JP6620913B1 - リザボア素子及びニューロモルフィック素子 - Google Patents
リザボア素子及びニューロモルフィック素子 Download PDFInfo
- Publication number
- JP6620913B1 JP6620913B1 JP2019530519A JP2019530519A JP6620913B1 JP 6620913 B1 JP6620913 B1 JP 6620913B1 JP 2019530519 A JP2019530519 A JP 2019530519A JP 2019530519 A JP2019530519 A JP 2019530519A JP 6620913 B1 JP6620913 B1 JP 6620913B1
- Authority
- JP
- Japan
- Prior art keywords
- layer
- ferromagnetic layer
- ferromagnetic
- reservoir element
- reservoir
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 230000005294 ferromagnetic effect Effects 0.000 claims abstract description 187
- 230000005291 magnetic effect Effects 0.000 claims description 29
- 230000005381 magnetic domain Effects 0.000 claims description 12
- 229910045601 alloy Inorganic materials 0.000 claims description 5
- 239000000956 alloy Substances 0.000 claims description 5
- 229910003271 Ni-Fe Inorganic materials 0.000 claims description 4
- 229910020516 Co—V Inorganic materials 0.000 claims description 3
- 229910017082 Fe-Si Inorganic materials 0.000 claims description 3
- 229910017133 Fe—Si Inorganic materials 0.000 claims description 3
- 229910002796 Si–Al Inorganic materials 0.000 claims description 3
- 229910008423 Si—B Inorganic materials 0.000 claims description 3
- 230000007480 spreading Effects 0.000 claims description 3
- 238000003892 spreading Methods 0.000 claims description 3
- 239000010410 layer Substances 0.000 description 220
- 230000005415 magnetization Effects 0.000 description 22
- 239000000463 material Substances 0.000 description 21
- 230000000694 effects Effects 0.000 description 8
- 238000004519 manufacturing process Methods 0.000 description 7
- 239000000758 substrate Substances 0.000 description 7
- 230000008859 change Effects 0.000 description 5
- 210000004556 brain Anatomy 0.000 description 4
- 229910001291 heusler alloy Inorganic materials 0.000 description 4
- 229910052751 metal Inorganic materials 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 210000002569 neuron Anatomy 0.000 description 4
- 229910052759 nickel Inorganic materials 0.000 description 4
- 229910020068 MgAl Inorganic materials 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 3
- 230000001427 coherent effect Effects 0.000 description 3
- 239000004020 conductor Substances 0.000 description 3
- 239000003302 ferromagnetic material Substances 0.000 description 3
- 230000003993 interaction Effects 0.000 description 3
- 239000011229 interlayer Substances 0.000 description 3
- 229910052748 manganese Inorganic materials 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 238000001020 plasma etching Methods 0.000 description 3
- 210000000225 synapse Anatomy 0.000 description 3
- 229910000640 Fe alloy Inorganic materials 0.000 description 2
- 229910001106 Ho alloy Inorganic materials 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- 230000005290 antiferromagnetic effect Effects 0.000 description 2
- 238000005229 chemical vapour deposition Methods 0.000 description 2
- 229910052804 chromium Inorganic materials 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 229910052733 gallium Inorganic materials 0.000 description 2
- 229910052732 germanium Inorganic materials 0.000 description 2
- 229910052742 iron Inorganic materials 0.000 description 2
- 150000002739 metals Chemical class 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 229910052763 palladium Inorganic materials 0.000 description 2
