JP6344313B2 - Coating film width measuring method and coating film width measuring apparatus - Google Patents

Description

  The present invention relates to a coating film width measuring method and a coating film width measuring apparatus.

  There is a technique for measuring the width of an applied coating film on a coating member in which the coating film is applied to a belt-like substrate such as a metal foil. As a method for measuring the coating film width, for example, the position of both edges of the coating film in the width direction of the coating member is detected by a sensor such as a laser displacement meter, and the detected width direction distance of both edges is measured. A technique for calculating the width dimension has been developed. For example, with respect to the coating member to be transported, first, the displacement (height) in the thickness direction of the coating member is measured at a plurality of different positions in the width direction of the coating member with a laser displacement meter or the like. The profile (correlation diagram, correlation curve) of the height of the coating member corresponding to each width direction position is acquired. Then, the width direction position where the height value matches the preset threshold value is detected as the width direction position of the edge of the coating film. And the distance between the detected two edges is computed as a width direction dimension of a coating film.

  On the other hand, the surface of the belt-shaped substrate to be transported may not be flat. For example, the belt-shaped substrate may be lifted or fluttered. In addition, when detecting the height of the belt-shaped substrate using a laser displacement meter or the like, noise may be generated due to vibration or halation caused by conveyance of the belt-shaped substrate. In such a case, the height of the coating member measured by a laser displacement meter or the like may be different from the actual height of the coating member. As a result, if the height of the belt-like base material is erroneously detected higher than the actual height, and the erroneously detected height value matches the threshold value, the position is mistaken for the edge of the coating film. There is a risk of detection. As a technique for solving the above problem, Patent Document 1 accurately detects the position in the width direction of the edge of the coating film without erroneous detection by canceling the lifting or noise component of the band-shaped substrate in the profile. A coating width measurement method that can be used is disclosed.

JP2013-142612A

  By the way, in a coating member, the factor which misdetects the height of a coating member may generate | occur | produce not only in a strip | belt-shaped base material but in a coating film. For example, in the coating film, a depression that is recessed from the original coating film height may occur in the coating film due to some influence, which may cause erroneous detection of the coating film height. If the dent is formed deeper than the threshold value, the position of the dent may be erroneously detected as the edge position of the coating film. As a result, the coating film width may not be measured accurately.

  The purpose of the present invention is in the case where a factor that can erroneously detect the height of the coating member occurs in both the belt-like substrate and the coating film in the coating member formed by laminating the coating film on the belt-like substrate. Even if it exists, it is providing the coating-film width measuring method and coating-film width measuring apparatus which can measure a coating-film width accurately.

  The coating film width measuring method according to the present invention detects the positions of edges on both sides of the coating film in the width direction of the coating member, with respect to the coating member formed by laminating the coating film on the belt-shaped substrate. A coating width measuring method for measuring a distance in the width direction of the detected edges on both sides as a width of the coating film, wherein each of the plurality of positions in the width direction of the coating member is measured. Using the measurement data indicating the height of the coating member relative to a surface, obtaining a first profile indicating the height of the coating member relative to the position in the width direction of the coating member; and Using the first profile, obtaining a substrate height corresponding to the height of the substrate to which the coating film to be measured is applied, and using the first profile, Get the coating height corresponding to the coating height Based on the process and the base material height and the coating height, lower than the coating height, than the height of the assumed noise that can be erroneously detected as the edge of the coating film at a position corresponding to the base material A high first threshold value is set, and a second threshold value that is lower than the first threshold value, higher than the base material height, and corresponding to the height of the coating film to be measured as the width of the coating film is set. A step of searching for a first point having a height exceeding the first threshold value from the outside in the width direction of the coating member to the inside in the first profile; and the first profile. Then, from the first point toward the outer side in the width direction of the coating member, a second point having a height lower than the second threshold value is searched, and the second point is determined as the measurement target. A first edge determining step for determining the edge of the coating film; The coating both sides distance in the width direction of the determined edge for the film to be measured, and a step of calculating the width of the coating film of the measurement object.

  Moreover, the coating film width measuring device according to the present invention is the coating member formed by laminating the coating film on the belt-like base material, and positions of the edges on both sides of the coating film in the width direction of the coating member, respectively. A coating film width measuring apparatus that detects and measures the distance in the width direction of the detected edges on both sides as the width of the coating film, wherein the height of the coating member relative to a measurement reference plane is determined as the coating material. At least one sensor that measures each of a plurality of positions in the width direction of the work member, and an arithmetic device that performs a process for measuring the width of the coating film. The arithmetic device receives a measurement result from the sensor. A data acquisition unit for acquiring a first profile indicating a height of the coating member with respect to a position in a width direction of the coating member using the measurement data; and the first profile Use to measure A height acquisition unit for acquiring a substrate height corresponding to the height of the substrate on which the coating film is applied, and a coating height corresponding to the height of the coating film to be measured, and the substrate Based on the height and the coating height, a first threshold value lower than the coating height and higher than an assumed noise height that can be erroneously detected as an edge of the coating film at a position corresponding to the substrate. A threshold setting unit that sets a second threshold value that is lower than the first threshold value, higher than the substrate height, and corresponding to the height of the coating film to be measured as the width of the coating film; In the first profile, from the outer side in the width direction of the coating member toward the inner side, a first point that is higher than the first threshold value is searched, and in the first profile, the first point From the point toward the outside in the width direction of the coating member, the second threshold value is set. An edge determination unit that searches for a second point that is a turning height and determines that the second point is an edge of the coating film to be measured, and the determination is made on both sides of the coating film to be measured. And a coating film width calculating unit that calculates the distance in the width direction of the edge as the width of the coating film to be measured.

  When a factor that may cause a false detection of the height of the coating member occurs, the height of the substrate on which the coating film is applied in the coating member increases from the original height, and the coating film height exceeds the original height. It may happen that the height of the coating member is erroneously detected so that the height of the coating member also descends. By being configured as described above, the present invention suppresses erroneous detection of the position corresponding to the rising portion (assumed noise) of the base material or the falling portion of the coating film as the position of the edge of the coating film. It is possible. Therefore, according to the present invention, it is possible to accurately measure the coating film width even when a factor that may erroneously detect the height of the coating member occurs in both the belt-shaped substrate and the coating film.

  Preferably, the coating film width measuring method continuously measures the width of the coating film as the coating member is transported at a plurality of measurement positions in the transport direction of the coating member to be transported. Based on the determined position of the edge of the coating film in the width direction of the coating member, for the measurement position next to the measurement position where the edge is determined in the transport direction, the base material height and The method further includes a step of setting a first range and a second range in the width direction of the coating member for calculating the coating height, and acquiring the base material height in the first range. Then, the coating height is acquired in the second range.

  Since the present invention is configured as described above, the first range for acquiring the substrate height and the second range for acquiring the coating height are more appropriately set. can do. Thereby, the first threshold value and the second threshold value can be set more appropriately. Therefore, the present invention can detect the edge of the coating film with higher accuracy.

  Preferably, the coating member is formed by laminating at least a first coating film and a second coating film on the belt-shaped substrate, and in the first profile, the height of the coating member is high. Differentiating the thickness with respect to the width direction of the coating member, obtaining a second profile indicating a differential value of the height of the coating member corresponding to the position in the width direction of the coating member; In the profile of 2, obtaining the maximum value of the differential value in each of the first region and the second region divided by a predetermined first gap in the width direction of the coating member; The maximum value of the differential value in the first region when the sum of the maximum value of the differential value in the first region and the maximum value of the differential value in the second region is the maximum. The position in the width direction of the coating member is the first position. The second position is determined as the edge position of the coating film, and the position in the width direction of the coating member taking the maximum value of the differential value in the second region is determined as the edge position of the second coating film. An edge determination step, and for a first measurement position among a plurality of measurement positions in the conveyance direction of the coating member, the edge of the coating film is determined by the second edge determination step, and the coating Regarding the Nth measurement position (N is an integer of 2 or more) among the plurality of measurement positions in the conveyance direction of the work member, the edge of the coating member in the width direction of the edge determined at the N-1th measurement position is measured. Based on the position, the first range and the second range are set, the base material height is obtained in the set first range, and the coating height is set in the set second range. The first edge determination process Determining the edge of the coating film by.

  By being configured as described above, the present invention detects the edge of the coating film without obtaining the substrate height and coating height for the first measurement position in the conveying direction of the coating member. An edge can be detected with high accuracy by the possible second edge determination step. The Nth measurement position (N is an integer of 2 or more) in the conveying direction of the coating member is the first based on the position of the edge in the width direction of the coating member determined at the N-1th measurement position. The range of 1 and the 2nd range are set, and the edge of a coating film is continuously detected by the 1st edge judgment process. This makes it possible to detect the edge of the coating film with higher accuracy at each of a plurality of measurement positions in the conveying direction of the coating member.

  Preferably, the method further includes a step of acquiring a distribution in the height direction from the measurement profile, and acquiring the base material height and the coating height based on the distribution in the height direction.

  Since the present invention is configured as described above, it is possible to acquire the substrate height and the coating height without setting the first range and the second range. Accordingly, the position of the edge of the coating film can be detected with higher accuracy.

  According to the present invention, in the coating member formed by laminating the coating film on the belt-like base material, when a factor that can erroneously detect the height of the coating member occurs in both the belt-like base material and the coating film. Even if it exists, the coating-film width measuring method and coating-film width measuring apparatus which can measure a coating-film width accurately can be provided.

