JP2007263696A - Profile-defect detection method and program - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a defect detection method and its program for calculating a quasi-straight line with accuracy that will not deteriorate, by using a simple means, in a state of on-line real time where inspecting objects are flowing, when detecting defects in the profile shapes of the inspecting objects. <P>SOLUTION: A measurement-data capturing means 11 of a discriminator 4 thereinto inputs an output waveform of the voltage level of a glass plate 1 from a one-dimensional CCD camera 3, to generate measurement data on each inspection side, while specifying a corner of the glass plate 1. A quasi-straight line calculation means 12 calculates the initial value of an intercept and that of a slope by the least-squares method, in calculating the quasi-straight line. Two slopes are calculated by means of enclosure method, by using a function indicating the degree of distribution of the measurement data as to the positional relation between the measurement data and an initial quasi-straight line, based on the initial-value intercept and slope. Furthermore, a slope optimum with respect to these two slopes is calculated by a method of bisection, and a quasi-straight line, based on the slope and the then intercept, is calculated. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

  The present invention relates to a technique for detecting a defect occurring in an outer shape of a glass plate or the like.

  Conventionally, research on techniques for detecting defects occurring in the outer shape of a glass plate or the like has been underway. For example, Patent Document 1 describes an apparatus for detecting a defect generated at a cut surface of a glass plate. Generally, in a glass plate production line, a glass plate is produced by cutting a glass plate pulled up from a kiln in a direction parallel to a conveying direction and a direction perpendicular to the conveying direction on a line conveyor. Specifically, a cutting line (trimmer line) in a direction parallel to the conveying direction is drawn by a trimmer, a cutting line (cutter line) in a direction perpendicular to the conveying direction is drawn by a skew cutter, and a cutting line is cut along the cutter line. Cut and cut along the trimmer line with a splitting device. When this cutting occurs, the edge that is the cut edge of the glass plate has defects such as corners (outside) protruding outward in the surface direction of the glass plate or chipping in the surface direction of the glass plate There is. When the cut defect detection device detects the defect, a glass plate having a cut defect is discarded as a defective product depending on the degree. As described above, the cut defect detection device was developed instead of visually detecting the cut defect, and the corner generated at the cut of the glass plate under the condition that the glass plate is being conveyed at high speed. And defects such as chipping can be detected by online real-time processing.

  Here, when inspecting the cut, the cut defect detecting device obtains a pseudo straight line of the edge portion which is the cut surface of the glass plate, and obtains the actually measured coordinate data (measurement data) of the edge portion and the pseudo straight line. By comparing, calculating the size of the corner and the chip and comparing with the reference value, it is determined whether or not the defect is within the allowable range. Various methods are used to obtain the pseudo straight line. For example, methods using the least square method, the Hough transform method, and the like have been proposed in various inspection fields.

  For example, Non-Patent Document 2 describes an apparatus that detects a defect on the outer periphery of an electronic component using a least square method and a Hough transform method. Specifically, the frequency of appearance of the outer peripheral coordinates is calculated using the neighborhood of (ρ, θ) that gives the maximum frequency when calculating the normal outer region by the Hough transform method, and the appearance frequency is weighted to the coordinates The Then, the pseudo straight line is calculated by the least square method using the weighted coordinate data. Accordingly, an electronic component having a curvature and distortion within an allowable range is determined as a non-defective product, and thus a normal region with few errors can be detected.

  Non-Patent Document 3 describes a method for inspecting an article using a Hough transform method, an eigenvector method, and a least square method. Specifically, a rough approximate straight line is obtained by the Hough transform method, a distance di as a straight line candidate point is calculated, a median value thereof and an average value DM of n pieces before and after are obtained, and the average value DM and the distance dit are obtained. The point where the absolute value of the difference between the values exceeds the reference value is removed from the straight line candidate point group. Then, a pseudo straight line is calculated from the last remaining straight line candidate point by the eigenvector method or the least square method. As a result, even if a point far from the straight line candidate point group is included, it is possible to exclude the point, so that a pseudo straight line can be detected with high accuracy.