- 229910052697 platinum Inorganic materials 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 229910052723 transition metal Inorganic materials 0.000 description 2
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 1
- 229910020598 Co Fe Inorganic materials 0.000 description 1
- 229910002519 Co-Fe Inorganic materials 0.000 description 1
- 229910005347 FeSi Inorganic materials 0.000 description 1
- 229910052688 Gadolinium Inorganic materials 0.000 description 1
- 229910017028 MnSi Inorganic materials 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- 229910052771 Terbium Inorganic materials 0.000 description 1
- 238000013528 artificial neural network Methods 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 239000002902 ferrimagnetic material Substances 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 229910000765 intermetallic Inorganic materials 0.000 description 1
- CPLXHLVBOLITMK-UHFFFAOYSA-N magnesium oxide Inorganic materials [Mg]=O CPLXHLVBOLITMK-UHFFFAOYSA-N 0.000 description 1
- 230000003278 mimic effect Effects 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 229910000510 noble metal Inorganic materials 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 241000894007 species Species 0.000 description 1
- 238000000992 sputter etching Methods 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 150000003624 transition metals Chemical class 0.000 description 1
- 229910052720 vanadium Inorganic materials 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/161—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect details concerning the memory cell structure, e.g. the layers of the ferromagnetic memory cell
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/80—Constructional details
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/32—Spin-exchange-coupled multilayers, e.g. nanostructured superlattices
- H01F10/324—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer
- H01F10/3254—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer the spacer being semiconducting or insulating, e.g. for spin tunnel junction [STJ]
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N3/00—Computing arrangements based on biological models
- G06N3/02—Neural networks
- G06N3/04—Architecture, e.g. interconnection topology
- G06N3/044—Recurrent networks, e.g. Hopfield networks
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N3/00—Computing arrangements based on biological models
- G06N3/02—Neural networks
- G06N3/06—Physical realisation, i.e. hardware implementation of neural networks, neurons or parts of neurons
- G06N3/063—Physical realisation, i.e. hardware implementation of neural networks, neurons or parts of neurons using electronic means
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N3/00—Computing arrangements based on biological models
- G06N3/02—Neural networks
- G06N3/06—Physical realisation, i.e. hardware implementation of neural networks, neurons or parts of neurons
- G06N3/063—Physical realisation, i.e. hardware implementation of neural networks, neurons or parts of neurons using electronic means
- G06N3/065—Analogue means
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N3/00—Computing arrangements based on biological models
- G06N3/02—Neural networks
- G06N3/08—Learning methods
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/32—Spin-exchange-coupled multilayers, e.g. nanostructured superlattices
- H01F10/324—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer
- H01F10/329—Spin-exchange coupled multilayers wherein the magnetisation of the free layer is switched by a spin-polarised current, e.g. spin torque effect
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/80—Constructional details
- H10N50/85—Magnetic active materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/01—Manufacture or treatment
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biomedical Technology (AREA)
- Biophysics (AREA)
- Computing Systems (AREA)
- Software Systems (AREA)
- Evolutionary Computation (AREA)
- General Health & Medical Sciences (AREA)
- Molecular Biology (AREA)
- Computational Linguistics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Mathematical Physics (AREA)
- Data Mining & Analysis (AREA)
- Artificial Intelligence (AREA)
- Neurology (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Hall/Mr Elements (AREA)
- Mram Or Spin Memory Techniques (AREA)
Abstract
Description
図1は、第1実施形態にかかるニューロモルフィック素子の概念図である。ニューロモルフィック素子100は、入力部20とリザボア素子10と出力部30とを有する。入力部20及び出力部30は、リザボア素子10に接続されている。
非磁性層3が絶縁体の場合(トンネルバリア層である場合)、非磁性層3は、例えば、Al2O3、SiO2、MgO、MgAl2O4等である。また非磁性層3は、上記の材料におけるAl、Si、Mgの一部が、Zn、Be等に置換された材料等でもよい。MgO、MgAl2O4は、第1強磁性層1と第2強磁性層2との間でコヒーレントトンネル現象を実現でき、第1強磁性層1から第2強磁性層2へスピンを効率よく注入できる。非磁性層3が金属の場合、非磁性層3は、例えば、Cu、Au、Ag等である。また非磁性層3が半導体の場合、非磁性層3は、例えば、Si、Ge、CuInSe2、CuGaSe2、Cu(In,Ga)Se2等である。
図9は、第2実施形態にかかるリザボア素子の断面図である。第2実施形態にかかるリザボア素子11は、ビア配線4を複数有さない点が、第1実施形態にかかるリザボア素子10と異なる。その他の構成は、第1実施形態にかかるリザボア素子10と同一であり、説明を省く。また図9において、図1と同一の構成には同一の符号を付す。
図10は、第3実施形態にかかるリザボア素子の断面図である。第3実施形態にかかるリザボア素子12は、共通電極層5を有する点が、第1実施形態にかかるリザボア素子10と異なる。その他の構成は、第1実施形態にかかるリザボア素子10と同一であり、説明を省く。また図10において、図1と同一の構成には同一の符号を付す。
図11は、第4実施形態にかかるリザボア素子の断面図である。第4実施形態にかかるリザボア素子13は、磁気干渉層6を有する点が、第1実施形態にかかるリザボア素子10と異なる。その他の構成は、第1実施形態にかかるリザボア素子10と同一であり、説明を省く。また図11において、図1と同一の構成には同一の符号を付す。
2 第2強磁性層
2’ 強磁性層
3 非磁性層
4 ビア配線
5 共通電極層
6 磁気干渉層
10、10A、10B、10C、11、12、13 リザボア素子
20 入力部
30 出力部
100 ニューロモルフィック素子
A 集合体
Cp チップ
HM ハードマスク
I 層間絶縁膜
Sb 基板
Claims (8)
- 第1強磁性層と、
前記第1強磁性層に対して第1方向に位置し、前記第1方向からの平面視で互いに離間して配置された複数の第2強磁性層と、
前記第1強磁性層と前記複数の第2強磁性層との間に位置する非磁性層と、
前記第1強磁性層と電気的に接続されたビア配線と、を備え、
前記複数の第2強磁性層のうち隣接する第2強磁性層のそれぞれから前記ビア配線に向って書き込み電流が流れた際に、前記隣接する第2強磁性層のそれぞれから広がる磁区が相互作用する、リザボア素子。 - 前記ビア配線が複数あり、
複数のビア配線のそれぞれは、前記第1強磁性層の前記非磁性層と反対側の面と電気的に接続され、前記第1方向からの平面視で、前記複数の第2強磁性層のそれぞれと重なる位置にある、請求項1に記載のリザボア素子。 - 前記第1強磁性層の前記非磁性層と反対側の面に接し、前記第1強磁性層よりも保磁率の小さい磁気干渉層を備える、請求項1又は2に記載のリザボア素子。
- 前記磁気干渉層は、Fe−Si、Fe−Si−Al、Fe−Co−V、Ni−Fe、Co−Fe−Si−Bのいずれかを含む合金である、請求項3に記載のリザボア素子。
- 前記複数のビア配線のうち少なくとも2つ以上のビア配線を繋ぐ共通電極層をさらに備える、請求項2に記載のリザボア素子。
- 前記複数の第2強磁性層は、前記第1方向からの平面視で六方格子状に配列している、請求項1〜5のいずれか一項に記載のリザボア素子。
- 前記複数の第2強磁性層は、前記第1方向からの平面視で第2強磁性層が密集した集合体を複数形成し、前記集合体において、前記第2強磁性層は六方格子状に配列している、請求項1〜5のいずれか一項に記載のリザボア素子。
- 請求項1〜7のいずれか一項に記載のリザボア素子と、
前記リザボア素子に接続された入力部と、
前記リザボア素子に接続され、前記リザボア素子からの信号を学習する出力部と、を備える、ニューロモルフィック素子。
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2018/033798 WO2020053987A1 (ja) | 2018-09-12 | 2018-09-12 | リザボア素子及びニューロモルフィック素子 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP6620913B1 true JP6620913B1 (ja) | 2019-12-18 |
JPWO2020053987A1 JPWO2020053987A1 (ja) | 2020-10-22 |
Family
ID=68581132
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2019530519A Active JP6620913B1 (ja) | 2018-09-12 | 2018-09-12 | リザボア素子及びニューロモルフィック素子 |
Country Status (5)
Country | Link |
---|---|
US (1) | US11588099B2 (ja) |
EP (1) | EP3640960B1 (ja) |
JP (1) | JP6620913B1 (ja) |
CN (1) | CN110895952B (ja) |