1 is an external view of a coating film width measuring apparatus according to a first embodiment. It is sectional drawing and the top view of the coating-film width measuring apparatus concerning Embodiment 1. FIG. 3 is a flowchart showing a coating film width measuring method according to the first embodiment. FIG. 3 is a functional block diagram showing a configuration of an edge detection unit according to the first exemplary embodiment. 3 is a flowchart illustrating an edge detection method according to the first exemplary embodiment. FIG. 6 is a diagram illustrating details of a measurement profile on the left side according to the first embodiment. It is the elements on larger scale of the measurement profile shown in FIG. FIG. 6 is a diagram for explaining a base material height calculation method according to the first exemplary embodiment; It is a figure for demonstrating the calculation method of the coating height concerning Embodiment 1. FIG. FIG. 6 is a diagram for explaining a method for setting an upper limit threshold and a lower limit threshold according to the first embodiment; It is a figure for demonstrating the method to judge the edge of the coating film concerning Embodiment 1. FIG. It is a figure for demonstrating the method to calculate the coating-film width | variety concerning Embodiment 1. FIG. It is a figure for demonstrating measuring a coating-film width | variety about each measurement position of the conveyance direction of the coating member concerning Embodiment 1. FIG. It is a flowchart which shows the coating-film width | variety measuring method concerning a comparative example. It is a figure for demonstrating the coating-film width measuring method concerning a comparative example. It is a figure for demonstrating the problem concerning a comparative example. FIG. 6 is a functional block diagram illustrating a configuration of an edge detection unit according to a second exemplary embodiment. 10 is a flowchart illustrating an edge detection method according to the second exemplary embodiment. It is a figure for demonstrating the method to set the base-material height calculation range concerning Embodiment 2, and a coating height calculation range. FIG. 9 is a functional block diagram illustrating a configuration of an edge detection unit according to a third embodiment. It is a flowchart which shows the method of determining the base-material height and coating height concerning Embodiment 3. FIG. It is a figure for demonstrating the method to determine the base-material height and coating height concerning Embodiment 3. FIG. FIG. 9 is a functional block diagram illustrating a configuration of an edge detection unit according to a fourth embodiment. 10 is a flowchart illustrating an edge detection method according to a fourth exemplary embodiment. FIG. 10 is a diagram for explaining edge detection processing according to the fourth embodiment; FIG. 10 is a diagram for explaining edge detection processing according to the fourth embodiment; FIG. 10 is a diagram for explaining edge detection processing according to the fourth embodiment; FIG. 10 is a diagram for explaining edge detection processing according to the fourth embodiment; FIG. 10 is a functional block diagram illustrating a configuration of an edge detection unit according to a fifth embodiment. 10 is a flowchart illustrating an edge detection method according to a fifth exemplary embodiment. It is a figure which illustrates the coating member concerning a modification.

(Embodiment 1)
Embodiments of the present invention will be described below with reference to the drawings. Note that, in each drawing, the same element is denoted by the same reference numeral, and redundant description is omitted as necessary.

  FIG. 1 is an external view of a coating film width measuring apparatus 1 according to the first embodiment. FIG. 2 is a cross-sectional view and a plan view of the coating film width measuring apparatus 1 according to the first embodiment. 2A shows a cross-sectional view of the coating film width measuring apparatus 1, and FIG. 2B shows a plan view of the coating film width measuring apparatus 1. FIG. In FIG. 2, (c) illustrates a measurement profile (first profile). The measurement profile will be described later. The coating film width measuring device 1 includes a sensor 10, a roller 30, and a calculation device 100. The roller 30 conveys the coating member 50 in the arrow A direction by rotating in the arrow B direction.

  The coating member 50 is formed by laminating a coating film on a belt-like base material 52 formed long in the transport direction (arrow A direction). In the first embodiment, the coating member 50 has a coating film 54 (coating film A) applied to one surface (front surface) of the strip-shaped substrate 52, and the other surface of the strip-shaped substrate 52 ( The coating film 56 (coating film B) is formed on the surface facing the roller 30; the back surface. Here, when the coating member 50 is transported by the roller 30, the coating member 50 is in close contact with the roller 30 due to the tension applied in the transport direction. As a result, as shown in FIG. 2, the vicinity of both ends in the width direction (arrow W direction) of the belt-like substrate 52 and the coating film 56 are in contact with the roller 30. And about the location (range shown by arrow W1 of FIG. 2) where the coating film 56 was apply | coated to the back surface of the strip | belt-shaped base material 52, it is in a height direction (arrow H direction of FIG. 2) with respect to the surface of the roller 30. It becomes a raised state. In addition, the conveyance direction (arrow A direction) of the coating member 50 is substantially orthogonal to the width direction (arrow W direction) of the coating member 50.

  In addition, the strip | belt-shaped base material 52 may be metal foil, for example. The coating film 54 and the coating film 56 may be, for example, a coating film (electrode mixture layer) having a battery electrode material (active material powder or the like) and a binder. In addition, the coating member 50 may be, for example, a battery electrode in which an electrode mixture layer that is a coating film 54 and a coating film 56 is coated on the surface of a metal foil that is a band-shaped substrate 52.

  The sensor 10 is a laser displacement meter, for example, and measures the height (thickness) of the coating member 50. Specifically, the sensor 10 is provided, for example, on the upper side of the roller 30. The sensor 10 uses the surface of the roller 30 facing the sensor 10 as a measurement reference surface 30a, and changes the displacement in the height direction of the coating member 50 conveyed by the roller 30 in the width direction (arrow W direction) of the coating member 50. Measure at each of a plurality of different positions. Thereby, the sensor 10 measures the height of the coating member 50 on the basis of the measurement reference plane 30a for each of a plurality of different positions in the width direction of the coating member 50. Then, the sensor 10 outputs measurement data indicating the measurement result (the value of the height Y [μm] with respect to the position X [mm] in the width direction of the coating member 50) to the arithmetic device 100.

  Here, the sensor 10 includes two sensors 10 </ b> L and 10 </ b> R provided side by side in the width direction of the coating member 50. The sensor 10 </ b> L is provided on the left side in the width direction of the coating member 50, and the sensor 10 </ b> R is provided on the right side in the width direction of the coating member 50. The sensor 10 </ b> L measures the height of the coating member 50 in the measurement width WL on the left side of the coating member 50. The sensor 10 </ b> R measures the height of the coating member 50 in the measurement width WR on the right side of the coating member 50. That is, the sensor 10 does not need to measure the height near the center of the coating member 50.

  The arithmetic device 100 is, for example, a computer and includes a processing device such as a CPU (Central Processing Unit) and a storage device such as a RAM (Random Access Memory) and a ROM (Read Only Memory). Arithmetic device 100 acquires measurement data from sensor 10, and performs processing for measuring the width (coating film width) of coating film 54 (coating film A) and coating film 56 (coating film B). In addition, the arithmetic device 100 includes a data acquisition unit 102, an edge detection unit 110, and a coating film width calculation unit 104. These components of the arithmetic device 100 can be realized by a processing device executing a program stored in a storage device (the same applies to other embodiments). On the other hand, each component of the arithmetic device 100 may be realized as hardware by some circuit configuration or the like, not as software as described above. The operation of each component of the arithmetic device 100 will be described with reference to the flowchart shown in FIG.

  FIG. 3 is a flowchart illustrating the method for measuring the coating film width according to the first embodiment. Each step of the flowchart shown in FIG. 3 is performed by the arithmetic device 100. First, the data acquisition unit 102 of the arithmetic device 100 acquires measurement data from the sensor 10 (S10). Next, the data acquisition unit 102 acquires the measurement profile 80 illustrated in FIG. 2C using the acquired measurement data (S12). Here, the measurement profile is a curve (correlation curve, correlation diagram) showing the height Y with respect to the position X in the width direction of the coating member 50. Specifically, the data acquisition unit 102 uses the measurement data acquired from the sensor 10L to create a measurement profile 80L on the left side of the coating member 50 in the width direction. In addition, the data acquisition unit 102 uses the measurement data acquired from the sensor 10R to create a measurement profile 80R on the right side of the coating member 50 in the width direction.

  The edge detector 110 of the arithmetic device 100 detects the left edge ELa of the coating film 54 (coating film A) using the measurement profile 80L (S20). Specific processing of S20 will be described later. Similarly to the processing of S20, the edge detection unit 110 detects the right edge ERa of the coating film 54 (coating film A) using the measurement profile 80R (S30). The processing of S30 is substantially the same as that in which the left and right are reversed in the processing of S20, and thus description thereof is omitted. In the following description, the left edge detection process of the coating film will be described, and a specific description of the right edge detection process of the coating film will be omitted.

  The coating film width calculation unit 104 of the arithmetic device 100 calculates the coating film width WC (WCa) of the coating film A from the detected left edge ELa and right edge ERa (both edges) of the coating film A ( S40). Thereby, the coating-film width measuring apparatus 1 measures the coating-film width WC of a coating film. Specifically, the coating film width calculation unit 104 stores in advance a sensor interval Ws that is an interval between the sensor 10L and the sensor 10R, and the sensor interval Ws, the width direction position XLa of the edge ELa, and the edge The coating film width WCa is calculated from the width direction position XRa of ERa. Here, the sensor interval Ws is a distance between a position corresponding to the right end of the measurement width WL of the sensor 10L and a position corresponding to the left end of the measurement width WR of the sensor 10R. Further specific methods will be described later.

