JP6408863B2 - ガスセンサ - Google Patents
ガスセンサ Download PDFInfo
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- JP6408863B2 JP6408863B2 JP2014218074A JP2014218074A JP6408863B2 JP 6408863 B2 JP6408863 B2 JP 6408863B2 JP 2014218074 A JP2014218074 A JP 2014218074A JP 2014218074 A JP2014218074 A JP 2014218074A JP 6408863 B2 JP6408863 B2 JP 6408863B2
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- misfet
- radiation
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Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2014218074A JP6408863B2 (ja) | 2014-10-27 | 2014-10-27 | ガスセンサ |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2014218074A JP6408863B2 (ja) | 2014-10-27 | 2014-10-27 | ガスセンサ |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2016085124A JP2016085124A (ja) | 2016-05-19 |
| JP2016085124A5 JP2016085124A5 (https=) | 2017-04-27 |
| JP6408863B2 true JP6408863B2 (ja) | 2018-10-17 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2014218074A Active JP6408863B2 (ja) | 2014-10-27 | 2014-10-27 | ガスセンサ |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP6408863B2 (https=) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2018072146A (ja) | 2016-10-28 | 2018-05-10 | 株式会社日立製作所 | ガスセンサ |
| JP6740949B2 (ja) | 2017-03-31 | 2020-08-19 | 日立金属株式会社 | ガスセンサ |
| JP7078499B2 (ja) * | 2018-09-10 | 2022-05-31 | 日立Geニュークリア・エナジー株式会社 | 半導体素子、電子機器、イメージセンサ、計測装置、半導体素子の製造方法 |
| JP7336729B2 (ja) * | 2019-05-21 | 2023-09-01 | パナソニックIpマネジメント株式会社 | ガスセンサ |
| CN111008506B (zh) * | 2019-11-30 | 2023-04-07 | 中国科学院新疆理化技术研究所 | 一种基于阈值电压类型匹配的6-t存储单元抗总剂量加固方法 |
| JP2025090435A (ja) * | 2023-12-05 | 2025-06-17 | 株式会社日立ハイテク | ガスセンサモジュール |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5433097A (en) * | 1977-08-18 | 1979-03-10 | Seiko Epson Corp | Semiconductor gas sensor |
| JPS62296420A (ja) * | 1986-06-16 | 1987-12-23 | Nec Corp | 半導体装置の製造方法 |
| JP4866880B2 (ja) * | 2008-06-16 | 2012-02-01 | 株式会社日立製作所 | 電極、ガスセンサおよびその製造方法 |
| JP2011137770A (ja) * | 2009-12-29 | 2011-07-14 | Hitachi Ltd | 放射線被曝量計測機能付プロセス計測機器 |
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2014
- 2014-10-27 JP JP2014218074A patent/JP6408863B2/ja active Active
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| Publication number | Publication date |
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| JP2016085124A (ja) | 2016-05-19 |
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