JP6552306B2 - 放射線撮像装置、放射線撮像システム、及び、放射線撮像装置による方法 - Google Patents

放射線撮像装置、放射線撮像システム、及び、放射線撮像装置による方法 Download PDF

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Publication number
JP6552306B2
JP6552306B2 JP2015138110A JP2015138110A JP6552306B2 JP 6552306 B2 JP6552306 B2 JP 6552306B2 JP 2015138110 A JP2015138110 A JP 2015138110A JP 2015138110 A JP2015138110 A JP 2015138110A JP 6552306 B2 JP6552306 B2 JP 6552306B2
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Japan
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radiation
signal
dose
waveform
output
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Expired - Fee Related
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JP2015138110A
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English (en)
Japanese (ja)
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JP2017018283A (ja
Inventor
恵梨子 佐藤
恵梨子 佐藤
登志男 亀島
登志男 亀島
英之 岡田
英之 岡田
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Canon Inc
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Canon Inc
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Priority to JP2015138110A priority Critical patent/JP6552306B2/ja
Priority to PCT/JP2016/003120 priority patent/WO2017006543A1/fr
Publication of JP2017018283A publication Critical patent/JP2017018283A/ja
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14643—Photodiode arrays; MOS imagers
    • H01L27/14658—X-ray, gamma-ray or corpuscular radiation imagers
    • H01L27/14663—Indirect radiation imagers, e.g. using luminescent members
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Toxicology (AREA)
  • Health & Medical Sciences (AREA)
  • Electromagnetism (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Signal Processing (AREA)
  • Multimedia (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
JP2015138110A 2015-07-09 2015-07-09 放射線撮像装置、放射線撮像システム、及び、放射線撮像装置による方法 Expired - Fee Related JP6552306B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2015138110A JP6552306B2 (ja) 2015-07-09 2015-07-09 放射線撮像装置、放射線撮像システム、及び、放射線撮像装置による方法
PCT/JP2016/003120 WO2017006543A1 (fr) 2015-07-09 2016-06-29 Appareil d'imagerie par rayonnement, système d'imagerie par rayonnement et procédé utilisant un appareil d'imagerie par rayonnement

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2015138110A JP6552306B2 (ja) 2015-07-09 2015-07-09 放射線撮像装置、放射線撮像システム、及び、放射線撮像装置による方法

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JP2017018283A JP2017018283A (ja) 2017-01-26
JP6552306B2 true JP6552306B2 (ja) 2019-07-31

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JP2015138110A Expired - Fee Related JP6552306B2 (ja) 2015-07-09 2015-07-09 放射線撮像装置、放射線撮像システム、及び、放射線撮像装置による方法

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JP (1) JP6552306B2 (fr)
WO (1) WO2017006543A1 (fr)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2018159465A1 (fr) * 2017-02-28 2018-09-07 富士フイルム株式会社 Système de détection de rayonnement, appareil de sortie de rayonnement et appareil de détection de rayonnement
WO2021177229A1 (fr) * 2020-03-04 2021-09-10 キヤノン株式会社 Système radiographique, dispositif de commande et procédé de commande de système radiographique

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000030891A (ja) * 1998-07-15 2000-01-28 Shimadzu Corp Ｘ線自動露出制御装置
JP2003130957A (ja) * 2001-10-23 2003-05-08 Shimadzu Corp Ｘ線フラットパネル検出器のラグ補正方法およびその装置並びにｘ線検査装置
JP4858701B2 (ja) * 2006-10-23 2012-01-18 株式会社島津製作所 Ｘ線高電圧装置およびｘ線高電圧装置を含むｘ線診断装置
JP5558538B2 (ja) * 2011-12-08 2014-07-23 富士フイルム株式会社 放射線撮影装置、放射線撮影システム、放射線撮影装置の制御方法及び制御プログラム
JP5975733B2 (ja) * 2012-05-25 2016-08-23 富士フイルム株式会社 放射線画像検出装置およびその駆動制御方法、並びに放射線撮影システム

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WO2017006543A1 (fr) 2017-01-12
JP2017018283A (ja) 2017-01-26

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