JP6823103B2 - Mounting method and mounting device - Google Patents

Mounting method and mounting device Download PDF

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JP6823103B2
JP6823103B2 JP2019080816A JP2019080816A JP6823103B2 JP 6823103 B2 JP6823103 B2 JP 6823103B2 JP 2019080816 A JP2019080816 A JP 2019080816A JP 2019080816 A JP2019080816 A JP 2019080816A JP 6823103 B2 JP6823103 B2 JP 6823103B2
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mounting
chip
chip component
bonding head
bonding
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JP2019114819A (en
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寺田　勝美
勝美 寺田
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Toray Engineering Co Ltd
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Toray Engineering Co Ltd
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    • H—ELECTRICITY
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    • H05K13/04—Mounting of components, e.g. of leadless components
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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
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  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Wire Bonding (AREA)
  • Supply And Installment Of Electrical Components (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Description

本発明は、集積回路などのチップ部品を半導体ウエハまたは回路基板などに実装する実装方法および実装装置に関する。 The present invention relates to a mounting method and a mounting device for mounting a chip component such as an integrated circuit on a semiconductor wafer or a circuit board.

近年、エレクトロニクス製品の軽量化および小型化に伴って回路基板のパターンがファインピッチ化（高精度化・微細化）される傾向にある。ファインピッチ化に伴って回路基板に実装する部品点数も増加する傾向にある。そこで、回路基板への実装時間を短縮するために、１枚の回路基板に複数台のボンディングヘッドを備えた実装装置でチップを実装している。つまり、回路基板上の電極部分に塗布または転写された非導電性樹脂（ＮＣＰ）、非導電性フィルム（ＮＣＦ）または異方導電性フィルム（ＡＣＦ）などの上にチップ部品を実装して仮圧着している。 In recent years, as electronic products have become lighter and smaller, circuit board patterns have tended to have finer pitches (higher precision and miniaturization). As the pitch becomes finer, the number of parts mounted on the circuit board tends to increase. Therefore, in order to shorten the mounting time on the circuit board, the chip is mounted by a mounting device provided with a plurality of bonding heads on one circuit board. That is, the chip component is mounted on a non-conductive resin (NCP), a non-conductive film (NCF), an anisotropic conductive film (ACF), or the like coated or transferred to the electrode portion on the circuit board and temporarily crimped. doing.

当該仮圧着された基板を後工程に搬送し、専用のボンディングヘッドによりチップ部品を加熱して非導電性フィルム（ＮＣＦ）などを加熱硬化させて本圧着している（特許文献１）。 The temporarily crimped substrate is conveyed to a subsequent process, and the chip parts are heated by a dedicated bonding head to heat-cure a non-conductive film (NCF) or the like for main crimping (Patent Document 1).

国際公開公報 ＷＯ２０１０／１１０１６５International Publication WO2010 / 110165

しかしながら、従来の実装装置では、仮圧着工程および本圧着工程ごとに個別のボンディングヘッドを設ける必要があり、装置構成が大型化し、十分な設置スペースを確保しなければならないといった不都合が生じている。 However, in the conventional mounting device, it is necessary to provide individual bonding heads for each of the temporary crimping process and the main crimping process, which causes a disadvantage that the device configuration becomes large and a sufficient installation space must be secured.

また、仮圧着時の接着力が不十分な場合、仮圧着工程から本圧着工程に搬送する過程で、回路基板の電極からチップ部品が剥がれたり位置ズレを起こしたりするといった問題が生じている。 Further, when the adhesive force at the time of temporary crimping is insufficient, there is a problem that the chip component is peeled off from the electrode of the circuit board or the position is displaced in the process of transporting from the temporary crimping process to the main crimping process.

本発明はこのような事情に鑑みてなされたものであって、半導体ウエハや回路基板などにチップ部品を高速かつ精度よく実装することが可能な実装方法および実装装置を提供することを主たる目的としている。 The present invention has been made in view of such circumstances, and an object of the present invention is to provide a mounting method and a mounting device capable of mounting chip components on a semiconductor wafer, a circuit board, or the like at high speed and with high accuracy. There is.

そこで、本発明者は、上記不都合および問題を解決するために、複数台の本圧着用のボンディングヘッドを備えた実装装置を作成して１枚の回路基板にチップ部品を高速に本圧着させる実験およびシミュレーションを行って鋭意検討した結果、次のような新たな知見を得た。 Therefore, in order to solve the above inconveniences and problems, the present inventor has created an experiment in which a mounting device including a plurality of bonding heads for main crimping is created and chip components are main crimped onto one circuit board at high speed. As a result of diligent examination by conducting simulations, the following new findings were obtained.

すなわち、本圧着用のボンディングヘッドを２台設置して交互に回路基板にチップ部品を実装する実験を繰り返した。しかしながら、回路基板の電極部位からチップ部品が剥がれたり、接続不良が生じたりしていた。そこで、当該接続不良などの原因を究明すべく、回路基板への実装直前のチップ部品の裏面を観察すると、電極表面を被覆しているフラックスが消滅していた。また、チップ部品によっては、フラックスの消滅だけではなく、バンプ先端部の半田が溶融または変形しているものが含まれていた。 That is, the experiment in which two bonding heads for main crimping were installed and chip components were alternately mounted on the circuit board was repeated. However, chip parts were peeled off from the electrode parts of the circuit board, and poor connection occurred. Therefore, when observing the back surface of the chip component immediately before mounting on the circuit board in order to investigate the cause of the poor connection, the flux covering the electrode surface disappeared. Further, depending on the chip component, not only the flux disappears but also the solder at the tip of the bump is melted or deformed.

さらに、チップ部品の温度が高いままであると、チップ部品と回路基板との間に介在させるＮＣＦなどの樹脂の硬化が過剰に促進される。すなわち、チップ部品のバンプと回路基板の電極のみを互いに接触させつつも、その間を封止するために余剰な樹脂を排出する必要があるにも関わらず、排出前に樹脂が硬化してしまい接触不良が生じさせていた。 Further, if the temperature of the chip component remains high, the curing of the resin such as NCF interposed between the chip component and the circuit board is excessively promoted. That is, while only the bumps of the chip parts and the electrodes of the circuit board are brought into contact with each other, the resin is cured before being discharged even though it is necessary to discharge the excess resin in order to seal between them. It was causing defects.

したがって、本発明は、上述の問題およびこれらの新規な問題を解決することを目的とする。 Therefore, it is an object of the present invention to solve the above-mentioned problems and these novel problems.

この発明は、このような目的を達成するために、次のような構成をとる。 In order to achieve such an object, the present invention has the following configuration.

すなわち複数個の回路パターンが形成された基板に、前記基板の上部に配置された複数のボンディングヘッドによりチップ部品を実装する実装方法であって、
個々のボンディングヘッドが前記基板にチップ部品を実装する過程で、
前記基板を移動して、チップ部品を保持したボンディングヘッドの直下に前記基板の所定位置を配し、所定時間をかけて当該チップ部品を加熱しながら本圧着する実装過程と、
前記本圧着後に前記ボンディングヘッドを上昇させるとともに所定温度まで冷却する冷却過程を備え、
一つのボンディングヘッドが実装過程の間に、他のボンディングヘッドが冷却過程となることを繰り返し行うもので、
冷却過程のボンディングヘッドの下部に、次に実装するチップ部品を供給することを特徴とする。 That is, it is a mounting method in which chip components are mounted on a substrate on which a plurality of circuit patterns are formed by a plurality of bonding heads arranged on the upper part of the substrate .
In the process of mounting chip components on the board, each bonding head
And moving the substrate, and distribution of the predetermined position of the substrate directly below the bonding head holding the chip component, the mounting process of the bonding while heating the chip components over a predetermined time period,
A cooling process is provided in which the bonding head is raised and cooled to a predetermined temperature after the main crimping .
During one of the bonding head is mounted process, in which the other bonding head is repeated to be a cooling process,
The bottom of the bonding head of the cooling process, then characterized by subjected feeding the chip components to be mounted.

