JP6853496B2 - 検眼装置及び検眼プログラム - Google Patents

検眼装置及び検眼プログラム Download PDF

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Publication number
JP6853496B2
JP6853496B2 JP2016184727A JP2016184727A JP6853496B2 JP 6853496 B2 JP6853496 B2 JP 6853496B2 JP 2016184727 A JP2016184727 A JP 2016184727A JP 2016184727 A JP2016184727 A JP 2016184727A JP 6853496 B2 JP6853496 B2 JP 6853496B2
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eye
inspected
optical system
measurement
optotype
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JP2018047050A (ja
JP2018047050A5 (https=
Inventor
通浩 滝井
通浩 滝井
河合　規二
規二 河合
妙子 堀野
妙子 堀野
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Nidek Co Ltd
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Nidek Co Ltd
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Priority to JP2016184727A priority Critical patent/JP6853496B2/ja
Priority to US15/710,202 priority patent/US10470658B2/en
Priority to EP17192312.1A priority patent/EP3298953B1/en
Publication of JP2018047050A publication Critical patent/JP2018047050A/ja
Publication of JP2018047050A5 publication Critical patent/JP2018047050A5/ja
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JP2016184727A 2016-09-21 2016-09-21 検眼装置及び検眼プログラム Active JP6853496B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2016184727A JP6853496B2 (ja) 2016-09-21 2016-09-21 検眼装置及び検眼プログラム
US15/710,202 US10470658B2 (en) 2016-09-21 2017-09-20 Optometry apparatus and optometry program
EP17192312.1A EP3298953B1 (en) 2016-09-21 2017-09-21 Optometry apparatus and optometry program

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JP2016184727A JP6853496B2 (ja) 2016-09-21 2016-09-21 検眼装置及び検眼プログラム

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JP2018047050A JP2018047050A (ja) 2018-03-29
JP2018047050A5 JP2018047050A5 (https=) 2019-09-26
JP6853496B2 true JP6853496B2 (ja) 2021-03-31

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Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7271871B2 (ja) * 2018-08-03 2023-05-12 株式会社ニデック 自覚式検眼装置及び自覚式検眼プログラム
JP2020044199A (ja) * 2018-09-20 2020-03-26 株式会社トプコン 眼科装置
JP7331530B2 (ja) * 2019-07-29 2023-08-23 株式会社ニデック 眼科測定装置
JP7263985B2 (ja) * 2019-09-02 2023-04-25 株式会社ニデック 自覚式検眼装置
JP7844996B2 (ja) 2022-03-31 2026-04-14 株式会社ニデック 検眼装置
JP2025034651A (ja) 2023-08-31 2025-03-13 国立大学法人大阪大学 眼科検査装置及び眼科検査方法
JP2025034650A (ja) 2023-08-31 2025-03-13 国立大学法人大阪大学 眼科検査装置及び眼科検査方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06217938A (ja) * 1993-01-25 1994-08-09 Canon Inc 眼屈折計
US5483305A (en) * 1993-01-25 1996-01-09 Canon Kabushiki Kaisha Eye examining apparatus
JP4400009B2 (ja) * 2001-06-29 2010-01-20 パナソニック電工株式会社 瞳孔計測装置
JP2008246143A (ja) * 2007-03-30 2008-10-16 Hamamatsu Photonics Kk 瞳孔測定装置
JP5055166B2 (ja) * 2008-02-29 2012-10-24 キヤノン株式会社 眼の開閉度判定装置、方法及びプログラム、撮像装置

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