JP6969734B2 - 電荷検出回路及びそれを含む放射線検出装置 - Google Patents

電荷検出回路及びそれを含む放射線検出装置 Download PDF

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JP6969734B2
JP6969734B2 JP2017037071A JP2017037071A JP6969734B2 JP 6969734 B2 JP6969734 B2 JP 6969734B2 JP 2017037071 A JP2017037071 A JP 2017037071A JP 2017037071 A JP2017037071 A JP 2017037071A JP 6969734 B2 JP6969734 B2 JP 6969734B2
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JP2018141735A (ja
JP2018141735A5 (https=
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徹 青木
克之 都木
昭史 小池
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Anseen Inc
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JP2017037071A 2017-02-28 2017-02-28 電荷検出回路及びそれを含む放射線検出装置 Active JP6969734B2 (ja)

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JP2018141735A5 JP2018141735A5 (https=) 2020-04-09
JP6969734B2 true JP6969734B2 (ja) 2021-11-24

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KR20250175038A (ko) 2024-06-07 2025-12-16 충북대학교 산학협력단 방사선 검출 시스템

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CN119902254B (zh) * 2025-03-06 2025-09-23 清华大学 光子探测单元、成像探测阵列、x射线成像探测模块、探测器和探测系统

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JP3844806B2 (ja) * 1996-04-26 2006-11-15 浜松ホトニクス株式会社 固体撮像素子
JP2002111499A (ja) * 2000-09-26 2002-04-12 Sony Corp デジタル／アナログ変換装置及び数値制御発振装置
JP3945389B2 (ja) * 2002-11-27 2007-07-18 松下電器産業株式会社 時間電圧変換器及び方法
EP1706990A1 (en) * 2004-01-12 2006-10-04 Philips Intellectual Property & Standards GmbH Semiconductor-based image sensor
JP2010054248A (ja) * 2008-08-26 2010-03-11 Sharp Corp 変換回路、及び、照度センサ
US9628105B1 (en) * 2015-10-02 2017-04-18 Senseeker Engineering Inc. Electronic circuit having dynamic resistance element

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20250175038A (ko) 2024-06-07 2025-12-16 충북대학교 산학협력단 방사선 검출 시스템

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