  Moreover, the arithmetic unit 100 calculates the coating-film width WC (WCb) of the coating film 56 (coating film B) similarly to the process of S20-S40 (S50). Specifically, the edge detection unit 110 detects the left edge ELb of the coating film 56 (coating film B) using the measurement profile 80L in the same manner as the process of S20. Moreover, the edge detection part 110 detects the edge ERb on the right side of the coating film 56 (coating film B) using the measurement profile 80R similarly to the process of S30. Then, in the same manner as the process of S40, the coating film width calculation unit 104 determines the coating film B from the width direction position XLb of the left edge ELb of the detected coating film B and the width direction position XRb of the right edge ERb. The coating film width WC (WCb) is calculated.

  In addition, as the coating member 50 is transported in the transport direction (arrow A direction), the arithmetic device 100 repeats the processes of S10 to S50 for each measurement position in the transport direction (S60). Thereby, the coating film width measuring apparatus 1 measures the coating film width at each measurement position in the transport direction of the coating member 50.

Next, the edge detection method according to the first embodiment will be described in detail.
FIG. 4 is a functional block diagram of the configuration of the edge detection unit 110 according to the first embodiment. The edge detection unit 110 includes a height calculation unit 112 (height acquisition unit), a threshold setting unit 114, and an edge determination unit 116. The operation of each component of the edge detection unit 110 will be described with reference to the flowchart shown in FIG.

  FIG. 5 is a flowchart of the edge detection method according to the first embodiment. FIG. 5 shows details of the process of S20 shown in FIG. 3, that is, the method of detecting the left edge of the coating film A. FIG. 6 is a diagram illustrating details of the left measurement profile 80L according to the first embodiment. As shown in FIG. 6, the measurement profile 80 </ b> L indicates the height Y with respect to the width direction position X of the coating member 50, where the horizontal axis is the width direction position X and the vertical axis is the height Y.

  The measurement profile 80L includes a coating film A coating height portion 80a corresponding to the height of the coating film A, a coating film B coating height portion 80b corresponding to the height of the coating film B, and the band-shaped substrate 52. And a belt-like base material height portion 80c corresponding to the height. Here, the height Y in the coating film A coating height portion 80a corresponds to the sum of the thickness of the coating film A, the thickness of the belt-like substrate 52, and the thickness of the coating film B. The height Y in the coating film B coating height portion 80 b corresponds to the sum of the thickness of the strip-shaped substrate 52 and the thickness of the coating film B. The height Y in the belt-like base material height portion 80 c corresponds to the thickness of the belt-like base material 52.

  Further, the measurement profile 80L has a coating film A rising portion 80e corresponding to the rising position of the coating film A between the coating film A coating height portion 80a and the coating film B coating height portion 80b. In addition, the measurement profile 80L has a coating film B rising portion 80f corresponding to the rising position of the coating film B between the coating film B coating height portion 80b and the belt-like substrate height portion 80c. It is estimated that the left edge ELa of the coating film A is included in or near the coating film A rising portion 80e. Further, it is presumed that the left edge ELb of the coating film B is included in or near the rising portion 80f of the coating film B.

  The measurement data does not accurately indicate the height of the coating member 50 due to a factor (for example, noise) that may erroneously detect the height of the coating member. Therefore, in the measurement profile 80L, each of the coating film A coating height part 80a, the coating film B coating height part 80b, the belt-like substrate height part 80c, the coating film A rising part 80e, and the coating film B rising part 80f. The boundary is no longer clear. Even in such a case, the coating film width measuring apparatus 1 according to the present embodiment can detect the coating film width more accurately.

  FIG. 7 is a partially enlarged view of the measurement profile 80L shown in FIG. FIG. 7 shows an enlarged measurement profile 80L with respect to a portion surrounded by a broken line in FIG. As shown in FIG. 7, the coating film A coating height portion 80a and the coating film B coating height portion 80b are not actually smooth but have a jagged shape due to noise or the like. Further, the coating film A rising portion 80e can also have a jagged shape due to noise or the like. Hereinafter, the process relating to the portion shown in FIG. 7 in the measurement profile 80L, that is, the process relating to the vicinity of the coating film A rising portion 80e will be described. By this processing, the left edge ELa of the coating film A is detected. Further, the same processing is performed for the vicinity of the coating film B rising portion 80f other than the position shown in FIG. 7, and the left edge ELb of the coating film B is detected.

  The height calculation unit 112 of the arithmetic device 100 calculates the base material height HB using the measurement profile 80L (S202). That is, the height calculation unit 112 acquires the base material height HB. Here, the “base material” is an object to which a coating film to be measured (coating film 54 (coating film A) in this example) is applied. In this example, the base material of the coating film 54 is a portion where the coating film B is applied to the back surface of the belt-like base material 52. The “base material height” is the height Y of the base material to which the coating film to be measured (the coating film 54 (coating film A) in this example) is applied. Therefore, the substrate height HB related to the coating film 54 corresponds to the height Y of the coating film B coating height portion 80b. Here, as described above, the height Y of the coating film B coating height portion 80b is not constant due to the influence of noise or the like. Therefore, as described below, the height calculation unit 112 calculates the base material height HB used for detecting the edge.

  FIG. 8 is a diagram for explaining a calculation method of the substrate height HB according to the first embodiment. The height calculation unit 112 calculates the substrate height HB in the substrate height calculation range 82 (first range) surrounded by a broken line in the measurement profile 80L shown in FIG. For example, there are the following two methods for calculating the specific substrate height HB. The first method is a method (minimum value method) in which the lowest point of the coating film B coating height portion 80b in the base material height calculation range 82 is the base material height HB. In this case, the height Y indicated by the alternate long and short dash line A in FIG. 8 is the substrate height HB. The second method is a method of calculating the average of the height Y of the coating film B coating height portion 80b in the base material height calculation range 82 and setting the average value as the base material height HB (average value method). It is. In this case, the height Y indicated by the alternate long and short dash line B in FIG. 8 is the substrate height HB. In the first embodiment, the base material height calculation range 82 may be a fixed range that is arbitrarily specified, but is set each time by some method as in other embodiments described later. May be.

  The height calculation unit 112 calculates the coating height HC using the measurement profile 80L (S204). That is, the height calculation unit 112 acquires the coating height HC. Here, the “coating height” is the height Y of the coating film to be measured (coating film 54 (coating film A) in this example). The coating height HC related to the coating film 54 corresponds to the height Y of the coating film A coating height portion 80a. Here, as described above, the height Y of the coating film A coating height portion 80a is not constant due to the influence of noise or the like. Therefore, as described below, the height calculation unit 112 calculates the coating height HC used for detecting the edge.

  FIG. 9 is a diagram for explaining a method of calculating the coating height HC according to the first embodiment. The height calculation unit 112 calculates the coating height HC in the coating height calculation range 84 (second range) surrounded by a broken line in the measurement profile 80L shown in FIG. As a specific method for calculating the substrate height HC, for example, there are the following two methods. The first method is a method (maximum value method) in which the highest point of the coating film A coating height portion 80a in the coating height calculation range 84 is the coating height HC. In this case, the height Y indicated by the one-dot chain line A in FIG. 9 is the coating height HC. The second method is a method of calculating the average of the height Y of the coating film A coating height portion 80a in the coating height calculation range 84 and setting the average value as the coating height HC (average value method). It is. In this case, the height Y indicated by the one-dot chain line B in FIG. 9 is the coating height HC. In the first embodiment, the coating height calculation range 84 may be a fixed range that is arbitrarily specified, but is set each time by some method as in other embodiments described later. May be.

  The threshold setting unit 114 of the arithmetic device 100 sets the upper limit threshold Th1 (first threshold) and the lower limit threshold Th2 (second threshold) using the calculated base material height HB and coating height HC. (S206). Here, the definitions of “upper limit threshold” and “lower limit threshold” will be described. The “upper limit threshold value” is a coating film B coating height portion when the height Y (base material height HB) of the coating film B coating height portion 80b is increased due to the influence of halation (noise) or the like. This corresponds to the upper limit of the height Y of 80b. In other words, the “upper limit threshold value” may be assumed to be generated due to the influence of halation or the like, and noise (which may be erroneously detected as an edge of the coating film A in the coating film B coating height portion 80b (position corresponding to the base material)). It is higher than the expected noise). That is, even if the height Y of the coating film B coating height portion 80b is increased due to the influence of halation or the like, the height Y of the coating film B coating height portion 80b is equal to the upper limit threshold Th1. It can be: Further, the “lower threshold” corresponds to a height that defines the edge of the coating film A. In other words, the “lower threshold” corresponds to the height of the coating film A to be measured as the width of the coating film A. That is, the coating height of the coating film A corresponding to the coating film width of the coating film A can be higher than this lower limit threshold. Here, the lower limit threshold Th2 is lower than the upper limit threshold Th1. Therefore, when the height Y of the coating film B coating height portion 80b is increased due to the influence of halation or the like, the height Y of the coating film B coating height portion 80b may be higher than the lower limit threshold Th2. .

  FIG. 10 is a diagram for explaining a method of setting the upper limit threshold Th1 and the lower limit threshold Th2 according to the first embodiment. The threshold setting unit 114 sets an upper limit threshold Th1 and a lower limit threshold Th2 from the difference between the coating height HC and the substrate height HB. As shown in FIG. 10, the threshold setting unit 114 sets an upper limit threshold Th1 at a position slightly lower than the coating height HC from (HC−HB), and a lower limit at a position slightly higher than the base material height HB. A threshold value Th2 is set.