（作用・効果） この方法によれば、先行するボンディングヘッドが、基板にチップ部品を実装および本圧着している間、他のボンディングヘッドが、所定の温度まで積極的に冷却される。したがって、次に実装および本圧着を実行するボンディングヘッドによってチップ部品を保持して実装するまでの間に、当該チップ部品のバンプ先端部の半田が、本圧着時の加熱温度に近い温度で加熱されることがない。すなわち、チップ部品のバンプ先端の半田の溶融、変形、およびフラックスの消滅などを回避することができ、ひいては、基板への接続不良を解消することができる。 (Action / Effect) According to this method, the other bonding heads are positively cooled to a predetermined temperature while the preceding bonding head mounts the chip component on the substrate and the main crimping is performed. Therefore, the solder at the bump tip of the chip component is heated at a temperature close to the heating temperature at the time of the main crimping until the chip component is held and mounted by the bonding head that performs the next mounting and the main crimping. There is no such thing. That is, it is possible to avoid melting and deformation of the solder at the tip of the bump of the chip component, disappearance of the flux, and the like, and it is possible to eliminate the connection failure to the substrate.

なお、上記方法において、実装過程の間、認識機構を移動させながら、次にチップ部品の実装を行う実装部位の基板に設けられたアライメントマークを認識させてアライメント座標を求めることが好ましい。 In the above method, it is preferable to obtain the alignment coordinates by recognizing the alignment mark provided on the substrate of the mounting portion where the chip component is mounted next while moving the recognition mechanism during the mounting process.

この方法によれば、先行するボンディングヘッドが基板へのチップ部品の本圧着を完了すると、次に実装処理を行うボンディングヘッドと基板の実装部位とのアライメントを短時間で実施することができる。したがって、実装処理のタクトタイムを短縮することができる。 According to this method, when the preceding bonding head completes the main crimping of the chip component to the substrate, the alignment between the bonding head to be mounted next and the mounting portion of the substrate can be performed in a short time. Therefore, the takt time of the implementation process can be shortened.

また、この方法で、冷却過程のボンディングヘッドにおいて、チップ部品の吸着を行うアタッチメントツールの、チップ部品吸着前の表面を観察することが望ましい。更に、前記表面の観察を、チップ部品のアライメントマークを認識する認識機構が行っても良い。 Further, it is desirable to observe the surface of the attachment tool that adsorbs the chip component in the bonding head in the cooling process before adsorbing the chip component by this method. Further, the surface may be observed by a recognition mechanism that recognizes the alignment mark of the chip component.

この方法によれば、アタッチメントツールへの樹脂付着などを起因とする、実装時のチップ部品の破損や位置ズレを防ぐことができる。 According to this method, it is possible to prevent damage and misalignment of the chip parts during mounting due to resin adhesion to the attachment tool and the like.

チップ部品のアライメントマークを認識する認識機構を用いた場合においては、前記アタッチメントツールと、前記アタッチメントツールに吸着されたチップ部品の位置ズレ量を測定しても良い。 When a recognition mechanism that recognizes the alignment mark of the chip component is used, the amount of misalignment between the attachment tool and the chip component adsorbed on the attachment tool may be measured.

更に、前記位置ズレ量に応じて、前記アタッチメントツールへのチップ部品の吸着位置を補正しても良い。 Further, the suction position of the chip component to the attachment tool may be corrected according to the amount of the positional deviation.

この方法により、実装時にアタッチメントツールに樹脂が付着することを防ぐことが出来る。 By this method, it is possible to prevent the resin from adhering to the attachment tool at the time of mounting.

また、実装過程では、基板を保持する保持ステージを移動させて実装位置のアライメントを行うことが好ましい。 Further, in the mounting process, it is preferable to move the holding stage that holds the substrate to align the mounting position.

この方法によれば、保持ステージを移動させてボンディングヘッドを固定させることができる。つまり、ボンディングヘッドの移動時に発生しているチップ部品の保持位置のズレを回避することができる。換言すれば、保持位置のズレに伴う実装位置のズレを回避することができる。 According to this method, the holding stage can be moved to fix the bonding head. That is, it is possible to avoid the deviation of the holding position of the chip component that occurs when the bonding head is moved. In other words, it is possible to avoid the deviation of the mounting position due to the deviation of the holding position.

なお、上記方法において、１台の保持ステージに複数枚の前記基板を所定間隔をおいて整列配置し、
前記実装過程では、少なくとも２台のボンディングヘッドの組を、互いに異なる基板の同一部位にチップ部品を実装して本圧着し、
冷却過程では、他のボンディングヘッドを冷却することが好ましい。 In the above method, a plurality of the substrates are arranged and arranged at predetermined intervals on one holding stage.
In the mounting process, at least two sets of bonding heads are main-bonded by mounting chip components on the same parts of different substrates.
In the cooling process, it is preferable to cool the other bonding head.

この方法によれば、少なくとも２台のボンディングヘッドの組によって同時に複数枚の基板にチップ部品が実装されるので、実装処理のタクトタイムをさらに短縮することができる。 According to this method, chip components are mounted on a plurality of substrates at the same time by a pair of at least two bonding heads, so that the tact time of the mounting process can be further shortened.

また、この発明は、このような目的を達成するために、次のような構成をとる。 Further, the present invention has the following configuration in order to achieve such an object.

すなわち、複数個の回路パターンが形成された基板にチップ部品を実装する実装装置であって、
チップ部品をピックアップするピックアップ機構と、前記ピックアップ機構から受け渡されたチップ部品を搬送するチップスライダを有するチップ部品供給部と、
前記基板を保持する保持ステージと、前記保持ステージを移動させる駆動機構と、前記保持ステージの上部に配置され、前記保持ステージ上の基板の所定位置にチップ部品を実装および本圧着する複数のボンディングヘッドと、前記ボンディングヘッドを加熱するヒータと、前記ボンディングヘッドを冷却する冷却機構とを有したチップ部品実装部と、
前記チップ部品供給部と前記チップ部品実装部の動作を制御する制御部とを備え、
前記チップスライダは前記ピックアップ機構と複数のボンディングヘッドとの間を往復移動する機能を有し、
前記チップスライダが冷却中のボンディングヘッドの下部にチップ部品を供給する機能を有する。
That is, it is a mounting device that mounts chip components on a board on which a plurality of circuit patterns are formed.
A pickup mechanism that picks up chip components, a chip component supply unit that has a chip slider that conveys chip components delivered from the pickup mechanism, and a chip component supply unit.
A holding stage configured to hold the substrate, a driving mechanism for moving said holding stage being located above the holding stage, multiple bonding to implement and the bonding chip components in a predetermined position of the substrate on the holding stage A chip component mounting portion having a head, a heater for heating the bonding head, and a cooling mechanism for cooling the bonding head .
A control unit that controls the operation of the chip component supply unit and the chip component mounting unit is provided.
It said chip slider has a function of reciprocally moving between said pick-up mechanism and a plurality of the bonding head,
It has a function of supplying chip parts in the lower portion of the tip slider Bonn loading head during cooling.

（作用・効果） この構成によれば、先行するボンディングヘッドが基板にチップ部品を実装および本圧着している間に、他のボンディングヘッドおよびヒータを冷却することができる。したがって、上記方法を好適に実施することができる。 (Action / Effect) According to this configuration, other bonding heads and heaters can be cooled while the preceding bonding head mounts the chip component on the substrate and main crimps. Therefore, the above method can be preferably carried out.

なお、上記構成において、ボンディングヘッドに保持されているチップ部品のアライメントマークと基板に設けられたアライメントマークを認識する認識機構を備え
前記制御部は、先行するボンディングヘッドが基板にチップ部品を実装および本圧着している間、認識機構を走査させて次にチップ部品の実装を行う基板の実装予定部位に設けられたアライメントマークを認識させてアライメント座標を求めることが好ましい。 In the above configuration, the control unit includes a recognition mechanism for recognizing the alignment mark of the chip component held on the bonding head and the alignment mark provided on the substrate. In the control unit, the preceding bonding head mounts the chip component on the substrate. During the main crimping, it is preferable to scan the recognition mechanism to recognize the alignment mark provided at the planned mounting portion of the substrate on which the chip component is mounted, and obtain the alignment coordinates.

