JP6616339B2 - 検査装置及び巻回装置 - Google Patents

検査装置及び巻回装置 Download PDF

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Publication number
JP6616339B2
JP6616339B2 JP2017003851A JP2017003851A JP6616339B2 JP 6616339 B2 JP6616339 B2 JP 6616339B2 JP 2017003851 A JP2017003851 A JP 2017003851A JP 2017003851 A JP2017003851 A JP 2017003851A JP 6616339 B2 JP6616339 B2 JP 6616339B2
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Japan
Prior art keywords
winding
imaging
image
sheet
inspection
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Active
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JP2017003851A
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English (en)
Japanese (ja)
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JP2018113199A (ja
Inventor
伊久雄 二村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CKD Corp
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CKD Corp
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Publication date
Application filed by CKD Corp filed Critical CKD Corp
Priority to JP2017003851A priority Critical patent/JP6616339B2/ja
Priority to DE102017223835.6A priority patent/DE102017223835A1/de
Priority to CN201810025771.4A priority patent/CN108414523B/zh
Publication of JP2018113199A publication Critical patent/JP2018113199A/ja
Application granted granted Critical
Publication of JP6616339B2 publication Critical patent/JP6616339B2/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G01B11/2522—Projection by scanning of the object the position of the object changing and being recorded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/2408—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures for measuring roundness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/952—Inspecting the exterior surface of cylindrical bodies or wires
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
    • H01M10/00—Secondary cells; Manufacture thereof
    • H01M10/04—Construction or manufacture in general
    • H01M10/0404—Machines for assembling batteries
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
    • H01M10/00—Secondary cells; Manufacture thereof
    • H01M10/04—Construction or manufacture in general
    • H01M10/0431—Cells with wound or folded electrodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
    • H01M10/00—Secondary cells; Manufacture thereof
    • H01M10/05—Accumulators with non-aqueous electrolyte
    • H01M10/058—Construction or manufacture
    • H01M10/0587—Construction or manufacture of accumulators having only wound construction elements, i.e. wound positive electrodes, wound negative electrodes and wound separators
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
    • Y02E60/10—Energy storage using batteries
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50—Manufacturing or production processes characterised by the final manufactured product

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Manufacturing & Machinery (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • General Chemical & Material Sciences (AREA)
  • Secondary Cells (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Mathematical Physics (AREA)
  • Textile Engineering (AREA)
JP2017003851A 2017-01-13 2017-01-13 検査装置及び巻回装置 Active JP6616339B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2017003851A JP6616339B2 (ja) 2017-01-13 2017-01-13 検査装置及び巻回装置
DE102017223835.6A DE102017223835A1 (de) 2017-01-13 2017-12-28 Untersuchungsvorrichtung und Wickelvorrichtung
CN201810025771.4A CN108414523B (zh) 2017-01-13 2018-01-11 检查装置和卷绕装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2017003851A JP6616339B2 (ja) 2017-01-13 2017-01-13 検査装置及び巻回装置

Publications (2)

Publication Number Publication Date
JP2018113199A JP2018113199A (ja) 2018-07-19
JP6616339B2 true JP6616339B2 (ja) 2019-12-04

Family

ID=62716846

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2017003851A Active JP6616339B2 (ja) 2017-01-13 2017-01-13 検査装置及び巻回装置

Country Status (3)

Country Link
JP (1) JP6616339B2 (de)
CN (1) CN108414523B (de)
DE (1) DE102017223835A1 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6679686B2 (ja) * 2018-09-27 2020-04-15 Ckd株式会社 包装体の製造装置及び包装体の製造方法
CN109470180B (zh) * 2018-10-24 2020-12-18 湖南科霸汽车动力电池有限责任公司 检测判定圆柱形端面焊电池极组端面平整度的方法
CN109752386B (zh) * 2019-01-31 2021-03-26 浙江双元科技股份有限公司 锂电池卷芯极耳的检测装置及锂电池生产线
HUE063619T2 (hu) * 2019-03-05 2024-01-28 Philip Morris Products Sa Vizsgálóállomás és lapanyag vizsgálatára szolgáló eljárás
JP7462158B2 (ja) 2020-03-09 2024-04-05 パナソニックＩｐマネジメント株式会社 学習済みモデルの生成方法、装置、及びプログラム
JP7457968B2 (ja) 2020-03-09 2024-03-29 パナソニックＩｐマネジメント株式会社 情報処理方法、学習済みモデルの生成方法、装置、及びプログラム
CN111735825A (zh) * 2020-08-19 2020-10-02 深圳市中钞科信金融科技有限公司 极片边缘检测装置及检测方法
CN116670885A (zh) * 2021-09-01 2023-08-29 宁德时代新能源科技股份有限公司 卷绕电极组件测量方法及装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000090958A (ja) * 1998-09-14 2000-03-31 Fuji Photo Film Co Ltd 電池の検査装置及び検査方法
JP2002289251A (ja) * 2001-03-27 2002-10-04 Toshiba Battery Co Ltd 電極体監視装置、及び、電極体監視方法
JP6246684B2 (ja) * 2014-09-08 2017-12-13 Ckd株式会社 検査装置及び捲回装置
CN104394323B (zh) * 2014-12-04 2018-07-24 厦门大学 一种放大显微图像的拍摄方法

Also Published As

Publication number Publication date
DE102017223835A1 (de) 2018-07-19
CN108414523A (zh) 2018-08-17
CN108414523B (zh) 2021-10-29
JP2018113199A (ja) 2018-07-19

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