JP6582391B2 - プラズマ処理装置 - Google Patents
プラズマ処理装置 Download PDFInfo
- Publication number
- JP6582391B2 JP6582391B2 JP2014225241A JP2014225241A JP6582391B2 JP 6582391 B2 JP6582391 B2 JP 6582391B2 JP 2014225241 A JP2014225241 A JP 2014225241A JP 2014225241 A JP2014225241 A JP 2014225241A JP 6582391 B2 JP6582391 B2 JP 6582391B2
- Authority
- JP
- Japan
- Prior art keywords
- antenna
- plasma
- frequency
- frequency antenna
- processing apparatus
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/65—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials
- H10P14/6502—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials of treatments performed before formation of the materials
- H10P14/6512—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials of treatments performed before formation of the materials by exposure to a gas or vapour
- H10P14/6514—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials of treatments performed before formation of the materials by exposure to a gas or vapour by exposure to a plasma
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/321—Radio frequency generated discharge the radio frequency energy being inductively coupled to the plasma
- H01J37/3211—Antennas, e.g. particular shapes of coils
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/321—Radio frequency generated discharge the radio frequency energy being inductively coupled to the plasma
- H01J37/32119—Windows
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/32174—Circuits specially adapted for controlling the RF discharge
- H01J37/32183—Matching circuits
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32623—Mechanical discharge control means
- H01J37/32651—Shields, e.g. dark space shields, Faraday shields
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H1/00—Generating plasma; Handling plasma
- H05H1/24—Generating plasma
- H05H1/46—Generating plasma using applied electromagnetic fields, e.g. high frequency or microwave energy
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/63—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the formation processes
- H10P14/6326—Deposition processes
- H10P14/6328—Deposition from the gas or vapour phase
- H10P14/6334—Deposition from the gas or vapour phase using decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition
- H10P14/6336—Deposition from the gas or vapour phase using decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition in the presence of a plasma [PECVD]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Power Engineering (AREA)
- Electromagnetism (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Plasma Technology (AREA)
- Drying Of Semiconductors (AREA)
Priority Applications (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2014225241A JP6582391B2 (ja) | 2014-11-05 | 2014-11-05 | プラズマ処理装置 |
| TW108140483A TW202013429A (zh) | 2014-11-05 | 2015-10-28 | 電漿處理裝置 |
| TW104135442A TWI679673B (zh) | 2014-11-05 | 2015-10-28 | 電漿處理裝置 |
| KR1020150154648A KR101974691B1 (ko) | 2014-11-05 | 2015-11-04 | 플라즈마 처리 장치 |
| US14/933,911 US10325758B2 (en) | 2014-11-05 | 2015-11-05 | Plasma processing apparatus |
| KR1020190048440A KR102033873B1 (ko) | 2014-11-05 | 2019-04-25 | 플라즈마 처리 장치 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2014225241A JP6582391B2 (ja) | 2014-11-05 | 2014-11-05 | プラズマ処理装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2016091812A JP2016091812A (ja) | 2016-05-23 |
