JP7095579B2 - 質量分析装置 - Google Patents

質量分析装置 Download PDF

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Publication number
JP7095579B2
JP7095579B2 JP2018227790A JP2018227790A JP7095579B2 JP 7095579 B2 JP7095579 B2 JP 7095579B2 JP 2018227790 A JP2018227790 A JP 2018227790A JP 2018227790 A JP2018227790 A JP 2018227790A JP 7095579 B2 JP7095579 B2 JP 7095579B2
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Japan
Prior art keywords
ion
ions
cell
voltage
electrode
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JP2018227790A
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English (en)
Japanese (ja)
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JP2020091988A5 (https=
JP2020091988A (ja
Inventor
知義 松下
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Shimadzu Corp
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Shimadzu Corp
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Priority to JP2018227790A priority Critical patent/JP7095579B2/ja
Priority to US16/596,329 priority patent/US11393669B2/en
Publication of JP2020091988A publication Critical patent/JP2020091988A/ja
Publication of JP2020091988A5 publication Critical patent/JP2020091988A5/ja
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/067—Ion lenses, apertures, skimmers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/105—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
    • H01J49/005—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction by collision with gas, e.g. by introducing gas or by accelerating ions with an electric field
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
    • H01J49/0063—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction by applying a resonant excitation voltage
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/061—Ion deflecting means, e.g. ion gates
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/068—Mounting, supporting, spacing, or insulating electrodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/421—Mass filters, i.e. deviating unwanted ions without trapping
    • H01J49/4215—Quadrupole mass filters
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/426—Methods for controlling ions
    • H01J49/4265—Controlling the number of trapped ions; preventing space charge effects
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H01J49/0031—Step by step routines describing the use of the apparatus

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2018227790A 2018-12-05 2018-12-05 質量分析装置 Active JP7095579B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2018227790A JP7095579B2 (ja) 2018-12-05 2018-12-05 質量分析装置
US16/596,329 US11393669B2 (en) 2018-12-05 2019-10-08 Mass spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2018227790A JP7095579B2 (ja) 2018-12-05 2018-12-05 質量分析装置

Publications (3)

Publication Number Publication Date
JP2020091988A JP2020091988A (ja) 2020-06-11
JP2020091988A5 JP2020091988A5 (https=) 2021-05-06
JP7095579B2 true JP7095579B2 (ja) 2022-07-05

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ID=70970754

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2018227790A Active JP7095579B2 (ja) 2018-12-05 2018-12-05 質量分析装置

Country Status (2)

Country Link
US (1) US11393669B2 (https=)
JP (1) JP7095579B2 (https=)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102021002086B8 (de) * 2020-04-23 2025-12-18 National Institute Of Advanced Industrial Science And Technology Probeneinführungsvorrichtung, Analysevorrichtung mit induktiv gekoppeltem Plasma und Analyseverfahren
CN112599397B (zh) * 2020-12-14 2023-06-06 兰州空间技术物理研究所 一种储存式离子源
WO2022140740A1 (en) * 2020-12-23 2022-06-30 Mks Instruments, Inc. Monitoring radical particle concentration using mass spectrometry
GB2608824B (en) * 2021-07-13 2024-06-12 Isotopx Ltd Apparatus and method
WO2023028696A1 (en) * 2021-08-30 2023-03-09 Kimia Analytics Inc. Method and apparatus to increase sensitivity of inductively coupled plasma mass spectrometry
JP7775892B2 (ja) * 2021-11-16 2025-11-26 株式会社島津製作所 質量分析装置およびその制御方法
EP4435426A4 (en) * 2021-11-17 2025-03-12 Shimadzu Corporation INDUCTIVELY COUPLED PLASMA MASS SPECTROMETER
JP2024064401A (ja) 2022-10-28 2024-05-14 株式会社島津製作所 質量分析装置
JP2024064706A (ja) 2022-10-28 2024-05-14 株式会社島津製作所 質量分析装置および分析条件の設定方法
GB2631471B (en) * 2023-06-30 2025-09-24 Thermo Fisher Scient Bremen Gmbh Apparatus for inductively coupled plasma mass spectrometry