WO (1) | WO2020053987A1 (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6908210B1 (ja) * | 2020-03-26 | 2021-07-21 | Tdk株式会社 | パラメータの設定方法およびリザボア素子の制御方法 |
US11810700B2 (en) | 2018-10-30 | 2023-11-07 | Tanaka Kikinzoku Kogyo K.K. | In-plane magnetized film, in-plane magnetized film multilayer structure, hard bias layer, magnetoresistive element, and sputtering target |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6803575B2 (ja) * | 2016-06-24 | 2020-12-23 | 国立研究開発法人物質・材料研究機構 | I−iii−vi2化合物半導体を用いた磁気抵抗素子及びその製造方法、これを用いた磁気記憶装置並びにスピントランジスタ |
JP7120485B1 (ja) * | 2021-06-24 | 2022-08-17 | Tdk株式会社 | 情報処理装置 |
EP4160484A1 (en) | 2021-10-01 | 2023-04-05 | Centre national de la recherche scientifique | « in materio computing » classification device |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20140214738A1 (en) * | 2013-01-29 | 2014-07-31 | Hewlett-Packard Development Company, L.P. | Neuristor-based reservoir computing devices |
WO2014207818A1 (ja) * | 2013-06-25 | 2014-12-31 | 株式会社日立製作所 | スピン波回路 |
US20170330070A1 (en) * | 2016-02-28 | 2017-11-16 | Purdue Research Foundation | Spin orbit torque based electronic neuron |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001267522A (ja) * | 2000-03-23 | 2001-09-28 | Sharp Corp | 磁気メモリ素子及び磁気メモリ |
JP2004164692A (ja) * | 2002-11-08 | 2004-06-10 | Toshiba Corp | 磁気記録媒体及びその製造方法 |
CN1755929B (zh) * | 2004-09-28 | 2010-08-18 | 飞思卡尔半导体(中国)有限公司 | 形成半导体封装及其结构的方法 |
US7443638B2 (en) * | 2005-04-22 | 2008-10-28 | Taiwan Semiconductor Manufacturing Company Ltd. | Magnetoresistive structures and fabrication methods |
US8194364B2 (en) * | 2009-08-31 | 2012-06-05 | Tdk Corporation | Magnetoresistive effect element in CPP-type structure including ferromagnetic layer configured with CoFe system alloy and magnetic disk device therewith |
JP5150673B2 (ja) * | 2010-03-19 | 2013-02-20 | 株式会社東芝 | スピンメモリおよびスピントランジスタ |
JP5514059B2 (ja) * | 2010-09-17 | 2014-06-04 | 株式会社東芝 | 磁気抵抗効果素子及び磁気ランダムアクセスメモリ |
EP2503556B1 (en) * | 2011-03-25 | 2016-10-12 | Technische Universität Dresden | Memristive system |
JP2012209358A (ja) * | 2011-03-29 | 2012-10-25 | Renesas Electronics Corp | 磁気記憶素子および磁気記憶装置 |
US10395168B2 (en) * | 2015-10-26 | 2019-08-27 | International Business Machines Corporation | Tunable optical neuromorphic network |
WO2017213261A1 (ja) | 2016-06-10 | 2017-12-14 | Tdk株式会社 | 交換バイアス利用型磁化反転素子、交換バイアス利用型磁気抵抗効果素子、交換バイアス利用型磁気メモリ、不揮発性ロジック回路および磁気ニューロン素子 |
JP6724646B2 (ja) * | 2016-08-10 | 2020-07-15 | Tdk株式会社 | 磁気抵抗効果素子、熱履歴センサおよびスピングラス利用型磁気メモリ |
FR3084503B1 (fr) * | 2018-07-26 | 2020-10-16 | Thales Sa | Chaîne synaptique comprenant des resonateurs spintroniques bases sur l'effet de diode de spin et reseau de neurones comprenant une telle chaîne synaptique |
FR3084505B1 (fr) * | 2018-07-26 | 2021-09-10 | Thales Sa | Reseau de neurones comportant des resonateurs spintroniques |
-
2018
- 2018-09-12 WO PCT/JP2018/033798 patent/WO2020053987A1/ja active Application Filing
- 2018-09-12 JP JP2019530519A patent/JP6620913B1/ja active Active
-
2019
- 2019-09-10 US US16/566,003 patent/US11588099B2/en active Active
- 2019-09-10 EP EP19196454.3A patent/EP3640960B1/en active Active
- 2019-09-11 CN CN201910858696.4A patent/CN110895952B/zh active Active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20140214738A1 (en) * | 2013-01-29 | 2014-07-31 | Hewlett-Packard Development Company, L.P. | Neuristor-based reservoir computing devices |
WO2014207818A1 (ja) * | 2013-06-25 | 2014-12-31 | 株式会社日立製作所 | スピン波回路 |
