JP7112496B2 - 透明基板上に成膜された反射防止処理を硬化させる方法、および硬化された反射防止処理を含む透明基板 - Google Patents
透明基板上に成膜された反射防止処理を硬化させる方法、および硬化された反射防止処理を含む透明基板 Download PDFInfo
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- 238000011282 treatment Methods 0.000 title claims description 57
- 239000000758 substrate Substances 0.000 title claims description 40
- 238000000034 method Methods 0.000 title claims description 28
- 230000003667 anti-reflective effect Effects 0.000 title claims description 21
- 150000002500 ions Chemical class 0.000 claims description 55
- 229910052594 sapphire Inorganic materials 0.000 claims description 26
- 239000010980 sapphire Substances 0.000 claims description 26
- 238000010849 ion bombardment Methods 0.000 claims description 19
- 239000000463 material Substances 0.000 claims description 15
- 239000007789 gas Substances 0.000 claims description 12
- 238000010884 ion-beam technique Methods 0.000 claims description 10
- 238000005468 ion implantation Methods 0.000 claims description 9
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 8
- 238000000151 deposition Methods 0.000 claims description 8
- 239000011521 glass Substances 0.000 claims description 7
- ORUIBWPALBXDOA-UHFFFAOYSA-L magnesium fluoride Chemical compound [F-].[F-].[Mg+2] ORUIBWPALBXDOA-UHFFFAOYSA-L 0.000 claims description 7
- 238000000231 atomic layer deposition Methods 0.000 claims description 5
- 238000005240 physical vapour deposition Methods 0.000 claims description 5
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 claims description 5
- 238000001771 vacuum deposition Methods 0.000 claims description 5
- 230000008021 deposition Effects 0.000 claims description 4
- 229910052757 nitrogen Inorganic materials 0.000 claims description 4
- 238000005229 chemical vapour deposition Methods 0.000 claims description 3
- 238000000605 extraction Methods 0.000 claims description 3
- 238000002347 injection Methods 0.000 claims description 3
- 239000007924 injection Substances 0.000 claims description 3
- 239000000203 mixture Substances 0.000 claims description 3
- 230000008569 process Effects 0.000 claims description 2
- 238000001723 curing Methods 0.000 claims 9
- 230000000149 penetrating effect Effects 0.000 claims 1
- 239000013078 crystal Substances 0.000 description 46
- 230000003287 optical effect Effects 0.000 description 10
- 229910001635 magnesium fluoride Inorganic materials 0.000 description 7
- 229910003460 diamond Inorganic materials 0.000 description 6
- 239000010432 diamond Substances 0.000 description 6
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 4
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 4
- 229910052500 inorganic mineral Inorganic materials 0.000 description 3
- 239000011707 mineral Substances 0.000 description 3
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 2
- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 description 2
- 229910052786 argon Inorganic materials 0.000 description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 229910052799 carbon Inorganic materials 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 239000003574 free electron Substances 0.000 description 2
- 239000001307 helium Substances 0.000 description 2
- 229910052734 helium Inorganic materials 0.000 description 2
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 2
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 2
- 229910052754 neon Inorganic materials 0.000 description 2
- GKAOGPIIYCISHV-UHFFFAOYSA-N neon atom Chemical compound [Ne] GKAOGPIIYCISHV-UHFFFAOYSA-N 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 238000002310 reflectometry Methods 0.000 description 2
- 238000006748 scratching Methods 0.000 description 2
- 230000002393 scratching effect Effects 0.000 description 2
- 229910052724 xenon Inorganic materials 0.000 description 2
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 2
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 description 1
- 230000001133 acceleration Effects 0.000 description 1
- 238000013019 agitation Methods 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 239000006117 anti-reflective coating Substances 0.000 description 1
- 229910002092 carbon dioxide Inorganic materials 0.000 description 1