この構成によれば、先行するボンディングヘッドが基板へのチップ部品の本圧着を完了すると、次に実装処理を行うボンディングヘッドと基板の実装部位とのアライメントを短時間で実施することができる。したがって、実装処理のタクトタイムを短縮することができる。 According to this configuration, when the preceding bonding head completes the main crimping of the chip component to the substrate, the alignment between the bonding head to be mounted next and the mounting portion of the substrate can be performed in a short time. Therefore, the takt time of the implementation process can be shortened.

また、前記ボンディングヘッドがチップ部品を吸着するアタッチメントツールを備え、観察機構を備え、前記制御部が、前記観察機構を用いて、チップ部品を吸着していない状態の前記アタッチメントツールの表面を観察する機能を備えることが望ましい。その際、チップ部品のアライメントマークを認識する認識機構が、前記表面を観察しても良い。 Further, the bonding head is provided with an attachment tool for adsorbing chip parts, and an observation mechanism is provided, and the control unit observes the surface of the attachment tool in a state where the chip parts are not adsorbed by using the observation mechanism. It is desirable to have a function. At that time, the recognition mechanism that recognizes the alignment mark of the chip component may observe the surface.

この構成によれば、アタッチメントツールへの樹脂付着などを起因とする、実装時のチップ部品の破損や位置ズレを防ぐことができる。 According to this configuration, it is possible to prevent damage and misalignment of chip parts during mounting due to resin adhesion to the attachment tool and the like.

更に、前記制御部が、チップ部品のアライメントマークを認識する認識機構を用いて、前記アタッチメントツールと、前記アタッチメントツールに吸着されたチップ部品の位置ズレ量を測定する機能を備えることも望ましい。 Further, it is also desirable that the control unit has a function of measuring the amount of misalignment between the attachment tool and the chip component adsorbed on the attachment tool by using a recognition mechanism that recognizes the alignment mark of the chip component.

ここで、チップ部品を搬送し、前記アタッチメントツールに受け渡す、チップ部品受け渡し機構を備え、前記制御部が、前記位置ズレ量に応じて、チップ部品受け渡し機構において、チップ部品の位置補正を行う機能を備えることが更に望ましい。 Here, a function comprising a chip component delivery mechanism for transporting the chip component and delivering it to the attachment tool, and the control unit correcting the position of the chip component in the chip component delivery mechanism according to the amount of the positional deviation. It is more desirable to provide.

この構成によれば、実装時にアタッチメントツールに樹脂が付着することを防ぐことが出来る。 According to this configuration, it is possible to prevent the resin from adhering to the attachment tool at the time of mounting.

本発明の実装方法および実装装置によれば、回路基板にチップ部品を高速かつ精度よく実装および本圧着させることができる。 According to the mounting method and mounting device of the present invention, chip components can be mounted and crimped on a circuit board at high speed and with high accuracy.

本実施例に係る実装装置の概略構成を示す斜視図である。It is a perspective view which shows the schematic structure of the mounting apparatus which concerns on this Example. チップスライダの斜視図である。It is a perspective view of a tip slider. ボンディングヘッドの部分破断断図である。It is a partial fracture fracture drawing of a bonding head. 実施例装置の一連の動作を示すフローチャートである。It is a flowchart which shows a series of operations of an Example apparatus. ボンディングヘッドによる単一処理時間内の温度プロファイルを示す図である。It is a figure which shows the temperature profile in a single processing time by a bonding head. 実施例装置によって回路基板にチップ部品を実装する動作を説明する図である。It is a figure explaining the operation of mounting a chip component on a circuit board by an Example apparatus. 実施例装置によって回路基板にチップ部品を実装する動作を説明する図である。It is a figure explaining the operation of mounting a chip component on a circuit board by an Example apparatus. 実施例装置によって回路基板にチップ部品を実装する動作を説明する図である。It is a figure explaining the operation of mounting a chip component on a circuit board by an Example apparatus. 実施例装置によって回路基板にチップ部品を実装する動作を説明する図である。It is a figure explaining the operation of mounting a chip component on a circuit board by an Example apparatus. 実施例装置によって回路基板にチップ部品を実装する動作を説明する図である。It is a figure explaining the operation of mounting a chip component on a circuit board by an Example apparatus. 実施例装置によって回路基板にチップ部品を実装する動作を説明する図である。It is a figure explaining the operation of mounting a chip component on a circuit board by an Example apparatus. 実施例装置によって回路基板にチップ部品を実装する動作を説明する図である。It is a figure explaining the operation of mounting a chip component on a circuit board by an Example apparatus. 実施例装置によって回路基板にチップ部品を実装する動作を説明する図である。It is a figure explaining the operation of mounting a chip component on a circuit board by an Example apparatus. 実施例装置によって回路基板にチップ部品を実装する動作を説明する図である。It is a figure explaining the operation of mounting a chip component on a circuit board by an Example apparatus. 実施例装置によって回路基板にチップ部品を実装する動作を説明する図である。It is a figure explaining the operation of mounting a chip component on a circuit board by an Example apparatus. 実施例装置によって回路基板にチップ部品を実装する動作を説明する図である。It is a figure explaining the operation of mounting a chip component on a circuit board by an Example apparatus. 変形例の実装形態を示す図である。It is a figure which shows the mounting form of the modification. 変形例の実装形態を示す図である。It is a figure which shows the mounting form of the modification.

以下、図面を参照して本発明の一実施例を説明する。 Hereinafter, an embodiment of the present invention will be described with reference to the drawings.

図１は、本発明の実施例に係る実装装置の概略構成を示す斜視図である。 FIG. 1 is a perspective view showing a schematic configuration of a mounting device according to an embodiment of the present invention.

実装装置は、図１および図３に示すように、チップ部品供給部１、チップ部品実装部２および制御部３などから構成されている。 As shown in FIGS. 1 and 3, the mounting device includes a chip component supply unit 1, a chip component mounting unit 2, a control unit 3, and the like.

チップ部品供給部１は、マガジン載置ステージ４、ウエハ搬送機構５、ピックアップステージ６、ピックアップ機構７およびチップスライダ８などから構成されている。 The chip component supply unit 1 is composed of a magazine mounting stage 4, a wafer transfer mechanism 5, a pickup stage 6, a pickup mechanism 7, a chip slider 8, and the like.

マガジン載置ステージ４は、ダイシング処理された半導体ウエハＷＤ（以下、単に「ウエハ」という）を所定間隔をおいて多段に収納したマガジン９を載置される。ウエハＷＤエキスパンド処理によって個片に分断されてチップ部品Ｃとなる。チップ部品Ｃは、ダイシングテープによって接着保持されている。 The magazine mounting stage 4 mounts a magazine 9 in which dicing-processed semiconductor wafers WD (hereinafter, simply referred to as “wafers”) are stored in multiple stages at predetermined intervals. The wafer is divided into individual pieces by the WD expanding process to form chip parts C. The chip component C is adhesively held by a dicing tape.

ウエハ搬送機構５は、マガジン９からウエハＷＤを搬出してピックアップステージ６に載置する。すなわち、レール１０にスライド移動可能な可動台１１から片持ち支持されたアーム１２の先端にクランプ１３を備えている。当該可動台は１１、サーボモータで正逆駆動されるネジ軸によってネジ送り駆動されるように構成されている。 The wafer transfer mechanism 5 carries out the wafer WD from the magazine 9 and places it on the pickup stage 6. That is, the clamp 13 is provided at the tip of the arm 12 that is cantilevered and supported from the movable base 11 that can be slidably moved to the rail 10. The movable base is configured to be screw-fed driven by a screw shaft that is driven forward and reverse by a servomotor.

ピックアップステージ６は、ダイシングテープに接着保持されたウエハＷＤを吸着保持する。 The pickup stage 6 attracts and holds the wafer WD adhered and held on the dicing tape.

