗値が低く、加熱環境下における使用に適していることがわかる。
図2は試料13のSIM像であり、基材(Base Materialと表記)表面のニッケルめっき層(Niと表記)の上に、中間めっき層としてCuからなる層(Cuと表記)、銀錫合金めっき層(AgSnと表記)、銀めっき層(Agと表記)が形成されている。
これに対して、試料5は、銀錫合金めっき層の膜厚が0.4μmと小さいため、耐摩耗性が劣っていた。
試料6は、銀錫合金めっき層中のSnの含有量が多い(Agの含有量が少ない)ため、加熱によって拡散したSnが最表層に酸化膜を形成して接触抵抗が増加している。
試料9は、銀錫合金めっき層中のAg含有量が87at%であったことから、銀錫合金めっき層の結晶粒の大きさが極端にばらついて、均一な成膜ができなかった。
試料12は、中間めっき層の膜厚が0.01μmであったため、耐摩耗性に劣っていた。
中間めっき層を形成しなかった試料18〜21は、耐摩耗性に劣っていた。
As is clear from Tables 1 and 2, the thickness of the intermediate plating layer is 0.02 μm or more, the silver-tin alloy plating layer contains Ag in the range of 70 at% or more and 85 at% or less, and the silver-tin alloy. Samples 1 to 4,7,8,10,11,13 to 17 having a plating layer thickness of 0.5 μm or more and 5 μm or less have good contact resistance after heating of 2 mΩ or less and good wear resistance. there were. Of these, samples 8, 10, 11, 13 to 17 in which a silver-plated layer was formed on the outermost surface with a film thickness of 0.1 μm or more and 2 μm or less were samples 1 to 4 in which a silver-plated layer was not formed, and silver-plated. It can be seen that the contact resistance value after heating is lower than that of sample 7 in which the film thickness of the layer is 0.1 μm, and that it is suitable for use in a heating environment.
FIG. 2 is a SIM image of sample 13, in which a layer composed of Cu (denoted as Cu) and a silver-tin alloy as an intermediate plating layer are placed on a nickel plating layer (denoted as Ni) on the surface of a base material (denoted as Base Material). A plating layer (denoted as AgSn) and a silver plating layer (denoted as Ag) are formed.
On the other hand, in Sample 5, the film thickness of the silver-tin alloy plating layer was as small as 0.4 μm, so that the wear resistance was inferior.
In Sample 6, since the Sn content in the silver-tin alloy plating layer is high (the Ag content is low), Sn diffused by heating forms an oxide film on the outermost layer, and the contact resistance is increased.
Since the Ag content in the silver-tin alloy plating layer of Sample 9 was 87 at%, the size of the crystal grains in the silver-tin alloy plating layer was extremely uneven, and a uniform film formation could not be performed.
Sample 12 was inferior in wear resistance because the film thickness of the intermediate plating layer was 0.01 μm.
Samples 18 to 21 that did not form an intermediate plating layer were inferior in wear resistance.

1 コネクタ用端子材
2 基材
3 ニッケルめっき層
4 中間めっき層
5 銀錫合金めっき層
6 銀めっき層
1 Terminal material for connector 2 Base material 3 Nickel plating layer 4 Intermediate plating layer 5 Silver-tin alloy plating layer 6 Silver plating layer

Claims (4)

少なくとも表面が銅又は銅合金からなる基材と、該基材の表面に形成されたニッケルめっき層と、該ニッケルめっき層の上に形成された中間めっき層と、該中間めっき層の上に形成された銀錫合金めっき層とを備え、前記中間めっき層は、Cu,Pd,Co,Mnのいずれか一種を主成分として含有し、前記中間めっき層の膜厚が0.02μm以上であり、前記銀錫合金めっき層は、Agを70at%以上85at%以下の範囲で含み、前記銀錫合金めっき層の膜厚は0.5μm以上5μm以下であることを特徴とするコネクタ用端子材。 A base material whose surface is at least made of copper or a copper alloy, a nickel plating layer formed on the surface of the base material, an intermediate plating layer formed on the nickel plating layer, and an intermediate plating layer formed on the intermediate plating layer. The intermediate plating layer contains any one of Cu, Pd, Co, and Mn as a main component, and the thickness of the intermediate plating layer is 0.02 μm or more. The terminal material for a connector, wherein the silver-tin alloy plating layer contains Ag in a range of 70 at% or more and 85 at% or less, and the thickness of the silver-tin alloy plating layer is 0.5 μm or more and 5 μm or less. 前記銀錫合金めっき層の上に純度99質量%以上のAgからなる銀めっき層が0.1μm以上2.0μm以下の膜厚で形成されていることを特徴とする請求項1に記載のコネクタ用端子材。 The connector according to claim 1, wherein a silver plating layer made of Ag having a purity of 99% by mass or more is formed on the silver-tin alloy plating layer with a film thickness of 0.1 μm or more and 2.0 μm or less. Terminal material for. 請求項1に記載のコネクタ用端子材からなるコネクタ用端子であって、相手方コネクタ用端子との接点部分の表面が前記銀錫合金めっき層からなることを特徴とするコネクタ用端子。 The connector terminal made of the connector terminal material according to claim 1, wherein the surface of the contact portion with the mating connector terminal is made of the silver-tin alloy plating layer. 請求項2に記載のコネクタ用端子材からなるコネクタ用端子であって、相手方コネクタ用端子との接点部分の表面が前記銀めっき層からなることを特徴とするコネクタ用端子。 The connector terminal made of the connector terminal material according to claim 2, wherein the surface of the contact portion with the counterpart connector terminal is made of the silver-plated layer.
JP2019143826A 2019-08-05 2019-08-05 Connector terminal materials and connector terminals Active JP7302364B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2019143826A JP7302364B2 (en) 2019-08-05 2019-08-05 Connector terminal materials and connector terminals

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2019143826A JP7302364B2 (en) 2019-08-05 2019-08-05 Connector terminal materials and connector terminals

Publications (2)

Publication Number Publication Date
JP2021025086A true JP2021025086A (en) 2021-02-22
JP7302364B2 JP7302364B2 (en) 2023-07-04

Family

ID=74663703

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2019143826A Active JP7302364B2 (en) 2019-08-05 2019-08-05 Connector terminal materials and connector terminals

Country Status (1)

Country Link
JP (1) JP7302364B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2024047467A1 (en) * 2022-08-30 2024-03-07 Molex, Llc Connector and connector pair

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58221291A (en) * 1982-06-16 1983-12-22 Furukawa Electric Co Ltd:The Silver coated copper material for electrical connection
JP2011198683A (en) * 2010-03-23 2011-10-06 Mitsubishi Materials Corp Connection terminal for connector, and method for manufacturing the same
JP2016056422A (en) * 2014-09-11 2016-04-21 株式会社オートネットワーク技術研究所 Member for terminal and method for manufacturing the same, and terminal for connector

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58221291A (en) * 1982-06-16 1983-12-22 Furukawa Electric Co Ltd:The Silver coated copper material for electrical connection
JP2011198683A (en) * 2010-03-23 2011-10-06 Mitsubishi Materials Corp Connection terminal for connector, and method for manufacturing the same
JP2016056422A (en) * 2014-09-11 2016-04-21 株式会社オートネットワーク技術研究所 Member for terminal and method for manufacturing the same, and terminal for connector

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2024047467A1 (en) * 2022-08-30 2024-03-07 Molex, Llc Connector and connector pair

Also Published As

Publication number Publication date
JP7302364B2 (en) 2023-07-04

Similar Documents

Publication Publication Date Title
JP5280957B2 (en) Conductive member and manufacturing method thereof
JP4402132B2 (en) Reflow Sn plating material and electronic component using the same
US8101285B2 (en) Metallic material for a connecting part and a method of producing the same
JP4319247B1 (en) Conductive member and manufacturing method thereof
JP5498710B2 (en) Conductive member and manufacturing method thereof
TWI225322B (en) Terminal having ruthenium layer and a connector with the terminal
CN110997985A (en) Silver-coated membrane terminal material and silver-coated membrane terminal
JP2009084616A (en) REFLOW Sn PLATED MATERIAL AND ELECTRONIC COMPONENT USING THE SAME
JP4247256B2 (en) Cu-Zn-Sn alloy tin-plated strip
JP7302364B2 (en) Connector terminal materials and connector terminals
JP7302248B2 (en) Connector terminal materials and connector terminals
JP6743998B1 (en) Connector terminal material and connector terminal
JP7040544B2 (en) Terminal material for connectors
JP7313600B2 (en) Connector terminal materials and connector terminals
JP7059877B2 (en) Terminal material for connectors and terminals for connectors
JP2009097050A (en) Tin-plated material for electronic parts
JP2022021834A (en) Terminal material for connectors
JP2020117770A (en) Terminal material for connector, and terminal for connector
US11901659B2 (en) Terminal material for connectors
CN113166964A (en) Anti-corrosion terminal material, terminal and wire terminal structure
WO2021029254A1 (en) Terminal material for connectors
JP2020128575A (en) Terminal material for connector, terminal for connector, and method of producing terminal material for connector
JP2020056057A (en) Terminal material for connector, terminal for connector, and manufacturing method of terminal material for connector
JP2021063250A (en) Terminal material for connectors and method of manufacturing the same
JP2020117769A (en) Terminal material for connector, and terminal for connector

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20220331

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20230213

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20230221

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20230421

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20230523

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20230605

R150 Certificate of patent or registration of utility model

Ref document number: 7302364

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150