JP6729111B2 - Identification device, traceability system, and identification method - Google Patents

Description

The present invention relates to an identification device, a traceability system and an identification method for identifying individual boards in a board manufacturing process.

When manufacturing and selling a circuit board such as a printed wiring board, traceability is required for the purpose of product manufacturing process management, quality inspection, shipping inspection, sales management, and the like. Therefore, individual identification information including a product name, a product number, a manufacturing date, etc. is set on a circuit board, and the circuit board is traced based on the individual identification information.

The individual identification information is set on the circuit board by pasting a label such as a bar code or a QR code (registered trademark) on which the individual identification information is printed or an RFID (Radio Frequency Identifier) storing the individual identification information on the circuit board. be able to. Further, the individual identification information can be directly printed on the circuit board with a laser marker or an inkjet. In these methods, in order to identify each circuit board, individual identification information for identifying the circuit board is given to the circuit board.

In order to obtain the traceability of the circuit board by the method described above, a label, an RFID, a printing facility, etc. are required, which causes a problem of increasing manufacturing cost. Further, there is a problem that the manufacturing time is increased because the work such as pasting or printing the individual identification information on the substrate is required. In order to solve these problems, it is required to identify each board without giving individual identification information to the board.

In Patent Document 1, the positions of a plurality of measurement targets arranged on a circuit board are measured, the difference between the measured value of the measurement target and the design value is acquired as position information for each measurement target, and the acquired position information is acquired. There is disclosed a circuit board identification device that registers a combination of the above as a board identification code. According to the identification device of Patent Document 1, it is possible to identify individual boards without adding individual identification information to the boards.

Patent Document 2 discloses a technique of capturing an image of the side surface of a multilayer printed wiring board with a camera and extracting a feature amount from the captured image data. According to Patent Document 2, the board can be identified by using the pattern on the side surface of the board.

A substrate manufacturing process such as an SMT (Surface Mount Technology) process generally includes a plurality of processes such as a solder printing process, a solder printing inspection process, a component mounting process, a reflow process, and an appearance inspection process. For example, if the features of the substrate surface are extracted and registered in the first step of the SMT process, the individual substrate can be identified using the registered features in the subsequent steps.

JP, 2013-69838, A JP, 2009-140375, A

By the way, in a general SMT process, when the substrate passes through each process, there is a possibility that the surface of the substrate is scratched due to friction with a guide of a carrier that connects the processes. In addition, in the manufacturing apparatus, dirt, oil, solder, and other contaminants generated during the manufacturing process may adhere to the surface of the substrate. Furthermore, there is a possibility that the surface state may change from moment to moment due to changes over time in the substrate itself. Therefore, only by adopting the methods of Patent Documents 1 and 2 in a general SMT process, it is possible to perform accurate matching using the registered image registered at the time of loading the substrate and the matching images captured in each subsequent process. However, there is a problem that the identification accuracy of the substrate is lowered.

In order to solve the above problems, an object of the present invention is, in a plurality of steps constituting a substrate manufacturing line, even when the surface state of the substrate is changed, without individually assigning individual identification information to the substrate. An object of the present invention is to provide an identification device capable of identifying a substrate.

The identification device of the present invention includes an imaging unit that images the surface of a substrate in a plurality of steps that form a substrate manufacturing line, and a feature amount extraction unit that extracts a feature amount from image data of the surface of the substrate imaged by the imaging unit. A storage unit that stores the feature amount extracted by the feature amount extraction unit in association with the substrate information of the substrate; and a feature amount extracted from an arbitrary substrate in any step and a feature amount stored in the storage unit. A collation determination unit that collates and discriminates an arbitrary substrate based on a matching condition between the characteristic amount extracted from the arbitrary substrate and the characteristic amount stored in the storage unit is provided.

The traceability system of the present invention includes a plurality of processing apparatuses that perform processing of any of a plurality of steps that form a substrate manufacturing line, and a transporter that is connected to the plurality of processing apparatuses and that transports substrates to the plurality of processing apparatuses. , The surface of the substrate is imaged in a plurality of steps, the feature amount is extracted from the imaged image data of the surface of the substrate, and the extracted feature amount is stored in association with the substrate information of the substrate, and in any step A discriminating device for collating the feature amount extracted from the substrate with the stored feature amount, and identifying the arbitrary substrate based on the matching condition between the feature amount extracted from the arbitrary substrate and the stored feature amount; A production history server that registers a passage history when a substrate passes through a plurality of processing devices and an operation history of the plurality of processing devices in association with the substrate information.

In the identification method of the present invention, the surface of the substrate is imaged in a plurality of steps constituting the substrate manufacturing line, the feature amount is extracted from the imaged image data of the surface of the substrate, and the extracted feature amount is used as the substrate of the substrate. It is stored in association with the information, and the feature amount extracted from any substrate and the stored feature amount are collated in any step, and the feature amount extracted from any substrate matches the stored feature amount. Identify any substrate based on the conditions.

According to the present invention, in a plurality of steps constituting a board manufacturing line, even if the surface state of the board is changed, it is possible to identify each board without giving individual identification information to the board. It becomes possible to provide a device.

It is a block diagram which shows the structure of the identification device which concerns on the 1st Embodiment of this invention. It is a conceptual diagram which shows an example of the board|substrate side surface from which the identification device which concerns on the 1st Embodiment of this invention extracts a feature-value, and an example which dirt and a scratch adhere to the board|substrate side surface. It is a conceptual diagram which shows an example which arrange|positions the camera connected to the identification device which concerns on the 1st Embodiment of this invention on a board|substrate manufacturing line. It is a conceptual diagram which shows an example which arrange|positions the camera connected to the identification device which concerns on the 1st Embodiment of this invention on a board|substrate manufacturing line. It is a conceptual diagram which shows an example which arrange|positions the camera connected to the identification device which concerns on the 1st Embodiment of this invention on a board|substrate manufacturing line. It is an example of a management table managed by the identification device according to the first embodiment of the present invention. It is a conceptual diagram which shows the mounting surface of the board|substrate imaged by the identification device which concerns on the 1st Embodiment of this invention, and an example of the feature-value extracted from the mounting surface. It is a conceptual diagram which shows the side surface of the board|substrate imaged by the identification device which concerns on the 1st Embodiment of this invention, and an example of the feature-value extracted from the side surface. It is a conceptual diagram which shows the location which the identification device which concerns on the 1st Embodiment of this invention extracts the characteristic-value of a board|substrate. It is a conceptual diagram which shows an example of the feature-value which the identification device which concerns on the 1st Embodiment of this invention extracts from the side surface of a board|substrate. It is a conceptual diagram which shows an example of the feature-value which the identification device which concerns on the 1st Embodiment of this invention extracts from the side surface of a board|substrate. It is a conceptual diagram which shows the location which the identification device which concerns on the 1st Embodiment of this invention extracts the characteristic-value of a board|substrate. It is a conceptual diagram which shows an example of the feature-value which the identification device which concerns on the 1st Embodiment of this invention extracts from the side surface of a board|substrate. It is a conceptual diagram which shows the common characteristic part used when the identification device which concerns on the 1st Embodiment of this invention collates a board|substrate. It is a conceptual diagram which shows an example in which the identification device which concerns on the 1st Embodiment of this invention extracts the feature-value of the location where the dirt adhered. It is a conceptual diagram which shows an example which the identification apparatus which concerns on the 1st Embodiment of this invention restores the feature-value before attachment of dirt using the feature-value of the location where the dirt was attached. It is a figure which shows an example which the identification apparatus which concerns on the 1st Embodiment of this invention extracts the location where the variation|change_quantity of hue information or luminance information is more than a threshold value from the image which imaged the side surface of the board|substrate. 6 is a flowchart for explaining an operation of registration processing by the identification device according to the first embodiment of the present invention. 6 is a flowchart for explaining the operation of the matching process by the identification device according to the first embodiment of the present invention. It is a block diagram which shows the structure of the identification device which concerns on the 2nd Embodiment of this invention. It is an example of a management table managed by the identification device according to the second embodiment of the present invention. It is a flow chart for explaining operation of the discriminating device concerning a 2nd embodiment of the present invention. It is a block diagram which shows the structure of the traceability system which concerns on the 3rd Embodiment of this invention. It is a conceptual diagram which shows the structure of the traceability system which concerns on the 3rd Embodiment of this invention. It is a flow chart for explaining operation of registration processing by an identification device which constitutes a traceability system concerning a 3rd embodiment of the present invention. It is a flowchart for demonstrating operation|movement of the collation process by the identification device which comprises the traceability system which concerns on the 3rd Embodiment of this invention. It is a flow chart for explaining operation of process processing by a process processing device which constitutes a traceability system concerning a 3rd embodiment of the present invention. It is a flow chart for explaining operation of production history registration processing by a production history server which constitutes a traceability system concerning a 3rd embodiment of the present invention. It is a block diagram which shows an example of the hardware constitutions for implement|achieving the identification device which concerns on each embodiment of this invention.

