JP6643856B2 - 分類方法、検査方法、検査装置、およびプログラム - Google Patents

分類方法、検査方法、検査装置、およびプログラム Download PDF

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JP6643856B2
JP6643856B2 JP2015199722A JP2015199722A JP6643856B2 JP 6643856 B2 JP6643856 B2 JP 6643856B2 JP 2015199722 A JP2015199722 A JP 2015199722A JP 2015199722 A JP2015199722 A JP 2015199722A JP 6643856 B2 JP6643856 B2 JP 6643856B2
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JP2016110625A (ja
JP2016110625A5 (enExample
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英則 橋口
英則 橋口
洋志 奥田
洋志 奥田
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Canon Inc
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Canon Inc
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Priority to US14/943,512 priority Critical patent/US10248888B2/en
Priority to CN201510847745.6A priority patent/CN105654109B/zh
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/24—Classification techniques
    • G06F18/241—Classification techniques relating to the classification model, e.g. parametric or non-parametric approaches
    • G06F18/2415—Classification techniques relating to the classification model, e.g. parametric or non-parametric approaches based on parametric or probabilistic models, e.g. based on likelihood ratio or false acceptance rate versus a false rejection rate

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Data Mining & Analysis (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Engineering & Computer Science (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Evolutionary Biology (AREA)
  • Evolutionary Computation (AREA)
  • Artificial Intelligence (AREA)
  • General Physics & Mathematics (AREA)
  • Probability & Statistics with Applications (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
  • Information Retrieval, Db Structures And Fs Structures Therefor (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP2015199722A 2014-11-28 2015-10-07 分類方法、検査方法、検査装置、およびプログラム Expired - Fee Related JP6643856B2 (ja)

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US14/943,512 US10248888B2 (en) 2014-11-28 2015-11-17 Classifying method, storage medium, inspection method, and inspection apparatus
CN201510847745.6A CN105654109B (zh) 2014-11-28 2015-11-27 分类方法、检查方法和检查装置

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JP2014242305 2014-11-28
JP2014242305 2014-11-28

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JP2016110625A JP2016110625A (ja) 2016-06-20
JP2016110625A5 JP2016110625A5 (enExample) 2018-11-15
JP6643856B2 true JP6643856B2 (ja) 2020-02-12

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Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6381144B2 (ja) * 2016-10-06 2018-08-29 ソリッドビジョン株式会社 撮像処理装置
JP6786035B2 (ja) * 2017-03-27 2020-11-18 三菱重工業株式会社 航空機用部品の欠陥検出システム及び航空機用部品の欠陥検出方法
JP7130984B2 (ja) * 2018-03-01 2022-09-06 日本電気株式会社 画像判定システム、モデル更新方法およびモデル更新プログラム
WO2019194064A1 (ja) * 2018-04-02 2019-10-10 日本電産株式会社 画像処理装置、画像処理方法、外観検査システムおよび外観検査方法
JP2018164272A (ja) * 2018-05-28 2018-10-18 ソリッドビジョン株式会社 撮像処理装置

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001156135A (ja) * 1999-11-29 2001-06-08 Hitachi Ltd 欠陥画像の分類方法及びその装置並びにそれを用いた半導体デバイスの製造方法
JP4606779B2 (ja) * 2004-06-07 2011-01-05 グローリー株式会社 画像認識装置、画像認識方法およびその方法をコンピュータに実行させるプログラム
US20060193520A1 (en) * 2005-02-28 2006-08-31 Takeshi Mita Object detection apparatus, learning apparatus, object detection system, object detection method and object detection program
JP2009080557A (ja) * 2007-09-25 2009-04-16 Seiko Epson Corp 識別方法及びプログラム
JP4629118B2 (ja) * 2008-03-03 2011-02-09 株式会社日立ハイテクノロジーズ 欠陥検査装置およびこの欠陥検査装置に用いるパラメータ調整方法。
JP2009282699A (ja) * 2008-05-21 2009-12-03 Seiko Epson Corp 画像における顔の器官の画像に対応する器官領域の検出
JP5414416B2 (ja) * 2008-09-24 2014-02-12 キヤノン株式会社 情報処理装置及び方法
JP4670976B2 (ja) * 2008-10-03 2011-04-13 ソニー株式会社 学習装置および方法、認識装置および方法、プログラム、並びに記録媒体
JP4710979B2 (ja) * 2009-01-09 2011-06-29 ソニー株式会社 対象物検出装置、学習装置、対象物検出方法およびプログラム
EP2678665A4 (en) * 2011-02-24 2017-07-05 3M Innovative Properties Company System for detection of non-uniformities in web-based materials
JP5214762B2 (ja) * 2011-03-25 2013-06-19 株式会社東芝 認識装置、方法及びプログラム
JP2013117861A (ja) * 2011-12-02 2013-06-13 Canon Inc 学習装置、学習方法およびプログラム

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JP2016110625A (ja) 2016-06-20
CN105654109A (zh) 2016-06-08
CN105654109B (zh) 2019-03-05

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