| JP2016091812A5 JP2016091812A5 (https=) | 2017-12-14 |
| JP6582391B2 true JP6582391B2 (ja) | 2019-10-02 |
Family
ID=55853446
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2014225241A Active JP6582391B2 (ja) | 2014-11-05 | 2014-11-05 | プラズマ処理装置 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US10325758B2 (https=) |
| JP (1) | JP6582391B2 (https=) |
| KR (2) | KR101974691B1 (https=) |
| TW (2) | TWI679673B (https=) |
Families Citing this family (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10714960B2 (en) * | 2015-12-22 | 2020-07-14 | Intel Corporation | Uniform wireless charging device |
| CN106920732B (zh) * | 2015-12-25 | 2018-10-16 | 中微半导体设备(上海)有限公司 | 一种电极结构及icp刻蚀机 |
| US20190088449A1 (en) * | 2017-09-21 | 2019-03-21 | Semes Co., Ltd. | Substrate treating apparatus and substrate treating method |
| JP7175239B2 (ja) * | 2018-06-22 | 2022-11-18 | 東京エレクトロン株式会社 | 制御方法、プラズマ処理装置、プログラム及び記憶媒体 |
| DE102018116637A1 (de) * | 2018-07-10 | 2020-01-16 | TRUMPF Hüttinger GmbH + Co. KG | Leistungsversorgungseinrichtung und Betriebsverfahren hierfür |
| JP7139181B2 (ja) * | 2018-07-26 | 2022-09-20 | ワイエイシイテクノロジーズ株式会社 | プラズマ処理装置 |
| WO2020141806A2 (ko) * | 2018-12-31 | 2020-07-09 | 인투코어테크놀로지 주식회사 | 플라즈마 발생 장치 및 그 동작 방법 |
| US11515122B2 (en) * | 2019-03-19 | 2022-11-29 | Tokyo Electron Limited | System and methods for VHF plasma processing |
| JP7579766B2 (ja) * | 2020-10-06 | 2024-11-08 | 東京エレクトロン株式会社 | プラズマ処理装置及びプラズマ処理用コイル |
| US11401608B2 (en) * | 2020-10-20 | 2022-08-02 | Sky Tech Inc. | Atomic layer deposition equipment and process method |
| CN112331546B (zh) * | 2020-10-26 | 2024-06-21 | 北京北方华创微电子装备有限公司 | 半导体工艺设备 |
| WO2022146648A1 (en) | 2020-12-28 | 2022-07-07 | Mattson Technology, Inc. | Induction coil assembly for plasma processing apparatus |
| KR102323580B1 (ko) * | 2021-04-01 | 2021-11-09 | 피에스케이 주식회사 | 플라즈마 발생 유닛 및 기판 처리 장치 |
| JP2022185603A (ja) * | 2021-06-03 | 2022-12-15 | 株式会社アルバック | プラズマ処理装置 |
| CN114171920B (zh) * | 2021-12-07 | 2025-05-23 | 国开启科量子技术(北京)有限公司 | 一种基于低温螺旋谐振器的天线调节系统 |
| JP7650834B2 (ja) * | 2022-02-16 | 2025-03-25 | 東京エレクトロン株式会社 | プラズマ処理装置 |
Family Cites Families (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5814762B2 (ja) | 1975-08-25 | 1983-03-22 | 日立電線株式会社 | アンテナツキケ−ブル |
| US5731565A (en) * | 1995-07-27 | 1998-03-24 | Lam Research Corporation | Segmented coil for generating plasma in plasma processing equipment |
| US6045618A (en) * | 1995-09-25 | 2000-04-04 | Applied Materials, Inc. | Microwave apparatus for in-situ vacuum line cleaning for substrate processing equipment |
| JP3739137B2 (ja) * | 1996-06-18 | 2006-01-25 | 日本電気株式会社 | プラズマ発生装置及びこのプラズマ発生装置を使用した表面処理装置 |
| US6164241A (en) * | 1998-06-30 | 2000-12-26 | Lam Research Corporation | Multiple coil antenna for inductively-coupled plasma generation systems |
| US6441555B1 (en) * | 2000-03-31 | 2002-08-27 | Lam Research Corporation | Plasma excitation coil |
| US7096819B2 (en) * | 2001-03-30 | 2006-08-29 | Lam Research Corporation | Inductive plasma processor having coil with plural windings and method of controlling plasma density |
| KR101038204B1 (ko) * | 2004-02-25 | 2011-05-31 | 주성엔지니어링(주) | 플라즈마 발생용 안테나 |
| US20070170867A1 (en) * | 2006-01-24 | 2007-07-26 | Varian Semiconductor Equipment Associates, Inc. | Plasma Immersion Ion Source With Low Effective Antenna Voltage |
| US8075734B2 (en) * | 2007-07-06 | 2011-12-13 | Applied Materials, Inc. | Remote inductively coupled plasma source for CVD chamber cleaning |