ピックアップ機構７は、前後左右（図中のＸＹ軸方向）に移動可能であるとともに、昇降可能（Ｚ軸方向）な下向きのピックアップノズル１４を備えている。つまり、ピックアップ機構７は、ピックアップノズル１４によって吸着保持したチップ部品Ｃをチップスライダ８に受け渡すように構成されている。 The pickup mechanism 7 includes a downward pickup nozzle 14 that can move forward / backward / left / right (in the XY-axis direction in the drawing) and can move up / down (Z-axis direction). That is, the pickup mechanism 7 is configured to deliver the chip component C attracted and held by the pickup nozzle 14 to the chip slider 8.

チップスライダ８は、後述するボンディングヘッド２１ａ、２１ｂの個数に対応させた台数を備えている。したがって、本実施例では、２台のチップスライダ８ａ、８ｂを上下２段に備えている。各チップスライダ８ａ、８ｂは、図２に示すように、チップ部品Ｃを吸着保持した吸着板１６によって、ピックアップ機構７側の受け取り位置からボンディングヘッド２１ａ、２１ｂの下方の受け渡し位置までをそれぞれが往復移動する。すなわち、吸着板１６を備え、かつ、レール１７にスライド移動可能に支持された可動台１８が、サーボモータ１９で正逆駆動されるネジ軸２０によってネジ送り駆動されるように構成されている。チップスライダ８は、タクトタイムに余裕があれば、１台のチップスライダでそれぞれのボンディングヘッド２１ａ、２１ｂにチップ部品Ｃを受け渡してもよい。 The chip slider 8 includes a number corresponding to the number of bonding heads 21a and 21b described later. Therefore, in this embodiment, two tip sliders 8a and 8b are provided in two upper and lower stages. As shown in FIG. 2, each of the chip sliders 8a and 8b reciprocates from the receiving position on the pickup mechanism 7 side to the lower transfer position of the bonding heads 21a and 21b by the suction plate 16 that sucks and holds the chip component C. Moving. That is, the movable base 18 provided with the suction plate 16 and supported by the rail 17 in a slidable manner is configured to be screw-fed driven by the screw shaft 20 driven forward and reverse by the servomotor 19. The chip slider 8 may deliver the chip component C to the bonding heads 21a and 21b, respectively, with one chip slider if the tact time is sufficient.

チップ部品実装部２は、ボンディングヘッド２１ａ、２１ｂ、２視野カメラ２２および保持ステージ２３などから構成されている。 The chip component mounting unit 2 includes bonding heads 21a and 21b, a two-field camera 22, a holding stage 23, and the like.

ボンディングヘッド２１ａ、２１ｂは、保持ステージ２３を跨いで基台２４に立設された門型フレーム２５の梁部分にシリンダやボールネジなどの昇降機構２６を介して装着されている。また、ボンディングヘッド２１ａ、２１ｂは、縦Ｚ軸周り回転可能に構成されている。つまり、ボンディングヘッド２１ａ、２１ｂは、図中のθ方向の位置合わせが可能になっている。 The bonding heads 21a and 21b are attached to the beam portion of the portal frame 25 erected on the base 24 across the holding stage 23 via an elevating mechanism 26 such as a cylinder or a ball screw. Further, the bonding heads 21a and 21b are configured to be rotatable around the vertical Z axis. That is, the bonding heads 21a and 21b can be aligned in the θ direction in the drawing.

さらに、ボンディングヘッド２１ａ、２１ｂは、図３に示すように、金属製のツールからなる本体３０の下部から順にセラミック製のホルダ３１、断熱ブロック３３、セラミックヒータ３４およびアタッチメントツール３５で構成されている。なお、アタッチメントツール３５は、セラミックヒータ３４に吸着固定されており、チップ部品Ｃの形状に応じた専用のツールを自動交換可能になっている。 Further, as shown in FIG. 3, the bonding heads 21a and 21b are composed of a ceramic holder 31, a heat insulating block 33, a ceramic heater 34, and an attachment tool 35 in this order from the lower part of the main body 30 made of a metal tool. .. The attachment tool 35 is suction-fixed to the ceramic heater 34, and a dedicated tool according to the shape of the chip component C can be automatically replaced.

セラミックヒータ３４には、例えば、熱電対、測温抵抗体などの温度検出器３６が設けられている。つまり、セラミックヒータ３４から受ける熱を温度検出器３６で検出し、その検出結果を制御部３に送信する。 The ceramic heater 34 is provided with a temperature detector 36 such as a thermocouple or a resistance temperature detector, for example. That is, the heat received from the ceramic heater 34 is detected by the temperature detector 36, and the detection result is transmitted to the control unit 3.

セラミックヒータ３４の発熱部分の上端面にエアーが流通して排出される流路３７が、本体３０まで貫通している。また、流路３７には、バルブＶを備えた耐圧ホース３８を介してエアー供給源３９に連通接続されている。 A flow path 37 through which air flows and is discharged to the upper end surface of the heat generating portion of the ceramic heater 34 penetrates to the main body 30. Further, the flow path 37 is communicated with the air supply source 39 via a pressure resistant hose 38 provided with a valve V.

つまり、エアー供給手段３９から供給されたエアーは、流路３７を通じて開口部３７ａから排出される。したがって、セラミックヒータ３４の発熱部から発せられる熱がエアー循環により奪われ、セラミックヒータ３４およびアタッチメントツール３５の両方を含むボンディングヘッド２１ａ、２１ｂを急速に冷却することができる。また、外部に設けたノズルからセラミックヒータ３４およびアタッチメントツール３５の両方にエアーを吹き付けて冷却すれば、冷却時間をさらに短縮することができる。 That is, the air supplied from the air supply means 39 is discharged from the opening 37a through the flow path 37. Therefore, the heat generated from the heat generating portion of the ceramic heater 34 is taken away by the air circulation, and the bonding heads 21a and 21b including both the ceramic heater 34 and the attachment tool 35 can be rapidly cooled. Further, if air is blown from an external nozzle to both the ceramic heater 34 and the attachment tool 35 to cool the ceramic heater 34, the cooling time can be further shortened.

なお、ボンディングヘッド２１ａ、２１ｂは、本体３０からアタッチメントツール３５にかけて貫通孔４０が形成されており、当該貫通孔４０と外部の真空源４１とが電磁弁Ｖを介して連通接続されている。 The bonding heads 21a and 21b have a through hole 40 formed from the main body 30 to the attachment tool 35, and the through hole 40 and the external vacuum source 41 are communicated with each other via a solenoid valve V.

２視野カメラ２２は、チップ部品Ｃを実装する基板の回路パターンに付されたアライメントマークとチップ部品Ｃに付されたアライメントマークを画像認識し、画像データを制御部３に送信する。すなわち、２視野カメラ２２は、保持ステージ２３とチップ部品Ｃの間で水平移動するように構成されている。なお、本実施例においては、チップ部品Ｃを実装する基板としてウエハＷを用いているが、基板はウエハに限定されるものではなく、耐熱性樹脂等を基材とするフレキシブルプリント基板や、セラミックスやガラス等を基材とするリジッドプリント基板であっても良い。 The two-field camera 22 image-recognizes the alignment mark attached to the circuit pattern of the substrate on which the chip component C is mounted and the alignment mark attached to the chip component C, and transmits the image data to the control unit 3. That is, the two-field camera 22 is configured to move horizontally between the holding stage 23 and the chip component C. In this embodiment, the wafer W is used as the substrate on which the chip component C is mounted, but the substrate is not limited to the wafer, and a flexible printed circuit board using a heat-resistant resin or the like as a base material or ceramics. It may be a rigid printed circuit board whose base material is glass or the like.

保持ステージ２３は、基台に２４に設置され、前後左右（図中のＸＹ方向）に水平移動するように構成されている。 The holding stage 23 is installed on the base 24 and is configured to move horizontally in the front-rear, left-right (XY directions in the drawing).