For example, the threshold setting unit 114 sets the upper limit threshold Th1 using the following formula 1 and sets the lower limit threshold Th2 using the following formula 2.
(Formula 1): Th1 = (HC−HB) * C1 + HB
(Formula 2): Th2 = (HC−HB) * C2 + HB
C1 and C2 are constants, and 1>C1>C2> 0. For example, although C1 = 0.7 and C2 = 0.3, it is not limited to this. In this case, the difference between the coating height HC and the upper limit threshold Th1 and the difference between the lower limit threshold Th2 and the base material height HB are (HC−HB) * 0.3. C1 and C2 can be set in advance so as to satisfy the definitions of the “upper limit threshold” and the “lower limit threshold” described above. That is, C1 can be set so that the “upper limit threshold” is higher than the height of the assumed noise. C2 may be set so that the “lower threshold” corresponds to the height of the coating film A to be measured as the width of the coating film A.

  Next, the edge determination unit 116 of the arithmetic device 100 searches the measurement profile 80L for a point P1 (first point) that exceeds the upper limit threshold Th1 from the outer side to the inner side in the width direction of the coating member 50 ( S208). Then, the edge determination unit 116 determines whether or not the point P1 has been found (S210). If the point P1 is not found (NO in S210), the process of S208 is repeated until the point P1 is found.

  When the point P1 is found (YES in S210), the edge determination unit 116 falls below the lower limit threshold Th2 from the found point P1 toward the outside in the width direction of the coating member 50 in the measurement profile 80L. Search for (second point) (S212). Then, the edge determination unit 116 determines whether or not the point P2 has been found (S214). If the point P2 is not found (NO in S214), the process of S212 is repeated until the point P2 is found. When the point P2 is found (YES in S214), the edge determining unit 116 determines the found point P2 as the edge ELa (S216). Hereinafter, the processing of S208 to S216 will be described with reference to FIG.

  FIG. 11 is a diagram for explaining a method of determining the edge of the coating film according to the first embodiment. Here, the “outside” means the end portion side in the width direction of the coating member 50, and is the left side in the measurement profile 80 </ b> L illustrated in FIG. 11. Further, “inner side” means the center side in the width direction of the coating member 50, and is the right side in the measurement profile 80L shown in FIG.

  First, in the process of S208, as indicated by an arrow A in FIG. 11, the edge determination unit 116 searches for a point P1 that exceeds the upper limit threshold Th1 from the outside toward the inside. At this time, as described above, when the height Y of the coating film B coating height portion 80b (the portion corresponding to the base material of the coating film A) is increased due to the influence of halation or the like (broken line in FIG. 11) However, the height Y of the coating film B coating height portion 80b is equal to or less than the upper limit threshold value. Therefore, the edge determination part 116 does not find the point P1 exceeding the upper limit threshold Th1 in the coating film B coating height part 80b. In this way, in the processing of S208, the edge determination unit 116 determines that the height Y of the coating film B coating height portion 80b (the portion corresponding to the base material of the coating film A) is the actual height due to the influence of halation or the like. It is possible to suppress erroneous detection of a position (indicated by an arrow C in FIG. 11) that is higher than the edge as an edge.

  On the other hand, at a position corresponding to the vicinity of the edge of the coating film A (the coating film A rising portion 80e or the coating film A coating height portion 80a), the height Y increases due to the presence of the coating film A and exceeds the upper limit threshold Th1. . Therefore, the edge determination part 116 finds the point P1 exceeding the upper limit threshold Th1 in the coating film A rising part 80e or the coating film A coating height part 80a.

  Next, in the process of S212, as indicated by the arrow B in FIG. 11, the edge determination unit 116 searches for a point P2 that falls below the lower limit threshold Th2 from the point P1 toward the outside. As described above, the point P1 corresponds to a position where the height Y increases due to the presence of the coating film A and exceeds the upper limit threshold Th1. Therefore, the edge of the coating film A exists outside this point P1 (on the side of the belt-like substrate). Therefore, the edge determination unit 116 can detect the edge ELa corresponding to the point P2 by searching for the point P2 that is lower than the lower limit threshold Th2 outward from the point P1.

  Furthermore, the position of the depression (shown by a broken line in FIG. 11) formed in the coating film A is erroneously detected as the edge ELa by searching for a point P2 that falls below the lower limit threshold Th2 toward the outside starting from the point P1. Is suppressed. Temporarily, when searching for the point P2 which falls below the lower limit threshold Th2 from the inside to the outside, the height Y of the position of the dent formed in the coating film A (shown by the arrow D in FIG. 11) is below the lower limit threshold Th2. The position of the dent is erroneously detected as an edge. On the other hand, in the present embodiment, the starting point for searching for the point P2 below the lower limit threshold Th2 is the point P1, and the point P1 is outside the position where the depression is formed. Thereby, in the process of searching for the point P2 (edge position of the coating film) that is lower than the lower limit threshold Th2, searching for the position where the depression is formed can be excluded. Therefore, in the present embodiment, erroneous detection of the position of the depression formed in the coating film A as the edge ELa is suppressed.

  In the above description, the method of detecting the left edge ELa of the coating film A is shown, but the left edge ELb of the coating film B can be detected in the same manner. In this case, the base material of the coating film 56 (coating film B) is a belt-like base material 52 that is an object to which the coating film 56 (coating film B) to be measured is applied. And the base material height HB of the coating film 56 (coating film B) respond | corresponds to the height Y of the strip | belt-shaped base material height part 80c. The coating height HC of the coating film 56 (coating film B) corresponds to the height Y of the coating film B coating height portion 80b.

  FIG. 12 is a diagram for explaining a method (S40) of calculating the coating film width according to the first embodiment. As described above, the edge detection unit 110 detects the edge ELa at the width direction position X = XLa using the measurement profile 80L of the measurement width WL. Similarly, the edge detection unit 110 detects the edge ERa at the width direction position X = XRa using the measurement profile 80R of the measurement width WR.

Here, in both the measurement profiles 80L and 80R, the reference value (0 value) of the width direction position X is the left side. Further, as described above, the sensor interval Ws is a distance between a position corresponding to the right end of the measurement width WL of the sensor 10L and a position corresponding to the left end of the measurement width WR of the sensor 10R. Therefore, the coating film width calculation unit 104 of the arithmetic device 100 calculates the coating film width WC (WCa) of the coating film A using the following Expression 3.
(Formula 3): WCa = (WL−XLa) + Ws + XRa

Note that the sensor interval Ws may be shifted due to reasons such as the operator contacting the sensor 10. In such a case, the sensor interval Ws can be adjusted as follows. That is, the above-described measurement is performed on a master work whose coating film width WC is known in advance, and the edge position is detected to measure the coating film width. Then, the sensor interval Ws is adjusted so that the measurement result matches the known value in the master work. That is, assuming that the coating width of the master workpiece is WCm, the left edge position of the detected coating film is X = L, and the right edge position of the detected coating film is X = R, Equation 3 As shown in FIG. 4, the sensor interval Ws is set.
(Formula 4): Ws = WCm− (WL−L) −R

  FIG. 13 is a diagram for explaining the measurement of the coating film width at each measurement position in the transport direction of the coating member 50 according to the first embodiment. As shown in FIG. 3, in the process of S <b> 60, the arithmetic device 100 measures the coating film width at each measurement position in the transport direction of the coating member 50. As shown in FIG. 13, first, the coating film width measuring apparatus 1 makes the first position Z_1 near the end in the longitudinal direction (conveying direction) of the coating member 50 face the sensor 10. And the coating-film width measuring apparatus 1 measures (calculates) a coating-film width as mentioned above in this 1st position Z_1. And the coating-film width | variety measuring apparatus 1 rotates the roller 30, conveys the coating member 50 in the arrow A direction, and sets the 2nd time position Z_2 of the conveyance direction downstream side of the coating member 50 rather than the 1st position Z_1. It is made to oppose the sensor 10. The coating film width measuring device 1 measures (calculates) the coating film width as described above at the second position Z_2.

  In the same manner, the coating film width measuring apparatus 1 rotates the roller 30 to convey the coating member 50 in the direction of arrow A, and is closer to the downstream side in the conveyance direction of the coating member 50 than the (N-1) th position Z_1. The Nth position Z_N is opposed to the sensor 10. And the coating-film width measuring apparatus 1 measures (calculates) a coating-film width as mentioned above in this Nth position Z_N. Here, N is an integer of 2 or more. In this way, the coating film width measuring apparatus 1 continuously measures the coating film width along with the conveyance of the coating member 50 at a plurality of measurement positions in the conveyance direction of the coating member 50. Note that the interval between the measurement positions in the transport direction may be constant. Further, the interval between the measurement positions can be determined according to the rotation speed of the roller 30 and the speed of the sensor 10.