Hereinafter, embodiments for carrying out the present invention will be described with reference to the drawings. However, the embodiments described below have technically preferable limitations for carrying out the present invention, but the scope of the invention is not limited to the following. In all the drawings used in the description of the embodiments below, like parts are designated by like reference numerals unless otherwise specified. Further, in the following embodiments, repeated description of similar configurations and operations may be omitted.

(First embodiment)
〔Constitution〕
First, the configuration of the identification device 1 according to the first embodiment of the present invention will be described with reference to the drawings. FIG. 1 is a block diagram of an identification device 1 according to this embodiment. The identification device 1 includes a storage unit 12, an imaging unit 13, a feature amount extraction unit 14, and a collation determination unit 15.

The storage unit 12 stores, in a board manufacturing line including a plurality of steps, a feature amount based on a surface state of a board to be registered (hereinafter, a target board) as individual identification information for uniquely specifying the target board. .. The storage unit 12 stores a feature amount (hereinafter simply referred to as a feature amount) based on the surface state of the substrate and the substrate information of the target substrate having the feature amount in association with each other. The storage unit 12 adds and registers the extracted feature amount in association with the board information every time the target board passes through the process.

Hereinafter, the board registered in the storage unit 12 will be referred to as a registered board. Further, regarding the registered boards registered in the storage unit 12, the feature amount and the board information associated with each other are referred to as registration information. The storage unit 12 may collectively manage the feature amounts obtained in each process for each product, or may manage the feature amounts separately for each process.

The characteristic amount of the substrate is information based on the pattern appearing on the surface of the substrate. For example, the characteristic amount of the target substrate is extracted from the substrate surface including the component mounting surface (main surface) and side surface. The board information is information including the product name and product number (ID: Identification) of the board, and is information for identifying each board.

As the characteristic amount of the substrate, at least one of the main surface and the side surface of the substrate may be used. When extracting the feature amount from the main surface of the board, the feature amount may be set to be extracted from the part where the component is not mounted. Further, since the side surface of the substrate does not change much during the manufacturing process, it is easy to arbitrarily set the location where the feature amount is extracted. In a manufacturing environment in which the surface condition of the substrate is likely to change, it is only necessary to extract the feature amount from both the main surface and the side face of the substrate and set the feature amount of at least one of the surfaces to be used depending on the situation.

A substrate such as a general organic wiring substrate has a structure in which a base material made of an organic material such as plastic contains a reinforcing material such as a glass cloth formed by folding glass fibers. A general substrate has, for example, a structure in which a reinforcing material such as glass cloth or a base material is laminated in layers. Therefore, different patterns appear on the surface of the substrate, such as a human fingerprint. Individual substrates can be identified by using a unique pattern for each substrate.

Here, the board that is registered and collated by the identification device 1 will be described with reference to FIG. Although FIG. 2 shows an example in which the substrate side surface is used as the surface state of the target substrate 100, registration/verification may be performed using the component mounting surface (main surface) of the substrate or another substrate surface.

The upper diagram of FIG. 2 is a conceptual diagram showing a side surface of a substrate to be registered/verified (hereinafter, the target substrate 100). The target substrate 100 in FIG. 2 shows a state in which elongated and deformed elliptical glass fibers 102 are laminated in a base material 101. A peculiar pattern appears on the side surface of each substrate depending on the laminated state of the glass fibers 102.

By the way, the lower diagram of FIG. 2 shows a state in which the dirt 111 and the scratch 112 are attached to the side surface of the target substrate 100 through the manufacturing process. If the pattern on the side surface of the target substrate 100 changes due to a change with time, dirt 111, or a scratch 112, it may not be possible to collate the substrate using the feature amount extracted before the substrate is input. Therefore, in the present embodiment, when a substrate having the same feature amount as the target substrate 100 is not registered, the registered substrate having the feature amount having a high matching rate with the feature amount of the target substrate 100 is the target substrate. judge.

The imaging unit 13 acquires an image including the surface state of the target substrate 100. The imaging unit 13 acquires the surface state of the target substrate 100 from the captured image data. For example, the image capturing unit 13 may perform image capturing control when it is detected that the target substrate 100 is transported by the sensor arranged near the device forming the SMT line.

For example, the image pickup unit 13 is connected to a camera including an image sensor such as a CCD (Charge Coupled Device) or a CMOS (Complementary Metal Oxide Semiconductor). The camera may be arranged near the entrance or exit of the device forming the SMT line. The image capturing unit 13 may include a camera. In that case, the imaging unit 13 has a camera that images the surface of the target substrate 100 at at least one of the entrance and the exit of the plurality of processing apparatuses 20 that share the plurality of processes.

3 to 5 are examples in which the cameras 131 are arranged in a plurality of processing devices 20 (20-1, 2,..., N) that configure an SMT (Surface Mount Technology) line (n is an arbitrary natural number). ). The target substrate 100 is transferred to the processing device 20 by being transferred to the transfer device 110.

The camera 131 has a resolution and a magnification that can acquire the pattern on the surface of the target substrate 100. The camera 131 is arranged at a position having an appropriate focal length according to the position of the target substrate 100 so that the surface state of the target substrate 100 can be imaged. Further, the target substrate 100 may be installed at an appropriate focus position of the camera 131. The arrangement of the cameras 131 in FIGS. 3 to 5 is an example, and the arrangement position and the number of the cameras 131 can be set arbitrarily.

The example of FIG. 3 is an example in which the cameras 131 are arranged at the entrances of all the processing devices 20 constituting the SMT line. The example of FIG. 4 is an example in which the cameras 131 are arranged in at least two processing devices 20 in the first to nth steps.

For example, the identification device 1 extracts the characteristic amount of the target substrate 100 from the image data acquired when the target substrate 100 is loaded into the first step processing apparatus 20-1. Then, the identification device 1 registers the extracted feature quantity in association with the board information of the target board 100. The identification device 1 collates the feature amount extracted from the image data acquired when the target substrate 100 is loaded into the second step processing device 20-2 or later with the registered feature amount, and thereby the target substrate 100. Can be identified.

Further, the identification device 1 registers, for a target substrate 100 having stains or scratches attached in any of the processing devices 20 or between processes, having a feature amount having a high matching rate with the feature amount extracted from the target substrate 100. Identify it as a substrate.