制御部３は、使用する樹脂、例えば、非導電性樹脂（ＮＣＰ）、非導電性フィルム（ＮＣＦ）または異方導電性フィルム（ＡＣＦ）ごと応じた設定条件が入力される。例えば、加熱時間、セラミックヒータ３４の冷却温度などが入力されている。これら入力条件と温度検出器３６から検出される検出結果とに基づいて、セラミックヒータ３４に通電する電流を調整、温度制御およびエアー供給源３９からのエアーの供給のオン・オフ切り替え、流量などの制御を行なっている。例えば、温度検出器３６実測値と設定値を比較し、求まる温度偏差に応じて温度を制御する。また、装置全体を統括的に制御している。具体的な制御については、以下の動作説明において詳述する。 The control unit 3 is input with setting conditions according to the resin to be used, for example, a non-conductive resin (NCP), a non-conductive film (NCF), or an anisotropic conductive film (ACF). For example, the heating time, the cooling temperature of the ceramic heater 34, and the like are input. Based on these input conditions and the detection result detected from the temperature detector 36, the current energizing the ceramic heater 34 is adjusted, the temperature control and the air supply from the air supply source 39 are switched on / off, the flow rate, etc. It is in control. For example, the measured value of the temperature detector 36 is compared with the set value, and the temperature is controlled according to the obtained temperature deviation. In addition, the entire device is controlled in an integrated manner. Specific control will be described in detail in the following operation description.

次に、図４のフローチャートに沿って上述の実装装置を用いて複数個の回路パターンの形成されたチップ部品を実装および本圧着する一連の動作について説明する。 Next, a series of operations of mounting and main crimping a chip component on which a plurality of circuit patterns are formed will be described using the above-mentioned mounting device according to the flowchart of FIG.

先ず、実験やシミュレーションによって、１回目の実装処理を行って加熱状態にあるボンディングヘッド２１ａ、２１ｂが、次のチップ部品Ｃを吸着してから実装部位に下降するまでの間で、チップ部品Ｃの下端の半田が溶融または変化しない温度およびフラックスが消滅しない温度（冷却温度）を予め求める。また、チップ部品ＣをウエハＷに実装および本圧着するために昇温した温度から冷却温度までにセラミックヒータ３４およびアタッチメントツール３５の温度が低下するまでの時間を求める。すなわち、図５に示すように、チップ部品Ｃの実装時間、冷却時間を含む１台のボンディングヘッド２１ａ、２１ｂの単一処理時間と温度プロファイルのデータを取得し、そのデータを元に制御部３の記憶部に記憶する（ステップＳ１）。例えば、２２０℃まで樹脂を加熱し、樹脂のチップ部品Ｃの接着が安定し始めるガラス転移点の１２０℃まで低下した時点でボンディングヘッド２１ａ、２１ｂを上昇させて冷却を開始する。 First, by experiments and simulations, the bonding heads 21a and 21b, which are in a heated state after the first mounting process, adsorb the next chip component C and descend to the mounting site. The temperature at which the solder at the lower end does not melt or change and the temperature at which the flux does not disappear (cooling temperature) are determined in advance. Further, the time until the temperature of the ceramic heater 34 and the attachment tool 35 drops from the temperature raised to the cooling temperature for mounting and main crimping the chip component C on the wafer W is obtained. That is, as shown in FIG. 5, the single processing time and temperature profile data of one bonding head 21a and 21b including the mounting time and cooling time of the chip component C are acquired, and the control unit 3 is based on the data. It is stored in the storage unit of (step S1). For example, the resin is heated to 220 ° C., and when the temperature drops to 120 ° C., which is the glass transition point at which the adhesion of the resin chip component C begins to stabilize, the bonding heads 21a and 21b are raised to start cooling.

条件設定が完了し、装置を作動すると、制御部３は、ウエハ搬送機構５によってマガジン９からウエハＷＤを搬出させてピックアップステージ６に載置させる。その後、制御部３は、条件設定された単一処理時間に基づいて、ボンディングヘッド２１ａ、２１ｂの作動を切り替えながら、実装処理を開始する（ステップＳ２）。 When the condition setting is completed and the device is operated, the control unit 3 carries out the wafer WD from the magazine 9 by the wafer transfer mechanism 5 and places it on the pickup stage 6. After that, the control unit 3 starts the mounting process while switching the operation of the bonding heads 21a and 21b based on the single processing time for which the conditions are set (step S2).

ピックアップ機構７が、吸着したチップ部品Ｃをチップスライダ８ａ、８ｂの順番に受け渡す。以後、ボンディングヘッド２１ａ、２１ｂの並列処理が実行される（ステップＳ２）。 The pickup mechanism 7 delivers the attracted chip component C in the order of the chip sliders 8a and 8b. After that, parallel processing of the bonding heads 21a and 21b is executed (step S2).

先ず、ボンディングヘッド２１ａによる実装処理が実行される。 First, the mounting process by the bonding head 21a is executed.

チップスライダ８ａが、先行してボンディングヘッド２１ａの下方の受け渡し位置に移動する。ボンディングヘッド２１ａは、図６に示すように、下降してチップ部品Ｃを吸着する（ステップＳ３ａ）。同時に、２視野カメラ２２が、ボンディングヘッド２１ａに保持されたチップ部品ＣとウエハＷとの間に移動してくる。その後、チップスライダ８ａは、次のチップ部品Ｃを受け取るために、ピックアップ機構７側へ移動する。 The tip slider 8a moves in advance to the delivery position below the bonding head 21a. As shown in FIG. 6, the bonding head 21a descends to attract the chip component C (step S3a). At the same time, the two-field camera 22 moves between the chip component C held by the bonding head 21a and the wafer W. After that, the chip slider 8a moves to the pickup mechanism 7 side in order to receive the next chip component C.

図７に示すように、２視野カメラ２２によってウエハＷの回路パターンに付されたアライメントマークとチップ部品Ｃに付されたアライメントマークを画像認識し、画像データを制御部３に送信する。 As shown in FIG. 7, the two-field camera 22 image-recognizes the alignment mark attached to the circuit pattern of the wafer W and the alignment mark attached to the chip component C, and transmits the image data to the control unit 3.

制御部３は、当該画像データを利用しアライメント処理を行うために駆動機構を作動制御する（ステップＳ４ａ）。すなわち、制御部３は、両アライメンマークの位置座標を求める。さらに，回路パターンのアライメントマークの位置座標からチップ部品Ｃのアライメントマークの位置座標までの方向および距離を算出し、保持ステージ２３のみを移動させてアライメントする。他方のボンディングヘッド２１ａは、縦軸周りに回転してアライメントされる。 The control unit 3 operates and controls the drive mechanism in order to perform the alignment process using the image data (step S4a). That is, the control unit 3 obtains the position coordinates of both alignment marks. Further, the direction and distance from the position coordinates of the alignment mark of the circuit pattern to the position coordinates of the alignment mark of the chip component C are calculated, and only the holding stage 23 is moved for alignment. The other bonding head 21a is rotated around the vertical axis and aligned.

アライメント処理が完了すると、図８に示すように、ボンディングヘッド２１ａを所定高さまで下降させて回路パターン上の樹脂にチップ部品Ｃを実装する（ステップＳ５ａ）。このとき、他方のボンディングヘッド２１ｂの下方に２視野カメラ２２が移動してくる。この段階において、ボンディングヘッド２１ｂのアタッチメントツール３５のチップ吸着面の表面に汚れがあると、チップ部品Ｃを吸着した際に、チップ部品Ｃに無用な応力が加わることになり、実装時の破損や位置ズレが起こる懸念がある。そこで、画像認識手段を用いて、アタッチメントツール３５の表面状態を観察して、樹脂等の付着やキズの有無を判断する機能を制御手段３に付加してもよく、画像認識手段として２視野カメラ２２を用いても良い。その際、付着物やキズが許容範囲以内と判断したら次のステップに移行する。 When the alignment process is completed, as shown in FIG. 8, the bonding head 21a is lowered to a predetermined height to mount the chip component C on the resin on the circuit pattern (step S5a). At this time, the two-field camera 22 moves below the other bonding head 21b. At this stage, if the surface of the chip suction surface of the attachment tool 35 of the bonding head 21b is dirty, unnecessary stress will be applied to the chip component C when the chip component C is sucked, resulting in damage during mounting. There is a concern that the position may shift. Therefore, a function of observing the surface state of the attachment tool 35 and determining the presence or absence of adhesion of resin or the like or scratches may be added to the control means 3 by using an image recognition means, and a two-field camera as an image recognition means. 22 may be used. At that time, if it is judged that the deposits and scratches are within the allowable range, the process proceeds to the next step.

