JP6505228B2 - 電離放射線を検出する検出器、撮像装置、非一時的コンピュータ可読媒体、及び方法 - Google Patents

電離放射線を検出する検出器、撮像装置、非一時的コンピュータ可読媒体、及び方法 Download PDF

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JP6505228B2
JP6505228B2 JP2017530021A JP2017530021A JP6505228B2 JP 6505228 B2 JP6505228 B2 JP 6505228B2 JP 2017530021 A JP2017530021 A JP 2017530021A JP 2017530021 A JP2017530021 A JP 2017530021A JP 6505228 B2 JP6505228 B2 JP 6505228B2
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electrode
electrodes
detector
signal
ionizing radiation
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JP2018500556A (ja
JP2018500556A5 (OSRAM
Inventor
エワルド ルースル
エワルド ルースル
クリストフ ヘルマン
クリストフ ヘルマン
ブッカ— ロヒエル ステッドマン
ブッカ― ロヒエル ステッドマン
クラウス ユールゲン エンゲル
クラウス ユールゲン エンゲル
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Koninklijke Philips NV
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Koninklijke Philips NV
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/208—Circuits specially adapted for scintillation detectors, e.g. for the photo-multiplier section
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/241—Electrode arrangements, e.g. continuous or parallel strips or the like
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/247—Detector read-out circuitry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/28—Measuring radiation intensity with secondary-emission detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/36—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry
    • G01T1/366—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry with semi-conductor detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/185—Measuring radiation intensity with ionisation chamber arrangements

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Measurement Of Radiation (AREA)
JP2017530021A 2014-12-17 2015-12-11 電離放射線を検出する検出器、撮像装置、非一時的コンピュータ可読媒体、及び方法 Expired - Fee Related JP6505228B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP14198540.8 2014-12-17
EP14198540 2014-12-17
PCT/EP2015/079330 WO2016096622A1 (en) 2014-12-17 2015-12-11 Detector and method for detecting ionizing radiation

Publications (3)

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JP2018500556A JP2018500556A (ja) 2018-01-11
JP2018500556A5 JP2018500556A5 (OSRAM) 2018-09-27
JP6505228B2 true JP6505228B2 (ja) 2019-04-24

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US (1) US10054692B2 (OSRAM)
EP (1) EP3234649A1 (OSRAM)
JP (1) JP6505228B2 (OSRAM)
CN (1) CN107110987B (OSRAM)
RU (1) RU2705717C2 (OSRAM)
WO (1) WO2016096622A1 (OSRAM)

Families Citing this family (8)

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Publication number Priority date Publication date Assignee Title
CN106249270B (zh) 2016-08-31 2023-04-25 同方威视技术股份有限公司 半导体探测器
EP3498171A1 (en) 2017-12-15 2019-06-19 Koninklijke Philips N.V. Single shot x-ray phase-contrast and dark field imaging
EP3508887A1 (en) * 2018-01-09 2019-07-10 Koninklijke Philips N.V. Charge sharing calibration method and system
US10254163B1 (en) * 2018-03-15 2019-04-09 Kromek Group, PLC Interaction characteristics from a plurality of pixels
US10247834B1 (en) * 2018-08-15 2019-04-02 General Electric Company Anodes for improved detection of non-collected adjacent signal
EP3709059A1 (en) * 2019-03-14 2020-09-16 Koninklijke Philips N.V. Charge sharing compensation with sampled discriminators
CN113794449B (zh) * 2021-09-16 2024-02-02 西北工业大学 一种静态功耗自动配置的低功耗前端读出电路及设计方法
CN114236627B (zh) * 2021-12-18 2024-11-22 中国人民解放军96901部队23分队 一种辐射源位置探测方法和装置

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JP3274704B2 (ja) * 1992-06-02 2002-04-15 オリンパス光学工業株式会社 固体撮像素子
DE19616545B4 (de) * 1996-04-25 2006-05-11 Siemens Ag Schneller Strahlungsdetektor
DE10240062A1 (de) * 2002-08-30 2004-03-11 Philips Intellectual Property & Standards Gmbh Detektoranordnung
CN1328598C (zh) * 2005-01-26 2007-07-25 上海大学 共面栅阳极碲锌镉探测器的制备方法
JP2009133823A (ja) * 2007-10-31 2009-06-18 Fujifilm Corp 放射線画像検出器および放射線位相画像撮影装置
KR101371604B1 (ko) * 2007-11-26 2014-03-06 삼성디스플레이 주식회사 액정 표시 장치
CN101569530B (zh) * 2008-04-30 2013-03-27 Ge医疗系统环球技术有限公司 X-射线检测器和x-射线ct设备
US8546765B2 (en) * 2008-06-26 2013-10-01 Trixell High dynamic range X-ray detector with improved signal to noise ratio
US8405038B2 (en) * 2009-12-30 2013-03-26 General Electric Company Systems and methods for providing a shared charge in pixelated image detectors
US8466420B2 (en) * 2010-06-04 2013-06-18 General Electric Company Charge loss correction
US9018589B2 (en) * 2010-12-07 2015-04-28 Koninklijke Philips N.V. Direct conversion X-ray detector
RU2594606C2 (ru) * 2011-08-30 2016-08-20 Конинклейке Филипс Н.В. Детектор счета фотонов
US9069088B2 (en) * 2011-11-09 2015-06-30 Koninklijke Philips N.V. Radiation-sensitive detector device with charge-rejecting segment gaps
RU2014128555A (ru) * 2011-12-13 2016-02-10 Конинклейке Филипс Н.В. Детектор излучения
WO2014087290A1 (en) 2012-12-04 2014-06-12 Koninklijke Philips N.V. Photon counting x-ray detector
CN103280393A (zh) * 2013-05-30 2013-09-04 中国科学院西安光学精密机械研究所 交叉位敏阳极及应用其实现光子计数积分成像测量的方法

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Publication number Publication date
RU2017125176A (ru) 2019-01-17
US10054692B2 (en) 2018-08-21
RU2705717C2 (ru) 2019-11-11
EP3234649A1 (en) 2017-10-25
WO2016096622A1 (en) 2016-06-23
JP2018500556A (ja) 2018-01-11
CN107110987B (zh) 2019-11-01
RU2017125176A3 (OSRAM) 2019-04-24
CN107110987A (zh) 2017-08-29
US20170357013A1 (en) 2017-12-14

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