US20170330070A1 (en) * | 2016-02-28 | 2017-11-16 | Purdue Research Foundation | Spin orbit torque based electronic neuron |
Non-Patent Citations (3)
Title |
---|
M.RIOU ET AL.: "Neuromorphic Computing through Time-Multiplexing with a Spin-Torque Nano-Oscillator", IEEE CONFERENCE PROCEEDINGS, vol. 2017, JPN7019002525, 2017, pages 36 - 3, ISSN: 0004136931 * |
TORREJON, JACOB ET AL.: "Neuromorphic Computing with nanoscale spintronic oscillators", NATURE, vol. 547, no. 7664, JPN7019002526, 27 July 2017 (2017-07-27), pages 428 - 431, XP055593242, ISSN: 0004136932, DOI: 10.1038/nature23011 * |
常木澄人: "スピントルク発振素子を用いたリザーバーコンピューティング", 第65回応用物理学会春季学術講演会講演予稿集, JPN7019002527, 5 March 2018 (2018-03-05), pages 104 - 7, ISSN: 0004136930 * |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11810700B2 (en) | 2018-10-30 | 2023-11-07 | Tanaka Kikinzoku Kogyo K.K. | In-plane magnetized film, in-plane magnetized film multilayer structure, hard bias layer, magnetoresistive element, and sputtering target |
JP6908210B1 (ja) * | 2020-03-26 | 2021-07-21 | Tdk株式会社 | パラメータの設定方法およびリザボア素子の制御方法 |
WO2021192147A1 (ja) * | 2020-03-26 | 2021-09-30 | Tdk株式会社 | パラメータの設定方法およびリザボア素子の制御方法 |
Also Published As
Publication number | Publication date |
---|---|
JPWO2020053987A1 (ja) | 2020-10-22 |
CN110895952B (zh) | 2023-07-18 |
CN110895952A (zh) | 2020-03-20 |
US11588099B2 (en) | 2023-02-21 |
WO2020053987A1 (ja) | 2020-03-19 |
EP3640960B1 (en) | 2023-07-05 |
EP3640960A1 (en) | 2020-04-22 |
US20200083434A1 (en) | 2020-03-12 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP6620913B1 (ja) | リザボア素子及びニューロモルフィック素子 | |
US10916480B2 (en) | Magnetic wall utilization type analog memory device, magnetic wall utilization type analog memory, nonvolatile logic circuit, and magnetic neuro device | |
JP6620915B1 (ja) | リザボア素子及びニューロモルフィック素子 | |
CN110462814B (zh) | 自旋元件及磁存储器 | |
US10490735B2 (en) | Magnetic memory | |
WO2017183573A1 (ja) | 磁壁利用型アナログメモリ素子および磁壁利用型アナログメモリ | |
JP6642773B2 (ja) | スピン流磁化反転素子、スピン軌道トルク型磁気抵抗効果素子、及びスピン流磁化反転素子の製造方法 | |
US20180301199A1 (en) | Magnetic domain wall type analog memory element, magnetic domain wall type analog memory, nonvolatile logic circuit, and magnetic neuro-element | |
JP6551594B1 (ja) | スピン軌道トルク型磁気抵抗効果素子及び磁気メモリ | |
JP2019161176A (ja) | スピン軌道トルク型磁化回転素子、スピン軌道トルク型磁気抵抗効果素子、磁気メモリ及び発振器 | |
JP2019041098A (ja) | スピン流磁気抵抗効果素子及び磁気メモリ | |
JP2019047110A (ja) | スピン流磁化反転素子、スピン軌道トルク型磁気抵抗効果素子、磁気メモリ及び高周波磁気素子 | |
JPWO2020157912A1 (ja) | スピン軌道トルク型磁化回転素子、スピン軌道トルク型磁気抵抗効果素子、磁気メモリ及びリザボア素子 | |
JP6625281B1 (ja) | リザボア素子及びニューロモルフィック素子 | |
JP6973679B2 (ja) | 磁性素子、磁気メモリ、リザボア素子、認識機及び磁性素子の製造方法 | |
JP6866917B2 (ja) | リザボア素子の動作方法 | |
JP6886951B2 (ja) | 磁気記憶装置 | |
JP6897888B2 (ja) | リザボア素子及びニューロモルフィック素子 | |
JP2022087584A (ja) | 磁気アレイ及び磁気アレイの製造方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20190606 |
|
A871 | Explanation of circumstances concerning accelerated examination |
Free format text: JAPANESE INTERMEDIATE CODE: A871 Effective date: 20190606 |
|
A975 | Report on accelerated examination |
Free format text: JAPANESE INTERMEDIATE CODE: A971005 Effective date: 20190709 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20190813 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20190926 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20191023 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20191105 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 6620913 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |