TWI679673B - 電漿處理裝置 - Google Patents
電漿處理裝置 Download PDFInfo
- Publication number
- TWI679673B TWI679673B TW104135442A TW104135442A TWI679673B TW I679673 B TWI679673 B TW I679673B TW 104135442 A TW104135442 A TW 104135442A TW 104135442 A TW104135442 A TW 104135442A TW I679673 B TWI679673 B TW I679673B
- Authority
- TW
- Taiwan
- Prior art keywords
- frequency
- plasma
- antenna
- frequency antenna
- variable capacitor
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/65—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials
- H10P14/6502—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials of treatments performed before formation of the materials
- H10P14/6512—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials of treatments performed before formation of the materials by exposure to a gas or vapour
- H10P14/6514—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials of treatments performed before formation of the materials by exposure to a gas or vapour by exposure to a plasma
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/321—Radio frequency generated discharge the radio frequency energy being inductively coupled to the plasma
- H01J37/3211—Antennas, e.g. particular shapes of coils
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/321—Radio frequency generated discharge the radio frequency energy being inductively coupled to the plasma
- H01J37/32119—Windows
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/32174—Circuits specially adapted for controlling the RF discharge
- H01J37/32183—Matching circuits
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32623—Mechanical discharge control means
- H01J37/32651—Shields, e.g. dark space shields, Faraday shields
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H1/00—Generating plasma; Handling plasma
- H05H1/24—Generating plasma
- H05H1/46—Generating plasma using applied electromagnetic fields, e.g. high frequency or microwave energy
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/63—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the formation processes
- H10P14/6326—Deposition processes
- H10P14/6328—Deposition from the gas or vapour phase
- H10P14/6334—Deposition from the gas or vapour phase using decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition
- H10P14/6336—Deposition from the gas or vapour phase using decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition in the presence of a plasma [PECVD]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Power Engineering (AREA)
- Electromagnetism (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Plasma Technology (AREA)
- Drying Of Semiconductors (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2014-225241 | 2014-11-05 | ||
| JP2014225241A JP6582391B2 (ja) | 2014-11-05 | 2014-11-05 | プラズマ処理装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201630031A TW201630031A (zh) | 2016-08-16 |
| TWI679673B true TWI679673B (zh) | 2019-12-11 |
Family
ID=55853446
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW104135442A TWI679673B (zh) | 2014-11-05 | 2015-10-28 | 電漿處理裝置 |
| TW108140483A TW202013429A (zh) | 2014-11-05 | 2015-10-28 | 電漿處理裝置 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW108140483A TW202013429A (zh) | 2014-11-05 | 2015-10-28 | 電漿處理裝置 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US10325758B2 (https=) |
| JP (1) | JP6582391B2 (https=) |
| KR (2) | KR101974691B1 (https=) |
| TW (2) | TWI679673B (https=) |
Families Citing this family (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10714960B2 (en) * | 2015-12-22 | 2020-07-14 | Intel Corporation | Uniform wireless charging device |
| CN106920732B (zh) * | 2015-12-25 | 2018-10-16 | 中微半导体设备(上海)有限公司 | 一种电极结构及icp刻蚀机 |
| US20190088449A1 (en) * | 2017-09-21 | 2019-03-21 | Semes Co., Ltd. | Substrate treating apparatus and substrate treating method |
| JP7175239B2 (ja) * | 2018-06-22 | 2022-11-18 | 東京エレクトロン株式会社 | 制御方法、プラズマ処理装置、プログラム及び記憶媒体 |
| DE102018116637A1 (de) * | 2018-07-10 | 2020-01-16 | TRUMPF Hüttinger GmbH + Co. KG | Leistungsversorgungseinrichtung und Betriebsverfahren hierfür |
| JP7139181B2 (ja) * | 2018-07-26 | 2022-09-20 | ワイエイシイテクノロジーズ株式会社 | プラズマ処理装置 |
| WO2020141806A2 (ko) * | 2018-12-31 | 2020-07-09 | 인투코어테크놀로지 주식회사 | 플라즈마 발생 장치 및 그 동작 방법 |
| US11515122B2 (en) * | 2019-03-19 | 2022-11-29 | Tokyo Electron Limited | System and methods for VHF plasma processing |
| JP7579766B2 (ja) * | 2020-10-06 | 2024-11-08 | 東京エレクトロン株式会社 | プラズマ処理装置及びプラズマ処理用コイル |
| US11401608B2 (en) * | 2020-10-20 | 2022-08-02 | Sky Tech Inc. | Atomic layer deposition equipment and process method |
