JP6853495B2 - 自覚式検眼装置及び自覚式検眼プログラム - Google Patents

自覚式検眼装置及び自覚式検眼プログラム Download PDF

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Publication number
JP6853495B2
JP6853495B2 JP2016173090A JP2016173090A JP6853495B2 JP 6853495 B2 JP6853495 B2 JP 6853495B2 JP 2016173090 A JP2016173090 A JP 2016173090A JP 2016173090 A JP2016173090 A JP 2016173090A JP 6853495 B2 JP6853495 B2 JP 6853495B2
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eye
inspected
subjective
measurement
optical
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Japanese (ja)
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JP2018038481A (ja
JP2018038481A5 (https=
Inventor
通浩 滝井
通浩 滝井
河合　規二
規二 河合
昌明 羽根渕
昌明 羽根渕
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Nidek Co Ltd
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Nidek Co Ltd
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Priority to JP2016173090A priority Critical patent/JP6853495B2/ja
Priority to KR1020170104389A priority patent/KR102397802B1/ko
Priority to US15/694,235 priority patent/US10264967B2/en
Priority to CN201710787259.9A priority patent/CN107788946B/zh
Priority to EP17189377.9A priority patent/EP3298950B1/en
Publication of JP2018038481A publication Critical patent/JP2018038481A/ja
Publication of JP2018038481A5 publication Critical patent/JP2018038481A5/ja
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JP2016173090A 2016-09-05 2016-09-05 自覚式検眼装置及び自覚式検眼プログラム Active JP6853495B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2016173090A JP6853495B2 (ja) 2016-09-05 2016-09-05 自覚式検眼装置及び自覚式検眼プログラム
KR1020170104389A KR102397802B1 (ko) 2016-09-05 2017-08-17 자각식 검안 장치 및 자각식 검안 프로그램
US15/694,235 US10264967B2 (en) 2016-09-05 2017-09-01 Subjective optometry apparatus and subjective optometry program
CN201710787259.9A CN107788946B (zh) 2016-09-05 2017-09-04 主观式验光装置及主观式验光程序
EP17189377.9A EP3298950B1 (en) 2016-09-05 2017-09-05 Subjective optometry apparatus and subjective optometry program

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2016173090A JP6853495B2 (ja) 2016-09-05 2016-09-05 自覚式検眼装置及び自覚式検眼プログラム

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JP2018038481A JP2018038481A (ja) 2018-03-15
JP2018038481A5 JP2018038481A5 (https=) 2019-09-12
JP6853495B2 true JP6853495B2 (ja) 2021-03-31

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Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7379927B2 (ja) * 2019-08-20 2023-11-15 株式会社ニデック 自覚式検眼装置及び自覚式検眼プログラム
JP7459609B2 (ja) * 2020-03-27 2024-04-02 株式会社ニデック 検眼装置及び検眼プログラム
JP7689001B2 (ja) * 2021-03-31 2025-06-05 株式会社トプコン 眼科装置及び被検眼の検査方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06165758A (ja) * 1992-11-28 1994-06-14 Canon Inc 眼科装置
JP3399613B2 (ja) * 1993-12-29 2003-04-21 株式会社トプコン 検眼装置
JPH11113848A (ja) * 1997-10-14 1999-04-27 Nikon Corp 検眼機器
JP2002083156A (ja) * 2000-06-23 2002-03-22 Vision Megane:Kk 無人メガネ情報処理装置およびその方法
CN100349541C (zh) * 2001-11-13 2007-11-21 株式会社拓普康 视力检查装置
JP5643078B2 (ja) * 2010-12-27 2014-12-17 株式会社ニデック 眼屈折力測定装置
EP2949266B1 (en) * 2014-05-29 2019-04-17 Kabushiki Kaisha Topcon Ophthalmologic apparatus

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