JP7159106B2 - 非接触電気的パラメータ測定のためのクランププローブ - Google Patents

非接触電気的パラメータ測定のためのクランププローブ Download PDF

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Publication number
JP7159106B2
JP7159106B2 JP2019089284A JP2019089284A JP7159106B2 JP 7159106 B2 JP7159106 B2 JP 7159106B2 JP 2019089284 A JP2019089284 A JP 2019089284A JP 2019089284 A JP2019089284 A JP 2019089284A JP 7159106 B2 JP7159106 B2 JP 7159106B2
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clamp
probe
insulated conductor
clamping
electrical parameter
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Japanese (ja)
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JP2019215332A (ja
JP2019215332A5 (enExample
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ウォロンズ ジェフリー
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Fluke Corp
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Fluke Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416—Connectors, terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/07—Non contact-making probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
    • G01R1/22—Tong testers acting as secondary windings of current transformers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/12—Circuits for multi-testers, i.e. multimeters, e.g. for measuring voltage, current, or impedance at will
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/16—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using capacitive devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/145—Indicating the presence of current or voltage
    • G01R19/155—Indicating the presence of voltage
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G01R19/2506—Arrangements for conditioning or analysing measured signals, e.g. for indicating peak values ; Details concerning sampling, digitizing or waveform capturing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G—PHYSICS
    • G08—SIGNALLING
    • G08C—TRANSMISSION SYSTEMS FOR MEASURED VALUES, CONTROL OR SIMILAR SIGNALS
    • G08C17/00—Arrangements for transmitting signals characterised by the use of a wireless electrical link
    • G08C17/02—Arrangements for transmitting signals characterised by the use of a wireless electrical link using a radio link

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Geometry (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Power Engineering (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
JP2019089284A 2018-05-09 2019-05-09 非接触電気的パラメータ測定のためのクランププローブ Active JP7159106B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US15/975,000 2018-05-09
US15/975,000 US10775409B2 (en) 2018-05-09 2018-05-09 Clamp probe for non-contact electrical parameter measurement

Publications (3)

Publication Number Publication Date
JP2019215332A JP2019215332A (ja) 2019-12-19
JP2019215332A5 JP2019215332A5 (enExample) 2022-05-13
JP7159106B2 true JP7159106B2 (ja) 2022-10-24

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JP2019089284A Active JP7159106B2 (ja) 2018-05-09 2019-05-09 非接触電気的パラメータ測定のためのクランププローブ

Country Status (5)

Country Link
US (1) US10775409B2 (enExample)
EP (1) EP3567382B1 (enExample)
JP (1) JP7159106B2 (enExample)
CN (1) CN110470868B (enExample)
TW (1) TWI799576B (enExample)

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US10750252B2 (en) 2017-02-22 2020-08-18 Sense Labs, Inc. Identifying device state changes using power data and network data
US10878343B2 (en) 2018-10-02 2020-12-29 Sense Labs, Inc. Determining a power main of a smart plug
US11768228B2 (en) 2019-07-11 2023-09-26 Sense Labs, Inc. Current transformer with calibration information
US11067641B2 (en) * 2019-07-22 2021-07-20 Fluke Corporation Measurement device and operating methods thereof for power disturbance indication
US11735015B2 (en) * 2020-04-17 2023-08-22 Fluke Corporation Measurement devices with visual indication of detected electrical conditions
KR102255463B1 (ko) * 2020-05-28 2021-05-24 한국전력공사 전압 계측 프로브 홀더
USD946430S1 (en) * 2020-07-28 2022-03-22 Chauvin Arnoux Power energy logger
US11693033B2 (en) * 2021-09-02 2023-07-04 Fluke Corporation Sensor probe with combined non-contact sensor and a Rogowski coil
US12449283B2 (en) * 2021-12-30 2025-10-21 Robert Bosch Gmbh Non-contact voltage tester lightbulb socket adapter
CN114705975B (zh) * 2022-03-03 2025-01-28 贵州电网有限责任公司 一种便于接线的密度继电器校验装置
USD1031469S1 (en) * 2022-04-20 2024-06-18 Shenzhen Shanshui Power Technology Co. LTD Multimeter
FR3137177B1 (fr) * 2022-06-23 2024-06-21 Chauvin Arnoux Pince de mesure pour courants de fuite AC et DC
CN115541969A (zh) * 2022-10-27 2022-12-30 云南电网有限责任公司电力科学研究院 非接触式电流电压复合测量设备及系统
USD1054889S1 (en) 2023-02-10 2024-12-24 Chauvin Arnoux Insulation resistance tester
USD1093184S1 (en) * 2023-03-27 2025-09-16 Jiangsu Jingchuang Electronics Co., Ltd Temperature clamp (PT)
USD1092262S1 (en) * 2023-03-27 2025-09-09 Jiangsu Jingchuang Electronics Co., Ltd Temperature clamp
USD1092263S1 (en) * 2024-08-02 2025-09-09 Jiangsu Jingchuang Electronics Co., Ltd Temperature clamp

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Also Published As

Publication number Publication date
TW201947227A (zh) 2019-12-16
EP3567382B1 (en) 2022-03-02
CN110470868A (zh) 2019-11-19
US10775409B2 (en) 2020-09-15
JP2019215332A (ja) 2019-12-19
CN110470868B (zh) 2022-02-01
EP3567382A1 (en) 2019-11-13
US20190346484A1 (en) 2019-11-14
TWI799576B (zh) 2023-04-21

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