JP7004420B2 - 放射温度測定装置 - Google Patents
放射温度測定装置 Download PDFInfo
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- JP7004420B2 JP7004420B2 JP2018554988A JP2018554988A JP7004420B2 JP 7004420 B2 JP7004420 B2 JP 7004420B2 JP 2018554988 A JP2018554988 A JP 2018554988A JP 2018554988 A JP2018554988 A JP 2018554988A JP 7004420 B2 JP7004420 B2 JP 7004420B2
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- polarizing plate
- wire grid
- infrared sensor
- measuring device
- temperature measuring
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- 230000005855 radiation Effects 0.000 title claims description 49
- 238000009529 body temperature measurement Methods 0.000 claims description 34
- 238000001514 detection method Methods 0.000 claims description 10
- 230000010287 polarization Effects 0.000 claims description 7
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 5
- 229910052782 aluminium Inorganic materials 0.000 claims description 5
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 3
- 229910052814 silicon oxide Inorganic materials 0.000 claims description 3
- 239000011521 glass Substances 0.000 description 34
- 238000010586 diagram Methods 0.000 description 11
- 238000002834 transmittance Methods 0.000 description 10
- 238000005259 measurement Methods 0.000 description 9
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 6
- 230000005540 biological transmission Effects 0.000 description 5
- 230000007423 decrease Effects 0.000 description 5
- 230000000694 effects Effects 0.000 description 5
- 238000000034 method Methods 0.000 description 5
- 238000012937 correction Methods 0.000 description 4
- 238000010521 absorption reaction Methods 0.000 description 3
- 238000004364 calculation method Methods 0.000 description 3
- 238000006243 chemical reaction Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 229920006254 polymer film Polymers 0.000 description 3
- 238000001931 thermography Methods 0.000 description 3
- 230000005457 Black-body radiation Effects 0.000 description 2
- 239000004973 liquid crystal related substance Substances 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 241000251468 Actinopterygii Species 0.000 description 1
- 241000276420 Lophius piscatorius Species 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 230000002542 deteriorative effect Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/59—Radiation pyrometry, e.g. infrared or optical thermometry using polarisation; Details thereof
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/06—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0808—Convex mirrors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/30—Polarising elements
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/30—Polarising elements
- G02B5/3025—Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state
- G02B5/3058—Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state comprising electrically conductive elements, e.g. wire grids, conductive particles
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/60—Radiation pyrometry, e.g. infrared or optical thermometry using determination of colour temperature
