JP6731046B2 - 空間依存ｘ線束劣化及び光子スペクトル変化を決定するデバイス - Google Patents

空間依存ｘ線束劣化及び光子スペクトル変化を決定するデバイス Download PDF

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JP6731046B2
JP6731046B2 JP2018517407A JP2018517407A JP6731046B2 JP 6731046 B2 JP6731046 B2 JP 6731046B2 JP 2018517407 A JP2018517407 A JP 2018517407A JP 2018517407 A JP2018517407 A JP 2018517407A JP 6731046 B2 JP6731046 B2 JP 6731046B2
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ray
dependent
data
flux degradation
ray tube
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JP2018531087A (ja
JP2018531087A6 (ja
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レスター ドナルド ミラー
レスター ドナルド ミラー
カロリナ リビング
カロリナ リビング
デ ヴェン ディオニス ファン
デ ヴェン ディオニス ファン
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Koninklijke Philips NV
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    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/26—Measuring, controlling or protecting
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/02—Arrangements for diagnosis sequentially in different planes; Stereoscopic radiation diagnosis
    • A61B6/03—Computed tomography [CT]
    • A61B6/032—Transmission computed tomography [CT]
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/40—Arrangements for generating radiation specially adapted for radiation diagnosis
    • A61B6/4021—Arrangements for generating radiation specially adapted for radiation diagnosis involving movement of the focal spot
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/58—Testing, adjusting or calibrating thereof
    • A61B6/586—Detection of faults or malfunction of the device
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/36—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/26—Measuring, controlling or protecting
    • H05G1/54—Protecting or lifetime prediction

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  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Medical Informatics (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Molecular Biology (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Radiology & Medical Imaging (AREA)
  • Animal Behavior & Ethology (AREA)
  • Optics & Photonics (AREA)
  • Pathology (AREA)
  • Biophysics (AREA)
  • Biomedical Technology (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Veterinary Medicine (AREA)
  • Surgery (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Public Health (AREA)
  • Toxicology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Pulmonology (AREA)
  • Theoretical Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • X-Ray Techniques (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
JP2018517407A 2015-10-06 2016-10-04 空間依存ｘ線束劣化及び光子スペクトル変化を決定するデバイス Expired - Fee Related JP6731046B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201562237727P 2015-10-06 2015-10-06
US62/237,727 2015-10-06
PCT/IB2016/055924 WO2017060814A1 (en) 2015-10-06 2016-10-04 Device for determining spatially dependent x-ray flux degradation and photon spectral change

Publications (4)

Publication Number Publication Date
JP2018531087A JP2018531087A (ja) 2018-10-25
JP2018531087A6 JP2018531087A6 (ja) 2018-12-13
JP2018531087A5 JP2018531087A5 (https=) 2020-06-18
JP6731046B2 true JP6731046B2 (ja) 2020-07-29

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JP2018517407A Expired - Fee Related JP6731046B2 (ja) 2015-10-06 2016-10-04 空間依存ｘ線束劣化及び光子スペクトル変化を決定するデバイス

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US (1) US10757795B2 (https=)
EP (1) EP3359045B1 (https=)
JP (1) JP6731046B2 (https=)
CN (1) CN108135562B (https=)
WO (1) WO2017060814A1 (https=)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6774813B2 (ja) * 2016-08-12 2020-10-28 日本電子株式会社 画像処理装置、画像処理方法、および分析装置
EP3413691A1 (en) * 2017-06-08 2018-12-12 Koninklijke Philips N.V. Apparatus for generating x-rays
AU2018309611B2 (en) * 2017-07-31 2022-11-10 Lawrence Livermore National Security, Llc Convergent x-ray imaging device and method
CN107582089B (zh) * 2017-09-29 2021-06-29 上海联影医疗科技股份有限公司 准直器、成像设备、焦点位置跟踪方法及校正方法
JP7043210B2 (ja) * 2017-10-04 2022-03-29 キヤノンメディカルシステムズ株式会社 Ｘ線画像診断装置
JP6954232B2 (ja) * 2018-06-08 2021-10-27 株式会社島津製作所 Ｘ線検査装置およびｘ線検査装置におけるｘ線管のターゲットの消耗度判定方法
CN111195134B (zh) * 2018-11-19 2024-01-26 锐珂（上海）医疗器材有限公司 用于确定x射线照相系统的剂量率变化程度的方法和装置

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US4497062A (en) * 1983-06-06 1985-01-29 Wisconsin Alumni Research Foundation Digitally controlled X-ray beam attenuation method and apparatus
US4763343A (en) * 1986-09-23 1988-08-09 Yanaki Nicola E Method and structure for optimizing radiographic quality by controlling X-ray tube voltage, current, focal spot size and exposure time
JP2959745B2 (ja) * 1994-09-27 1999-10-06 株式会社テクノス 表面欠陥評価装置
US5680431A (en) * 1996-04-10 1997-10-21 Schlumberger Technology Corporation X-ray generator
US5668850A (en) 1996-05-23 1997-09-16 General Electric Company Systems and methods of determining x-ray tube life
SE513161C2 (sv) * 1997-11-03 2000-07-17 Digiray Ab En metod och en anordning för radiografi med plant strålknippe och en strålningsdetektor
SE514460C2 (sv) * 1999-04-14 2001-02-26 Xcounter Ab Förfarande för detektering av joniserande strålning, strålningsdetektor och anordning för användning vid radiografi med plant strålknippe
SE514475C2 (sv) * 1999-04-14 2001-02-26 Xcounter Ab Strålningsdetektor, en anordning för användning vid radiografi med plant strålknippe och ett förfarande för detektering av joniserande strålning
SE0000957D0 (sv) * 2000-02-08 2000-03-21 Digiray Ab Detector and method for detection of ionizing radiation
JP4505664B2 (ja) * 2000-03-24 2010-07-21 株式会社ニコン Ｘ線発生装置
SE518801C2 (sv) * 2000-06-05 2002-11-26 Xcounter Ab Anordning och förfarande för detektering av joniserande strålning
JP4748869B2 (ja) * 2001-03-26 2011-08-17 株式会社日立メディコ Ｘ線装置
US6724782B2 (en) * 2002-04-30 2004-04-20 The Regents Of The University Of California Femtosecond laser-electron x-ray source
DE10338693B3 (de) 2003-08-22 2005-05-25 Siemens Ag Verfahren zum Abschätzen der Restlebensdauer eines Röntgenstrahlers
JP2007242287A (ja) * 2006-03-06 2007-09-20 Nagoya Electric Works Co Ltd Ｘ線出力器診断装置およびｘ線出力器診断方法
US7959343B2 (en) * 2006-09-19 2011-06-14 Koninklijke Philips Electronics N.V. Illumination system for luminaires and display devices
WO2008132635A2 (en) 2007-04-25 2008-11-06 Koninklijke Philips Electronics, N.V. X-ray beam z-axis positioning
CN102415220B (zh) * 2009-05-05 2015-07-08 皇家飞利浦电子股份有限公司 用于对x射线生成设备的焦斑进行负荷相关尺寸调整的方法和设备
EP2545749B1 (en) * 2010-03-10 2018-05-16 Philips Lighting Holding B.V. Maintaining color consistency in led lighting device having different led types
WO2012069944A1 (en) * 2010-11-08 2012-05-31 Koninklijke Philips Electronics N.V. Determining changes in the x-ray emission yield of an x-ray source
DE102011083729A1 (de) * 2011-09-29 2013-04-04 Siemens Aktiengesellschaft Verfahren und Vorrichtung zur Bestimmung des Verschleißes einer Röntgenanode
BR112014010237A2 (pt) * 2011-11-03 2017-04-18 Koninklijke Philips Nv processamento de dados de imagem e método
US20140177810A1 (en) * 2012-12-21 2014-06-26 Ge Global Research System and methods for x-ray tube aging determination and compensation
CN105580102B (zh) * 2013-09-05 2017-03-22 皇家飞利浦有限公司 X射线探测
JP6289114B2 (ja) * 2014-01-17 2018-03-07 キヤノンメディカルシステムズ株式会社 Ｘ線コンピュータ断層撮影装置及び線量値計算装置

Also Published As

Publication number Publication date
JP2018531087A (ja) 2018-10-25
EP3359045A1 (en) 2018-08-15
CN108135562A (zh) 2018-06-08
US20180279457A1 (en) 2018-09-27
CN108135562B (zh) 2022-08-16
EP3359045B1 (en) 2020-04-08
WO2017060814A1 (en) 2017-04-13
US10757795B2 (en) 2020-08-25

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