| JP5227245B2 (ja) | 2009-04-28 | 2013-07-03 | 東京エレクトロン株式会社 | プラズマ処理装置 |
| US8741097B2 (en) * | 2009-10-27 | 2014-06-03 | Tokyo Electron Limited | Plasma processing apparatus and plasma processing method |
| US9313872B2 (en) * | 2009-10-27 | 2016-04-12 | Tokyo Electron Limited | Plasma processing apparatus and plasma processing method |
| JP5592098B2 (ja) * | 2009-10-27 | 2014-09-17 | 東京エレクトロン株式会社 | プラズマ処理装置及びプラズマ処理方法 |
| JP5606821B2 (ja) * | 2010-08-04 | 2014-10-15 | 東京エレクトロン株式会社 | プラズマ処理装置 |
| JP5800547B2 (ja) * | 2011-03-29 | 2015-10-28 | 東京エレクトロン株式会社 | プラズマ処理装置及びプラズマ処理方法 |
| JP5781349B2 (ja) * | 2011-03-30 | 2015-09-24 | 東京エレクトロン株式会社 | プラズマ処理装置 |
| KR101328520B1 (ko) * | 2012-05-17 | 2013-11-20 | 한양대학교 산학협력단 | 플라즈마 장비 |
| WO2014073395A1 (ja) * | 2012-11-09 | 2014-05-15 | 株式会社村田製作所 | 電気部品およびアンテナ |
| WO2016007594A1 (en) * | 2014-07-08 | 2016-01-14 | Witricity Corporation | Resonators for wireless power transfer systems |
-
2014
- 2014-11-05 JP JP2014225241A patent/JP6582391B2/ja active Active
-
2015
- 2015-10-28 TW TW104135442A patent/TWI679673B/zh active
- 2015-10-28 TW TW108140483A patent/TW202013429A/zh unknown
- 2015-11-04 KR KR1020150154648A patent/KR101974691B1/ko active Active
- 2015-11-05 US US14/933,911 patent/US10325758B2/en active Active
-
2019
- 2019-04-25 KR KR1020190048440A patent/KR102033873B1/ko active Active
Also Published As
| Publication number | Publication date |
|---|---|
| KR20160053824A (ko) | 2016-05-13 |
| KR20190045141A (ko) | 2019-05-02 |
| TWI679673B (zh) | 2019-12-11 |
| TW201630031A (zh) | 2016-08-16 |
| KR102033873B1 (ko) | 2019-10-17 |
| TW202013429A (zh) | 2020-04-01 |
| US10325758B2 (en) | 2019-06-18 |
| US20160126063A1 (en) | 2016-05-05 |
| KR101974691B1 (ko) | 2019-05-02 |
| JP2016091812A (ja) | 2016-05-23 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP6582391B2 (ja) | プラズマ処理装置 | |
| KR101998520B1 (ko) | 플라즈마 처리 장치 및 플라즈마 발생 유닛 | |
| KR101852310B1 (ko) | 플라즈마 처리 장치 및 플라즈마 처리 방법 | |
| JP5231308B2 (ja) | プラズマ処理装置 | |
| CN106997842B (zh) | 控制电容耦合等离子体工艺设备的边缘环的射频振幅 | |
| KR101899096B1 (ko) | 플라즈마 처리 장치 및 플라즈마 처리 방법 | |
| JP5805227B2 (ja) | プラズマ処理装置 | |
| JP2020017445A (ja) | プラズマ処理装置 | |
| KR102330281B1 (ko) | 정전 척 및 이를 포함하는 기판 처리 장치 | |
| JP2016091811A5 (https=) | ||
| KR20190033672A (ko) | 기판 처리 장치 및 기판 처리 방법 | |
| JP5696206B2 (ja) | プラズマ処理装置 | |
| US20080190560A1 (en) | Microwave Plasma Processing Apparatus | |
| JP2022075654A (ja) | 基板処理装置 | |
| KR20150102921A (ko) | 플라즈마 처리 장치 및 플라즈마 처리 방법 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20171101 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20171101 |
|
| RD02 | Notification of acceptance of power of attorney |
Free format text: JAPANESE INTERMEDIATE CODE: A7422 Effective date: 20171228 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20180814 |
|
| A601 | Written request for extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A601 Effective date: 20181011 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20181210 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20190115 |
|
| A601 | Written request for extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A601 Effective date: 20190315 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20190806 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20190819 |
|
| R150 | Certificate of patent or registration of utility model |
Ref document number: 6582391 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |