JP6379031B2 - 波面歪み量測定装置、波面補償装置、光学測定装置、および方法 - Google Patents

波面歪み量測定装置、波面補償装置、光学測定装置、および方法 Download PDF

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JP6379031B2
JP6379031B2 JP2014266374A JP2014266374A JP6379031B2 JP 6379031 B2 JP6379031 B2 JP 6379031B2 JP 2014266374 A JP2014266374 A JP 2014266374A JP 2014266374 A JP2014266374 A JP 2014266374A JP 6379031 B2 JP6379031 B2 JP 6379031B2
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Japan
Prior art keywords
wavefront
wavefront distortion
light
modulator
amount
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JP2014266374A
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Japanese (ja)
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JP2016125895A (ja
JP2016125895A5 (enExample
Inventor
圭佑 磯部
圭佑 磯部
緑川　克美
克美 緑川
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RIKEN
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RIKEN
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Priority to JP2014266374A priority Critical patent/JP6379031B2/ja
Priority to PCT/JP2015/084955 priority patent/WO2016104223A1/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/35—Non-linear optics
    • G02F1/39—Non-linear optics for parametric generation or amplification of light, infrared or ultraviolet waves

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Analytical Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Optics & Photonics (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
JP2014266374A 2014-12-26 2014-12-26 波面歪み量測定装置、波面補償装置、光学測定装置、および方法 Active JP6379031B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2014266374A JP6379031B2 (ja) 2014-12-26 2014-12-26 波面歪み量測定装置、波面補償装置、光学測定装置、および方法
PCT/JP2015/084955 WO2016104223A1 (ja) 2014-12-26 2015-12-14 波面歪み量測定装置、波面補償装置、光学測定装置、および方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014266374A JP6379031B2 (ja) 2014-12-26 2014-12-26 波面歪み量測定装置、波面補償装置、光学測定装置、および方法

Publications (3)

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JP2016125895A JP2016125895A (ja) 2016-07-11
JP2016125895A5 JP2016125895A5 (enExample) 2018-01-18
JP6379031B2 true JP6379031B2 (ja) 2018-08-22

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JP (1) JP6379031B2 (enExample)
WO (1) WO2016104223A1 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107978209B (zh) * 2017-12-08 2024-01-05 中国科学院西安光学精密机械研究所 远程傅里叶望远镜成像演示系统
TWI794416B (zh) * 2018-02-28 2023-03-01 美商賽格股份有限公司 多層堆疊結構之計量方法及干涉儀系統
DE102019218664A1 (de) * 2019-12-02 2021-06-02 Carl Zeiss Microscopy Gmbh Verfahren und Vorrichtung zur Abbildung von Proben mittels manipulierter Anregungsstrahlung
JP7411913B2 (ja) * 2020-06-03 2024-01-12 パナソニックＩｐマネジメント株式会社 Ｏｃｔ計測装置及びｏｃｔ計測方法
EP4229385A4 (en) * 2020-10-15 2024-10-16 Applied Materials, Inc. TRANSPARENT METROLOGY SYSTEMS, APPARATUS AND METHODS FOR OPTICAL DEVICES

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11230833A (ja) * 1998-02-17 1999-08-27 Ricoh Co Ltd 位相分布の測定方法及び装置
US7423766B1 (en) * 2003-12-17 2008-09-09 Chian Chiu Li Interferometric optical profiler
JP5350178B2 (ja) * 2009-10-23 2013-11-27 キヤノン株式会社 補償光学装置、補償光学装置を備える撮像装置、補償光学方法
JP2011232243A (ja) * 2010-04-28 2011-11-17 Canon Inc 計測装置

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JP2016125895A (ja) 2016-07-11
WO2016104223A1 (ja) 2016-06-30

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