JP6974900B2 - Ｘ線回折法システムにおける二次元検出器の空間的向きを決定する方法 - Google Patents

Ｘ線回折法システムにおける二次元検出器の空間的向きを決定する方法 Download PDF

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JP6974900B2
JP6974900B2 JP2017099298A JP2017099298A JP6974900B2 JP 6974900 B2 JP6974900 B2 JP 6974900B2 JP 2017099298 A JP2017099298 A JP 2017099298A JP 2017099298 A JP2017099298 A JP 2017099298A JP 6974900 B2 JP6974900 B2 JP 6974900B2
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detector
orientation
axis
sample
determining
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JP2017211380A5 (enExample
JP2017211380A (ja
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バオピン ホー ボブ
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Bruker AXS Inc
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/0091—Powders
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
    • G01N2223/056—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction
    • G01N2223/0566—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction analysing diffraction pattern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/303—Accessories, mechanical or electrical features calibrating, standardising
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/32—Accessories, mechanical or electrical features adjustments of elements during operation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/50—Detectors
    • G01N2223/501—Detectors array

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  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
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  • Crystallography & Structural Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2017099298A 2016-05-24 2017-05-18 Ｘ線回折法システムにおける二次元検出器の空間的向きを決定する方法 Active JP6974900B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US15/162,889 US10444169B2 (en) 2016-05-24 2016-05-24 Two-dimensional X-ray detector position calibration and correction with diffraction pattern
US15/162,889 2016-05-24

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JP2017211380A JP2017211380A (ja) 2017-11-30
JP2017211380A5 JP2017211380A5 (enExample) 2020-04-30
JP6974900B2 true JP6974900B2 (ja) 2021-12-01

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US (1) US10444169B2 (enExample)
EP (1) EP3249393B1 (enExample)
JP (1) JP6974900B2 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7050273B2 (ja) * 2017-08-22 2022-04-08 国立大学法人金沢大学 回折環計測装置
FR3103897B1 (fr) * 2019-12-02 2022-04-01 Safran Dispositif et procédé de mesure des angles d’orientation d’un système d’imagerie x
JP7300718B2 (ja) * 2019-12-13 2023-06-30 株式会社リガク 制御装置、システム、方法およびプログラム
US11953707B2 (en) * 2020-01-14 2024-04-09 Purdue Research Foundation Smooth surface diffraction grating lens and method for manufacturing the same
CN115954070B (zh) * 2022-12-29 2024-03-29 中国科学院福建物质结构研究所 一种高角度x射线孪生衍射点的衍射强度的校正方法

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20050037086A (ko) * 2003-10-17 2005-04-21 삼성전자주식회사 Ｘ선 회절 분석기 및 이 분석기의 측정 위치 보정방법
US7190762B2 (en) * 2004-10-29 2007-03-13 Broker Axs, Inc Scanning line detector for two-dimensional x-ray diffractometer
JP4581126B2 (ja) * 2005-03-09 2010-11-17 独立行政法人物質・材料研究機構 Ｘ線回折分析方法およびｘ線回折分析装置
DE102009015507B4 (de) * 2009-04-02 2010-12-23 Bundesrepublik Deutschland, vertr.d.d. Bundesministerium für Wirtschaft und Technologie, d.vertr.d.d. Präsidenten der Physikalisch-Technischen Bundesanstalt Verfahren zum Messen eines Rollwinkels und Rollwinkelmessvorrichtung
US8687766B2 (en) * 2010-07-13 2014-04-01 Jordan Valley Semiconductors Ltd. Enhancing accuracy of fast high-resolution X-ray diffractometry
KR101256596B1 (ko) * 2011-01-19 2013-04-19 한국표준과학연구원 실리콘 단결정의 비축을 이용한 ｘ선 회절용 무반사 샘플홀더, 그 샘플홀더의 제조방법, 그 샘플홀더를 포함하는 ｘ선 회절분석시스템 및 회절분석방법

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EP3249393B1 (en) 2021-10-13
US20170343490A1 (en) 2017-11-30
JP2017211380A (ja) 2017-11-30
US10444169B2 (en) 2019-10-15
EP3249393A1 (en) 2017-11-29

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