- G01J5/602—Radiation pyrometry, e.g. infrared or optical thermometry using determination of colour temperature using selective, monochromatic or bandpass filtering
- G01J2005/604—Radiation pyrometry, e.g. infrared or optical thermometry using determination of colour temperature using selective, monochromatic or bandpass filtering bandpass filtered
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/48—Thermography; Techniques using wholly visual means
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Optics & Photonics (AREA)
- Radiation Pyrometers (AREA)
- Polarising Elements (AREA)
Description
図1は、本実施形態にかかる放射温度測定装置100の概略構成例を示すブロック図である。放射温度測定装置100は、赤外線センサを用いて測定対象の物体の表面温度を非接触で測定する装置である。
反射型偏光板2の具体的な一例として、WGFが挙げられる。図3に示すように、反射型偏光板2は、フィルム面23、およびフィルム面23に垂直な向きから見ると、図3のようにグリッド21(アルミニウムの細線)が一方向に並んで(図3の場合にはたてに並んで)形成されている。
ガラスの反射率は、WGFの基材フィルムなどとほぼ同様の1.5程度である。このガラスに入射角度0~90度の電磁波が入ったときの反射率はよく知られている。図8は、ガラスに入射角度0~90度で電磁波が入ったときの反射率を示すグラフである。図8において、横軸は入射角(度)を示し、縦軸は反射率を示している。反射率の単位は、最大値(100%)で規格化されている。特性SRは、ガラスのS波に対する反射率特性を示し、特性PRは、ガラスのP波に対する反射率特性を示している。
2 反射型偏光板
3 筐体
4 温度変換部
21 グリッド
23 フィルム面
100 放射温度測定装置
101 温度測定対象物
Claims (7)
- 赤外線センサを用いて物体の表面温度を非接触で測定する放射温度測定装置において、
酸化ケイ素を主成分として含む温度測定対象である前記物体から放射される電磁波を検出する赤外線センサと、
前記電磁波のうち、一方向の偏光波を反射するとともに、前記一方向とは垂直な方向の偏光波を透過又は吸収する偏光板と、
を備え、
前記赤外線センサが、前記偏光板の反射する一方向の偏光電磁波を検出すること
を特徴とし、
さらに、
前記偏光板がフィルム形状であるとともに、前記偏光板が前記偏光板を回転させても反射偏光波の方向が変わらない軸を持つワイヤグリッド偏光板であり、
前記偏光板の反射する一方向の偏光電磁波が前記温度測定対象からのP波であり、
前記赤外線センサが、前記物体から放射されて前記ワイヤグリッド偏光板のグリッド側に入射し該ワイヤグリッド偏光板で反射された前記一方向の偏光電磁波を検出することを特徴とし、
前記ワイヤグリッド偏光板が、前記ワイヤグリッド偏光板のグリッド方向を回転軸として回転させて前記赤外線センサに対して傾けて配置されていることを特徴とする放射温度測定装置。 - 前記ワイヤグリッド偏光板の反射偏光波方向を回転軸として回転させた角度が10度から80度の間の角度であることを特徴とする請求項1に記載の放射温度測定装置。
- 前記ワイヤグリッド偏光板の反射角度は、前記ワイヤグリッド偏光板の垂直な方向の反射率が最小になるように設定されていることを特徴とする請求項1又は2記載の放射温度測定装置。
- 前記ワイヤグリッド偏光板の偏光反射率は、90%以上であることを特徴とする
請求項1から3までのいずれか一項に記載の放射温度測定装置。 - 前記物体の表面は平面であり、
前記赤外線センサと前記ワイヤグリッド偏光板により検出される方向が前記平面の法線方向と異なることを特徴とする
請求項1から4までのいずれか一項に記載の放射温度測定装置。 - 前記赤外線センサの検出波長帯域は、8μm以下であって9μmから10μmを含まないことを特徴とする
請求項4又は5に記載の放射温度測定装置。 - 前記ワイヤグリッド偏光板のワイヤグリッドがアルミニウムで形成されていることを特徴とする請求項1から6までのいずれか一項に記載の放射温度測定装置。
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JP2021100380A JP7319325B2 (ja) | 2016-12-07 | 2021-06-16 | 放射温度測定装置 |
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JP2016237745 | 2016-12-07 | ||
JP2016237745 | 2016-12-07 | ||
PCT/JP2017/043454 WO2018105551A1 (ja) | 2016-12-07 | 2017-12-04 | 放射温度測定装置 |
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JP2021100380A Division JP7319325B2 (ja) | 2016-12-07 | 2021-06-16 | 放射温度測定装置 |
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JPWO2018105551A1 JPWO2018105551A1 (ja) | 2019-06-24 |
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JP2021100380A Active JP7319325B2 (ja) | 2016-12-07 | 2021-06-16 | 放射温度測定装置 |
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Country Status (5)
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US (1) | US11573128B2 (ja) |
EP (1) | EP3553479A4 (ja) |
JP (2) | JP7004420B2 (ja) |
CN (2) | CN110036265A (ja) |
WO (1) | WO2018105551A1 (ja) |
Families Citing this family (1)
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WO2020105344A1 (ja) * | 2018-11-22 | 2020-05-28 | 日本電気硝子株式会社 | ガラス物品の温度測定方法 |