  Non-Patent Document 4 describes a method for inspecting a defect of an article using a least square method. Specifically, a pseudo straight line for inspecting a defect is calculated by using the least square method, and then a difference between the pseudo straight line and the coordinates of the measurement point is obtained. Then, measurement points where the difference exceeds a certain value are excluded, a pseudo straight line is calculated again using the least square method, and this is repeated until the coefficients of the linear approximation converge.

Japanese Patent Laid-Open No. 01-169343 Japanese Patent Laid-Open No. 15-139519 Japanese Patent Laid-Open No. 11-096371 JP-A-10-283473

  However, the methods described in Patent Documents 2 to 4 described above all target relatively small objects, and do not perform inspection by calculating a pseudo straight line in an online real-time state in which the objects are flowing. For example, when the inspection object cannot be fixed, the flow of the inspection object cannot be controlled, or when the inspection object is relatively large, the inspection object may not be within the field of view of the camera. In this case, since the inspection object cannot be photographed at one time, it is necessary to join the separated images, and there is a problem that the processing becomes complicated as a whole.

  In the methods described in Patent Documents 3 and 4 described above, inconvenient measurement points are excluded when calculating the pseudo straight line. For this reason, the amount of information for calculating the pseudo line is reduced, and a pseudo line with low accuracy may be calculated as a whole. Therefore, the excluded measurement points may not necessarily be suitable for exclusion. There was a problem. Generally, in order to calculate a pseudo straight line with high accuracy, it is desirable that the amount of information of measurement points is as large as possible.

  Moreover, the method described in the above-mentioned patent documents 2 to 4 calculates a pseudo straight line using the least square method. For this reason, there is a problem in that if there are measurement points that are significantly distant from each other, the pseudo straight line cannot be calculated with high accuracy.

  Further, the methods described in Patent Documents 2 and 3 calculate a pseudo straight line using the Hough transform method. The Hough transform method has a problem in that it requires a large amount of memory for performing the processing and uses a voting method, which requires processing time.

  Therefore, the present invention has been made paying attention to such a problem, and the purpose thereof is a simple method in the online real-time state in which the inspection object is flowing when detecting the defect of the outer shape of the inspection object. Accordingly, it is an object of the present invention to provide a defect detection method and a program capable of calculating a pseudo straight line without reducing accuracy.

ここで、計測データ（ｘ_ｉ，ｙ_ｉ）は、１次元の撮像装置が検出した光に対応する信号に基づいて生成した座標データを示す。また、ｂは傾きを、ａは切片をそれぞれ示す。 Hereinafter, the principle of calculating the pseudo straight line in the present invention will be described. The pseudo line to be calculated is shown in equation (1).

Here, the measurement data (x _i , y _i ) indicates coordinate data generated based on a signal corresponding to light detected by the one-dimensional imaging device. Further, b represents an inclination, and a represents an intercept.

である。 And the evaluation function we want to minimize is

It is.

In general, the set of data c _i, the median c _m is these intermediate values, it is known to minimize the sum of absolute deviation of (3).

Therefore, if the slope b is fixed, the value of the intercept a that minimizes the evaluation function of equation (2) can be expressed as equation (4) using the median function.

本発明は、最小二乗法を用いて疑似直線の傾き及び切片の初期値を求め、囲い込み法を用いて前述の（４）（５）式により２つの傾きを求め、２分法を用いて（４）（５）式により２つの傾きの間に存在する最適な傾きを求め、（１）式を算出する。ここで、最小二乗法は、初期値を求めるために１回のみ用いられる。 The slope b is calculated using the function of equation (5).

In the present invention, the initial value of the slope and intercept of the quasi-straight line is obtained using the least square method, the two slopes are obtained using the enclosing method (4) and (5), and the bisection method is used ( 4) The optimum inclination existing between the two inclinations is obtained from the expression (5), and the expression (1) is calculated. Here, the least square method is used only once to obtain the initial value.