The example of FIG. 4 is an example in which the camera 131 is arranged at the entrance of the first step processing apparatus 20-1 and the nth step processing apparatus 20-n. The example of FIG. 4 can be expressed as an example in which the camera 131 is not arranged in any of the processing devices 20 that configure the SMT line. For example, in the case of registering the target substrate 100 that has passed through a step where stains or scratches are likely to be attached among the plurality of steps forming the SMT line in the next step, the configuration as shown in FIG. 4 may be used.

The example of FIG. 5 is an example in which the camera 131 is arranged at the entrance of the processing device 20 in the first to nth steps and the camera 131 is arranged at the exit of any one of the processing devices 20. For example, in the case where the target substrate 100 that has passed a process in which dirt or scratches are likely to be attached among the plurality of processes forming the SMT line is registered on the exit side, the configuration as shown in FIG. 5 may be used. According to the configuration shown in FIG. 5, when the target substrate 100 with stains or scratches advances to the next step, the characteristic amount of the target substrate 100 with stains or scratches is already registered, so that the substrate can be more reliably processed. Can be matched.

FIG. 6 is a management table 120 that manages registration information of individual registration boards. The management table 120 stores the board information and the feature amount in association with each other for each registered board. The management table 120 is a table for managing the feature amount for each of a plurality of processes extracted from the target substrate 100 in association with the substrate information. The management table 120 is an example of registration information managed by the identification device 1 and does not limit the scope of the present invention.

In the management table 120 of FIG. 6, the registered board with the board ID 001 is the board with the product name X01-000001 and the product number X001. The registered board having the board ID 002 is a board having a product name of X01-000001 and a product number of X002. The same product may have the same product name, but the product number differs for each registered board. Therefore, for the same product, the product number may be used as the board ID.

In this way, the identification device 1 adds the feature amount extracted for each process to the registration information for each registered substrate when the target substrate corresponding to the registered substrate passes through the process. Therefore, traceability can be obtained even for a substrate whose feature amount has changed in the SMT process.

The feature amount extraction unit 14 extracts the feature amount of the target substrate 100 from the information regarding the surface state of the target substrate 100 included in the image data acquired by the imaging unit 13. For example, the feature amount extraction unit 14 extracts at least one of the outer shape information, the hue information, and the luminance information of the pattern appearing on the surface of the target substrate 100 as the feature amount. The feature amount extracted by the feature amount extraction unit 14 will be described later in detail.

The collation determination unit 15 collates the feature amount newly extracted from the collation target substrate with the feature amount registered in the storage unit 12 in an arbitrary process, so that the substrate having the feature amount of the collation target substrate can be obtained. It is determined whether the data is stored in the storage unit 12. In other words, the collation determination unit 15 collates the feature amount extracted from any substrate in any step with the feature amount stored in the storage unit 12, and the feature amount extracted from any substrate and the storage unit are compared. An arbitrary board is identified based on the matching condition with the feature amount stored in 12.

When the feature amount that matches the feature amount of the matching target substrate is stored in the storage unit 12, the matching determination unit 15 determines that the matching target substrate is the registered substrate. On the other hand, if the feature amount that matches the feature amount of the matching target substrate is not stored in the storage unit 12, the matching determination unit 15 determines that the matching target substrate has the feature amount that has the highest matching rate with the feature amount of the matching target substrate. It is determined that the board is a registered board. These determinations by the collation determining unit 15 are an example of realizing identification of an arbitrary board based on the matching condition between the characteristic amount extracted from the arbitrary substrate and the characteristic amount stored in the storage unit 12.

Then, the matching determination unit 15 stores the board information of the registered board and the feature amount extracted from the matching target board in the storage unit 12 in association with each other for each process.

The above is the description of the configuration of the identification device 1 according to the present embodiment. The identification device 1 described here is an example, and various changes, additions, and deletions can be made.

The relationship between the above components can be expressed as follows. The imaging unit images the front surface of the substrate in a plurality of steps that form the substrate manufacturing line. The feature amount extraction unit extracts a feature amount from the image data of the surface of the substrate captured by the image capturing unit. The storage unit stores the feature amount extracted by the feature amount extraction unit in association with the board information of the board. Then, the collation determination unit collates the feature amount extracted from any substrate in any step with the feature amount stored in the storage unit. At this time, the collation determination unit determines that the substrate having the characteristic amount extracted from the arbitrary substrate is the same as the arbitrary substrate when the characteristic amount extracted from the arbitrary substrate is stored in the storage unit. To do. Further, when the feature amount extracted from an arbitrary substrate is not stored in the storage unit, the collation determination unit determines whether the substrate having the feature amount having the highest matching rate with the feature amount extracted from the arbitrary substrate is an arbitrary one. It is determined that the substrate is the same.

〔Feature value〕
Here, the feature amount used by the identification device 1 to identify the substrate will be described with reference to the drawings.

FIG. 7 is a conceptual diagram for explaining an example of extracting the feature amount from the main surface of the substrate.

The upper diagram of FIG. 7 shows image data of the main surface of the substrate. The upper diagram of FIG. 7 shows an example of the pattern of the substrate appearing on the main surface. On the main surface, a pattern in which the shapes of rectangular corners are arranged appears. Such a pattern originates from the substrate itself and does not change at any stage after the substrate is manufactured.

The lower diagram of FIG. 7 shows an example in which the edge is detected from the peripheral portion and the contour is detected from the outer shape of the pattern using the image data of the main surface. The lower diagram of FIG. 7 can be obtained, for example, by first-order differentiation (difference) of the image data of the upper diagram. That is, in the lower diagram of FIG. 7, the peripheral edge of the substrate and the outer shape (contour) of the pattern on the principal surface are detected by first-order differentiation (difference) of the image data of the principal surface of the substrate.

For example, the edge and the contour are detected by using a Sobel filter for the image data of the main surface and performing operations such as spatial first-order differentiation on nine pixel values of the upper, lower, left, and right centering on the target pixel. be able to. Then, for example, the contour of the pattern within the distance L1 from the left edge and the distance L2 from the upper edge may be used as the feature amount.

FIG. 8 is a conceptual diagram for explaining an example of extracting the feature amount from the side surface of the substrate.

The upper diagram of FIG. 8 shows image data of the side surface of the substrate. The upper diagram of FIG. 7 shows an example of the pattern of the substrate appearing on the side surface. On the side, a pattern of elongated ellipses appears. Such a pattern originates from the substrate itself and does not change at any stage after the substrate is manufactured.

The lower diagram of FIG. 8 shows an example in which the edge is detected from the peripheral portion and the contour is detected from the outer shape of the pattern using the image data of the side surface. The lower diagram of FIG. 8 can be obtained by first-order differentiating (difference) the image data of the upper diagram as in the case of using the main surface. That is, in the lower diagram of FIG. 8, the peripheral edge of the substrate and the outer shape (contour) of the pattern on the main surface are detected by first-order differentiation (difference) of the image data on the side surface of the substrate.

For example, for edges and contours, as in FIG. 7, a Sobel filter is used for side image data, and spatial first derivative or the like is performed for nine pixel values on the upper, lower, left, and right sides of the pixel of interest. Can be detected. Then, for example, the contour of the pattern within the distance L3 from the left edge and the distance L4 from the upper edge may be used as the feature amount.

As shown in FIG. 7 and FIG. 8, traceability can be obtained in the substrate manufacturing process by using the characteristic amount extracted from the pattern appearing on the main surface or the side surface of the substrate.

FIG. 9 is a diagram in which the left end of the side surface of the target substrate 100 shown in FIG. 8 is extracted. FIG. 9 shows that the image data of the side surface of the target substrate 100 is scanned in the thickness direction from the lower side to the upper side of the target substrate 100 at a distance L5 from the left end of the target substrate 100.

FIG. 10 shows a waveform of a hue value obtained when the target substrate 100 is scanned in the thickness direction as in FIG. In FIG. 10, the horizontal axis represents the position in the thickness direction, and the vertical axis represents the hue value. The waveform of the hue value as shown in FIG. 10 can be used as the feature amount.

As the hue value, any one or more of RGB (red, green, blue) may be used (R:Red, G:Green, B:Blue). Further, the hue value may be obtained by converting into another color space such as a color space composed of three components of HSV (hue, saturation, lightness) (H:Hue, S:Saturation, V:Value).

FIG. 11 shows a waveform of a luminance value obtained when the target substrate 100 is scanned in the thickness direction as in FIG. In FIG. 10, the horizontal axis represents the position in the thickness direction, and the vertical axis represents the brightness value. A brightness value waveform as shown in FIG. 10 can be used as a feature amount.

The brightness value may be obtained from the image data acquired in the monochrome mode. Alternatively, the luminance value may be obtained by converting to another color space such as YUV which is a set of (luminance (Y) and color difference (difference between luminance and blue=U, difference between luminance and red=V)).

The values in the hue value direction and the brightness value direction change depending on the imaging environment such as the installation location of the imaging unit 13, but if the same substrate is used, the values in the hue value direction and the brightness value direction are normalized, The overall shapes of the waveforms in FIGS. 10 and 11 are the same. Therefore, if the waveforms of the hue value and the brightness value extracted from the side surface of the substrate are used as the characteristic amount, the traceability can be obtained in the substrate manufacturing process.

FIG. 12 is a diagram in which the left end of the side surface of the target substrate 100 is extracted, as in FIG. 9. In FIG. 12, with respect to the image data of the side surface of the target substrate 100 on which the dirt 111 is attached, a position away from the left end of the target substrate 100 by a distance L5 is scanned in the thickness direction from the lower side to the upper side of the target substrate 100. Indicates.

FIG. 13 shows a waveform of a hue value obtained when the target substrate 100 is scanned in the thickness direction as in FIG. Compared with the case where the dirt 111 does not adhere to the target substrate 100 (FIG. 10), when the dirt 111 adheres to the target substrate 100 (FIG. 13), the hue value in the adhesion range of the dirt 111 is generally small. Has become. It should be noted that when the dirt 111 is attached, the feature value may be extracted by using the luminance value instead of the hue value.

FIG. 14 is an example in which common feature portions before and after the stain 111 is attached are extracted from the feature amounts before and after the stain 111 is attached. The feature amount A1 is extracted before the stain 111 is attached, and the feature amount A2 is extracted after the stain 111 is attached. The difference between the characteristic amount A1 and the characteristic amount A2 appears only in the adhesion range of the dirt 111. That is, the feature amount A1 and the feature amount A2 have the common feature portion having the same feature except the attachment range of the stain 111.

If the waveform of the common characteristic portion is extracted and registered as the feature amount AX in a certain process, the collation may be performed using the feature amount AX in the subsequent process.

Further, if the common characteristic portion is specified, the matching rate of the waveforms when the entire waveforms are collated can be specified, so that it is also possible to identify the substrate by using the matching rate of the waveforms. For example, when the scanning range (thickness of the substrate) is D and the stain adhesion range is p, the same substrate can be determined if the waveform matching rate is (1-p)/D. In other words, if the waveform mismatch rate is p/D, it can be determined that the substrates are the same.

FIG. 15 is an example in which the difference before and after the stain 11 is attached is extracted from the feature amount before and after the stain 111 is attached. The difference between the characteristic amount A1 and the characteristic amount A2 appears only in the adhesion range of the dirt 111. That is, the characteristic amount A1 and the characteristic amount A2 have different characteristic amounts AY only in the adhesion range of the dirt 111.

FIG. 16 is an example in which the feature amount A1 before the stain 111 is attached is restored by combining the feature amount A2 after the stain 111 is attached with the difference feature amount AY before and after the stain 111 is attached. Note that the feature amount A1 before the stain 111 is attached can be restored by combining the feature amount AX of the common feature portion and the difference feature amount AY shown in FIG.

As shown in FIG. 16, when dirt adheres to a substrate in a certain process, if the feature quantity before the dirt adheres can be restored, the feature quantity before that step and the restored feature quantity can be directly calculated. Since the collation can be performed, the board can be identified with higher accuracy. In addition, since it is possible that stains attached to the surface of the substrate in a certain process may be removed before the subsequent processes, it is useful to restore the feature amount before the stains are attached. Furthermore, when dirt inside the device adheres to the substrate, it is also assumed that dirt having the same characteristics adheres to different substrates. In such a case, if the feature amount of the stain itself is extracted and patterned, it is possible to estimate what kind of stain has occurred inside the apparatus from the feature amount of the stain.

FIG. 17 is an example in which a difference between a hue value and a brightness value of a pattern between adjacent pixel areas is extracted as a feature amount. The pixel region may be a single pixel or a group of several pixels.

In the upper diagram of FIG. 17, in the image data on the surface of the target substrate 100, a portion (hereinafter, a characteristic region) where the difference between the hue value and the luminance value of the pattern between the adjacent pixel regions is equal to or more than a predetermined threshold value is circled. It shows with. That is, in the characteristic region, the difference between the hue value and the brightness value is large.

The lower diagram of FIG. 17 plots the characteristic regions on the XY plane in which the lower left of the target substrate 100 is the origin and the direction parallel to the main surface is defined as the X direction and the thickness direction is defined as the Y direction. In addition, in the diagram of FIG. 17, the center points of the characteristic regions are plotted.

As shown in the lower diagram of FIG. 17, the plurality of characteristic regions extracted from the surface of the target substrate 100 show a unique positional relationship for each target substrate 100. Therefore, it is possible to use a figure in which any one of the extracted plurality of characteristic regions is connected by a line or the positional relationship itself of the plurality of characteristic regions as a characteristic amount unique to the target substrate 100.

The above is the description of the feature amount used by the identification device 1 to identify the substrate.

In the present embodiment, the feature amount to be used is not limited to one, and any two or more of the above feature amounts may be used. In the present embodiment, any one of outline information (contour) information, hue information, and luminance information of the pattern indicated by the surface state information is selected according to the change in the surface state of the substrate that occurs between the steps in manufacturing the substrate. One or more may be selected and used. Further, an appropriate feature amount may be selected or combined depending on the lighting condition when photographing the surface of the substrate and the ease of extracting the feature amount obtained from the pattern on the substrate surface.

〔motion〕
Next, the operation of the identification device 1 according to this embodiment will be described. 18 and 19 are flowcharts for explaining the operation of the identification device 1.

〔registration process〕
First, the operation of the identification device 1 will be described with reference to the flowchart of FIG. FIG. 18 relates to the operation of the process of registering the target substrate 100 on the SMT line (hereinafter referred to as the registration process). The registration process may be performed on the target substrate 100 transported to the entrance of the first step processing apparatus. The registration process may be configured to be performed after the second step.

In FIG. 18, first, the imaging unit 13 images the surface of the target substrate 100 that has been conveyed (step S111). In the registration process, the board information of the target board 100 is received by the identification device side.

Next, the feature amount extraction unit 14 extracts the feature amount from the image captured by the image capturing unit 13 (step S112).

Then, the storage unit 12 registers the feature amount extracted from the target substrate 100 in association with the substrate information of the target substrate 100 (step S113). The operation subject in step S113 may be the feature amount extraction unit 14 or the collation determination unit 15.

The above is the description of the registration process.