Citations (5)
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JP2007256219A (ja) | 2006-03-27 | 2007-10-04 | Nissan Motor Co Ltd | 温度検出装置 |
JP2014044244A (ja) | 2012-08-24 | 2014-03-13 | Asahi Kasei E-Materials Corp | 映像表示装置 |
JP2014134630A (ja) | 2013-01-09 | 2014-07-24 | Asahi Kasei E-Materials Corp | 光学システム |
JP2016038537A (ja) | 2014-08-11 | 2016-03-22 | 旭硝子株式会社 | ワイヤグリッド型偏光子、光源モジュールおよび投射型表示装置 |
JP6019508B1 (ja) | 2016-02-09 | 2016-11-02 | 大学共同利用機関法人 高エネルギー加速器研究機構 | 放射測定器 |
Family Cites Families (17)
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JPS6019508B2 (ja) | 1977-02-04 | 1985-05-16 | 株式会社リコー | 静電潜像の現像方法 |
US4257106A (en) * | 1979-05-24 | 1981-03-17 | Norlin Industries, Inc. | Method and apparatus for thermal imaging |
JPS6049850B2 (ja) | 1980-09-29 | 1985-11-05 | 三菱電機株式会社 | 放射温度計 |
JPS5764130A (en) | 1980-10-08 | 1982-04-19 | Mitsubishi Electric Corp | Radiation thermometer |
JPS57161625A (en) | 1981-03-31 | 1982-10-05 | Jeol Ltd | Infrared temperature measuring method |
JPS62266424A (ja) | 1986-05-14 | 1987-11-19 | Nec Corp | 放射温度測定装置 |
JPH05273045A (ja) * | 1992-03-26 | 1993-10-22 | Nippon Steel Corp | 透明性薄膜に被覆された物体の温度測定装置 |
CN1030155C (zh) * | 1992-11-28 | 1995-10-25 | 浙江大学 | 三片式高效红外偏振分束器 |
US5436443A (en) * | 1994-07-06 | 1995-07-25 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Polaradiometric pyrometer in which the parallel and perpendicular components of radiation reflected from an unpolarized light source are equalized with the thermal radiation emitted from a measured object to determine its true temperature |
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CN105890777B (zh) * | 2016-03-31 | 2018-11-06 | 北京理工大学 | 红外可控部分偏振辐射源 |
-
2017
- 2017-12-04 US US16/467,651 patent/US11573128B2/en active Active
- 2017-12-04 WO PCT/JP2017/043454 patent/WO2018105551A1/ja unknown
- 2017-12-04 JP JP2018554988A patent/JP7004420B2/ja active Active
- 2017-12-04 CN CN201780075144.5A patent/CN110036265A/zh active Pending
- 2017-12-04 CN CN202111549318.1A patent/CN114414058A/zh not_active Withdrawn
- 2017-12-04 EP EP17879403.8A patent/EP3553479A4/en not_active Withdrawn
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2021
- 2021-06-16 JP JP2021100380A patent/JP7319325B2/ja active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007256219A (ja) | 2006-03-27 | 2007-10-04 | Nissan Motor Co Ltd | 温度検出装置 |
JP2014044244A (ja) | 2012-08-24 | 2014-03-13 | Asahi Kasei E-Materials Corp | 映像表示装置 |
JP2014134630A (ja) | 2013-01-09 | 2014-07-24 | Asahi Kasei E-Materials Corp | 光学システム |
JP2016038537A (ja) | 2014-08-11 | 2016-03-22 | 旭硝子株式会社 | ワイヤグリッド型偏光子、光源モジュールおよび投射型表示装置 |
JP6019508B1 (ja) | 2016-02-09 | 2016-11-02 | 大学共同利用機関法人 高エネルギー加速器研究機構 | 放射測定器 |
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CN114414058A (zh) | 2022-04-29 |
US20200080897A1 (en) | 2020-03-12 |
WO2018105551A1 (ja) | 2018-06-14 |
JP7319325B2 (ja) | 2023-08-01 |
EP3553479A4 (en) | 2019-12-04 |
JP2021139917A (ja) | 2021-09-16 |
JPWO2018105551A1 (ja) | 2019-06-24 |
US11573128B2 (en) | 2023-02-07 |
EP3553479A1 (en) | 2019-10-16 |
CN110036265A (zh) | 2019-07-19 |
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