JP6598673B2 - データ処理装置およびその方法 - Google Patents

データ処理装置およびその方法 Download PDF

Info

Publication number
JP6598673B2
JP6598673B2 JP2015252404A JP2015252404A JP6598673B2 JP 6598673 B2 JP6598673 B2 JP 6598673B2 JP 2015252404 A JP2015252404 A JP 2015252404A JP 2015252404 A JP2015252404 A JP 2015252404A JP 6598673 B2 JP6598673 B2 JP 6598673B2
Authority
JP
Japan
Prior art keywords
image data
phase
shape
image
shape image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2015252404A
Other languages
English (en)
Japanese (ja)
Other versions
JP2017116420A (ja
JP2017116420A5 (enExample
Inventor
将英 森部
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP2015252404A priority Critical patent/JP6598673B2/ja
Priority to EP16802161.6A priority patent/EP3394830B1/en
Priority to PCT/JP2016/083538 priority patent/WO2017110293A1/en
Priority to US15/767,844 priority patent/US10664981B2/en
Publication of JP2017116420A publication Critical patent/JP2017116420A/ja
Publication of JP2017116420A5 publication Critical patent/JP2017116420A5/ja
Application granted granted Critical
Publication of JP6598673B2 publication Critical patent/JP6598673B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2504—Calibration devices
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00—Image enhancement or restoration
    • G06T5/50—Image enhancement or restoration using two or more images, e.g. averaging or subtraction
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10028—Range image; Depth image; 3D point clouds

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP2015252404A 2015-12-24 2015-12-24 データ処理装置およびその方法 Active JP6598673B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2015252404A JP6598673B2 (ja) 2015-12-24 2015-12-24 データ処理装置およびその方法
EP16802161.6A EP3394830B1 (en) 2015-12-24 2016-11-11 Data processing apparatus and method of controlling same
PCT/JP2016/083538 WO2017110293A1 (en) 2015-12-24 2016-11-11 Data processing apparatus and method of controlling same
US15/767,844 US10664981B2 (en) 2015-12-24 2016-11-11 Data processing apparatus and method of controlling same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2015252404A JP6598673B2 (ja) 2015-12-24 2015-12-24 データ処理装置およびその方法

Publications (3)

Publication Number Publication Date
JP2017116420A JP2017116420A (ja) 2017-06-29
JP2017116420A5 JP2017116420A5 (enExample) 2019-02-14
JP6598673B2 true JP6598673B2 (ja) 2019-10-30

Family

ID=57421919

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015252404A Active JP6598673B2 (ja) 2015-12-24 2015-12-24 データ処理装置およびその方法

Country Status (4)

Country Link
US (1) US10664981B2 (enExample)
EP (1) EP3394830B1 (enExample)
JP (1) JP6598673B2 (enExample)
WO (1) WO2017110293A1 (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6598673B2 (ja) * 2015-12-24 2019-10-30 キヤノン株式会社 データ処理装置およびその方法
JP2019058993A (ja) * 2017-09-27 2019-04-18 セイコーエプソン株式会社 ロボットシステム
JP2019159872A (ja) * 2018-03-14 2019-09-19 セイコーエプソン株式会社 演算装置、演算装置の制御方法、および、コンピュータープログラム
US11040452B2 (en) * 2018-05-29 2021-06-22 Abb Schweiz Ag Depth sensing robotic hand-eye camera using structured light
KR102596053B1 (ko) * 2018-08-27 2023-11-01 엘지이노텍 주식회사 영상 처리 장치 및 영상 처리 방법
US11107268B2 (en) * 2018-09-07 2021-08-31 Cognex Corporation Methods and apparatus for efficient data processing of initial correspondence assignments for three-dimensional reconstruction of an object
WO2020262389A1 (ja) * 2019-06-28 2020-12-30 キヤノン株式会社 計測装置、撮像装置、計測システム、制御方法及びプログラム
JP7452121B2 (ja) * 2020-03-12 2024-03-19 オムロン株式会社 検査装置及び検査方法
US20250124586A1 (en) * 2022-03-30 2025-04-17 Panasonic Intellectual Property Management Co., Ltd. Parallax information generation device and parallax information generation method