図９に示すように、ボンディングヘッド２１ａのセラミックヒータ３４によってアタッチメントツール３５を加熱し、チップ部品Ｃを所定温度で所定時間をかけて加熱する。つまり、チップ部品Ｃを介して樹脂を加熱硬化させてチップ部品ＣをウエハＷの回路パターンに本圧着する（ステップＳ６ａ）。 As shown in FIG. 9, the attachment tool 35 is heated by the ceramic heater 34 of the bonding head 21a, and the chip component C is heated at a predetermined temperature over a predetermined time. That is, the resin is heat-cured via the chip component C, and the chip component C is main-bonded to the circuit pattern of the wafer W (step S6a).

ボンディングヘッド２１ａが、本圧着処理を行っている間、チップスライダ８ｂからボンディングヘッド２１ｂにチップ部品Ｃが受け渡される（ステップＳ３ｂ）。なお、この段階でチップ部品Ｃが、ボンディングヘッド２１ｂのアタッチメントツール３５の所定の位置に吸着されていないと、実装段階でチップ部品Ｃからはみ出した樹脂がアタッチメントツール３５に付着する可能性が生じる。アタッチメントツール３５への樹脂の付着は前述のとおり、チップ部品Ｃ実装時の破損や位置ズレの原因となる。そこで、チップスライダ８ｂが次のチップ部品Ｃを受け取るために、ピックアップ機構７側に移動すれば、２視野カメラ２２の位置が、ボンディングヘッド２１ｂに保持されたチップ部品ＣとウエハＷとの間となることから、２視野カメラ２２によりチップ部品Ｃがアタッチメントツール３５の所定位置に吸着されているか否か、その位置ズレ量を測定することが可能となる。この位置ズレ量を補正するために、ピックアップ機構７からチップスライダ８ｂへの受け渡し段階または／およびチップスライダ８ｂからボンディングヘッド２１ｂへの受け渡し時の、チップ部品Ｃの位置補正を行うような機能を制御手段３に付加しても良い。 While the bonding head 21a is performing the main crimping process, the chip component C is delivered from the chip slider 8b to the bonding head 21b (step S3b). If the chip component C is not attracted to a predetermined position of the attachment tool 35 of the bonding head 21b at this stage, the resin protruding from the chip component C at the mounting stage may adhere to the attachment tool 35. As described above, the adhesion of the resin to the attachment tool 35 causes damage or misalignment when the chip component C is mounted. Therefore, if the chip slider 8b moves to the pickup mechanism 7 side in order to receive the next chip component C, the position of the two-field camera 22 is between the chip component C held by the bonding head 21b and the wafer W. Therefore, it is possible to measure whether or not the chip component C is attracted to a predetermined position of the attachment tool 35 by the two-field camera 22 and the amount of the positional deviation. In order to correct this amount of misalignment, a function for correcting the position of the chip component C at the transfer stage from the pickup mechanism 7 to the chip slider 8b and / or at the time of transfer from the chip slider 8b to the bonding head 21b is controlled. It may be added to the means 3.

本圧着処理が完了し、図１０に示すように、ボンディングヘッド２１ａが上昇する（ステップＳ７ｂ）。当該ボンディングヘッド２１ａのセラミックヒータ３４をオフにして、エアー供給源３９からエアーを供給して当該ボンディングヘッド２１ａを所定の温度まで冷却させる（ステップＳ８ａ）。 This crimping process is completed, and as shown in FIG. 10, the bonding head 21a rises (step S7b). The ceramic heater 34 of the bonding head 21a is turned off, and air is supplied from the air supply source 39 to cool the bonding head 21a to a predetermined temperature (step S8a).

ボンディングヘッド２１ａの上昇と同時に、図１１に示すように、保持ステージ２３を予め決めた方向および所定距離だけ移動させる。図１２に示すように、２視野カメラ２２によってウエハＷの回路パターンに付されたアライメントマークとボンディングヘッド２１ｂに保持されているチップ部品Ｃに付されたアライメントマークを画像認識し、画像データを制御部３に送信する。制御部３は、当該画像データに基づいて、保持ステージ２３およびボンディングヘッド２１ｂのアライメントを行う（ステップＳ４ｂ）。 At the same time as the bonding head 21a is raised, the holding stage 23 is moved by a predetermined direction and a predetermined distance as shown in FIG. As shown in FIG. 12, the two-field camera 22 image-recognizes the alignment mark attached to the circuit pattern of the wafer W and the alignment mark attached to the chip component C held by the bonding head 21b, and controls the image data. It is transmitted to the part 3. The control unit 3 aligns the holding stage 23 and the bonding head 21b based on the image data (step S4b).

このとき、冷却処理中のボンディングヘッド２１ａの下方に、新たしいチップ部品Ｃが
搬送されてくる。 At this time, a new chip component C is conveyed below the bonding head 21a being cooled.

ボンディングヘッド２１ｂのアライメント処理が完了すると、図１３に示すように、ボンディングヘッド２１ｂが、所定高さまで下降し始める（ステップＳ５ｂ）。同時に、ボンディングヘッド２１ａの下方に２視野カメラ２２が移動してくる。
この段階において、画像認識手段を用いて、ボンディングヘッド２１ａのアタッチメントツール３５表面状態を観察して、樹脂等の付着やキズの有無を判断する機能を制御手段３に付加してもよく、画像認識手段として２視野カメラ２２を用いても良い。その際、付着物やキズが許容範囲以内と判断したら次のステップに移行する。 When the alignment process of the bonding head 21b is completed, as shown in FIG. 13, the bonding head 21b begins to descend to a predetermined height (step S5b). At the same time, the two-field camera 22 moves below the bonding head 21a.
At this stage, the control means 3 may be provided with a function of observing the surface state of the attachment tool 35 of the bonding head 21a and determining the presence or absence of adhesion of resin or the like or scratches by using the image recognition means. A two-field camera 22 may be used as the means. At that time, if it is judged that the deposits and scratches are within the allowable range, the process proceeds to the next step.

図１４に示すように、ボンディングヘッド２１ｂによってウエハＷの回路パターン上にチップ部位Ｃが実装および本圧着がされる（ステップＳ６ｂ）。他方のボンディングヘッド２１ａにチップ部品Ｃが、チップスライダ８ａにより受け渡される。その後、チップスライダ８ａが次のチップ部品Ｃを受け取るために、ピックアップ機構７側に移動すれば、２視野カメラ２２により、チップ部品Ｃがアタッチメンボンディングへッド２１ａのアタッチメントツール３５の所定位置に吸着されているか否か、その位置ズレ量を測定することが可能となる。ここで、位置ズレ量を補正するために、ピックアップ機構７からチップスライダ８ａへの受け渡し段階または／およびチップスライダ８ａからボンディングヘッド２１ｂへの受け渡し時の、チップ部品Ｃの位置補正を行うような機能を制御手段３に付加しても良い。 As shown in FIG. 14, the chip portion C is mounted and main crimped on the circuit pattern of the wafer W by the bonding head 21b (step S6b). The chip component C is delivered to the other bonding head 21a by the chip slider 8a. After that, when the chip slider 8a moves to the pickup mechanism 7 side in order to receive the next chip component C, the chip component C is attracted to a predetermined position of the attachment tool 35 of the attachment bonding head 21a by the two-field camera 22. It is possible to measure whether or not the position is displaced and the amount of the positional deviation. Here, in order to correct the amount of misalignment, a function for correcting the position of the chip component C at the transfer stage from the pickup mechanism 7 to the chip slider 8a and / or at the time of transfer from the chip slider 8a to the bonding head 21b. May be added to the control means 3.

