JP6542906B2 - 少なくとも部分的に透明な物体の表面に関連する表面データおよび／または測定データを決定するための方法および装置 - Google Patents

少なくとも部分的に透明な物体の表面に関連する表面データおよび／または測定データを決定するための方法および装置 Download PDF

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JP6542906B2
JP6542906B2 JP2017546833A JP2017546833A JP6542906B2 JP 6542906 B2 JP6542906 B2 JP 6542906B2 JP 2017546833 A JP2017546833 A JP 2017546833A JP 2017546833 A JP2017546833 A JP 2017546833A JP 6542906 B2 JP6542906 B2 JP 6542906B2
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light
polarization
analyzer
reflection
data
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JP2018515747A5 (enExample
JP2018515747A (ja
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トラム，ステファン
セスナー，レイナー
ウッテンヴァイラー，ディトマー
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ローデンシュトック ゲーエムベーハー
ローデンシュトック ゲーエムベーハー
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0207—Details of measuring devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/025—Testing optical properties by measuring geometrical properties or aberrations by determining the shape of the object to be tested
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0257—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested
    • G01M11/0264—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested by using targets or reference patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
JP2017546833A 2015-06-03 2016-03-23 少なくとも部分的に透明な物体の表面に関連する表面データおよび／または測定データを決定するための方法および装置 Active JP6542906B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102015108839.8 2015-06-03
DE102015108839.8A DE102015108839A1 (de) 2015-06-03 2015-06-03 Verfahren zum Bestimmen von Oberflächendaten und/oder Messdaten einer Oberfläche eines zumindest teilweise transparenten Objekts
PCT/EP2016/056367 WO2016192869A1 (de) 2015-06-03 2016-03-23 Verfahren und vorrichtung zum bestimmen von oberflächendaten und/oder messdaten einer oberfläche eines zumindest teilweise transparenten objekts

Publications (3)

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JP2018515747A JP2018515747A (ja) 2018-06-14
JP2018515747A5 JP2018515747A5 (enExample) 2019-02-21
JP6542906B2 true JP6542906B2 (ja) 2019-07-10

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JP2017546833A Active JP6542906B2 (ja) 2015-06-03 2016-03-23 少なくとも部分的に透明な物体の表面に関連する表面データおよび／または測定データを決定するための方法および装置

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US (1) US10337953B2 (enExample)
EP (1) EP3304025B1 (enExample)
JP (1) JP6542906B2 (enExample)
DE (1) DE102015108839A1 (enExample)
WO (1) WO2016192869A1 (enExample)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10802382B2 (en) * 2018-07-24 2020-10-13 Qualcomm Incorporated Adjustable light projector for flood illumination and active depth sensing
CN112602009B (zh) * 2018-09-28 2022-09-02 豪雅镜片泰国有限公司 曲面形状评估方法、眼镜镜片的制造方法以及眼镜镜片
JP7225644B2 (ja) * 2018-09-28 2023-02-21 株式会社ニデック レンズ測定装置
US12085473B2 (en) 2019-02-25 2024-09-10 Arizona Board Of Regents On Behalf Of The University Of Arizona Deflectometry devices, systems and methods
WO2021257734A1 (en) * 2020-06-18 2021-12-23 Arizona Board Of Regents On Behalf Of The University Of Arizona Freeform surface metrology and deflectometry

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JPH0830796B2 (ja) * 1993-02-17 1996-03-27 日本電気株式会社 Ｌｃｄ表示体検査装置
RU2107903C1 (ru) * 1996-04-23 1998-03-27 Институт солнечно-земной физики СО РАН Способ контроля формы оптической поверхности
JPH11211617A (ja) * 1998-01-22 1999-08-06 Topcon Corp レンズ特定装置
DE10014964C2 (de) 2000-03-25 2002-04-11 Rainer Sesner Verfahren zum optischen Messen der Form spiegelnder Oberflächen
US7612880B2 (en) * 2003-08-06 2009-11-03 Arizona Board Of Regents On Behalf Of The University Of Arizona Advanced polarization imaging method, apparatus, and computer program product for retinal imaging, liquid crystal testing, active remote sensing, and other applications
JP2007533977A (ja) * 2004-03-11 2007-11-22 アイコス・ビジョン・システムズ・ナムローゼ・フェンノートシャップ 波面操作および改良３ｄ測定方法および装置
DE102004020419B3 (de) 2004-04-23 2005-10-20 3D Shape Gmbh Verfahren und Vorrichtung zur Bestimmung der Form und der lokalen Oberflächennormalen spiegelnder Oberflächen
US7161669B2 (en) * 2005-05-06 2007-01-09 Kla- Tencor Technologies Corporation Wafer edge inspection
JP2007240168A (ja) * 2006-03-06 2007-09-20 Nikon Corp 検査装置
KR20100014399A (ko) * 2007-02-14 2010-02-10 더 인스티튜트 포 아이 리서치 리미티드 광학 시스템의 특성
CN101464209A (zh) * 2007-12-19 2009-06-24 鸿富锦精密工业（深圳）有限公司 镜片折射率变化量的测量方法及其装置
US7869060B2 (en) * 2008-06-26 2011-01-11 Mitutoyo Corporation Jig for measuring an object shape and method for measuring a three-dimensional shape
US7688431B1 (en) * 2009-04-09 2010-03-30 Younger Mfg. Co. Dispersion demonstrator for eyewear lenses
US20100268069A1 (en) * 2009-04-16 2010-10-21 Rongguang Liang Dental surface imaging using polarized fringe projection
DE102011078833A1 (de) * 2011-07-07 2013-01-10 3D-Micromac Ag Verfahren und Vorrichtung zum Detektieren einer Markierung an einem Objekt
JP5988643B2 (ja) * 2012-03-26 2016-09-07 キヤノン株式会社 計測装置、計測方法及び光学部品の製造方法
EP2880398B1 (en) * 2012-07-31 2018-03-28 Essilor International Method and system for identification of a given geometrical feature of an optical component
DE102013208090B4 (de) 2013-05-02 2020-09-03 Carl Zeiss Vision International Gmbh Verfahren und Vorrichtung für die Brillenglas-Qualitätskontrolle sowie Computerprogramm
KR102166189B1 (ko) * 2013-10-08 2020-10-15 이미지 비전 피티이. 리미티드 습식 안과 렌즈 검사 시스템 및 방법

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Publication number Publication date
US10337953B2 (en) 2019-07-02
JP2018515747A (ja) 2018-06-14
DE102015108839A1 (de) 2016-12-08
WO2016192869A1 (de) 2016-12-08
EP3304025A1 (de) 2018-04-11
US20180058977A1 (en) 2018-03-01
EP3304025B1 (de) 2021-11-24

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