JP7233592B1 - 画像処理装置、画像処理方法及びプログラム - Google Patents

画像処理装置、画像処理方法及びプログラム Download PDF

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Publication number
JP7233592B1
JP7233592B1 JP2022140209A JP2022140209A JP7233592B1 JP 7233592 B1 JP7233592 B1 JP 7233592B1 JP 2022140209 A JP2022140209 A JP 2022140209A JP 2022140209 A JP2022140209 A JP 2022140209A JP 7233592 B1 JP7233592 B1 JP 7233592B1
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Japan
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image
folder
resolution
images
image processing
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JP2022140209A
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English (en)
Japanese (ja)
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JP2023063228A (ja
Inventor
智大 佐藤
淳一 児玉
勇樹 釜森
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Canon Inc
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Canon Inc
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Application filed by Canon Inc filed Critical Canon Inc
Priority to PCT/JP2022/039075 priority Critical patent/WO2023068323A1/ja
Priority to JP2023025525A priority patent/JP7479528B2/ja
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Publication of JP7233592B1 publication Critical patent/JP7233592B1/ja
Publication of JP2023063228A publication Critical patent/JP2023063228A/ja
Priority to US18/624,185 priority patent/US20240242333A1/en
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T3/00—Geometric image transformations in the plane of the image
    • G06T3/40—Scaling of whole images or parts thereof, e.g. expanding or contracting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0008—Industrial image inspection checking presence/absence

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Quality & Reliability (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Analysis (AREA)
  • Processing Or Creating Images (AREA)
  • Management, Administration, Business Operations System, And Electronic Commerce (AREA)
JP2022140209A 2021-10-22 2022-09-02 画像処理装置、画像処理方法及びプログラム Active JP7233592B1 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
PCT/JP2022/039075 WO2023068323A1 (ja) 2021-10-22 2022-10-20 画像処理装置、画像処理方法及びプログラム
JP2023025525A JP7479528B2 (ja) 2021-10-22 2023-02-21 画像処理装置、画像処理方法及びプログラム
US18/624,185 US20240242333A1 (en) 2021-10-22 2024-04-02 Image processing apparatus and image processing method

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2021173416 2021-10-22
JP2021173416 2021-10-22

Related Child Applications (1)

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JP2023025525A Division JP7479528B2 (ja) 2021-10-22 2023-02-21 画像処理装置、画像処理方法及びプログラム

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JP7233592B1 true JP7233592B1 (ja) 2023-03-06
JP2023063228A JP2023063228A (ja) 2023-05-09

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JP2023025525A Active JP7479528B2 (ja) 2021-10-22 2023-02-21 画像処理装置、画像処理方法及びプログラム

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US (1) US20240242333A1 (enExample)
JP (2) JP7233592B1 (enExample)
WO (1) WO2023068323A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2023063324A (ja) * 2021-10-22 2023-05-09 キヤノン株式会社 画像処理装置、画像処理方法及びプログラム

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2018037689A1 (ja) 2016-08-22 2018-03-01 富士フイルム株式会社 画像処理装置及び画像処理方法
WO2020121564A1 (ja) 2019-07-04 2020-06-18 株式会社日立ハイテク 寸法計測装置、寸法計測プログラム及び半導体製造システム
JP2021124933A (ja) 2020-02-05 2021-08-30 株式会社日立製作所 画像を生成するシステム
JP2021140739A (ja) 2020-02-28 2021-09-16 株式会社Pros Cons プログラム、学習済みモデルの生成方法、情報処理方法及び情報処理装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7233592B1 (ja) * 2021-10-22 2023-03-06 キヤノン株式会社 画像処理装置、画像処理方法及びプログラム

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2018037689A1 (ja) 2016-08-22 2018-03-01 富士フイルム株式会社 画像処理装置及び画像処理方法
WO2020121564A1 (ja) 2019-07-04 2020-06-18 株式会社日立ハイテク 寸法計測装置、寸法計測プログラム及び半導体製造システム
JP2021124933A (ja) 2020-02-05 2021-08-30 株式会社日立製作所 画像を生成するシステム
JP2021140739A (ja) 2020-02-28 2021-09-16 株式会社Pros Cons プログラム、学習済みモデルの生成方法、情報処理方法及び情報処理装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2023063324A (ja) * 2021-10-22 2023-05-09 キヤノン株式会社 画像処理装置、画像処理方法及びプログラム
JP7479528B2 (ja) 2021-10-22 2024-05-08 キヤノン株式会社 画像処理装置、画像処理方法及びプログラム

Also Published As

Publication number Publication date
WO2023068323A1 (ja) 2023-04-27
JP2023063228A (ja) 2023-05-09
JP7479528B2 (ja) 2024-05-08
JP2023063324A (ja) 2023-05-09
US20240242333A1 (en) 2024-07-18

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