| CN112331546B (zh) * | 2020-10-26 | 2024-06-21 | 北京北方华创微电子装备有限公司 | 半导体工艺设备 |
| WO2022146648A1 (en) | 2020-12-28 | 2022-07-07 | Mattson Technology, Inc. | Induction coil assembly for plasma processing apparatus |
| KR102323580B1 (ko) * | 2021-04-01 | 2021-11-09 | 피에스케이 주식회사 | 플라즈마 발생 유닛 및 기판 처리 장치 |
| JP2022185603A (ja) * | 2021-06-03 | 2022-12-15 | 株式会社アルバック | プラズマ処理装置 |
| CN114171920B (zh) * | 2021-12-07 | 2025-05-23 | 国开启科量子技术(北京)有限公司 | 一种基于低温螺旋谐振器的天线调节系统 |
| JP7650834B2 (ja) * | 2022-02-16 | 2025-03-25 | 東京エレクトロン株式会社 | プラズマ処理装置 |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6164241A (en) * | 1998-06-30 | 2000-12-26 | Lam Research Corporation | Multiple coil antenna for inductively-coupled plasma generation systems |
| JP2010258324A (ja) * | 2009-04-28 | 2010-11-11 | Tokyo Electron Ltd | プラズマ処理装置 |
| US20110094997A1 (en) * | 2009-10-27 | 2011-04-28 | Tokyo Electron Limited | Plasma processing apparatus and plasma processing method |
| US20120031560A1 (en) * | 2010-08-04 | 2012-02-09 | Tokyo Electron Limited | Plasma processing apparatus |
| TW201304615A (zh) * | 2011-03-29 | 2013-01-16 | Tokyo Electron Ltd | 電漿處理裝置及電漿處理方法 |
| WO2013172665A1 (ko) * | 2012-05-17 | 2013-11-21 | 한양대학교 산학협력단 | 플라즈마 장비 |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5814762B2 (ja) | 1975-08-25 | 1983-03-22 | 日立電線株式会社 | アンテナツキケ−ブル |
| US5731565A (en) * | 1995-07-27 | 1998-03-24 | Lam Research Corporation | Segmented coil for generating plasma in plasma processing equipment |
| US6045618A (en) * | 1995-09-25 | 2000-04-04 | Applied Materials, Inc. | Microwave apparatus for in-situ vacuum line cleaning for substrate processing equipment |
| JP3739137B2 (ja) * | 1996-06-18 | 2006-01-25 | 日本電気株式会社 | プラズマ発生装置及びこのプラズマ発生装置を使用した表面処理装置 |
| US6441555B1 (en) * | 2000-03-31 | 2002-08-27 | Lam Research Corporation | Plasma excitation coil |
| US7096819B2 (en) * | 2001-03-30 | 2006-08-29 | Lam Research Corporation | Inductive plasma processor having coil with plural windings and method of controlling plasma density |
| KR101038204B1 (ko) * | 2004-02-25 | 2011-05-31 | 주성엔지니어링(주) | 플라즈마 발생용 안테나 |
| US20070170867A1 (en) * | 2006-01-24 | 2007-07-26 | Varian Semiconductor Equipment Associates, Inc. | Plasma Immersion Ion Source With Low Effective Antenna Voltage |
| US8075734B2 (en) * | 2007-07-06 | 2011-12-13 | Applied Materials, Inc. | Remote inductively coupled plasma source for CVD chamber cleaning |
| US8741097B2 (en) * | 2009-10-27 | 2014-06-03 | Tokyo Electron Limited | Plasma processing apparatus and plasma processing method |
| US9313872B2 (en) * | 2009-10-27 | 2016-04-12 | Tokyo Electron Limited | Plasma processing apparatus and plasma processing method |
| JP5781349B2 (ja) * | 2011-03-30 | 2015-09-24 | 東京エレクトロン株式会社 | プラズマ処理装置 |
| WO2014073395A1 (ja) * | 2012-11-09 | 2014-05-15 | 株式会社村田製作所 | 電気部品およびアンテナ |
| WO2016007594A1 (en) * | 2014-07-08 | 2016-01-14 | Witricity Corporation | Resonators for wireless power transfer systems |
-
2014
- 2014-11-05 JP JP2014225241A patent/JP6582391B2/ja active Active
-
2015
- 2015-10-28 TW TW104135442A patent/TWI679673B/zh active
- 2015-10-28 TW TW108140483A patent/TW202013429A/zh unknown
- 2015-11-04 KR KR1020150154648A patent/KR101974691B1/ko active Active
- 2015-11-05 US US14/933,911 patent/US10325758B2/en active Active
-
2019
- 2019-04-25 KR KR1020190048440A patent/KR102033873B1/ko active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6164241A (en) * | 1998-06-30 | 2000-12-26 | Lam Research Corporation | Multiple coil antenna for inductively-coupled plasma generation systems |
| JP2010258324A (ja) * | 2009-04-28 | 2010-11-11 | Tokyo Electron Ltd | プラズマ処理装置 |
| US20110094997A1 (en) * | 2009-10-27 | 2011-04-28 | Tokyo Electron Limited | Plasma processing apparatus and plasma processing method |
| US20120031560A1 (en) * | 2010-08-04 | 2012-02-09 | Tokyo Electron Limited | Plasma processing apparatus |
| TW201304615A (zh) * | 2011-03-29 | 2013-01-16 | Tokyo Electron Ltd | 電漿處理裝置及電漿處理方法 |
| WO2013172665A1 (ko) * | 2012-05-17 | 2013-11-21 | 한양대학교 산학협력단 | 플라즈마 장비 |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20160053824A (ko) | 2016-05-13 |
| KR20190045141A (ko) | 2019-05-02 |
| TW201630031A (zh) | 2016-08-16 |
| KR102033873B1 (ko) | 2019-10-17 |
| TW202013429A (zh) | 2020-04-01 |
| US10325758B2 (en) | 2019-06-18 |
| US20160126063A1 (en) | 2016-05-05 |
| KR101974691B1 (ko) | 2019-05-02 |
| JP2016091812A (ja) | 2016-05-23 |
| JP6582391B2 (ja) | 2019-10-02 |
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