JP7239022B2 - 時系列データ処理方法 - Google Patents

時系列データ処理方法 Download PDF

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Publication number
JP7239022B2
JP7239022B2 JP2021566664A JP2021566664A JP7239022B2 JP 7239022 B2 JP7239022 B2 JP 7239022B2 JP 2021566664 A JP2021566664 A JP 2021566664A JP 2021566664 A JP2021566664 A JP 2021566664A JP 7239022 B2 JP7239022 B2 JP 7239022B2
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JPWO2021130936A5 (https=
JPWO2021130936A1 (https=
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洋平 飯澤
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NEC Corp
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NEC Corp
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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0221—Preprocessing measurements, e.g. data collection rate adjustment; Standardization of measurements; Time series or signal analysis, e.g. frequency analysis or wavelets; Trustworthiness of measurements; Indexes therefor; Measurements using easily measured parameters to estimate parameters difficult to measure; Virtual sensor creation; De-noising; Sensor fusion; Unconventional preprocessing inherently present in specific fault detection methods like PCA-based methods
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0243—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults model based detection method, e.g. first-principles knowledge model
    • G05B23/0254—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults model based detection method, e.g. first-principles knowledge model based on a quantitative model, e.g. mathematical relationships between inputs and outputs; functions: observer, Kalman filter, residual calculation, Neural Networks
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0224—Process history based detection method, e.g. whereby history implies the availability of large amounts of data
    • G05B23/024—Quantitative history assessment, e.g. mathematical relationships between available data; Functions therefor; Principal component analysis [PCA]; Partial least square [PLS]; Statistical classifiers, e.g. Bayesian networks, linear regression or correlation analysis; Neural networks

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Automation & Control Theory (AREA)
  • Artificial Intelligence (AREA)
  • Evolutionary Computation (AREA)
  • Mathematical Physics (AREA)
  • Testing And Monitoring For Control Systems (AREA)
JP2021566664A 2019-12-25 2019-12-25 時系列データ処理方法 Active JP7239022B2 (ja)

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PCT/JP2019/050988 WO2021130936A1 (ja) 2019-12-25 2019-12-25 時系列データ処理方法

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JPWO2021130936A1 JPWO2021130936A1 (https=) 2021-07-01
JPWO2021130936A5 JPWO2021130936A5 (https=) 2022-07-25
JP7239022B2 true JP7239022B2 (ja) 2023-03-14

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JP (1) JP7239022B2 (https=)
WO (1) WO2021130936A1 (https=)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7710886B2 (ja) * 2021-05-06 2025-07-22 キヤノン株式会社 情報処理方法、情報処理装置、制御プログラム、記録媒体、物品の製造方法、学習用データの取得方法
JP7656863B2 (ja) * 2021-08-05 2025-04-04 パナソニックＩｐマネジメント株式会社 モデル生成装置、モデル生成方法、異常予兆検知装置、異常予兆検知方法及び異常予兆検知システム
JP7358679B1 (ja) * 2022-02-24 2023-10-10 株式会社日立ハイテク 診断装置及び診断方法並びに半導体製造装置システム及び半導体装置製造システム
CN114978863B (zh) * 2022-05-17 2024-03-01 安天科技集团股份有限公司 一种数据处理方法、装置、计算机设备及可读存储介质
CN119166485B (zh) * 2024-11-19 2025-03-18 杭银消费金融股份有限公司 一种评估分析处理系统运行状态的方法及系统

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010191556A (ja) 2009-02-17 2010-09-02 Hitachi Ltd 異常検知方法及び異常検知システム
JP2019079089A (ja) 2017-10-20 2019-05-23 株式会社日立製作所 診断装置
WO2019102884A1 (ja) 2017-11-21 2019-05-31 日本電信電話株式会社 ラベル生成装置、モデル学習装置、感情認識装置、それらの方法、プログラム、および記録媒体
JP2019144767A (ja) 2018-02-19 2019-08-29 富士通株式会社 学習プログラム、学習方法および学習装置
JP2019204155A (ja) 2018-05-21 2019-11-28 ファナック株式会社 異常検出器

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7457550B2 (en) * 2005-01-18 2008-11-25 Ricoh Company, Limited Abnormality determining apparatus, image forming apparatus, copying machine, and information obtaining method
JP5530020B1 (ja) * 2013-11-01 2014-06-25 株式会社日立パワーソリューションズ 異常診断システム及び異常診断方法
US10504036B2 (en) * 2016-01-06 2019-12-10 International Business Machines Corporation Optimizing performance of event detection by sensor data analytics
US10805324B2 (en) * 2017-01-03 2020-10-13 General Electric Company Cluster-based decision boundaries for threat detection in industrial asset control system
JP7148311B2 (ja) * 2018-08-07 2022-10-05 ファナック株式会社 製品検査装置
US20200097810A1 (en) * 2018-09-25 2020-03-26 Oracle International Corporation Automated window based feature generation for time-series forecasting and anomaly detection

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010191556A (ja) 2009-02-17 2010-09-02 Hitachi Ltd 異常検知方法及び異常検知システム
JP2019079089A (ja) 2017-10-20 2019-05-23 株式会社日立製作所 診断装置
WO2019102884A1 (ja) 2017-11-21 2019-05-31 日本電信電話株式会社 ラベル生成装置、モデル学習装置、感情認識装置、それらの方法、プログラム、および記録媒体
JP2019144767A (ja) 2018-02-19 2019-08-29 富士通株式会社 学習プログラム、学習方法および学習装置
JP2019204155A (ja) 2018-05-21 2019-11-28 ファナック株式会社 異常検出器

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JPWO2021130936A1 (https=) 2021-07-01
WO2021130936A1 (ja) 2021-07-01

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