JP6515542B2 - 眼鏡装用画像解析装置、眼鏡装用画像解析方法、及び眼鏡装用画像解析プログラム - Google Patents

眼鏡装用画像解析装置、眼鏡装用画像解析方法、及び眼鏡装用画像解析プログラム Download PDF

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Publication number
JP6515542B2
JP6515542B2 JP2015006469A JP2015006469A JP6515542B2 JP 6515542 B2 JP6515542 B2 JP 6515542B2 JP 2015006469 A JP2015006469 A JP 2015006469A JP 2015006469 A JP2015006469 A JP 2015006469A JP 6515542 B2 JP6515542 B2 JP 6515542B2
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Prior art keywords
image
wearing
eyeglass frame
eyeglass
subject
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Japanese (ja)
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JP2015179254A5 (enExample
JP2015179254A (ja
Inventor
徹 有川
徹 有川
賀洋 尾崎
賀洋 尾崎
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Nidek Co Ltd
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Nidek Co Ltd
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Priority to JP2015006469A priority Critical patent/JP6515542B2/ja
Priority to US14/631,042 priority patent/US10108847B2/en
Priority to EP15156528.0A priority patent/EP2913704A1/en
Publication of JP2015179254A publication Critical patent/JP2015179254A/ja
Publication of JP2015179254A5 publication Critical patent/JP2015179254A5/ja
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V20/00—Scenes; Scene-specific elements
    • G06V20/60—Type of objects
    • G06V20/64—Three-dimensional objects
    • G06V20/653—Three-dimensional objects by matching three-dimensional models, e.g. conformal mapping of Riemann surfaces
    • G—PHYSICS
    • G02—OPTICS
    • G02C—SPECTACLES; SUNGLASSES OR GOGGLES INSOFAR AS THEY HAVE THE SAME FEATURES AS SPECTACLES; CONTACT LENSES
    • G02C13/00—Assembling; Repairing; Cleaning
    • G02C13/003—Measuring during assembly or fitting of spectacles
    • G—PHYSICS
    • G02—OPTICS
    • G02C—SPECTACLES; SUNGLASSES OR GOGGLES INSOFAR AS THEY HAVE THE SAME FEATURES AS SPECTACLES; CONTACT LENSES
    • G02C13/00—Assembling; Repairing; Cleaning
    • G02C13/003—Measuring during assembly or fitting of spectacles
    • G02C13/005—Measuring geometric parameters required to locate ophtalmic lenses in spectacles frames

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Ophthalmology & Optometry (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Geometry (AREA)
  • Software Systems (AREA)
  • Multimedia (AREA)
  • Theoretical Computer Science (AREA)
  • Eye Examination Apparatus (AREA)
  • Eyeglasses (AREA)
JP2015006469A 2014-02-27 2015-01-16 眼鏡装用画像解析装置、眼鏡装用画像解析方法、及び眼鏡装用画像解析プログラム Active JP6515542B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2015006469A JP6515542B2 (ja) 2014-02-27 2015-01-16 眼鏡装用画像解析装置、眼鏡装用画像解析方法、及び眼鏡装用画像解析プログラム
US14/631,042 US10108847B2 (en) 2014-02-27 2015-02-25 Eyeglass wearing image analysis device, eyeglass wearing image analysis method, and storage medium having eyeglass wearing image analysis program stored
EP15156528.0A EP2913704A1 (en) 2014-02-27 2015-02-25 Eyeglass wearing image analysis device, eyeglass wearing image analysis method, and eyeglass wearing image analysis program

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2014037352 2014-02-27
JP2014037352 2014-02-27
JP2015006469A JP6515542B2 (ja) 2014-02-27 2015-01-16 眼鏡装用画像解析装置、眼鏡装用画像解析方法、及び眼鏡装用画像解析プログラム

Publications (3)