- 239000001569 carbon dioxide Substances 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000012512 characterization method Methods 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000002708 enhancing effect Effects 0.000 description 1
- 238000007542 hardness measurement Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000007373 indentation Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- 230000035515 penetration Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000003678 scratch resistant effect Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 239000012780 transparent material Substances 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
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- G04B39/00—Watch crystals; Fastening or sealing of crystals; Clock glasses
- G04B39/004—Watch crystals; Fastening or sealing of crystals; Clock glasses from a material other than glass
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Description
- 透明基板は、サファイア製である。
- サファイア製の透明基板は、時計用クリスタルである。
- イオン化される材料は、炭素(C)、酸素(O)、窒素(N)、アルゴン(Ar)、ヘリウム(He)、キセノン(Xe)、およびネオン(Ne)からなる群から選択される。
- 単一荷電または多重荷電イオンは、30kV~50kVの範囲内にある電圧下で加速される。
- 注入されるイオン・ドーズ量は、0.1×1016イオン/cm2~2×1016イオン/cm2の範囲内にある。
- イオン注入プロセスの期間は、5秒を超えない。
- 1つまたは複数の反射防止層は、シリコン酸化物(SiO2)またはフッ化マグネシウム(MgF2)を用いて作られる。
- 反射防止層の厚さは、150nmを超えない。
- 1つまたは複数の反射防止層の成膜から生じる反射防止処理は、1.55を超えない光屈折率を有する。
- 少なくとも1つの反射防止層の成膜前に、透明基板の上面および/または底面は、イオン衝撃を経る。
- 少なくとも1つの追加の反射防止層が、反射防止処理後にイオン衝撃を経た上面および/または底面上に成膜される。
・注入されたイオンの種類:窒素
・イオン加速電圧:40kV
・イオン注入ドーズ量:0.1×1016イオン/cm2~0.25×1016イオン/cm2の範囲内
・イオン・ビームの強度:6mA
・真空条件:4×10-6mbar
・フッ化マグネシウムMgF2層のイオンの浸透深さ:約50nm
2 入射段階
4 イオン化されるガスの容量
6 マイクロ波
8 磁気閉込段階
10 プラズマ
12 抽出段階
12a アノード
12b カソード
14 イオン・ビーム
18 時計用クリスタル
20 反射防止処理
22a 上面
22b 底面
24a、24b 平面時計用クリスタル
26a、26b 反射防止処理
O 起点
A-A 平面時計用クリスタル24Aのサファイアが露出した場所を示す直線
B-B 平面時計用クリスタル24Bのサファイアが露出した場所を示す直線
Claims (9)
- サファイア製の時計用ガラスである透明基板上に成膜される反射防止処理層(20)を硬化させる方法であって、前記透明基板は、上面(22a)と前記上面(22a)から離れて延びる底面(22b)とを備え、前記反射防止処理層(20)は、前記透明基板の前記上面(22a)および前記底面(22b)のうちの少なくとも1つの上に、少なくとも1つの材料の少なくとも1つの反射防止層を成膜することを含むステップによって生成され、前記硬化させる方法は、単一荷電および/または多重荷電電子サイクロトロン共鳴(ECR)イオン源(1)によって生成される単一荷電および/または多重荷電イオン・ビーム(14)を用いて、前記少なくとも1つの反射防止層が成膜された少なくとも1つの前記上面(22a)または前記底面(22b)に衝撃を与えることからなるステップを含み、
前記イオンは、40kVの電圧下で加速され、
注入されるイオン・ドーズ量は、0.1×1016イオン/cm2~0.25×1016イオン/cm2の範囲内であり、
前記ECRイオン源(1)は、イオン化されるある容量のガス(4)およびマイクロ波(6)が入射される入射段階(2)と、プラズマ(10)が生成される磁気閉込段階(8)と、高電圧がそれらの間に印加されるアノード(12a)およびカソード(12b)を用いて前記プラズマ(10)の前記イオンが抽出および加速されることを可能にする抽出段階(12)と、を含み、前記ECRイオン源(1)の出力において生成されるイオン・ビーム(14)は、処理される前記透明基板の表面に衝突し、処理される前記透明基板の前記上面(22a)および前記底面(22b)のうちの少なくとも1つの上に構築された前記反射防止処理層(20)の中に多少深く浸透し、
イオン化される前記ガスは、窒素(N)であり、
前記1つまたは複数の反射防止層はフッ化マグネシウム(MgF 2 )を用いて作られ、
前記イオン・ビーム(14)の強度は6mAである、
硬化させる方法。 - 前記少なくとも1つの反射防止層は、材料の真空蒸着によって成膜されることを特徴とする、請求項1に記載の硬化させる方法。
- 前記真空蒸着成膜技術は、物理蒸着、化学蒸着、プラズマ強化化学蒸着、および原子層堆積の中から選択されることを特徴とする、請求項2に記載の硬化させる方法。
- 前記少なくとも1つの反射防止層の成膜前に、前記反射防止層が成膜されるように意図される前記上面(22a)および/または底面(22b)は、イオン衝撃を経ることを特徴とする、請求項1~3のいずれか一項に記載の硬化させる方法。
- 少なくとも1つの追加の反射防止層は、イオン衝撃を経た前記反射防止処理層(20)上に成膜されることを特徴とする、請求項1~4のいずれか一項に記載の硬化させる方法。
- 前記イオンは、単一荷電型、即ち、その電離度が+1に等しいものとすることができ、または多重荷電型、即ち、その前記電離度が+1より大きいものとすることができることを特徴とする、請求項1~5のいずれか一項に記載の硬化させる方法。
- 前記ECRイオン源(1)によって生成される前記イオン・ビーム(14)は、全てが同じ電離度を有するイオンから形成されることが可能であり、または少なくとも2つの異なる電離度を有するイオンの混合から形成されることが可能であることを特徴とする、請求項6に記載の硬化させる方法。
- イオン注入プロセスの期間は、5秒を超えないことを特徴とする、請求項1~7のいずれか一項に記載の硬化させる方法。
- 前記反射防止層の厚さは、150nmを超えないことを特徴とする、請求項1~8のいずれか一項に記載の硬化させる方法。
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EP18199708.1A EP3636796A1 (fr) | 2018-10-10 | 2018-10-10 | Procede de durcissement d'un traitement antireflet depose sur un substrat transparent et substrat transparent comprenant un traitement antireflet durci |
PCT/EP2019/075256 WO2020074235A1 (fr) | 2018-10-10 | 2019-09-19 | Procede de durcissement d'un traitement antireflet depose sur un substrat transparent et substrat transparent comprenant un traitement antireflet durci |
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WO2020074235A1 (fr) | 2020-04-16 |
KR102473257B1 (ko) | 2022-12-01 |
US20200331801A1 (en) | 2020-10-22 |
EP3714079B1 (fr) | 2021-12-15 |
CN111542642A (zh) | 2020-08-14 |
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KR20200097324A (ko) | 2020-08-18 |
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