図１５に示すように、ボンディングヘッド２１ｂによる本圧着処理が完了すると、当該ボンディングヘッド２１ｂを上昇させるとともに、保持ステージ２３を予め決めた方向および所定距離だけ移動させる（ステップＳ７ｂ）。一方のボンディングヘッド２１ｂの冷却処理が開始されると（ステップＳ８ｂ）、他方のボンディングヘッド２１ａのアライメント処理が開始される。 As shown in FIG. 15, when the main crimping process by the bonding head 21b is completed, the bonding head 21b is raised and the holding stage 23 is moved by a predetermined direction and a predetermined distance (step S7b). When the cooling process of one bonding head 21b is started (step S8b), the alignment process of the other bonding head 21a is started.

以上で２台のボンディングヘッド２１ａ、２１ｂを利用して本圧着処理が完了し、以後、ステップＳ９ａ、Ｓ９ｂにおいて、実装予定数に達するまでカウントされ、同じサイクルでウエハＷに形成された回路パターンの個数分の本圧着処理が繰り返し実行される。 As described above, the main crimping process is completed using the two bonding heads 21a and 21b, and thereafter, in steps S9a and S9b, the number of circuit patterns formed on the wafer W is counted until the planned number of mountings is reached. The number of main crimping processes is repeatedly executed.

上記実施例装置によれば、一方のボンディングヘッド２１ｂがウエハＷの回路パターンにチップ部品Ｃを実装および本圧着している間、先行して本圧着処理を完了したボンディングヘッド２１ａの内部にエアー供給源３９からエアーを供給して積極的に冷却することができる。すなわち、チップ部品Ｃのバンプの半田を溶融または変形させることもなければ、回路基板上の樹脂を不用意に硬化させることなく、ボンディングヘッド２１ａ、２１ｂを交互に切り替えて、連続的にチップ部品ＣをウエハＷの回路パターンに精度よく実装することができる。 According to the above-described apparatus, air is supplied to the inside of the bonding head 21a in which the main crimping process is completed in advance while one of the bonding heads 21b mounts and main crimps the chip component C on the circuit pattern of the wafer W. Air can be supplied from the source 39 for positive cooling. That is, the bonding heads 21a and 21b are alternately switched to continuously switch the chip component C without melting or deforming the solder of the bump of the chip component C and without inadvertently curing the resin on the circuit board. Can be accurately mounted on the circuit pattern of the wafer W.

本発明は上述した実施例のものに限らず、次のように変形実施することもできる。 The present invention is not limited to the above-described embodiment, and can be modified as follows.

（１）上記実施例装置において、ボンディングヘッド２１ａ、２１ｂのいずれか一方が、ウエハＷの回路パターンにチップ部品Ｃを実装している間、２視野カメラ２２を走査し、他方のボンディングヘッドが、次にチップ部品Ｃを実装する予定の回路パターンのアライメントマークのみを先に認識させておいてもよい。この構成によれば、待機時間を利用して一方のアライメントマークのみの画像処理させることができるので、制御部３への画像処理の負担を軽減できるとともに、処理時間を短縮することができる。 (1) In the above-described apparatus, while one of the bonding heads 21a and 21b mounts the chip component C on the circuit pattern of the wafer W, the two-field camera 22 is scanned, and the other bonding head scans. Next, only the alignment mark of the circuit pattern in which the chip component C is to be mounted may be recognized first. According to this configuration, since the image processing of only one of the alignment marks can be performed by using the standby time, the burden of image processing on the control unit 3 can be reduced and the processing time can be shortened.

（２）上記実施例装置において、図１７に示すように、１台の保持ステージ２３に複数枚の回路基板を所定ピッチをおいて整列配置し、２台一組のボンディングヘッドが同時に、回路基板の同一部位にチップ部品Ｃを実装可能にしてもよい。この構成によれば、上記実施例の２倍の速度でチップ部品Ｃを回路基板に実装することができる。 (2) In the above-described apparatus, as shown in FIG. 17, a plurality of circuit boards are arranged and arranged on one holding stage 23 at a predetermined pitch, and a set of two bonding heads are simultaneously arranged on the circuit boards. The chip component C may be mounted on the same portion of the above. According to this configuration, the chip component C can be mounted on the circuit board at twice the speed of the above embodiment.

（３）上記実施例装置において、温度検出器３６でボンディングヘッド２１ａ、２１ｂの温度を検出し、当該検出結果に応じてエアーの供給量などを調整し、冷却時間を一定に保つよう構成してもよい。 (3) In the above-described apparatus, the temperature detector 36 detects the temperatures of the bonding heads 21a and 21b, adjusts the air supply amount and the like according to the detection result, and is configured to keep the cooling time constant. May be good.

（４）上記実施例装置において、図１８に示すように、回路基板上の実装エリアを３つに区画し、左右のエリアを各ボンディングヘッド２１ａ、２１ｂの実装エリアに割当て、中央のエリアを両ボンディングヘッド２１ａ、２１ｂが利用して実装可能な共用エリアにすることもできる。 (4) In the above-described apparatus, as shown in FIG. 18, the mounting area on the circuit board is divided into three, the left and right areas are assigned to the mounting areas of the bonding heads 21a and 21b, and the central area is both. It can also be a common area that can be mounted by using the bonding heads 21a and 21b.

すなわち、各ボンディングヘッド２１ａ、２１ｂに割り当てられた実装エリアに、不良回路パターンの箇所にバッドマークが付されて実装できない部位がある。当該不良回路パターンに実装予定であったチップ部品Ｃを共用エリアに実装することにより、両ボンディングヘッド２１ａ、２１ｂの実装数を均等に保つことができる。 That is, in the mounting area assigned to the bonding heads 21a and 21b, there is a portion where the defective circuit pattern is marked with a bad mark and cannot be mounted. By mounting the chip component C that was planned to be mounted in the defective circuit pattern in the common area, the number of mountings of both bonding heads 21a and 21b can be kept equal.

（４）上記実施例装置では、１台に保持ステージ２３に対して配備されるボンディングヘッド２１ａ、２１ｂは、２台に限定されない。すなわち、２台以上であればよい。 (4) In the above-described apparatus, the number of bonding heads 21a and 21b arranged for the holding stage 23 in one unit is not limited to two. That is, it may be two or more.

１ … チップ部品供給部
２ … チップ部品実装部
３ … 制御部
２１ａ… ボンディングヘッド
２１ｂ… ボンディングヘッド
２２ … ２視野カメラ
３０ … 本体
３１ … ホルダ
３２ … ヒータベース
３３ … 断熱ブロック
３４ … セラミックヒータ
３５ … アタッチメントツール
３６ … 温度検出器
３７ … 流路
３９ … エアー供給源
Ｃ … チップ部品 1 ... Chip component supply unit 2 ... Chip component mounting unit 3 ... Control unit 21a ... Bonding head 21b ... Bonding head 22 ... 2 Field-of-view camera 30 ... Main body 31 ... Holder 32 ... Heater base 33 ... Insulation block 34 ... Ceramic heater 35 ... Attachment Tool 36… Temperature detector 37… Flow path 39… Air supply source C… Chip parts

Claims (14)