Publication Number Publication Date
JP2015179254A JP2015179254A (ja) 2015-10-08
JP2015179254A5 JP2015179254A5 (enExample) 2018-02-08
JP6515542B2 true JP6515542B2 (ja) 2019-05-22

Family

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JP2015006469A Active JP6515542B2 (ja) 2014-02-27 2015-01-16 眼鏡装用画像解析装置、眼鏡装用画像解析方法、及び眼鏡装用画像解析プログラム

Country Status (3)

Country Link
US (1) US10108847B2 (enExample)
EP (1) EP2913704A1 (enExample)
JP (1) JP6515542B2 (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9086582B1 (en) * 2014-08-20 2015-07-21 David Kind, Inc. System and method of providing custom-fitted and styled eyewear based on user-provided images and preferences
JP2017181657A (ja) * 2016-03-29 2017-10-05 株式会社ニデック 眼鏡装用画像解析装置、眼鏡装用画像解析方法、及び眼鏡装用画像解析プログラム
EP3413122B1 (de) 2017-06-08 2020-03-04 Carl Zeiss Vision International GmbH Verfahren, vorrichtung und computerprogramm zum bestimmen eines nah-durchblickpunktes
EP3438635B1 (en) 2017-07-31 2025-10-29 Nidek Co., Ltd. Glasses measurement apparatus
JP7143652B2 (ja) * 2018-07-02 2022-09-29 株式会社ニデック 眼鏡測定システム及び眼鏡測定プログラム
MX2021003565A (es) * 2018-09-26 2021-05-27 Essilor Int Metodo para determinar al menos un parametro geometrico-morfologic o de un sujeto.
US10685457B2 (en) 2018-11-15 2020-06-16 Vision Service Plan Systems and methods for visualizing eyewear on a user
CN114730103B (zh) * 2020-01-10 2024-06-25 依视路国际公司 眼睛配戴物设备的镜片的位置变化
CN113440100B (zh) * 2021-07-01 2022-05-17 深圳市时代创越科技有限公司 一种具有自检功能的移动式眼底成像系统终端设备
CN116091750A (zh) * 2022-12-05 2023-05-09 北京字跳网络技术有限公司 眼镜度数识别方法、装置、电子设备及存储介质

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0535827A (ja) * 1991-05-10 1993-02-12 Miki:Kk 眼鏡の選択および設計システム
FR2719463B1 (fr) * 1994-05-03 1996-07-26 Essilor Int Procédé de métrologie optique.
JP2000020580A (ja) * 1998-07-02 2000-01-21 Fine System Kikaku Kk 眼鏡レイアウト及びレンズ選択作業サポートシステム
FR2807169B1 (fr) * 2000-03-31 2002-06-07 Essilor Int Procede de montage de lentilles ophtalmiques
US7434931B2 (en) * 2001-10-25 2008-10-14 Ophthonix Custom eyeglass manufacturing method
WO2005092173A1 (ja) * 2004-03-26 2005-10-06 Hoya Corporation 眼鏡レンズ供給システム、眼鏡装用パラメータ測定装置、眼鏡装用検査システム、眼鏡レンズ及び眼鏡
JP5013930B2 (ja) * 2006-03-31 2012-08-29 Ｈｏｙａ株式会社 眼鏡装用パラメータ測定装置及び眼鏡装用パラメータ測定方法
US7370970B2 (en) * 2006-06-14 2008-05-13 Delphi Technologies, Inc. Eyeglass detection method
FR2906047B1 (fr) 2006-09-14 2008-11-07 Essilor Int Procede et dispositif de determination de l'orientation d'une lentille ophtalmique correctrice et procede de conception optique de la lentille correctrice
JP4616303B2 (ja) 2007-04-23 2011-01-19 株式会社ニデック 眼位置測定装置

Also Published As

Publication number Publication date
US20150242677A1 (en) 2015-08-27
EP2913704A1 (en) 2015-09-02
US10108847B2 (en) 2018-10-23
JP2015179254A (ja) 2015-10-08

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