(Comparative example)
Next, a comparative example will be described. FIG. 14 is a flowchart illustrating a method for measuring a coating film width according to a comparative example. Moreover, FIG. 15 is a figure for demonstrating the coating-film width measuring method concerning a comparative example. The coating film width measuring method according to the comparative example is performed by a coating film width measuring apparatus having a configuration substantially similar to that of the first embodiment. Also in the comparative example, measurement data is acquired from the sensor as in the first embodiment (S2). Then, similarly to the first embodiment, measurement profiles 80L and 80R are acquired from the measurement data (S4). Here, in the comparative example, the intersections of the measurement profiles 80L and 80R and the predetermined threshold Th are detected as the left edge EL and the right edge ER, respectively (S6). Then, the distance between the edge EL and the edge ER is measured as the coating film width WC (S8).

  FIG. 16 is a diagram for explaining the problem according to the comparative example. As described above, in the actual measurement profile 80, as indicated by the arrow A, the belt-like base material 52 may be lifted or fluttered. Further, as indicated by an arrow B, an edge defect may occur. Further, as indicated by an arrow C, the measurement profile 80 may locally become maximum due to noise such as halation. Moreover, as shown by the arrow D, the hollow of a coating film may be formed. In such a case, the measurement profile 80 has an intersection with the threshold Th at a position other than the edge. Therefore, in the comparative example, there is a possibility that the edge is erroneously detected. Therefore, in the comparative example, it is difficult to accurately measure the coating film width.

  On the other hand, in the first embodiment, erroneous detection of an edge is suppressed by the configuration described above. Therefore, in Embodiment 1, it is possible to accurately measure the width of the coating film laminated on the belt-like substrate 52.

(Embodiment 2)
Next, a second embodiment will be described.
In the first embodiment, the base material height calculation range 82 (FIG. 8) used when calculating the base material height HB (S202 in FIG. 5) is set to a arbitrarily specified fixed value. Similarly, the coating height calculation range 84 (FIG. 9) used when calculating the coating height HC (S204 in FIG. 5) is set to an arbitrarily designated fixed value.

  On the other hand, the second embodiment differs from the first embodiment in that the base material height calculation range 82 and the coating height calculation range 84 are not fixed values. That is, in the second embodiment, when the coating film width is continuously measured as the coating member 50 is transported, the arithmetic device 100 has a plurality of measurement positions in the transport direction of the coating member 50 (FIG. 13). In each case, the base material height calculation range 82 and the coating height calculation range 84 are set. Details will be described below.

  FIG. 17 is a functional block diagram of the configuration of the edge detection unit 200 according to the second embodiment. In the second embodiment, the edge detection unit 110 shown in FIG. The edge detection unit 200 includes a range setting unit 202, a height calculation unit 112, a threshold setting unit 114, and an edge determination unit 116. The operations of the height calculation unit 112, the threshold setting unit 114, and the edge determination unit 116 are substantially the same as the operations of the components in the first embodiment, and thus the description thereof is omitted (other implementations). The same applies to the form). The operation of the range setting unit 202 will be described with reference to the flowchart shown in FIG.

  FIG. 18 is a flowchart of an edge detection method (S220) according to the second embodiment. First, for edge detection processing relating to the first position Z_1 (FIG. 13) in the transport direction, the range setting unit 202 of the arithmetic device 100 sets the base material height calculation range 82 and the coating height calculation range 84 to the embodiment. Similarly to 1, it is set to an arbitrary fixed value (S222-1). Then, similarly to the process of S20, the edge detection unit 200 detects the edge position at the first position Z_1 in the transport direction (S224-1). That is, in the edge detection process for the first position Z_1, the edge detection unit 200 calculates the substrate height HB and the coating height HC in the same manner as in the first embodiment (S202, S204), thereby Edges are detected by the processes of S206 to S216.

  Next, for the edge detection process related to the second position Z_2 in the transport direction, the range setting unit 202 determines the base material height calculation range 82 and the coating height calculation range 84 from the edge position detected for the first position Z_1. Is set (S222-2). Then, the edge detection unit 200 uses the substrate height calculation range 82 and the coating height calculation range 84 set by using the edge position at the first position Z_1 in the transport direction in the same manner as the process of S20. The edge position is detected at the second position Z_2 (S224-2). That is, in the edge detection process related to the second position Z_2, the edge detection unit 200 uses the substrate height calculation range 82 and the coating height calculation range 84 set in the process of S222-2 to determine the substrate height. HB and coating height HC are calculated (S202, S204), and the edge is detected by the processing of S206 to S216.

  Similarly, for edge detection processing related to the Nth position Z_N in the transport direction, the range setting unit 202 calculates the base material height calculation range from the edge position detected for the N−1th position Z_ (N−1). 82 and the coating height calculation range 84 are set (S222-N). Then, the edge detection unit 200 performs the process of S20 by the base material height calculation range 82 and the coating height calculation range 84 set by using the edge position at the (N-1) th position Z_ (N-1). Similarly, the edge position is detected at the Nth position Z_N in the transport direction (S224-N).

  FIG. 19 is a diagram for explaining a method of setting the base material height calculation range 82 and the coating height calculation range 84 according to the second embodiment. In FIG. 19, the measurement profile 80- (N-1) at the (N-1) th position Z_ (N-1) is indicated by a broken line, and the measurement profile 80-N at the Nth position Z_N is indicated by a solid line. Yes. In the edge detection process at the (N-1) th position Z_ (N-1), the edge ELa (N-1) of the coating film is detected.

  At this time, the range setting unit 202 sets the base material height calculation range 82 at the Nth position Z_N to the left from the position of the edge ELa (N−1) as a range of A [mm] to B [mm]. Here, A and B are fixed values determined in advance from an empirical rule, and A> B. In addition, the range setting unit 202 sets the coating height calculation range 84 at the N-th position Z_N as a range of C [mm] to D [mm] to the right from the position of the edge ELa (N−1). Here, C and D are fixed values determined in advance from an empirical rule, and D> C.

  In the first embodiment, in order to detect the edge of the coating film with higher accuracy, it is necessary to set the upper limit threshold Th1 and the lower limit threshold Th2 more appropriately. Moreover, in order to set the upper limit threshold Th1 and the lower limit threshold Th2 more appropriately, it is necessary to calculate the base material height HB and the coating height HC more accurately. In order to calculate the base material height HB and the coating height HC more accurately, it is necessary to set the base material height calculation range 82 and the coating height calculation range 84 more appropriately, respectively.

  Here, the substrate height HB has a property of being stable in the vicinity of the edge of the coating film, and tends to flutter as the distance from the edge increases. Further, since the coating height HC has a large variation at the boundary between the coating film and the substrate in the vicinity of the coating film edge, it is preferable to calculate the coating height HC at an appropriate distance. That is, in order to calculate the base material height HB and the coating height HC more accurately, the base material height calculation range 82 and the coating height calculation range 84 can be set from the position in the width direction of the edge. preferable.

  Here, the width direction position of the coating film edge at the N-th position Z_N in the transport direction of the coating member 50 is the coating position detected for the (N-1) th position Z_ (N-1) in the transport direction of the coating member 50. It is considered that there is no significant difference from the position of the film edge in the width direction. That is, it is considered that the position in the width direction of the detected edge of the coating film is hardly shifted between the (N-1) th position Z_ (N-1) and the Nth position Z_N in the transport direction of the coating member 50. It is done.

  Therefore, when the edge detection unit 200 according to the second embodiment detects an edge at the Nth position Z_N in the transport direction of the coating member 50, the N−1th position Z_ (N in the transport direction of the coating member 50 is detected. The base material height calculation range 82 and the coating height calculation range 84 are set using the width direction position of the edge of the coating film detected about -1). In other words, when the edge detection unit 200 detects (determines) an edge at a certain measurement position in the conveyance direction of the coating member 50, the edge detection unit 200 detects the coating film detected at the previous measurement position in the conveyance direction of the coating member 50. The base material height calculation range 82 and the coating height calculation range 84 are set using the position in the width direction of the edge. Furthermore, in other words, the edge detection unit 200 uses the position in the width direction of the edge of the coating film detected (determined) for a certain measurement position in the transport direction of the coating member 50 to perform the next in the transport direction of the coating member 50. A substrate height calculation range 82 and a coating height calculation range 84 are set for the measurement position.

  With such a configuration, in the second embodiment, the base material height calculation range 82 and the coating height calculation range 84 can be set more appropriately, and thus the base material height HB and the coating height are set. HC can be calculated with higher accuracy. Thereby, in Embodiment 2, it becomes possible to detect the position in the width direction of the edge of the coating film with higher accuracy.

(Embodiment 3)
Next, Embodiment 3 will be described.
As described above, in order to detect the edge of the coating film with higher accuracy in the first embodiment, it is necessary to detect the base material height HB and the coating height HC with higher accuracy. The third embodiment is different from the other embodiments in that the substrate height HB and the coating height HC are determined from the distribution in the height direction in the measurement profile 80.

  FIG. 20 is a functional block diagram of the configuration of the edge detection unit 300 according to the third embodiment. In the third embodiment, the edge detection unit 110 shown in FIG. The edge detection unit 300 includes a height distribution acquisition unit 302, a height determination unit 304 (height acquisition unit), a threshold setting unit 114, and an edge determination unit 116. The operations of the height distribution acquisition unit 302 and the height determination unit 304 will be described with reference to the flowchart shown in FIG.

  FIG. 21 is a flowchart illustrating a method (S240) of determining the substrate height HB and the coating height HC according to the third embodiment. FIG. 22 is a diagram for explaining a method for determining the substrate height HB and the coating height HC according to the third embodiment. Note that the processing of the flowchart shown in FIG. 21 can be replaced with the processing of S202 and S204 of the flowchart according to the first embodiment shown in FIG.

