JP6379502B2 - 眼鏡装用画像解析装置、眼鏡装用画像解析方法、及び眼鏡装用画像解析プログラム - Google Patents

眼鏡装用画像解析装置、眼鏡装用画像解析方法、及び眼鏡装用画像解析プログラム Download PDF

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JP6379502B2
JP6379502B2 JP2014020834A JP2014020834A JP6379502B2 JP 6379502 B2 JP6379502 B2 JP 6379502B2 JP 2014020834 A JP2014020834 A JP 2014020834A JP 2014020834 A JP2014020834 A JP 2014020834A JP 6379502 B2 JP6379502 B2 JP 6379502B2
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image
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spectacle
wearing
optical system
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JP2015148691A5 (fr
JP2015148691A (ja
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賀洋 尾崎
賀洋 尾崎
裕司郎 栃久保
裕司郎 栃久保
徹 有川
徹 有川
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Nidek Co Ltd
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JP2014020834A 2014-02-05 2014-02-05 眼鏡装用画像解析装置、眼鏡装用画像解析方法、及び眼鏡装用画像解析プログラム Active JP6379502B2 (ja)

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JP2015148691A JP2015148691A (ja) 2015-08-20
JP2015148691A5 JP2015148691A5 (fr) 2017-03-09
JP6379502B2 true JP6379502B2 (ja) 2018-08-29

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JP2017181657A (ja) * 2016-03-29 2017-10-05 株式会社ニデック 眼鏡装用画像解析装置、眼鏡装用画像解析方法、及び眼鏡装用画像解析プログラム

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JP5013930B2 (ja) * 2006-03-31 2012-08-29 Ｈｏｙａ株式会社 眼鏡装用パラメータ測定装置及び眼鏡装用パラメータ測定方法
JP2011253042A (ja) * 2010-06-02 2011-12-15 Seiko Epson Corp 眼鏡レンズ選択方法及び眼鏡レンズ選択システム
JP2013097014A (ja) * 2011-10-28 2013-05-20 Tokai Kogaku Kk 位置データ算出方法

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