[Verification processing]
Next, the operation of the identification device 1 will be described with reference to the flowchart of FIG. FIG. 19 shows a process of collating the conveyed target substrate 100 with a registered substrate registered in the storage unit 12 (hereinafter, collation process). In the matching process, the feature amount of the target substrate 100 is added and registered to the registration information of the registered substrate determined to be the same as the target substrate 100.

In FIG. 19, first, the imaging unit 13 images the surface of the target substrate 100 that has been conveyed (step S121).

Next, the feature amount extraction unit 14 extracts the feature amount from the image captured by the image capturing unit 13 (step S122).

Next, the collation determination unit 15 collates the feature amount extracted from the target substrate 100 with the feature amount of the registered substrate stored in the storage unit 12 (step S123).

When a registered substrate having the same characteristic amount as the characteristic amount extracted from the target substrate 100 is registered in the storage unit 12 (Yes in step S124), the collation determination unit 15 determines that the registered substrate and the target substrate 100 are It is determined that they are the same (step S125).

On the other hand, when the registered substrate having the same feature amount as the feature amount extracted from the target substrate 100 is not registered in the storage unit 12 (No in step S124), the collation determination unit 15 operates differently from step S125. To do. In this case, the matching determination unit 15 extracts a registered substrate having a characteristic amount having a high matching rate with the characteristic amount of the target substrate 100, and determines that the target substrate 100 is the same as the registered substrate (step S126).

Then, the feature amount extraction unit 14 adds the feature amount extracted from the target substrate 100 to the registration information of the registered substrate that is determined to be the same as the target substrate 100 and registers it (step S127). Note that the operation subject in step S127 may be the feature amount extraction unit 14 or the collation determination unit 15.

The above is the description of the matching process.

As described above, the identification device according to the present embodiment registers a desired board feature amount (individual identification information) for each step in any of a plurality of steps that constitute a board manufacturing step such as an SMT line. deep.

Then, the identification device according to the present embodiment images the surface of the conveyed target substrate, and extracts the feature amount (individual identification information) from the surface state information included in the imaged image.

Further, the identification device according to the present embodiment identifies the target substrate based on the matching condition between the conveyed target substrate and the already stored registered substrate. That is, when the registration board having the extracted feature quantity is stored, the identification device according to the present embodiment determines that the registration board is a target board, and extracts the extracted feature quantity from the registration information of the registration board. Add to and register. On the other hand, the identification device according to the present embodiment identifies the target substrate based on the matching rate between the stored registration substrate and the target substrate when the registered substrate having the extracted feature amount is not stored, The extracted feature amount is added to the registration information of the identified registration board and registered.

Therefore, according to the present embodiment, when dirt, scratches, and deterioration over time occur on the substrate surface after the substrate is put into the substrate manufacturing process, by comparing with the feature quantity extracted in at least one previous process, the substrate It is possible to prevent deterioration of the identification accuracy of. That is, according to the present embodiment, even when the surface state of the substrate is changed in the substrate manufacturing process, it is possible to identify each substrate without adding individual identification information to the substrate.

(Second embodiment)
〔Constitution〕
Next, the configuration of the identification device 2 according to the second embodiment of the present invention will be described with reference to the drawings. FIG. 20 is a block diagram of the identification device 2 according to this embodiment. The identification device 2 according to the present embodiment has a configuration in which a control unit 16 is added to the identification device 1 according to the first embodiment. The control unit 16 controls the image capturing unit 13 to capture an image according to a detection signal indicating that the target substrate 100 has been detected.

The identification device 2 includes a storage unit 12, an imaging unit 13, a feature amount extraction unit 14, a collation determination unit 15, and a control unit 16. Since the functional configurations of the storage unit 12, the imaging unit 13, the feature amount extraction unit 14, and the collation determination unit 15 are basically the same as those of the identification device 1 according to the first embodiment, detailed description thereof will be omitted.

The control unit 16 controls the imaging unit 13 according to the shooting instruction signal (also referred to as an instruction signal). The imaging instruction signal is matched with the board registration instruction signal for newly registering the feature amount of the target substrate with respect to the target substrate imaged by the imaging unit 13, and the known feature amount stored in the storage unit 12 for the feature amount of the target substrate. And a board collation instruction signal to be executed.

The control unit 16 detects a shooting instruction signal generated by, for example, pressing a board shooting switch of an operation unit (not shown), and stores the type of the detected shooting instruction signal in the temporary holding area of the storage unit 12. For example, the type of the imaging instruction signal includes a board registration instruction signal for registering the target board in the storage unit 12, and a board verification instruction signal for matching the board registered in the storage unit 12 with the target board.

When registering the target substrate in the storage unit 12, the control unit 16 causes the image capturing unit 13 to capture an image of the target substrate. At this time, the control unit 16 receives information about the target substrate (hereinafter referred to as substrate information) from the operation unit or an external system (for example, a host system), and stores the received substrate information in the temporary holding area of the storage unit 12. For example, the board information includes a board product name, a product number, and the like. The product number can also be regarded as an ID (Identifier) uniquely given to the product.

The control unit 16 combines new board information obtained by adding the registration date and time (current date and time) to the board information stored in the temporary holding area of the storage unit 12 and the feature amount extracted by the feature amount extracting unit 14. The registration information is stored in the data storage area of the storage unit 12. FIG. 21 shows a management table 220 for registering registration information in which board information and feature amounts are associated with each other. In the management table 220, in addition to the characteristic amount extracted in each process, the time when the characteristic amount is registered (registration time) is stored. That is, the storage unit 12 stores, in the management table 220, the times at which the characteristic amounts of the plurality of processes extracted from the target substrate 100 are registered in association with the substrate information. The control unit 16 may store the registration information in a format different from that of the management table 220.

A method of storing registration information in which the board information of the target board and the feature amount are associated with each other in the storage unit 12 will be described below. The control unit 16 stores the registration information including the board information and the feature amount of the target board in the storage unit 12 when receiving the board registration signal as the imaging instruction signal.

First, the control unit 16 controls the image capturing unit 13 to capture an image of the target substrate according to the image capturing instruction signal. Under the control of the control unit 16, the imaging unit 13 captures an image of the surface on the target substrate.

The feature amount extraction unit 14 extracts the feature amount of the substrate from the information of the surface state of the substrate included in the image captured by the image capturing unit 13.

The camera 131 is installed at a position where the surface of the substrate can be imaged under the control of the control unit 16 according to the imaging instruction signal. Further, the camera 131 may be configured to direct the lens in a direction in which the surface of the substrate is imaged based on the control of the control unit 16 according to the image capturing instruction signal.

The feature amount extraction unit 14 detects the edge of the substrate from the image data acquired by the image pickup unit 13 and extracts the feature amount from a predetermined range based on the edge.

Further, when the difference between the hue values (brightness values) of the patterns between the adjacent pixel areas on the image data is equal to or larger than a predetermined threshold value, the feature amount extraction unit 14 sets the positions indicating the hue values (brightness values) between the positions. The relation information may be used as the feature amount.

Then, when the feature amount extraction unit 14 receives the board registration instruction signal, the feature amount extraction unit 14 stores the feature amount extracted by the feature amount extraction unit 14 in the primary holding area of the storage unit 12. At this time, the control unit 16 combines the substrate information of the target substrate stored in the primary holding area and the characteristic amount and stores them in the data storage area of the storage unit 12.

The above is the description of the method of storing the registration information in which the board information and the feature amount are associated with each other in the storage unit 12.

〔motion〕
Next, the operation of the identification device 2 according to this embodiment will be described. FIG. 22 is a flowchart for explaining the operation of the identification device 2. In the operation of FIG. 22, if the registration information of the registered substrate corresponding to the conveyed target substrate is not stored in the storage unit 12, the substrate information of the target substrate can be received from the host system.

In FIG. 22, first, when the imaging unit 13 receives the imaging instruction signal (Yes in step S201), the imaging unit 13 controls the camera 131 to capture an image of the surface of the target substrate 100 and acquires the image data captured by the camera 131. Yes (step S202). If the shooting instruction signal has not been received (No in step S201), the process waits.

The feature amount extraction unit 14 extracts the feature amount from the image data acquired by the image pickup unit 13 (step S203).

The matching determination unit 15 determines whether or not the registration board having the feature amount extracted by the feature amount extraction unit 14 is registered in the storage unit 12 (step S204).

When the registered substrate having the characteristic amount extracted by the characteristic amount extraction unit 14 is registered in the storage unit 12 (Yes in step S204), the collation determination unit 15 determines that the registered substrate is the same as the target substrate. (Step S205). Then, the feature amount extraction unit 14 acquires the board information corresponding to the feature amount from the data storage area of the storage unit 12.

The storage unit 12 stores the extracted feature quantity in association with the board information (step S206). In step S206, the feature amount extraction unit 14 stores the feature amount extracted by the feature amount extraction unit 14 in the data storage area of the storage unit 12. At this time, the control unit 16 adds the registration date and time (current date and time) to the board information stored in the temporary storage area of the storage unit 12, associates the added registration date and time with the feature amount, and stores the data in the storage unit 12. Store in area.

Then, the identification device 2 causes the display unit (not shown) to display the board information of the target board together with information indicating whether the target board to be collated is one of the registered boards registered in the storage unit 12 (step S207). ).

On the other hand, when the registration board having the feature quantity extracted by the feature quantity extraction unit 14 is not registered in the storage unit 12 (No in step S204), the verification determination unit 15 registers the same feature quantity as the target board. It is determined that the board is not registered (step S208). Here, the feature quantity extraction unit 14 acquires board information corresponding to this feature quantity from the host system.

The storage unit 12 stores the extracted feature quantity in association with the board information (step S209). In step S209, the feature amount extraction unit 14 stores the feature amount extracted by the feature amount extraction unit 14 in the data storage area of the storage unit 12. At this time, the control unit 16 adds the registration date and time (current date and time) to the board information stored in the temporary storage area of the storage unit 12, and associates the added registration date and time with the feature amount to store the data in the storage unit 12. Store in area.

Then, the identification device 2 causes the display unit (not shown) to display the board information of the target board together with the information indicating that the target board to be collated is not registered in the storage unit 12 (step S207).

After step S207 or step S210, if the process of FIG. 22 is to be continued (Yes in step S211), the process returns to step S201, and if the process is to be ended (No in step S211), the process of FIG. 22 is ended.

The above is the description of the operation of the identification device 2 according to the present embodiment.

According to the present embodiment, as in the first embodiment, even when the surface state of the substrate is changed in the substrate manufacturing process, the individual substrates are identified without adding the individual identification information to the substrate. be able to.

Further, in the present embodiment, when the feature amount of the target substrate extracted for each process is added to the registration information of the registered substrate corresponding to the feature amount, the registration time at which the feature amount is added is recorded. To do. Therefore, according to the present embodiment, it is possible to trace which process or the process has changed between the feature amounts of the target substrate. Furthermore, when the change in the characteristic amount of the target substrate occurs in a specific process and in a specific pattern, it can be estimated that the inside of the apparatus in the specific process is dirty. From the result, the maintenance time of the device can be estimated.

(Third Embodiment)
〔Constitution〕
Next, a traceability system 30 according to a third embodiment of the present invention will be described with reference to the drawings. In this embodiment, a substrate traceability system 30 in an SMT line configured by a solder printing device, a component mounting device, and a reflow device will be described.

FIG. 23 is a block diagram of the traceability system 30 according to this embodiment. Further, FIG. 24 is a conceptual diagram of the traceability system 30.

As shown in FIG. 23, the traceability system 30 includes an identification device 1, a substrate loading unit 31, a plurality of processing devices 20 (20-1 to 20-3), a substrate unloading unit 33, and a production history server 35. Further, as shown in FIG. 24, the traceability system 30 includes a transporter 110 that transports the target substrate 100 to each processing device 20, and an imaging device 130 that images the target substrate at the entrance of each processing device 20.

The plurality of processing devices 20 are configured to be connected in series, and are devices that perform processes such as solder printing, component mounting, and reflow on the conveyed target substrate. In the present embodiment, the first step processing apparatus 20-1 will be described as a solder printing apparatus, the second step processing apparatus 20-2 as a component mounting apparatus, and the third step processing apparatus 20-3 as a reflow apparatus. Note that, in FIG. 23, the plurality of processing devices 20 are configured by three devices, but may be configured by four or more devices, or may be configured by two devices.

The solder printing device is a device that applies a solder paste to a component mounting portion on a board. The component mounting device is a device for mounting an electronic component on a component mounting portion where a solder paste is printed. The reflow device is a device for mounting an electronic component on a component mounting position by melting and solidifying a solder paste under a programmed temperature condition.

The transporter 110 is a conveyor that is installed so as to connect the plurality of processing apparatuses 20 and transports the input target substrate 100 to the processing apparatus 20 from the upstream side to the downstream side.

The imaging device 130 includes a sensor 132 that detects the conveyed target substrate 100, and a camera that images the surface of the target substrate 100 detected by the sensor 132.

The camera 131 is installed at the entrance of each processing apparatus 20 to capture an image of the substrate surface conveyed to each processing apparatus 20.

The sensor 132 detects that the target substrate 100 transported by the transport device 110 has arrived. The sensor 132 corresponds to a board photographing switch using FIG. The sensor 132 installed at the entrance of the first step processing apparatus 20-1 corresponds to a board photographing switch for board registration, and the sensor 132 installed at the entrance of the other processing apparatus 20 is a board photographing switch for board matching. Equivalent to. Further, the first detection signal output from the sensor 132 installed at the entrance of the first process processor 20-1 corresponds to the board imaging signal for board registration, and the detection signals output from other sensors are It corresponds to a board image pickup signal for board matching.

The production history server 35 registers the substrate passage history when the target substrate 100 has passed through the processing apparatus 20 and the operation history of the apparatus. The production history server 35 is connected to the plurality of processing devices 20 and the identification device 1 by a local area network or the Internet. The production history server 35 may be connected to the board loading unit 31 and the board unloading unit 33.

The identification device 1 is connected to a plurality of cameras 131 corresponding to a plurality of processing devices 20. Further, the identification device 1 is connected to a plurality of sensors 132 that detect the target substrate 100 conveyed to the processing device 20.

The traceability system 30 may include the identification device 2 according to the second embodiment instead of the identification device 1. When the identification device 2 is configured, the detection signal of the sensor 132 can be applied as the shooting instruction signal.

When the identification device 1 receives the detection signal indicating that the target substrate 100 has reached the entrance of the first process processor 20-1, the target substrate 100 is detected by the camera 131 installed at the entrance of the first process processor 20-1. The surface of 100 is imaged.

The identification device 1 extracts a feature amount from the acquired image data of the surface of the target substrate 100, and registers registration information in which the extracted feature amount is associated with the board information of the target substrate 100 in the storage unit 12. Further, the identification device 1 registers the passing date and time or the registration date and time of the target substrate 100 in the storage unit 12 and transmits the information to the production history server 35.

When the identification device 1 receives the detection signal indicating that the target substrate 100 reaches the processing device 20 after the first step, the target substrate 100 is detected by the camera 131 installed at the entrance of the processing device 20 in the process. Image the surface of.

The identification device 1 extracts a feature amount from the acquired image data of the surface of the target substrate 100. The identification device 1 determines that the target substrate 100 is collated with the registered substrate when the registered substrate having the extracted characteristic amount is stored in the storage unit 12. Then, the identification device 1 registers the passing date and time or the registration date and time of the processing device 20 of the process in the storage unit 12 and transmits the information to the production history server 35.

The above is the description of the configuration of the traceability system 30 according to the present embodiment. The traceability system 30 described here is an example, and various changes, additions, and deletions can be added.

The relationship between the above components can be expressed as follows. The plurality of processing apparatuses execute any one of the plurality of steps that form the substrate manufacturing line. The transporter is connected to the plurality of processing devices and transports the substrate to the plurality of processing devices. The identification device images the surface of the substrate in a plurality of steps, extracts a feature amount from the imaged image data of the surface of the substrate, and stores the extracted feature amount in association with the substrate information of the substrate. Then, the identification device collates the feature amount extracted from the arbitrary substrate with the stored feature amount in any step, and when the feature amount extracted from the arbitrary substrate is stored, the identification device It is determined that the substrate having the feature amount extracted from the same and the arbitrary substrate are the same. The production history server registers the passage history when the board passes through the plurality of processing apparatuses and the operation history of the plurality of processing apparatuses in association with the board information.

〔motion〕
Next, the operation of the traceability system 30 according to this embodiment will be described.

25 to 28 are flowcharts for explaining the operation of the traceability system 30.

〔registration process〕
FIG. 25 is a registration process of the target substrate 100 by the identification device 1.

In FIG. 25, first, the identification device 1 stores the substrate information of the target substrate 100 loaded from the substrate loading unit 31 by the user's operation (step S311). The board information is information including the product name and product number (ID) of the target board 100.

The target substrate 100 loaded from the substrate loading unit 31 is transported by the transport device 110 toward the first step processing apparatus 20-1. When the target substrate 100 reaches the entrance of the first step processing apparatus 20-1, the sensor 132 outputs a first detection signal indicating that the target substrate 100 has been detected.

Next, the identification device 1 receives the first detection signal output by the sensor 132 installed at the entrance of the first process processor 20-1 (step S312).

Upon receiving the first detection signal, the identification device 1 controls the camera 131 to capture an image of the surface of the target substrate 100 and acquires image data of the surface of the target substrate 100 (step S313).

The identification device 1 extracts a feature amount from the acquired image data (step S314).

The identification device 1 associates with the substrate information stored in step S311, the passing date and time and the registration date and time (current date and time) when the target substrate 100 passed through the first process processing apparatus 20-1, and the extracted features. The new board information including the quantity is stored in the storage unit 12 (step S315).

Then, the identification device 1 transmits new board information including the product name and product number (ID) of the target board 100 and the passage date and time (registration date and time) to the production history server 35 as a board passage history (step S316).

The above is the description regarding the registration processing of the target substrate 100 by the identification device 1.

[Verification processing]
FIG. 26 is a matching process of the target substrate 100 by the identification device 1. Since the second step and the third step perform the same operation, the third step is shown in parentheses.

When the target substrate 100 reaches the entrance of the second process processing apparatus 20-2 (third process processing apparatus 20-3), a second detection signal (third detection signal) indicating that the target substrate 100 is detected is output. It is output from the sensor 132.

In FIG. 26, first, the identification device 1 outputs a second detection signal (third detection signal) output by the sensor 132 installed at the entrance of the second process processing device 20-2 (third process processing device 20-3). Signal) (step S321).

When the identification device 1 receives the second detection signal (third detection signal), the identification device 1 controls the camera 131 to capture an image of the surface of the target substrate 100 and acquires image data of the surface of the target substrate 100 (step S322). ).

The identification device 1 extracts a feature amount from the acquired image data (step S323).

The identification device 1 collates the extracted feature amount with the feature amount stored in the device itself to identify the target substrate 100 (step S324).

The identification device 1 stores new board information in the storage unit 12 in association with the stored board information (step S325). The new board information includes the passing date and time and the registration date and time (current date and time) when the target substrate 100 has passed through the second step processing apparatus 20-2 (third step processing apparatus 20-3), and the extracted feature amount. including.

Then, the identification device 1 transmits new board information including the product name and product number (ID) of the target board 100 and the passage date and time (registration date and time) to the production history server 35 as a board passage history (step S326).

Here, if the current process is not the last process, the process returns to step S321, and if it is the last process, the series of processes ends (step S327).

The above is the description of the matching process of the target substrate 100 by the identification device 1.

[Process processing]
FIG. 27 shows a process performed by the processing device 20 in each process. Note that n in FIG. 27 indicates a process treatment number, which is 1 in the first process, 2 in the second process, and 3 in the third process.

When the target substrate 100 is transported to the nth process, the nth process processing device 20-n performs a predetermined process process on the target substrate 100 (step S331).

The n-th process processing device 20-n transmits a device operation history including information on process processing to the production history server 35 (step S332). The apparatus operation history is a history including processing time and processing content for the target substrate 100 in each process. For example, in the case of a solder printing device, the device operation history includes the processing time from the start of printing to the end of printing, the type of solder, and the like. Further, for example, in the case of a component mounting device, the device operation history includes the serial number of the mounted component and the like. Further, for example, in the case of a reflow device, the set temperature and temperature profile in the bath are included in the device operation history.

Here, if the current process is not the last process, the process returns to step S331, and if it is the last process, the series of processes ends (step S333).

The above is the description regarding the process processing by the processing device 20 in each process.

[Production history registration process]
28, the production history server 35 receives the passage history of the target substrate 100 transmitted from the identification apparatus 1 and the apparatus operation history transmitted from the processing apparatus 20 of each process, and the received passage history and The present invention relates to a production history registration process for registering a device operation history.

In FIG. 28, first, the production history server 35 receives the board information of the target board 100, the passage history of the first step, and the apparatus operation history (step S341).

The production history server 35 registers the passage history and the apparatus operation history of the first process in association with the board information of the target board 100 (step S342).

For example, it is assumed that the passing time of the target substrate 100 (substrate A) whose product number (ID) is A through the solder printer is 10:00:00 on November 11. In addition, the device operation history of the board A in the first step processing (solder printing processing) shows that the processing time of the first step processing apparatus 20-1 is November 11 from 10:00:00 to 10:00:31. It is assumed that the type of solder is Q type. At this time, the substrate A is processed by the first step processing apparatus 20-1 during the processing time of the first step processing apparatus 20-1 (10:00:00 on November 11). Therefore, the type of solder set in the first step processing apparatus 20-1 during the processing time of the first step processing apparatus 20-1 is Q type. That is, it can be seen that the solder used for the substrate A is Q type based on the passage history and the apparatus operation history in the first step.

Then, the production history server 35 receives the passage history and the device operation history of the second process (step S343).

The production history server 35 registers the passage history and the apparatus operation history of the second process in association with the board information of the target board 100 (step S344).
Then, the production history server 35 receives the passage history and the device operation history of the third process (step S345).

The production history server 35 registers the passage history and the apparatus operation history of the third step in association with the board information of the target board 100 (step S346).

The above is a description of the production history registration processing by the production history server 35.

As described above, in the present embodiment, the board passage history sent from the board identification apparatus and the apparatus operation history sent from various processing apparatuses are registered in combination by the production history server. As a result, according to the present embodiment, traceability can be obtained even when the surface state of the substrate changes at any stage of the substrate manufacturing process.

(hardware)
Finally, a hardware configuration that enables the identification device according to the present embodiment will be described. FIG. 29 is a block diagram showing an example of the hardware configuration of the identification device according to each embodiment of the present invention. FIG. 29 shows a hardware configuration in which a processor 91, a converter 93, a main storage device 95, an input/output interface 96, an image processing circuit 97, and a storage medium 98 are connected by a bus 99. Note that FIG. 29 is a configuration example for realizing the identification device according to each embodiment, and any device or circuit may be added or deleted according to the specifications of the device.

The processor 91 is an arithmetic unit that expands a program stored in the storage medium 98 or the like into the main storage device 95 or the like and executes the expanded program. The processor 91 may be configured by a general central processing unit (CPU). A part of the functions of the feature amount extraction unit 14 and the collation determination unit 15 may be assigned to the processor 91.

The converter 93 is a circuit having a function of converting analog data input from the outside into a digital signal. The converter 93 has an A/D (Analog/Digital) conversion converter that converts analog data into digital data. The converter 93 may have a function of converting the internally generated digital data into an analog signal.

The main storage device 95 is a device having a storage area for temporarily expanding programs and data handled by the processor 91. For example, a random access memory (RAM) can be configured as the main storage device 95.

The input/output interface 96 is an interface for exchanging data with an external or internal input/output device. For example, the input/output interface 96 is connected to the camera 131 and the sensor 132. The input/output interface 96 may be connected to an input device such as a keyboard and a mouse (not shown), an output device such as a display and a printer (not shown), and a network connected to an external computer or server.

The image processing circuit 97 is a circuit that performs various processes on image data. The image processing circuit 97 is, for example, an integrated circuit that performs image processing such as dark current correction, interpolation calculation, color space conversion, gamma correction, aberration correction, noise reduction, and image compression on the imaged data. The image processing circuit 97 may be configured to be able to execute processing other than the above-described image processing. When the feature amount extraction unit 14 performs image processing when processing image data, part of the function may be assigned to the image processing circuit 97.

The storage medium 98 is a medium that stores programs and data. For example, a hard disk or the like can be used as the storage medium 98. A ROM (Read Only Memory) may be configured as the storage medium 98. The function of the storage unit 12 may be assigned to the main storage device 95. The storage medium 98 may be realized by a semiconductor recording medium such as an SD (Secure Digital) card or a USB (Universal Serial Bus) memory. The storage medium 98 may be realized by a magnetic recording medium such as a flexible disk, an optical recording medium such as a CD (Compact Disc) or a DVD (Digital Versatile Disc), or a recording medium using other principles.

The above is an example of the hardware configuration for enabling the identification device according to the embodiment of the present invention. The hardware configuration of FIG. 29 is an example of the hardware configuration for enabling the identification device according to the present embodiment, and does not limit the scope of the present invention. A processing program that causes a computer to execute the processing by the identification device according to the present embodiment is also included in the scope of the present invention. Further, a program recording medium recording the processing program according to the embodiment of the present invention is also included in the scope of the present invention.

Although the present invention has been described with reference to the exemplary embodiments, the present invention is not limited to the above exemplary embodiments. Various changes that can be understood by those skilled in the art can be made to the configuration and details of the present invention within the scope of the present invention.

1, 2 Identification device 12 Storage unit 13 Imaging unit 14 Feature amount extraction unit 15 Matching determination unit 16 Control unit 20 Process processor 30 Traceability system 31 Substrate input unit 33 Substrate ejection unit 35 Production history server 100 Target substrate 101 Base material 102 Glass Fiber 130 Imaging device 131 Camera 132 Sensor

Claims (10)

An imaging unit that images the surface of the substrate in a plurality of steps that make up the substrate manufacturing line;
A feature amount extraction unit that extracts a feature amount from image data of the surface of the substrate captured by the image capturing unit;
A storage unit that stores the feature quantity extracted by the feature quantity extraction unit in association with the board information of the board;
In any of the steps, the characteristic amount extracted from an arbitrary substrate is compared with the characteristic amount stored in the storage unit, and the characteristic amount extracted from the arbitrary substrate and the characteristic amount stored in the storage unit are compared with each other. and a verification determining unit that identifies the arbitrary substrate based on the matching condition,
The feature amount extraction unit,
When the first characteristic amount and the second characteristic amount extracted from the image data on the surface of the substrate have a common characteristic portion, the waveform of the common characteristic portion is extracted as the characteristic amount,
The collation determination unit,
The common characteristic portion said characteristic quantity extracted from, that identifies the arbitrary substrate based on the matching condition between the feature amount extracted from the arbitrary substrate identification device. The collation determination unit,
When the characteristic amount extracted from the arbitrary substrate is stored in the storage unit, it is determined that the substrate and the arbitrary substrate having the characteristic amount extracted from the arbitrary substrate are the same,
When the feature amount extracted from the arbitrary substrate is not stored in the storage unit, the substrate having the feature amount having the highest matching rate with the feature amount extracted from the arbitrary substrate and the arbitrary substrate The identification device according to claim 1, wherein the identification devices are determined to be the same. The feature amount extraction unit,
The identification device according to claim 1, wherein at least one of outline information, hue information, and luminance information of a pattern appearing on the surface of the substrate is extracted as a feature amount. The imaging unit is
Of the inlet and outlet of the plurality of processing devices to share the plurality of steps have a camera for imaging a surface of the substrate at least one,
The dirt or scratches the processing apparatus per easy step to the substrate, identification apparatus according to any one of claims 1 to 3 for both the inlet and outlet the camera Ru is located. The identification device according to claim 1, further comprising a control unit configured to control the imaging unit to capture an image according to a detection signal indicating that the substrate has been detected. The storage unit is
The identification device according to claim 1, wherein information including a product name and a product number of the board is stored as the board information. The storage unit is
The identification device according to any one of claims 1 to 6, which stores a management table that manages a feature amount for each of a plurality of steps extracted from the board in association with the board information. The storage unit is
The identification device according to claim 7, wherein the time when the characteristic amount of each of the plurality of steps extracted from the board is registered is stored in the management table in association with the board information. A plurality of processing devices for performing any one of a plurality of steps constituting the substrate manufacturing line,
A transporter connected to the plurality of processing apparatuses and configured to transport a substrate to the plurality of processing apparatuses,
An image of the surface of the substrate is captured in the plurality of steps, a feature amount is extracted from the imaged image data of the surface of the substrate, and the extracted feature amount is stored in association with the substrate information of the substrate. In the process, the feature amount extracted from the arbitrary substrate and the stored feature amount are collated, and the arbitrary substrate is selected based on the matching condition between the feature amount extracted from the arbitrary substrate and the stored feature amount. An identification device for identification,
A production history server that registers a passage history when the substrate passes through the plurality of processing devices and an operation history of the plurality of processing devices in association with the substrate information ;
The identification device is
When the first characteristic amount and the second characteristic amount extracted from the image data on the surface of the substrate have a common characteristic portion, the waveform of the common characteristic portion is extracted as the characteristic amount,
Traceability system wherein a common characteristic portion said characteristic quantity extracted from, that identifies the arbitrary substrate based on the matching condition between the feature amount extracted from the arbitrary substrate. Imaging the surface of the board in multiple steps that make up the board manufacturing line,
Extracting a feature amount from the imaged image data of the surface of the substrate,
The extracted feature quantity is stored in association with the board information of the board,
In any of the steps, collate the feature amount extracted from any board with the stored feature amount,
Identifying the arbitrary board based on a matching condition between the characteristic quantity extracted from the arbitrary board and the stored characteristic quantity ,
When the first characteristic amount and the second characteristic amount extracted from the image data on the surface of the substrate have a common characteristic portion, the waveform of the common characteristic portion is extracted as the characteristic amount,
The common feature with the feature amount extracted from the site, the identification method of identifying the any substrate on the basis of the matching condition between the feature amount extracted from the arbitrary substrate.

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