JP6899067B1 - 抵抗検査方法 - Google Patents

抵抗検査方法 Download PDF

Info

Publication number
JP6899067B1
JP6899067B1 JP2020188782A JP2020188782A JP6899067B1 JP 6899067 B1 JP6899067 B1 JP 6899067B1 JP 2020188782 A JP2020188782 A JP 2020188782A JP 2020188782 A JP2020188782 A JP 2020188782A JP 6899067 B1 JP6899067 B1 JP 6899067B1
Authority
JP
Japan
Prior art keywords
inspection
resistance
value
sampling
power supply
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2020188782A
Other languages
English (en)
Japanese (ja)
Other versions
JP2022032913A (ja
Inventor
彭亜林
Original Assignee
杭州王之新創信息技術研究有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 杭州王之新創信息技術研究有限公司 filed Critical 杭州王之新創信息技術研究有限公司
Application granted granted Critical
Publication of JP6899067B1 publication Critical patent/JP6899067B1/ja
Publication of JP2022032913A publication Critical patent/JP2022032913A/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
JP2020188782A 2020-08-11 2020-11-12 抵抗検査方法 Active JP6899067B1 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN202010800981.3 2020-08-11
CN202010800981.3A CN112034254A (zh) 2020-08-11 2020-08-11 一种电阻测试方法

Publications (2)

Publication Number Publication Date
JP6899067B1 true JP6899067B1 (ja) 2021-07-07
JP2022032913A JP2022032913A (ja) 2022-02-25

Family

ID=73578063

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2020188782A Active JP6899067B1 (ja) 2020-08-11 2020-11-12 抵抗検査方法

Country Status (2)

Country Link
JP (1) JP6899067B1 (zh)
CN (1) CN112034254A (zh)

Also Published As

Publication number Publication date
JP2022032913A (ja) 2022-02-25
CN112034254A (zh) 2020-12-04

Similar Documents

Publication Publication Date Title
CN104820200B (zh) 具有自检功能的电池管理系统功能检验平台及自检方法和检验方法
CN111856243B (zh) 一种自动化电流测量精度测试系统及方法
JP6829354B1 (ja) 抵抗検査システム
CN102901905A (zh) 一种并行总线测试装置及方法
CN109490751A (zh) 一种emmc测试方法及测试电路
JP6899067B1 (ja) 抵抗検査方法
CN206369789U (zh) 一种多功能数字芯片测试仪
CN110570897B (zh) 存储器检测系统、存储器检测方法及错误映射表建立方法
CN204556812U (zh) 具有自检功能的电池管理系统功能检验平台
CN113409878A (zh) 闪存错误信息检测方法、替换方法、装置、设备及存储介质
CN110113701A (zh) 一种模拟麦克风的硬件调试方法
CN110261761B (zh) 一种基于fpga电气信号检测的主板自检装置及方法
CN113567834A (zh) 小卡电路通路测试方法、装置、计算机设备及存储介质
CN210109302U (zh) 一种表计通讯模块通道测试工装
TWI822999B (zh) 電子設備及其診斷方法
CN206161746U (zh) 一种贴装元器件检测系统
CN203191481U (zh) 逆变器老化测试系统
CN114994586B (zh) 一种蓄电池巡检仪检验验证装置与方法
CN110334417B (zh) 一种otp单片机量产可测试性集成电路及其设计方法
CN115617583A (zh) 一种板卡io状态自校验方案
CN115932553A (zh) 一种无图纸的电路板检测方法及检测设备
CN112067897A (zh) 一种电阻测试电路
JP2595263B2 (ja) テストパターン自動作成方式
JP2735010B2 (ja) 半導体装置及びその試験方法
CN113448781B (zh) 一种通用输入输出接口的测试方法、装置及设备

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20201113

A871 Explanation of circumstances concerning accelerated examination

Free format text: JAPANESE INTERMEDIATE CODE: A871

Effective date: 20201113

A975 Report on accelerated examination

Free format text: JAPANESE INTERMEDIATE CODE: A971005

Effective date: 20210212

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20210218

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20210218

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20210506

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20210521

R150 Certificate of patent or registration of utility model

Ref document number: 6899067

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150