  First, the height distribution acquisition unit 302 of the arithmetic device 100 counts the number of points at each height Y in the measurement profile 80 (S242). Next, the height distribution acquisition unit 302 acquires a height distribution 88 (distribution in the height direction), which is a distribution diagram (shown in the lower diagram of FIG. 22) of each counted height Y (S244). And the height determination part 304 of the arithmetic unit 100 is used for each layer (The coating-film A coating height part 80a, the coating-film B coating height part 80b, and a strip | belt-shaped base material from the peak (maximum point) in the height distribution 88. The height of the height portion 80c) is determined (S246). That is, the height determination unit 304 acquires the base material height HB and the coating height HC.

  The upper diagram of FIG. 22 is obtained by switching the X axis and the Y axis of the measurement profile 80 illustrated in FIG. The lower diagram of FIG. 22 shows the height distribution 88, the horizontal axis is the height Y of the coating member 50, and the vertical axis is the distribution (number of points) at each height Y.

  As shown in the upper diagram of FIG. 22, in the coating film A coating height portion 80a, although the height Y varies due to the influence of noise or fluttering, the coating film A rising portion 80e and the coating film B rising portion The fluctuation of the height Y is smaller than 80f. That is, the coating film A coating height portion 80a varies relatively small in the width direction in the vicinity of the actual height Y at a location corresponding to the coating film A coating height portion 80a. On the other hand, in the coating film A rising portion 80e and the coating film B rising portion 80f, the height Y greatly varies with respect to the width direction due to the rising of the coating film. Therefore, the number of points of each height Y in the coating film A coating height part 80a is larger than the number of points of each height Y in the coating film A rising part 80e and the coating film B rising part 80f. The height distribution 88 shown in FIG. 22 has a peak (indicated by an arrow A in FIG. 22) at Y = Ya near the actual height or the actual height in the coating film A coating height portion 80a. Can take.

  The same applies to the coating film B coating height portion 80b and the band-shaped substrate height portion 80c. That is, the number of points of each height Y in the coating film B coating height portion 80b is larger than the number of points of each height Y in the coating film A rising portion 80e and the coating film B rising portion 80f. The height distribution 88 shown in FIG. 22 can take a peak (indicated by an arrow B) at the actual height in the coating film B coating height portion 80b or at Y = Yb in the vicinity of the actual height. . Further, the number of points of each height Y in the belt-shaped substrate height portion 80c is larger than the number of points of each height Y in the coating film A rising portion 80e and the coating film B rising portion 80f. And the height distribution 88 shown in FIG. 22 can take a peak (indicated by arrow C) at Y = Yc in the vicinity of the actual height or the actual height in the band-shaped base material height portion 80c. That is, the height distribution 88 may have three peaks corresponding to the coating film A coating height part 80a, the coating film B coating height part 80b, and the belt-like substrate height part 80c.

  Therefore, in the process of S246, the height determination unit 304 determines the height Y = Ya when the peak (indicated by the arrow A) is taken at the position where the height Y is the largest in the height distribution 88 as the coating film A coating. The height of the work height portion 80a is determined. Further, the height determining unit 304 determines the height Y = Yb when the height Y takes a peak (indicated by an arrow B) at the position where the height Y is the second largest in the height distribution 88. The height of the portion 80b is determined. Further, the height determining unit 304 determines the height Y = Yc when the height Y takes a peak (indicated by an arrow C) at the position where the height Y is the smallest in the height distribution 88 as the height of the belt-shaped substrate height portion 80c. And decide. Therefore, when the coating film to be measured is the coating film A, the height determination unit 304 determines the height Y = Ya as the coating height HC and the height Y = Yb as the substrate height HB. To do. When the coating film to be measured is the coating film B, the height determining unit 304 determines the height Y = Yb as the coating height HC, and determines the height Y = Yc as the substrate height HB. To do.

  In Embodiment 1, it is necessary to set the base material height calculation range 82 and the coating height calculation range 84 when acquiring the base material height HB and the coating height HC. Here, the base material height calculation range 82 and the coating height calculation range 84 are arbitrarily fixed ranges in the first embodiment, and are set from arbitrary fixed values in the second embodiment. However, since an arbitrary fixed range or an arbitrary fixed value is determined by an operator from an empirical rule, there is a possibility that it does not correspond to the coating member 50 to be measured. On the other hand, in the third embodiment, the base material height HB and the coating are determined from the measurement profile 80 related to the coating member 50 to be measured without setting the base material height calculation range 82 and the coating height calculation range 84. It is possible to determine the height HC. Accordingly, in the third embodiment, the upper limit threshold Th1 and the lower limit threshold Th2 can be set more appropriately, so that the position in the width direction of the edge of the coating film can be detected with higher accuracy.

(Embodiment 4)
Next, a fourth embodiment will be described.
The fourth embodiment is different from the other embodiments described above in that the edges ELa and ERa of the coating film A and the edges ELb and ERb of the coating film B are detected from the differential values obtained by differentiating the measurement profile 80. In the following description, a method for detecting the left edge (ELa, ELb) of each coating film is shown. However, the right edge (ERa, ERb) is also processed substantially in the same manner by reversing the left and right sides. Is done.

  FIG. 23 is a functional block diagram of the configuration of the edge detection unit 400 according to the fourth embodiment. In the fourth embodiment, the edge detection unit 110 shown in FIG. The edge detection unit 400 includes a differential profile acquisition unit 402, a region division unit 404, a maximum value acquisition unit 406, a maximum value total unit 408, a region movement unit 410, and an edge determination unit 412. In addition, description about each component of the edge detection part 400 is demonstrated with the flowchart shown in FIG.

  FIG. 24 is a flowchart illustrating an edge detection method (S260) according to the fourth embodiment. FIGS. 25 to 28 are diagrams for explaining the edge detection processing according to the fourth embodiment. First, the differential profile acquisition unit 402 of the arithmetic device 100 differentiates the measurement profile 80 in the width direction of the coating member 50 to acquire a differential profile 90 (second profile) (S262). Specifically, the differential profile acquisition unit 402 differentiates the height Y of the measurement profile 80 illustrated in FIG. Then, the differential profile acquisition unit 402 acquires a differential profile 90 as illustrated in FIG. Here, the differential profile is a curve (correlation curve, correlation diagram) indicating a height differential value dY / dX, which is a differential value of height Y, corresponding to each position X in the width direction in the measurement profile.

  As illustrated in FIG. 25, the differential profile 90 includes a coating film A coating height differentiation unit 90a, a coating film B coating height differentiation unit 90b, a strip-shaped substrate height differentiation unit 90c, and a coating film A. It has a rising differentiation portion 90e and a coating film B rising differentiation portion 90f. The coating film A coating height differential part 90 a corresponds to the differential value in the coating film A coating height part 80 a of the measurement profile 80. The coating film B coating height differential part 90 b corresponds to the differential value in the coating film B coating height part 80 b of the measurement profile 80. The band-shaped substrate height differentiating portion 90 c corresponds to the differential value in the band-shaped substrate height portion 80 c of the measurement profile 80. The coating film A rising differentiation portion 90 e corresponds to the differential value in the coating film A rising portion 80 e of the measurement profile 80. The coating film B rising differentiation portion 90 f corresponds to the differential value in the coating film B rising portion 80 f of the measurement profile 80.

  In general, the lift of the base material is gentle and the rising edge of the coating film is steep. That is, in the measurement profile 80, the amount of change of the height Y in the coating film A rising portion 80e and the coating film B rising portion 80f with respect to the position X in the width direction is the coating film A coating height portion 80a and the coating film B coating height. It can be larger than the amount of change of the height Y in the width portion 80b and the band-shaped base material height portion 80c with respect to the position X in the width direction. Therefore, the height differential values dY / dX in the coating film A rising differentiation portion 90e and the coating film B rising differentiation portion 90f are the coating film A coating height differentiation portion 90a, the coating film B coating height differentiation portion 90b, and the belt-like shape. It may be larger than the height differential value dY / dX in the base material height differentiating portion 90c. That is, the height differential value dY / dX can be maximized in the coating film A rising differentiation portion 90e and the coating film B rising differentiation portion 90f. As described below, in the fourth embodiment, the edge detection unit 400 is positioned in the width direction where the height differential value dY / dX is maximized in the coating film A rising differentiation unit 90e and the coating film B rising differentiation unit 90f. X is determined to be an edge ELa and an edge ELb, respectively.

  As shown in FIG. 26, the region dividing unit 404 of the arithmetic device 100 divides the differential profile 90 into a right region 94R (first region) which is a right region and a left region which is a left region with a gap 92 therebetween. It is divided into 94L (second area) (S264). Here, the gap portion 92 is a gap (first gap) having a dimension of a distance D1 [mm] in the width direction of the coating member 50. Moreover, the space | interval D1 respond | corresponds to the length of the width direction in the coating-film B coating height differentiation part 90b (coating-film B coating height part 80b). The interval D1 is determined to be a distance that reliably enters between the position in the width direction of the edge ELa and the position in the width direction of the edge ELb. The distance D1 may be a dimension shorter by a predetermined length than the length in the width direction of the coating film B coating height portion 80b in the master work corresponding to the coating member 50. In the first process of S266, the gap 92 is set to be positioned near the left end in the differential profile 90.

