JP6870406B2 - タンデム四重極型質量分析装置および該装置の制御パラメータ最適化方法 - Google Patents

タンデム四重極型質量分析装置および該装置の制御パラメータ最適化方法 Download PDF

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JP6870406B2
JP6870406B2 JP2017053970A JP2017053970A JP6870406B2 JP 6870406 B2 JP6870406 B2 JP 6870406B2 JP 2017053970 A JP2017053970 A JP 2017053970A JP 2017053970 A JP2017053970 A JP 2017053970A JP 6870406 B2 JP6870406 B2 JP 6870406B2
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measurement
quadrupole mass
value
voltage
mass filter
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JP2018156879A (ja
JP2018156879A5 (cg-RX-API-DMAC7.html
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善樹 田井中
善樹 田井中
博史 菅原
博史 菅原
徹 塩浜
徹 塩浜
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Shimadzu Corp
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JP2017053970A 2017-03-21 2017-03-21 タンデム四重極型質量分析装置および該装置の制御パラメータ最適化方法 Active JP6870406B2 (ja)

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WO2020245964A1 (ja) * 2019-06-06 2020-12-10 株式会社島津製作所 質量分析装置及び質量分析方法
WO2022172155A1 (en) * 2021-02-10 2022-08-18 Dh Technologies Development Pte. Ltd. Method of performing ms/ms of high intensity ion beams using a bandpass filtering collision cell to enhance mass spectrometry robustness

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JP4822346B2 (ja) * 2006-10-31 2011-11-24 アジレント・テクノロジーズ・インク 誘導結合プラズマ質量分析装置のための診断及び較正システム
EP2782116B1 (en) * 2011-11-04 2018-05-30 Shimadzu Corporation Mass spectrometer
JP5780355B2 (ja) * 2012-03-22 2015-09-16 株式会社島津製作所 質量分析装置
JP6176049B2 (ja) * 2013-10-11 2017-08-09 株式会社島津製作所 タンデム四重極型質量分析装置
CA2932664A1 (en) * 2013-12-31 2015-07-09 Dh Technologies Development Pte. Ltd. Method for removing trapped ions from a multipole device

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