CN105654109B - 分类方法、检查方法和检查装置 - Google Patents

分类方法、检查方法和检查装置 Download PDF

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Publication number
CN105654109B
CN105654109B CN201510847745.6A CN201510847745A CN105654109B CN 105654109 B CN105654109 B CN 105654109B CN 201510847745 A CN201510847745 A CN 201510847745A CN 105654109 B CN105654109 B CN 105654109B
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group
evaluation
image
estimate
sample
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CN201510847745.6A
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Chinese (zh)
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CN105654109A (zh
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桥口英则
奥田洋志
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Canon Inc
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Canon Inc
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    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00Pattern recognition
    • G06F18/20Analysing
    • G06F18/24Classification techniques
    • G06F18/241Classification techniques relating to the classification model, e.g. parametric or non-parametric approaches
    • G06F18/2415Classification techniques relating to the classification model, e.g. parametric or non-parametric approaches based on parametric or probabilistic models, e.g. based on likelihood ratio or false acceptance rate versus a false rejection rate

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Data Mining & Analysis (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Engineering & Computer Science (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Evolutionary Biology (AREA)
  • Evolutionary Computation (AREA)
  • Artificial Intelligence (AREA)
  • General Physics & Mathematics (AREA)
  • Probability & Statistics with Applications (AREA)
  • Image Analysis (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
  • Information Retrieval, Db Structures And Fs Structures Therefor (AREA)
CN201510847745.6A 2014-11-28 2015-11-27 分类方法、检查方法和检查装置 Expired - Fee Related CN105654109B (zh)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2014242305 2014-11-28
JP2014-242305 2014-11-28
JP2015199722A JP6643856B2 (ja) 2014-11-28 2015-10-07 分類方法、検査方法、検査装置、およびプログラム
JP2015-199722 2015-10-07

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CN105654109A CN105654109A (zh) 2016-06-08
CN105654109B true CN105654109B (zh) 2019-03-05

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CN (1) CN105654109B (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6381144B2 (ja) * 2016-10-06 2018-08-29 ソリッドビジョン株式会社 撮像処理装置
JP6786035B2 (ja) * 2017-03-27 2020-11-18 三菱重工業株式会社 航空機用部品の欠陥検出システム及び航空機用部品の欠陥検出方法
JP7130984B2 (ja) * 2018-03-01 2022-09-06 日本電気株式会社 画像判定システム、モデル更新方法およびモデル更新プログラム
WO2019194064A1 (ja) * 2018-04-02 2019-10-10 日本電産株式会社 画像処理装置、画像処理方法、外観検査システムおよび外観検査方法
JP2018164272A (ja) * 2018-05-28 2018-10-18 ソリッドビジョン株式会社 撮像処理装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1828632A (zh) * 2005-02-28 2006-09-06 株式会社东芝 目标检测装置、学习装置、目标检测系统及目标检测方法
CN101794392A (zh) * 2009-01-09 2010-08-04 索尼公司 对象检测设备、学习设备、对象检测方法和程序
CN102165488A (zh) * 2008-09-24 2011-08-24 佳能株式会社 用于选择用于分类输入数据的特征的信息处理设备

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001156135A (ja) * 1999-11-29 2001-06-08 Hitachi Ltd 欠陥画像の分類方法及びその装置並びにそれを用いた半導体デバイスの製造方法
JP4606779B2 (ja) * 2004-06-07 2011-01-05 グローリー株式会社 画像認識装置、画像認識方法およびその方法をコンピュータに実行させるプログラム
JP2009080557A (ja) * 2007-09-25 2009-04-16 Seiko Epson Corp 識別方法及びプログラム
JP4629118B2 (ja) * 2008-03-03 2011-02-09 株式会社日立ハイテクノロジーズ 欠陥検査装置およびこの欠陥検査装置に用いるパラメータ調整方法。
JP2009282699A (ja) * 2008-05-21 2009-12-03 Seiko Epson Corp 画像における顔の器官の画像に対応する器官領域の検出
JP4670976B2 (ja) * 2008-10-03 2011-04-13 ソニー株式会社 学習装置および方法、認識装置および方法、プログラム、並びに記録媒体
EP2678665A4 (en) * 2011-02-24 2017-07-05 3M Innovative Properties Company System for detection of non-uniformities in web-based materials
JP5214762B2 (ja) * 2011-03-25 2013-06-19 株式会社東芝 認識装置、方法及びプログラム
JP2013117861A (ja) * 2011-12-02 2013-06-13 Canon Inc 学習装置、学習方法およびプログラム

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1828632A (zh) * 2005-02-28 2006-09-06 株式会社东芝 目标检测装置、学习装置、目标检测系统及目标检测方法
CN102165488A (zh) * 2008-09-24 2011-08-24 佳能株式会社 用于选择用于分类输入数据的特征的信息处理设备
CN101794392A (zh) * 2009-01-09 2010-08-04 索尼公司 对象检测设备、学习设备、对象检测方法和程序

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JP2016110625A (ja) 2016-06-20
CN105654109A (zh) 2016-06-08
JP6643856B2 (ja) 2020-02-12

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