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004507875A (ja) 2000-08-30 2004-03-11 エムディーエス　インコーポレイテッド　ドゥーイング　ビジネス　アズ　エムディーエス　サイエックス 質量分析において反応／衝突セルへのイオン源ガスの進入を防止するための装置及び方法
WO2009095958A1 (ja) 2008-01-30 2009-08-06 Shimadzu Corporation Ｍｓ／ｍｓ型質量分析装置
JP2017535040A (ja) 2010-02-26 2017-11-24 パーキンエルマー・ヘルス・サイエンシーズ・インコーポレイテッドＰｅｒｋｉｎｅｌｍｅｒ Ｈｅａｌｔｈ Ｓｃｉｅｎｃｅｓ， Ｉｎｃ． 不要イオンを抑制するシステム及び方法

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB9219457D0 (en) * 1992-09-15 1992-10-28 Fisons Plc Reducing interferences in plasma source mass spectrometers
JP3385707B2 (ja) * 1994-03-17 2003-03-10 株式会社日立製作所 質量分析装置
US6924478B1 (en) * 2004-05-18 2005-08-02 Bruker Daltonik Gmbh Tandem mass spectrometry method
WO2009094760A1 (en) * 2008-01-31 2009-08-06 Mds Analytical Technologies, A Business Unit Of Mds Inc., Doing Business Through Its Sciex Divison Method of operating a linear ion trap to provide low pressure short time high amplitude excitation with pulsed pressure
US9190253B2 (en) 2010-02-26 2015-11-17 Perkinelmer Health Sciences, Inc. Systems and methods of suppressing unwanted ions
JP5686566B2 (ja) * 2010-10-08 2015-03-18 株式会社日立ハイテクノロジーズ 質量分析装置
JP5543912B2 (ja) * 2010-12-27 2014-07-09 日本電子株式会社 質量分析装置
DE102011015517B3 (de) * 2011-03-30 2012-06-28 Leibniz-Institut für Analytische Wissenschaften-ISAS-e.V. Verfahren zur dielektrisch behinderten Elektrosprayionisierung von flüssigen Proben und zur nachfolgenden massenspektrometrischen Analyse der erzeugten Probenionen
WO2014096917A1 (en) * 2012-12-20 2014-06-26 Dh Technologies Development Pte. Ltd. Parsing events during ms3 experiments
GB2511035B (en) * 2013-02-14 2018-10-24 Thermo Fisher Scient Bremen Gmbh Ion fragmentation
US9214321B2 (en) * 2013-03-11 2015-12-15 1St Detect Corporation Methods and systems for applying end cap DC bias in ion traps
WO2015097504A1 (en) * 2013-12-23 2015-07-02 Dh Technologies Development Pte. Ltd. Mass spectrometer
US9613788B2 (en) * 2014-06-13 2017-04-04 Perkinelmer Health Sciences, Inc. RF ion guide with axial fields
US9406492B1 (en) * 2015-05-12 2016-08-02 The University Of North Carolina At Chapel Hill Electrospray ionization interface to high pressure mass spectrometry and related methods
WO2017122339A1 (ja) * 2016-01-15 2017-07-20 株式会社島津製作所 直交加速飛行時間型質量分析装置
US11241166B1 (en) * 2016-02-03 2022-02-08 Verily Life Sciences, LLC Communications between smart contact lens and ingestible smart pill
WO2019082351A1 (ja) * 2017-10-26 2019-05-02 株式会社島津製作所 質量分析装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004507875A (ja) 2000-08-30 2004-03-11 エムディーエス　インコーポレイテッド　ドゥーイング　ビジネス　アズ　エムディーエス　サイエックス 質量分析において反応／衝突セルへのイオン源ガスの進入を防止するための装置及び方法
WO2009095958A1 (ja) 2008-01-30 2009-08-06 Shimadzu Corporation Ｍｓ／ｍｓ型質量分析装置
JP2017535040A (ja) 2010-02-26 2017-11-24 パーキンエルマー・ヘルス・サイエンシーズ・インコーポレイテッドＰｅｒｋｉｎｅｌｍｅｒ Ｈｅａｌｔｈ Ｓｃｉｅｎｃｅｓ， Ｉｎｃ． 不要イオンを抑制するシステム及び方法

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Publication number Publication date
JP2020091988A (ja) 2020-06-11
US20200185210A1 (en) 2020-06-11
US11393669B2 (en) 2022-07-19

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