  That is, in the defect detection method according to the present invention, an elongated light source is disposed in an oblique direction with respect to the flow direction of the inspection object, a one-dimensional imaging device is disposed in parallel with the elongated light source, and light detected by the imaging device is detected. In the method for detecting a defect generated in the outer shape of the inspection object, a measurement data generation step of inputting a signal corresponding to the light detected by the imaging device and generating measurement data based on the signal, and the generated From the measured data, use the least square method to determine the slope and intercept of the pseudo line as the initial value, and use the enclosing method to determine the slope of the pseudo line to be determined from the slope and intercept as the initial value. A pseudo-straight line calculating step for obtaining a slope of a pseudo straight line from the two slopes using a bisection method and obtaining an intercept for the slope to calculate a pseudo straight line; A defect determination step of calculating an error between the calculated pseudo-line and the generated measurement data, calculating a width and a length of the defect based on the error, and determining whether the defect is within an allowable range; It is characterized by having.

  Although the present invention has been described as a defect detection method, the present invention can be substantially realized as a program executed by a computer, and the present invention includes a defect detection program. That is, the defect detection program according to the present invention includes an elongated light source arranged obliquely with respect to the flow direction of the inspection object, a one-dimensional imaging device arranged in parallel with the elongated light source, and light detected by the imaging device. , A defect detection program by an apparatus provided with a discrimination device for detecting defects generated in the outer shape of the inspection object, and a signal corresponding to the light detected by the imaging apparatus is input to a computer constituting the apparatus, A process of generating measurement data based on the signal, a process of obtaining the slope and intercept of the pseudo line as an initial value using the generated square data using the least square method, and the initial method using the enclosing method From the slopes and intercepts as values, a process for obtaining two slopes having the slope of the pseudo line to be obtained as a value between them, and using the bisection method, the two slopes are used to calculate the pseudo straight line. A process for calculating an inclination of the calculated straight line, a process for obtaining an intercept with respect to the obtained slope, calculating a pseudo straight line based on the slope and the intercept, and a process for calculating an error between the calculated pseudo straight line and the generated measurement data And calculating the width and length of the defect based on the error and determining whether the defect is within the allowable range.

  As described above, according to the present invention, when detecting a defect in the outer shape of an inspection object, a pseudo straight line that does not decrease accuracy can be obtained by a simple method in an online real-time state in which the inspection object flows. It is possible to calculate. Thereby, when detecting the defect of the external shape of the inspection object, erroneous determination is reduced.

The best mode for carrying out the present invention will be described below in detail with reference to the drawings.
〔Constitution〕
First, the configuration of the cut defect detecting device according to the embodiment of the present invention will be described. FIG. 1 is a schematic diagram showing the overall configuration of the cut defect detecting device. 1 (a) and 1 (b), the reflection type cut defect detecting device 10 has a longitudinal direction at a predetermined angle (above a glass plate 1 conveyed at a constant speed on a line conveyor (not shown)). For example, above the fluorescent lamp 2 arranged so as to form an angle of 45 ° with respect to the Y-axis direction and the glass plate 1, the arrangement direction of the CCD elements is a predetermined angle (for example, 45 ° with respect to the Y-axis direction). And the output waveforms from the CCD camera 3 are processed and the size of the defect is calculated to be within an allowable range. And a discriminating device 4 for discriminating whether or not this is a drawback.

  According to this cut defect detecting device 10, the light from the fluorescent lamp 2 is reflected by the surface of the glass plate 1 and received by the CCD camera 3. The amount of received light differs depending on whether the edge of the glass plate 1 has a defect or not. Therefore, the discriminating device 4 can obtain defect information about the four sides (trimmer side parallel to the transport direction and breaker side perpendicular to the transport direction) of the glass plate 1 due to the difference in the amount of received light. The length and the width when there is a defect can be calculated to detect a defect.

  FIG. 1C is a diagram illustrating the width and length of the defect. When there is a corner defect on the right edge of the glass plate 1, the length of the defect refers to the size of the corner in a direction parallel to the conveying direction of the glass plate 1. The size of the corner in the direction perpendicular to the transport direction. When there is a defect of chipping on the breaker side of the glass plate 1, the length of the defect refers to the size of the chip in the direction perpendicular to the conveying direction of the glass plate 1, and the width of the defect is the conveyance of the glass plate 1. The size of the chip in the direction parallel to the direction.