複数個の回路パターンが形成された基板に、前記基板の上部に配置された複数のボンディングヘッドによりチップ部品を実装する実装方法であって、
個々のボンディングヘッドが前記基板にチップ部品を実装する過程で、
前記基板を移動して、チップ部品を保持したボンディングヘッドの直下に前記基板の所定位置を配し、所定時間をかけて当該チップ部品を加熱しながら本圧着する実装過程と、
前記本圧着後に前記ボンディングヘッドを上昇させるとともに所定温度まで冷却する冷却過程を備え、
一つのボンディングヘッドが実装過程の間に、他のボンディングヘッドが冷却過程となることを繰り返し行うもので、
冷却過程のボンディングヘッドの下部に、次に実装するチップ部品を供給することを特徴とする実装方法。 It is a mounting method in which chip components are mounted on a board on which a plurality of circuit patterns are formed by a plurality of bonding heads arranged on the upper part of the board.
In the process of mounting chip components on the board, each bonding head
A mounting process in which the substrate is moved, a predetermined position of the substrate is placed directly under the bonding head holding the chip component, and the chip component is heated and crimped over a predetermined time.
A cooling process is provided in which the bonding head is raised and cooled to a predetermined temperature after the main crimping.
One bonding head repeats the cooling process while the other bonding head is in the mounting process.
A mounting method characterized in that a chip component to be mounted next is supplied to the lower part of the bonding head in the cooling process. 請求項１に記載の実装方法において、
前記実装過程の間、認識機構を移動させながら、次にチップ部品の実装を行う実装部位の基板に設けられたアライメントマークを認識させてアライメント座標を求めることを特徴とする実装方法。 In the mounting method according to claim 1,
A mounting method characterized in that, while moving the recognition mechanism during the mounting process, the alignment mark provided on the substrate of the mounting portion where the chip component is mounted next is recognized and the alignment coordinates are obtained. 請求項１または請求項２に記載の実装方法において、
冷却過程のボンディングヘッドにおいて、チップ部品の吸着を行うアタッチメントツールの、チップ部品吸着前の、表面を観察することを特徴とする実装方法。 In the implementation method according to claim 1 or 2.
A mounting method characterized by observing the surface of an attachment tool that adsorbs chip parts in a bonding head in the cooling process before adsorbing the chip parts. 請求項３に記載の実装方法において、
チップ部品のアライメントマークを認識する認識機構が、前記表面の観察も行うことを特徴とする実装方法。 In the mounting method according to claim 3,
A mounting method characterized in that a recognition mechanism that recognizes alignment marks of chip components also observes the surface. 請求項１ないし請求項４のいずれかに記載の実装方法において、
チップ部品のアライメントマークを認識する認識機構が、チップ部品の吸着を行うアタッチメントツールと、前記アタッチメントツールに吸着されたチップ部品の位置ズレ量を測定することを特徴とする実装方法。 In the implementation method according to any one of claims 1 to 4,
A mounting method characterized in that a recognition mechanism that recognizes an alignment mark of a chip component measures an attachment tool that adsorbs the chip component and the amount of misalignment of the chip component adsorbed on the attachment tool. 請求項５に記載の実装方法において、
前記位置ズレ量に応じて、前記アタッチメントツールへのチップ部品の吸着位置を補正することを特徴とする実装方法。 In the mounting method according to claim 5,
A mounting method characterized in that the suction position of a chip component on the attachment tool is corrected according to the amount of the positional deviation. 請求項１ないし請求項６に記載の実装方法において、
前記実装過程は、基板を保持する保持ステージを移動させて実装位置のアライメントを行うことを特徴とする実装方法。 In the implementation method according to claim 1 to 6,
The mounting process is a mounting method characterized in that a holding stage for holding a substrate is moved to align mounting positions. 請求項１ないし請求項７のいずれかに記載の実装方法において、
１台の保持ステージに複数枚の前記基板を所定間隔をおいて整列配置し、前記実装過程では、少なくとも２台のボンディングヘッドの組を、互いに異なる基板の同一部位にチップ部品を実装して本圧着し、冷却過程では、他のボンディングヘッドを冷却することを特徴とする実装方法。 In the implementation method according to any one of claims 1 to 7.
A plurality of the boards are arranged and arranged at a predetermined interval on one holding stage, and in the mounting process, at least two bonding head sets are mounted on the same parts of different boards. A mounting method characterized by crimping and cooling other bonding heads in the cooling process. 複数個の回路パターンが形成された基板にチップ部品を実装する実装装置であって、
チップ部品をピックアップするピックアップ機構と、前記ピックアップ機構から受け渡されたチップ部品を搬送するチップスライダを有するチップ部品供給部と、
前記基板を保持する保持ステージと、前記保持ステージを移動させる駆動機構と、前記保持ステージの上部に配置され、前記保持ステージ上の基板の所定位置にチップ部品を実装および本圧着する複数のボンディングヘッドと、前記ボンディングヘッドを加熱するヒータと、前記ボンディングヘッドを冷却する冷却機構とを有したチップ部品実装部と、
前記チップ部品供給部と前記チップ部品実装部の動作を制御する制御部とを備え、
前記チップスライダは前記ピックアップ機構と複数のボンディングヘッドとの間を往復移動する機能を有し、
前記チップスライダが冷却中のボンディングヘッドの下部にチップ部品を供給する機能を有する実装装置。 A mounting device that mounts chip components on a board on which a plurality of circuit patterns are formed.
A pickup mechanism that picks up chip components, a chip component supply unit that has a chip slider that conveys chip components delivered from the pickup mechanism, and a chip component supply unit.
A holding stage that holds the substrate, a drive mechanism that moves the holding stage, and a plurality of bonding heads that are arranged above the holding stage and mount and main-crimp chip components at predetermined positions on the substrate on the holding stage. A chip component mounting unit having a heater for heating the bonding head and a cooling mechanism for cooling the bonding head.
A control unit that controls the operation of the chip component supply unit and the chip component mounting unit is provided.
The chip slider has a function of reciprocating between the pickup mechanism and a plurality of bonding heads.
A mounting device having a function of supplying chip components to the lower part of a bonding head in which the chip slider is cooling. 請求項９に記載の実装装置であって、
前記ボンディングヘッドに保持されているチップ部品のアライメントマークと基板に設けられたアライメントマークを認識する認識機構を備え前記制御部は、先行するボンディングヘッドが基板にチップ部品を実装および本圧着している間、認識機構を走査させて次にチップ部品の実装を行う基板の実装予定部位に設けられたアライメントマークを認識させてアライメント座標を求めることを特徴とする実装装置。 The mounting device according to claim 9.
The control unit is provided with a recognition mechanism for recognizing the alignment mark of the chip component held on the bonding head and the alignment mark provided on the substrate. In the control unit, the preceding bonding head mounts the chip component on the substrate and crimps the chip component. A mounting device characterized in that the recognition mechanism is scanned for a while, and the alignment mark provided at the planned mounting site of the substrate on which the chip component is mounted is recognized to obtain the alignment coordinates. 請求項９または請求項１０に記載の実装装置であって、
前記ボンディングヘッドがチップ部品を吸着するアタッチメントツールを備え、
観察機構を備え、
前記制御部が、前記観察機構を用いて、チップ部品を吸着するアタッチメントツールの表面をチップ部品を吸着していない状態で観察する機能を備えたことを特徴とする実装装置。 The mounting device according to claim 9 or 10.
The bonding head is provided with an attachment tool for adsorbing chip parts.
Equipped with an observation mechanism
The mounting device is characterized in that the control unit has a function of observing the surface of an attachment tool for sucking chip parts in a state where the chip parts are not sucked by using the observation mechanism. 請求項１１に記載の実装装置であって、
チップ部品のアライメントマークを認識する認識機構が、前記表面を観察する機能も備えることを特徴とする実装装置。 The mounting device according to claim 11.
A mounting device characterized in that a recognition mechanism that recognizes alignment marks of chip components also has a function of observing the surface. 請求項１１または請求項１２に記載の実装装置であって、
前記制御部が、チップ部品のアライメントマークを認識する認識機構を用いて、前記アタッチメントツールと、前記アタッチメントツールに吸着されたチップ部品の位置ズレ量を測定する機能を備えたことを特徴とする実装装置。 The mounting device according to claim 11 or 12 .
The mounting is characterized in that the control unit has a function of measuring the amount of misalignment between the attachment tool and the chip component adsorbed on the attachment tool by using a recognition mechanism that recognizes the alignment mark of the chip component. apparatus. 請求項１３に記載の実装装置であって、
チップ部品を搬送し、前記アタッチメントツールに受け渡す、チップ部品受け渡し機構を備え、前記制御部が、前記位置ズレ量に応じて、チップ部品受け渡し機構において、チップ部品の位置補正を行う機能を備えたことを特徴とする実装装置。 The mounting device according to claim 13.
It is provided with a chip component delivery mechanism that transports chip components and delivers them to the attachment tool, and the control unit has a function of correcting the position of the chip components in the chip component delivery mechanism according to the amount of the positional deviation. A mounting device characterized by that.
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