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6028826A (en) * 1996-09-18 2000-02-22 Matsushita Electric Industrial Co., Ltd. Optical disk apparatus performing correction of phase difference tracking error signal, adjustment of focus position and process of gain adjustment
JP3708877B2 (ja) * 2001-05-01 2005-10-19 松下電器産業株式会社 フォトマスク
US7063923B2 (en) * 2002-07-11 2006-06-20 United Electronics Corp. Optical proximity correction method
DE602004032449D1 (de) * 2003-09-17 2011-06-09 Photonic Lattice Inc Polarisations-Analysegerät und entsprechende Methode
JP5029618B2 (ja) * 2006-12-25 2012-09-19 日本電気株式会社 パターン投影法による３次元形状計測装置、方法およびプログラム
JP2009180708A (ja) * 2008-02-01 2009-08-13 Nikon Corp 形状測定方法及び形状測定装置
JP2009210509A (ja) 2008-03-06 2009-09-17 Roland Dg Corp ３次元形状測定装置および３次元形状測定コンピュータプログラム
KR101129025B1 (ko) * 2009-06-25 2012-03-23 주식회사 하이닉스반도체 위상반전마스크의 위상차 에러 보정방법
JP5457825B2 (ja) * 2009-12-24 2014-04-02 ローランドディー．ジー．株式会社 ３次元形状計測方法および３次元形状計測装置
JP6507509B2 (ja) * 2014-07-18 2019-05-08 ソニー株式会社 流路撮像装置及び流路撮像方法
JP6598673B2 (ja) * 2015-12-24 2019-10-30 キヤノン株式会社 データ処理装置およびその方法
US9858672B2 (en) * 2016-01-15 2018-01-02 Oculus Vr, Llc Depth mapping using structured light and time of flight
TWI651513B (zh) * 2016-11-15 2019-02-21 財團法人工業技術研究院 三維量測系統及其方法
KR102464368B1 (ko) * 2017-11-07 2022-11-07 삼성전자주식회사 메타 프로젝터 및 이를 포함하는 전자 장치

Also Published As

Publication number Publication date
EP3394830A1 (en) 2018-10-31
WO2017110293A1 (en) 2017-06-29
EP3394830B1 (en) 2024-04-17
US20180315205A1 (en) 2018-11-01
US10664981B2 (en) 2020-05-26
JP2017116420A (ja) 2017-06-29

Similar Documents

Publication Publication Date Title
JP2017116420A (ja) データ処理装置およびその方法
US11763518B2 (en) Method and system for generating a three-dimensional image of an object
JP5029618B2 (ja) パターン投影法による３次元形状計測装置、方法およびプログラム
US10008007B2 (en) Method for generating an array of 3-D points
US20180306577A1 (en) System and Methods for Shape Measurement Using Dual Frequency Fringe Pattern
US20120176380A1 (en) Forming 3d models using periodic illumination patterns
TWI573984B (zh) 圖像匹配系統及方法
JP5633058B1 (ja) ３次元計測装置及び３次元計測方法
JP5016520B2 (ja) ３次元形状計測方法および装置
JP2003269928A (ja) ３次元形状計測方法および装置ならびにプログラム
CN114111633A (zh) 结构光三维测量的投影机镜头畸变误差校正方法
US20150271466A1 (en) Measuring device, measuring method, and computer program product
KR20110046222A (ko) 다중 공간 주파수를 이용한 3차원 물체의 깊이 측정 방법 및 그 장치
Yang et al. Unidirectional structured light system calibration with auxiliary camera and projector
CN118799410A (zh) 一种基于结构光的低反射率工件三维测量方法
Chen et al. Analysis and reduction of phase errors caused by nonuniform surface reflectivity in a phase-shifting measurement system
CN105157614A (zh) 基于二值相移图案的三维测量方法
CN112747686A (zh) 三维形貌测量装置
CN111462246A (zh) 一种结构光测量系统的设备标定方法
CN118485764A (zh) 一种结构光三维重建方法
JP6713622B2 (ja) ３次元計測装置、３次元計測システム、３次元計測方法及びプログラム
CN115127481B (zh) 条纹投影3d测量方法、终端设备及计算机可读存储介质
Li et al. Lasers structured light with phase-shifting for dense depth perception
KR102935158B1 (ko) 계층적 정현파 구조광 패턴의 생성방법 및 그 방법을 이용한 구조광 시스템
JP4985213B2 (ja) ３次元形状計測方法および装置ならびにプログラム

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20181219

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20181219

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20190902

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20191001

R151 Written notification of patent or utility model registration

Ref document number: 6598673

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R151