  Next, the maximum value acquisition unit 406 of the arithmetic device 100 acquires the maximum value of the height differential value dY / dX in each of the right region 94R and the left region 94L (S266). Then, the maximum value totaling unit 408 of the arithmetic device 100 calculates the sum Sum of the maximum values of the height differential values dY / dX in each of the right region 94R and the left region 94L (S268). Then, the region moving unit 410 of the arithmetic device 100 determines whether or not the gap 92 has reached the right end of the differential profile 90 (S270). When the gap portion 92 has not reached the right end of the differential profile 90 (NO in S270), the region moving unit 410 moves the gap portion 92 to the right with respect to the position X in the width direction of the differential profile 90 (in FIGS. 26 and 27). Move in the direction of arrow A) (S272). Then, the edge detection unit 400 repeats the processes of S264 to S268.

  When the gap 92 has reached the right end of the differential profile 90 (YES in S270), the edge determination unit 412 of the arithmetic device 100 determines the position where the maximum value is taken in the right region 94R when the sum Sum is maximum. The position of the edge ELa of A (first coating film) is determined (S274). Further, the edge determination unit 412 of the arithmetic device 100 determines the position where the maximum value is obtained in the left region 94L when the sum Sum is maximum as the position of the edge ELb of the coating film B (second coating film) ( S276).

  As shown in FIG. 26, when the gap 92 is in the belt-like base material height differentiating portion 90c, the maximum value dY / dX_maxR of the height differential value dY / dX in the right region 94R is the coating film A rising differentiating portion 90e and It is the larger one of the maximum values in each of the coating film B rising differentiation portions 90f. On the other hand, the left region 94L has no maximum point because the coating film A rising differentiation portion 90e and the coating film B rising differentiation portion 90f are not present in the left region 94L. Accordingly, the maximum value dY / dX_maxL of the height differential value dY / dX in the left region 94L is substantially zero. That is, dY / dX_maxR >> dY / dX_maxL≈0. Therefore, at this time, Sum≈dY / dX_maxR. This also applies to the case where the gap portion 92 is in the coating film A coating height differentiating portion 90a, except that the left and right sides are reversed.

  On the other hand, as shown in FIG. 27, when the gap portion 92 is in the coating film B coating height differentiating portion 90b, the maximum value dY / dX_maxR of the height differential value dY / dX in the right region 94R is This corresponds to the maximum value (maximum value) in the differentiation unit 90e. Further, the maximum value dY / dX_maxL of the height differential value dY / dX in the left region 94L corresponds to the maximum value (maximum value) in the coating film B rising differential part 90f. Therefore, at this time, Sum = dY / dX_maxR + dY / dX_maxL. Here, the sum Sum is maximum when Sum = dY / dX_maxR + dY / dX_maxL. Therefore, the edge determination unit 412 determines the width direction position X at which the height differential value is maximum in each of the right region 94R and the left region 94L at this time, as the edge ELa of the coating film A and the edge ELb of the coating film B, respectively. Judge. Thus, in the fourth embodiment, unlike the first embodiment, the edge of the coating film can be detected without calculating the substrate height HB and the coating height HC. Further, the region dividing unit 404 can divide the region so that the differential profile 90 includes both edge positions of the coating film A and the coating film B, respectively. Therefore, in Embodiment 4, when the coating member 50 has a some coating film, it is possible to detect each edge of a some coating film at once.

  Further, in the fourth embodiment, the case where the sum of the maximum values of the right region 94R and the left region 94L divided by the gap 92 is maximized is also determined in the case shown in FIG. It is possible to reliably determine the edge ELa of the film A and the edge ELb of the coating film B. Here, as described above, the height differential value dY / dX becomes maximum at the position of the edge ELa of the coating film A and the position of the edge ELb of the coating film B. Therefore, a second method of determining the width direction position X taking two maximum values in the differential profile 90 as the edge ELa of the coating film A and the edge ELb of the coating film B can be considered.

  However, in the differential profile 90 illustrated in FIG. 28, a plurality of local maximum points are generated in each of the coating film A rising differentiation portion 90e and the coating film B rising differentiation portion 90f due to noise or the like. Here, the position where the largest height differential value dY / dX in the differential profile 90 is taken is the position of the point indicated by the arrow F1 in FIG. Furthermore, the position at which the second largest height differential value dY / dX is taken in the differential profile 90 is also the position of the point indicated by the arrow F2 in FIG. Therefore, in the second method, the edge ELa in the coating film A rising differentiation portion 90e cannot be detected as the edge position. On the other hand, since the fourth embodiment determines the case where the sum of the maximum values of the right region 94R and the left region 94L divided by the gap 92 is maximized, the edge ELa of the coating film A and the coating film B are determined. It is possible to reliably determine the edge ELb.

  In the fourth embodiment described above, the gap 92 moves from the left to the right in the differential profile 90. However, the present invention is not limited to this. The gap 92 may move from the right to the left or may move randomly as long as it can move at all positions in the width direction position X.

(Embodiment 5)
Next, a fifth embodiment will be described.
In the edge detection method according to the fourth embodiment, in a dynamic state, that is, in a state where the coating member 50 is being conveyed, the edge is more accurately compared with the first embodiment due to the fluttering of the belt-like base material 52 or the like. May not be detected. On the other hand, in a static state, that is, in a state where the coating member 50 is not conveyed, the edge of the belt-like base material 52 can be detected with high accuracy because there is relatively little fluttering or the like. Therefore, in the fifth embodiment, at the first position Z_1 in the conveying direction of the coating member 50, the edge of the coating film is detected by the method according to the fourth embodiment (second edge determination step), and coating is performed. At the Nth position Z_N (N is an integer of 2 or more) in the conveying direction of the member 50, the edge of the coating film is detected by the method according to the first and second embodiments (first edge determination step).

  FIG. 29 is a functional block diagram of the configuration of the edge detection unit 500 according to the fifth embodiment. In the fifth embodiment, the edge detection unit 110 shown in FIG. The edge detection unit 500 includes a first-time edge detection unit 502, a range setting unit 202, a height calculation unit 112, a threshold setting unit 114, and an edge determination unit 116. The first edge detection unit 502 has substantially the same configuration as the edge detection unit 400 according to the fourth embodiment, and substantially the same operation as the edge detection unit 400 (the process of S260 illustrated in FIG. 24). I do.

  The first edge detection unit 502 detects the edge of the coating film for the first position Z_1 in the transport direction of the coating member 50. The range setting unit 202 sets the base material height calculation range 82 and the coating height calculation range 84 for the second position Z_2 from the edge position detected for the first position Z_1 by the first edge detection unit 502. Further, the range setting unit 202 sets the base material height calculation range 82 and the coating height calculation range 84 for the third position Z_3 from the edge position detected for the second position Z_2 by the edge determination unit 116. Thereafter, the range setting unit 202 determines the base material height calculation range 82 and the coating height for the Nth position Z_N from the edge position detected for the N−1th position Z_ (N−1) by the edge determination unit 116. A calculation range 84 is set. That is, the range setting unit 202, the height calculation unit 112, the threshold setting unit 114, and the edge determination unit 116 apply the coating film for positions after the second position Z_2 in the conveying direction of the coating member 50 (that is, the Nth position Z_N). Detect edges of

  FIG. 30 is a flowchart illustrating an edge detection method (S280) according to the fifth embodiment. First, the first edge detection unit 502 detects the edge of the coating film at the first position Z_1 in the transport direction by the process of S260 shown in FIG. 24 (S282). The positions after the second position Z_2 in the transport direction (that is, the Nth position Z_N) are substantially the same as the edge detection process (S220) according to the second embodiment, and thus the description thereof is omitted.

  In the second embodiment, when detecting the edge of the coating film for the first position Z_1 in the conveying direction of the coating member 50, the edge is not detected before this position. The coating height calculation range 84 needs to be set to an arbitrary fixed value. On the other hand, since this arbitrary fixed value is determined by an operator from an empirical rule, there is a possibility that it does not correspond to the coating member 50 to be measured. Therefore, in Embodiment 2, it may be difficult to accurately detect the edge of the coating film for the first position Z_1. If the edge of the coating film cannot be detected with high accuracy at the first position Z_1, it may be difficult to detect the edge of the coating film with high accuracy at the subsequent positions (Nth position Z_N).

  On the other hand, in the fifth embodiment, for the first position Z_1, the coating film is formed by a method (method according to the fourth embodiment) that does not require setting the base material height calculation range 82 and the coating height calculation range 84. Detect edges of Furthermore, as described above, the method according to the fourth embodiment can accurately detect an edge in a state where the coating member 50 is not conveyed, that is, in the first position Z_1. Therefore, the method according to the fifth embodiment can accurately detect an edge at the first position Z_1. Furthermore, since the method according to the fifth embodiment can accurately detect the edge of the coating film at the first position Z_1, the edge of the coating film can be detected with high accuracy at the subsequent positions (Nth position Z_N). Is possible.

(Modification)
Note that the present invention is not limited to the above-described embodiment, and can be changed as appropriate without departing from the spirit of the present invention. For example, the order of the processes (steps) in the flowchart described above can be changed as appropriate.

  For example, in the flowchart shown in FIG. 3, the process of S20 and the process of S30 may be reversed or performed simultaneously. That is, the order of the detection process for the left edge of the coating film and the detection process for the right edge of the coating film is arbitrary. Further, in the flowchart shown in FIG. 3, the coating film width of the coating film B is calculated after calculating the coating film width of the coating film A, but the coating film A is calculated after calculating the coating film width of the coating film B. The coating film width of the coating film A and the coating film width of the coating film B may be calculated simultaneously. Similarly, in the flowchart shown in FIG. 5, the process of S202 and the process of S204 may be performed in the reverse order or may be performed simultaneously.

  In the above-described embodiment, the coating member 50 has the coating film 54 (coating film A) applied to one surface of the strip-shaped substrate 52 and the coating film 56 (coating coating) to the other surface of the strip-shaped substrate 52. Although the film B) is formed by coating, it is not limited to such a configuration. For example, the coating member 50 may be formed by applying a single-layer coating film on one surface of the belt-like substrate 52. Further, as illustrated in FIG. 31, the coating member 50 may be formed by applying a plurality of layers of coating films on one side of the belt-like base material 52.

  FIG. 31 is a diagram illustrating a coating member 50 according to a modification. FIG. 31 illustrates a coating member 50 in which a plurality of layers of coating films are applied to one side of a belt-like substrate 52. The coating member 50 illustrated in FIG. 31 is configured by applying a coating film 56 on a belt-like substrate 52 and applying a coating film 54 on the coating film 56. In this example, when the coating film to be measured is the coating film 54, the coating height HC of the coating film 54 is the sum of the thickness of the coating film 54, the thickness of the coating film 56, and the thickness of the belt-shaped substrate 52. Corresponding to In this case, the base material of the coating film 54 to be measured is a coating film 56 that is an object to which the coating film 54 to be measured is applied. The substrate height HB of the coating film 54 corresponds to the sum of the thickness of the coating film 56 and the thickness of the belt-like substrate 52.

  In the example of FIG. 31, when the coating film to be measured is the coating film 56, the coating height HC of the coating film 56 corresponds to the sum of the thickness of the coating film 56 and the thickness of the strip-shaped substrate 52. In this case, the base material of the coating film 56 to be measured is a band-shaped base material 52 that is an object to which the coating film 56 to be measured is applied. The base material height HB of the coating film 56 corresponds to the thickness of the belt-like base material 52.

  In the fourth embodiment, the differential profile 90 is divided into two regions (the right region 94R and the left region 94L). However, the present invention is not limited to this. When there are three or more coating films whose coating film widths are to be measured, the number of regions to be divided may be appropriately set to three or more according to the number of coating films to be measured. For example, when there are three coating films whose coating film widths are to be measured, the number of regions to be divided may be three.

  In the above-described embodiment, the coating film width measuring device 1 has two sensors. However, the configuration is not limited thereto. As long as the sensor can accurately measure the height of the coating member with respect to the entire coating film width, the coating film width measuring device 1 may have only one sensor.

  The program may be stored using various types of non-transitory computer readable media and supplied to a computer. Non-transitory computer readable media include various types of tangible storage media. Examples of non-transitory computer readable media are magnetic recording media (eg flexible disks, magnetic tapes, hard disk drives), magneto-optical recording media (eg magneto-optical disks), CD-ROM, CD-R, CD-R / W. Semiconductor memory (for example, mask ROM, PROM (Programmable ROM), EPROM (Erasable PROM), flash ROM, RAM (Random Access Memory)). The program may also be supplied to the computer by various types of transitory computer readable media. Examples of transitory computer readable media include electrical signals, optical signals, and electromagnetic waves. The temporary computer-readable medium can supply the program to the computer via a wired communication path such as an electric wire and an optical fiber, or a wireless communication path.

DESCRIPTION OF SYMBOLS 1 Coating-film width measuring apparatus 10 Sensor 30 Roller 30a Measurement reference plane 50 Coating member 52 Strip | belt-shaped base material 54 Coating film (Coating film A)
56 Coating film (Coating film B)
80 Measurement profile 82 Substrate height calculation range 84 Coating height calculation range 88 Height distribution 90 Differential profile 92 Gap portion 94L Left region 94R Right region 100 Arithmetic device 102 Data acquisition unit 104 Coating film width calculation unit 110 Edge detection unit 112 Height calculation unit 114 Threshold setting unit 116 Edge determination unit 200 Edge detection unit 202 Range setting unit 300 Edge detection unit 302 Height distribution acquisition unit 304 Height determination unit 400 Edge detection unit 402 Differential profile acquisition unit 404 Region division unit 406 Maximum value acquisition unit 408 Maximum value summation unit 410 Region movement unit 412 Edge determination unit 500 Edge detection unit 502 First-time edge detection unit

Claims (5)

About the coating member formed by laminating the coating film on the belt-like base material, the positions of the edges on both sides of the coating film in the width direction of the coating member are detected respectively, and the width direction of the detected edges on both sides Is a coating film width measuring method for measuring the distance as the width of the coating film,
Using the measurement data indicating the height of the coating member relative to the measurement reference plane, measured for a plurality of positions in the width direction of the coating member, the position relative to the position in the width direction of the coating member Obtaining a first profile indicating the height of the coated member;
Using the first profile, obtaining a substrate height corresponding to the height of the substrate to which the coating film to be measured is applied; and
Using the first profile, obtaining a coating height corresponding to the height of the coating film to be measured;
Based on the substrate height and the coating height, the first lower than the coating height and higher than the assumed noise height that can be erroneously detected as an edge of the coating film at a position corresponding to the substrate. Setting a second threshold value, lower than the first threshold value, higher than the substrate height, and setting a second threshold value corresponding to the height of the coating film to be measured as the width of the coating film;
In the first profile, from the outside in the width direction of the coating member toward the inside, searching for a first point that is higher than the first threshold value;
In the first profile, the second point is searched for a second point having a height lower than the second threshold value from the first point toward the outside in the width direction of the coating member. A first edge determination step for determining the edge of the coating film to be measured;
Calculating a distance in the width direction of the determined edge on both sides of the coating film to be measured as a width of the coating film to be measured. The coating film width measuring method, for a plurality of measurement positions in the transport direction of the coating member to be transported, continuously measures the width of the coating film with the transport of the coating member,
Based on the determined position of the edge of the coating film in the width direction of the coating member, for the measurement position next to the measurement position where the edge is determined in the transport direction, the base material height and the A step of respectively setting a first range and a second range in the width direction of the coating member for calculating a coating height;
The coating film width measuring method according to claim 1, wherein the base material height is acquired in the first range, and the coating height is acquired in the second range. The coating member is formed by laminating at least a first coating film and a second coating film on the belt-shaped substrate,
In the first profile, the height of the coating member is differentiated with respect to the width direction of the coating member, and the differential value of the height of the coating member corresponding to the position in the width direction of the coating member is determined. Obtaining a second profile to be shown;
Obtaining a maximum value of the differential value in each of the first region and the second region divided by a predetermined first gap in the width direction of the coating member in the second profile. When,
The maximum value of the differential value in the first region when the sum of the maximum value of the differential value in the first region and the maximum value of the differential value in the second region is the maximum. The position in the width direction of the coating member is determined as the position of the edge of the first coating film, and the position in the width direction of the coating member that takes the maximum value of the differential value in the second region is the second position. A second edge judging step for judging the position of the edge of the coating film,
For the first measurement position of the plurality of measurement positions in the transport direction of the coating member, determine the edge of the coating film by the second edge determination step,
Regarding the Nth measurement position (N is an integer of 2 or more) among the plurality of measurement positions in the transport direction of the coating member, the width of the coating member at the edge determined at the N-1th measurement position Based on the position of the direction, the first range and the second range are set, the base material height is acquired in the set first range, and the coating is applied in the set second range. The method for measuring a coating film width according to claim 2, wherein a work height is acquired and an edge of the coating film is determined by the first edge determination step. Obtaining a distribution in the height direction from the measurement profile,
The coating film width measuring method according to claim 1, wherein the base material height and the coating height are acquired based on the distribution in the height direction. About the coating member formed by laminating the coating film on the belt-like base material, the positions of the edges on both sides of the coating film in the width direction of the coating member are detected respectively, and the width direction of the detected edges on both sides A coating width measuring device for measuring the distance of the coating as the width of the coating,
At least one sensor for measuring the height of the coating member with respect to a measurement reference plane at each of a plurality of positions in the width direction of the coating member;
An arithmetic unit that performs a process for measuring the width of the coating film,
The arithmetic unit is
A data acquisition unit that acquires measurement data indicating a measurement result from the sensor, and acquires a first profile indicating the height of the coating member with respect to a position in the width direction of the coating member using the measurement data; ,
Using the first profile, a substrate height corresponding to the height of the substrate on which the coating film to be measured is applied, and a coating height corresponding to the height of the coating film to be measured A height acquisition unit to acquire;
Based on the substrate height and the coating height, the first lower than the coating height and higher than the assumed noise height that can be erroneously detected as an edge of the coating film at a position corresponding to the substrate. A threshold value setting unit that sets a second threshold value that is lower than the first threshold value, higher than the base material height, and corresponding to the height of the coating film to be measured as the width of the coating film When,
In the first profile, a first point that is higher than the first threshold value is searched from the outer side to the inner side in the width direction of the coating member. In the first profile, the first point The second point having a height lower than the second threshold value is searched from the point toward the outer side in the width direction of the coating member, and the second point is the edge of the coating film to be measured. An edge determination unit for determining
A coating-film width measuring device, comprising: a coating-film width calculating unit that calculates a distance in the width direction of the determined edge on both sides of the coating film to be measured as a width of the coating film to be measured.

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