  Next, the configuration of the determination device 4 shown in FIG. 1 will be described. FIG. 2 is a block diagram illustrating a configuration of the determination device 4. The discriminating device 4 includes a measurement data fetching unit 11, a pseudo straight line calculating unit 12, a defect determining unit 13, and a storage unit 14.

  The measurement data capturing means 11 receives the output waveform of the voltage level at each side of the glass plate 1 from the CCD camera 3 and generates measurement data (coordinate data of measurement points at the inspection side) of the four inspection sides. Based on the measurement data, the measurement data of the corners that are the contact points of the two sides of the glass plate 1 are specified, and the measurement data is distinguished for each inspection side and stored in the storage unit 14.

  The pseudo straight line calculating unit 12 reads out measurement data for each inspection side from the storage unit 14 and calculates a pseudo straight line for each inspection side based on the measurement data. In calculating the pseudo line (calculation of the intercept and slope of the pseudo line), initial values of the intercept and the slope are calculated by the least square method. Then, using the function indicating the degree of distribution of the measurement data in the positional relationship between the measurement data and the initial value intercept and inclination, two inclinations are calculated by the enclosing method, and the two inclinations are calculated. Then, an optimum inclination is calculated by the bisection method, and a pseudo straight line is calculated by the inclination and the intercept at that time. In this case, the intercept is calculated from the slope using a median function.

  The defect determination unit 13 calculates an error between the pseudo line calculated by the pseudo line calculation unit 12 and the measurement data read from the storage unit 14, calculates the width and length of the defect, and falls within an allowable range. It is determined whether it is a defect.

[Operation]
Next, the operation of the discriminating device 4 in the cut defect detecting device 10 shown in FIG. 1 will be described. FIG. 3 is a flowchart for explaining the entire defect detection process performed by the determination device 4 of the cut defect detection device 10. First, the measurement data fetching means 11 receives an output waveform of a voltage level at each inspection side of the glass plate 1 from the CCD camera 3, and based on the output waveform, measurement data (coordinate data of measurement points at each inspection side) x _i , y _i ) are generated (step S2-1).

4, FIG. 5 and FIG. 6 are diagrams for explaining the details of the measurement data fetching process of step 2-1 shown in FIG. FIG. 4 shows an output waveform or the like of the voltage level when generating measurement data of the A, B, and C portions at the left edge of the glass plate 1. Assuming that the glass plate 1 is conveyed from the top to the bottom, the CCD camera 3 outputs the output waveform of the voltage level shown in the lower part of FIG. 4 to the determination device 4 in the order of (1), (2), and (3). The discriminating device 4 inputs these output waveforms and generates a plot diagram of detection positions (dot positions) by the CCD camera 3 according to the input time. In this case, since the dot position where the output waveform changes corresponds to the edge portion, A, B, and C portions at the left edge based on this plot (relationship between time and dot position) and the moving speed of the glass plate 1 Xy coordinates can be obtained. The xy coordinates are treated as measurement data (x _i , y _i ). Here, i indicates a plot number (measurement number) of measurement data.

FIG. 5 shows an output waveform or the like of the voltage level when generating measurement data of the A, B, and C portions at the right edge of the glass plate 1. Similar to FIG. 4, the discriminator 4 receives the output waveform, generates a plot diagram of the detection position (dot position) by the CCD camera 3 according to the input time, and this plot diagram (relationship between time and dot position). ) And the moving speed of the glass plate 1, the xy coordinates of the A, B, and C portions at the right edge are obtained. The xy coordinates are treated as measurement data (x _i , y _i ).

FIG. 6 shows an output waveform and the like of the voltage level when generating measurement data of the A and C portions in the central portion of the glass plate 1. Similar to FIGS. 4 and 5, the discriminator 4 receives the output waveform, generates a plot of the detection position (dot position) by the CCD camera 3 according to the input time, and generates this plot (time and dot position). And the xy coordinates of the A and C portions in the central portion are obtained based on the movement speed of the glass plate 1. The xy coordinates are treated as measurement data (x _i , y _i ).

Returning to FIG. 3, after obtaining the measurement data (x _i , y _i ) of the four inspection sides in the glass plate 1 in step 2-1, the measurement data fetching means 11 is at the four corners of the glass plate 1. Measurement data corresponding to a certain corner is specified (step S2-2), and measurement data for each inspection side is specified by distinguishing the measurement data for each inspection side (step S2-3).

  Specifically, the measurement data fetching means 11 identifies four corners 1 to 4 based on the plot diagrams (relationship between time and dot position) shown in FIGS. 4 and 5. In FIG. 4, the measurement data fetching means 11 first calculates the measurement data at the first point p of the inspection and the measurement data at the corner 2 as the last point, based on the plot diagram, whether there is dot position information on the time axis. And change amount. Then, the measurement data of the corner q is specified by the presence or absence of the dot position information, the change amount, and the like based on the plot diagram. Then, the measurement data of the corner 1 is specified by the measurement data of the corner 2, the point p, and the point q using the fact that the plot diagram is a parallelogram.

  In FIG. 5, the measurement data fetching unit 11 first, as described above, first calculates the measurement data at the corner 3 that is the first point of the inspection and the measurement data at the last point s on the time axis based on the plot diagram. It is specified by the presence / absence of dot position information and the amount of change. Then, the measurement data of the point r is specified by the presence / absence of dot position information, the change amount, etc. based on the plot diagram. Then, the measurement data of the corner 4 is specified by the measurement data of the corner 3, the point r, and the point s by utilizing the fact that the plot is a parallelogram. In this way, the measurement data of the four corners 1 to 4 of the glass plate 1 are specified.

  By specifying the measurement data of the four corners 1 to 4 of the glass plate 1, the measurement data capturing unit 11 converts the measurement data of the trimmer side of the left edge corresponding to the portion B shown in FIG. It specifies based on measurement data and the measurement data of the corner 2. Further, the measurement data of the trimmer side of the right edge corresponding to the portion B shown in FIG. 5 is specified based on the measurement data of the corner 3 and the measurement data of the corner 4. Further, the measurement data of the breaker side of the front edge corresponding to the portion A shown in FIGS. 4, 5, and 6 is specified, and similarly, the measurement data of the breaker side of the rear edge corresponding to the portion C is specified. In this way, measurement data for each inspection side is specified.

  Returning to FIG. 3, the pseudo straight line calculating means 12 calculates a pseudo straight line (y = bbx + aa) based on the measurement data of each inspection side specified by the measurement data capturing means 11 (step S2-4). Here, bb indicates the inclination of the pseudo line, and aa indicates the intercept of the pseudo line. Specifically, the pseudo straight line calculating means 12 calculates the intercept a1 and the slope b1 as initial values by the least square method (step S2-4-1). Then, two slopes are calculated by the enclosing method using a function indicating the distribution degree of the measurement data in the positional relationship between the measurement data and the initial value intercept a1 and the initial pseudo line by the slope b1 (step S2- 4-2) The inclination bb of the pseudo line existing between the two inclinations is calculated by the bisection method (step S2-4-3). In this case, the intercept aa is calculated from the slope bb using a median function. Details of the processing by the pseudo straight line calculating means 12 will be described later.

  The defect determination means 13 is based on the measurement data for each measurement side specified by the measurement data capturing means 11 in step 2-3 and the pseudo straight line calculated by the pseudo straight line calculation means 12 in step 2-4. The width and length of the defect are calculated for each inspection side (step S2-5). Specifically, the defect determination means 13 calculates the difference between the measurement data and the pseudo line for each inspection side. For the trimmer side of the left edge of the glass plate 1, the width of the defect is in the x-axis direction (see FIG. 1 (c)), so the difference between the measured data on the x-axis of the inspection side and the pseudo line is Calculate and set the maximum difference as the width of the defect. When calculating the width of this defect, the number of measurement data when the difference between the measurement data on the x-axis and the pseudo straight line is greater than or equal to a predetermined value is counted, and the distance according to the number is determined as the length of the defect. Set as. For the right edge trimmer side of the glass plate 1, the width and length of the defect are calculated as in the case of the left edge trimmer side.

  Further, for the breaker sides of the front edge and the rear edge of the glass plate 1, since the width of the defect is in the y-axis direction (see FIG. 1C), the measurement data and the pseudo straight line on the y-axis of the inspection side The maximum difference is set as the width of the defect. In calculating the width of this defect, the number of measurement data when the difference between the measurement data on the y-axis and the pseudo-line is equal to or greater than a predetermined value is counted, and the distance corresponding to the number is determined as the length of the defect. Set as.

  The defect determination means 13 calculates the width and length of the defect for each inspection side in step 2-5, and then compares the width and length of the defect with a preset reference value, respectively. If at least one of the values is larger than the reference value, the defect is determined to be an out-of-tolerance defect, and if both the width and length are less than the reference value, the defect is within the allowable range. (Step S2-6).

Next, details of the process of calculating the pseudo straight line in step 2-4 (steps 2-4-1 to 3) shown in FIG. 3 will be described. FIG. 7 is a flowchart for explaining details of the pseudo straight line calculation processing. This process is performed for each inspection side using the measurement data (x _i , y _i ) of the inspection side and the above-described equations (4) and (5) (step S3-1). First, the pseudo straight line calculating means 12 calculates the intercept a1 and the slope b1 as initial values by the least square method (step S3-2), and calculates the standard deviation sigb of the slope (step S3-3). This least square method is used only once in order to obtain the initial value in the process of FIG.

  The pseudo straight line calculating means 12 obtains the intercept a at the inclination b1 from the equation (4), obtains f (b1) from the equation (5), and determines whether it is 0 or more (step S3-4). . Here, the positional relationship between the measurement data and the initial pseudo line by the intercept a and the inclination b1 is obtained, and whether the inclination should be larger or smaller than b1 depending on the distribution degree of the measurement data in the positional relation. judge. If f (b1)> 0, it is determined that the inclination should be larger than b1, and an inclination b2 obtained by adding a value based on the standard deviation sigb to b1 is calculated (step S3-5). If f (b1)> 0 is not satisfied, it is determined that the slope should be smaller than b1, and a slope b2 obtained by subtracting a value based on the standard deviation sigb from b1 is calculated (step S3-6).

  Then, the pseudo straight line calculating means 12 obtains the intercept a at the inclination b2 from the equation (4), obtains f (b2) from the equation (5), and the product of f (b1) and f (b2) is 0. It is determined whether or not this is the case (step S3-7). Here, the distribution degree of the measurement data in the positional relationship between the measurement data and the pseudo line with the inclination b1, and the distribution degree of the measurement data in the positional relationship between the measurement data and the pseudo line with the inclination b2 are as follows. The relationship of distribution degree is determined. And when the product is larger than 0, new inclination b1 and b2 are set (step S3-8), and it returns to step 3-7. On the other hand, if the product is 0 or less, the pseudo straight line due to the slope existing between the slopes b1 and b2 is determined to be the obtained pseudo straight line, and the process proceeds to the next step 3-9. In this way, the inclinations b1 and b2 are calculated by the enclosing method in steps 3-7 and 3-8.

  Then, the pseudo straight line calculating unit 12 determines whether or not the difference between the inclinations b1 and b2 is larger than a value based on the standard deviation sigb (step S3-9). When the difference is larger than the value based on the standard deviation sigb, the equation (5) is obtained through the equation (4) by using an intermediate value bb between the slopes b1 and b2 (step S3-10), and f (bb ) And f (b1) is determined to be 0 or more (step S3-11), and the value of the gradient b1 or b2 is replaced with an intermediate value bb (steps S3-12, 13). Steps 3-9 to 3-13 are performed. In step 3-9, if the difference between the slopes b1 and b2 is equal to or smaller than the value based on the standard deviation sigb, the slope bb, which is an intermediate value at that time, and the slope bb obtained by the equation (4) In this case, the intercept aa is set as the inclination and intercept of the pseudo line (step S3-14). In this way, the inclination bb and the intercept aa of the pseudo straight line are calculated by the bisection method in steps 3-9 to 13.

  As described above, according to the cut defect detecting device 10 according to the embodiment of the present invention, the measurement data capturing means 11 inputs the voltage level waveform of the glass plate being conveyed from the one-dimensional CCD camera 3. The measurement data for each inspection side was specified. Further, the discriminating device 4 uses the measurement data for each inspection side to calculate the intercept and inclination as initial values by the least square method, and by the enclosure method and the bisection method, based on the intercept and inclination of the measurement data and the initial values. The pseudo line is calculated using a function indicating the distribution degree of the measurement data in the positional relationship with the initial pseudo line and a median function. This makes it possible to calculate a pseudo straight line by a simple method in the online real-time state in which the glass plate is flowing when detecting a defect occurring at the cut surface of the glass plate.

  In addition, according to the cut defect detecting device 10 according to the embodiment of the present invention, the one-dimensional CCD camera 3 is used to photograph various portions of the glass plate 1 being conveyed, and the measurement data for each inspection side is specified. Thus, the defect of the cut of the glass plate 1 is detected. Conventionally, if the inspection object cannot be fixed, the flow of the inspection object cannot be controlled, or the inspection object is relatively large, it will not fit within the field of view of the two-dimensional camera. It was. In the embodiment of the present invention, it is not necessary to perform complicated processing for joining such a plurality of images.

  Further, according to the cut defect detecting device 10 according to the embodiment of the present invention, the pseudo straight line calculating unit 12 calculates the pseudo straight line using all the measurement data without excluding inconvenient measurement data. . Accordingly, useful measurement data is not mistakenly excluded, and the amount of information for calculating the pseudo line is not reduced, so that it is possible to calculate the pseudo line with high accuracy as a whole. Therefore, there are fewer erroneous determinations in determining whether or not to accept a defect (see FIG. 8).

  Further, according to the cut defect detecting device 10 according to the embodiment of the present invention, the discriminating device 4 uses the least square method only once for obtaining the initial value. As a result, even if there is remarkably distant measurement data, there is no significant influence on obtaining a highly accurate pseudo straight line (see FIG. 9).

  Further, according to the cut defect detecting device 10 according to the embodiment of the present invention, the discriminating device 4 calculates the pseudo straight line using the least square method, the enclosing method, and the bisection method. Thereby, since a pseudo straight line can be calculated without using the Hough transform method, a large amount of memory for processing the Hough transform method is not required. Further, since it is not necessary to use a voting method, the processing time associated therewith is not required.

  The discriminating device 4 of the cut defect detecting device 10 includes a computer having a volatile storage medium such as a CPU and a RAM, a non-volatile storage medium such as a ROM, an interface, and the like. The functions of the measurement data fetching means 11, the pseudo straight line calculating means 12 and the defect judging means 13 provided in the determination device 4 are realized by causing the CPU to execute a program describing these functions. These programs can also be stored and distributed in a storage medium such as a magnetic disk (floppy disk, hard disk, etc.), optical disk (CD-ROM, DVD, etc.), semiconductor memory, or the like.

  The present invention has been described with reference to the embodiment. However, the present invention is not limited to the above embodiment, and various modifications can be made without departing from the technical idea thereof. For example, in the above embodiment, the glass plate 1 is described as an object, but a sheet-shaped inspection object may be used instead of the glass plate 1. In the above embodiment, the cut defect detection device 10 is used to detect cut defects at the edge of the glass plate 1 by online real-time processing. However, the glass plate 1 is detected by similar online real-time processing. For example, it may be used for inspecting the edge of an inspection object.

It is the schematic which shows the whole structure of the cut defect detection apparatus by embodiment of this invention. It is a block diagram which shows the structure of the discrimination | determination apparatus of FIG. It is a flowchart figure explaining the whole defect detection process. FIG. 4 is a first diagram illustrating details of measurement data import processing of FIG. 3. It is a 2nd figure explaining the detail of the taking-in process of the measurement data of FIG. FIG. 4 is a third diagram illustrating details of the measurement data capturing process of FIG. 3. It is a flowchart figure explaining the detail of the process which calculates the pseudo | simulation line of FIG. It is a figure explaining the effect by embodiment of this invention. It is a figure which compares the pseudo | simulation line calculated | required by the least square method with the quasi-straight line calculated | required by embodiment of this invention.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 Glass plate 2 Fluorescent lamp 3 CCD camera 4 Discriminating device 10 Cut defect detecting device 11 Measurement data taking-in means 12 Pseudo straight line calculating means 13 Defect determining means 14 Storage means

Claims (7)

Disadvantages generated in the outer shape of the inspection object from the light detected by the imaging device by disposing the elongated light source obliquely with respect to the flow direction of the inspection object, disposing a one-dimensional imaging device in parallel with the elongated light source. In the method of detecting
A measurement data generation step of inputting a signal corresponding to the light detected by the imaging device and generating measurement data based on the signal;
Using the generated measurement data, the least square method is used to determine the slope and intercept of the pseudo line as an initial value, and the enclosing method is used to determine the slope of the pseudo line to be obtained from the slope and intercept as the initial value. Obtaining two slopes as values between them, obtaining a slope of a pseudo straight line from the two slopes using a bisection method, obtaining an intercept with respect to the slope and calculating a pseudo straight line; and
A defect determination step of calculating an error between the calculated pseudo-line and the generated measurement data, calculating a width and a length of the defect based on the error, and determining whether the defect is within an allowable range; A defect detection method characterized by comprising: The defect detection method according to claim 1,
In the pseudo straight line calculation step, the two slopes are obtained by using a function indicating the degree of distribution of the measurement data in the positional relationship between the measurement data and the initial pseudo line based on the intercept and the slope of the initial value using the enclosing method. A defect detection method characterized by the above. The defect detection method according to claim 2,
In the pseudo straight line calculation step, when the measurement data is (x _i , y _i ), N is the number of measurement data, b is a slope, and a is an intercept, a function indicating the distribution degree of the measurement data is obtained.

A defect detection method characterized by obtaining the two inclinations. The defect detection method according to claim 3,
The fault detection method, wherein the pseudo straight line calculating step obtains an intercept with respect to the inclination using a median function. The defect detection method according to claim 4,
When the pseudo straight line calculation step uses (x _i , y _i ) as measurement data, N is the number of measurement data, b is a slope, and a is an intercept, the following median function

A defect detection method, characterized in that an intercept a with respect to a slope b is obtained using. In the fault detection method according to any one of claims 1 to 5,
The measurement data generation step specifies measurement data of four corners of the inspection object from the input signal, and generates measurement data of four inspection sides from the measurement data of the four corners,
The defect detection method, wherein the pseudo line calculation step and the defect determination step calculate a pseudo line and determine a defect for each inspection side. The elongated light source arranged in an oblique direction with respect to the flow direction of the inspection object, the one-dimensional imaging device arranged in parallel with the elongated light source, and the defects generated in the outer shape of the inspection object from the light detected by the imaging device A defect detection program by a device including a determination device for detecting a computer, and a computer constituting the device,
A process of inputting a signal corresponding to the light detected by the imaging device and generating measurement data based on the signal;
Using the generated measurement data, the least square method is used to determine the slope and intercept of the pseudo line as an initial value;
Using the enclosing method, from the slope and intercept as the initial value, a process of obtaining two slopes having the slope of the pseudo line to be obtained as a value between them;
A process of obtaining a slope of a pseudo straight line from the two slopes using a bisection method;
Obtaining an intercept with respect to the obtained slope, and calculating a pseudo straight line by the slope and the intercept;
A process of calculating an error between the calculated pseudo straight line and the generated measurement data;
A defect detection program that calculates a width and length of a defect based on the error and executes a process of determining whether the defect is within an allowable range.

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