JP6307328B2 - メタマテリアル光学部材、光検出装置、レーザ励起光源及び計測装置 - Google Patents
メタマテリアル光学部材、光検出装置、レーザ励起光源及び計測装置 Download PDFInfo
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- JP6307328B2 JP6307328B2 JP2014078820A JP2014078820A JP6307328B2 JP 6307328 B2 JP6307328 B2 JP 6307328B2 JP 2014078820 A JP2014078820 A JP 2014078820A JP 2014078820 A JP2014078820 A JP 2014078820A JP 6307328 B2 JP6307328 B2 JP 6307328B2
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
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- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
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- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/6428—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes"
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B1/00—Optical elements characterised by the material of which they are made; Optical coatings for optical elements
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- G—PHYSICS
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- G02B1/00—Optical elements characterised by the material of which they are made; Optical coatings for optical elements
- G02B1/10—Optical coatings produced by application to, or surface treatment of, optical elements
- G02B1/11—Anti-reflection coatings
- G02B1/113—Anti-reflection coatings using inorganic layer materials only
- G02B1/115—Multilayers
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- G—PHYSICS
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- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B3/00—Simple or compound lenses
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- G—PHYSICS
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- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
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- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
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- G01N2201/06113—Coherent sources; lasers
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Description
前記レーザ媒質は、前記メタマテリアル光学部材の前記凹面の内部に配置されている、
ことを特徴とする。
Claims (10)
- メタマテリアル光学部材及び光検出器を備える光検出装置であって、
前記メタマテリアル光学部材は、
光入射面と光出射面とを有し集光機能を有する集光光学部材と、
前記集光光学部材の光出射面に設けられた反射防止膜と、
を備え、
前記反射防止膜は、
光進行方向に沿って徐々に屈折率が低くなる第1メタマテリアル構造を有しており、
前記光出射面は、凹面を含み、
前記光検出器は、
前記メタマテリアル光学部材の前記凹面の内部に配置されている、
ことを特徴とする光検出装置。 - 前記集光光学部材は、前記光入射面から前記光出射面に向かうに従って徐々に屈折率が高くなる第2メタマテリアル構造を有している、
ことを特徴とする請求項1に記載の光検出装置。 - 前記光出射面は、前記凹面の一部に連続し、前記凹面の開口サイズよりも、小さな開口サイズを有する第2の凹面を含む、
ことを特徴とする請求項1又は2に記載の光検出装置。 - メタマテリアル光学部材及びレーザ媒質を備えるレーザ励起光源であって、
前記メタマテリアル光学部材は、
光入射面と光出射面とを有し集光機能を有する集光光学部材と、
前記集光光学部材の光出射面に設けられた反射防止膜と、
を備え、
前記反射防止膜は、
光進行方向に沿って徐々に屈折率が低くなる第1メタマテリアル構造を有しており、
前記光出射面は、凹面を含み、
前記レーザ媒質は、
前記メタマテリアル光学部材の前記凹面の内部に配置されている、
ことを特徴とするレーザ励起光源。 - 前記集光光学部材は、前記光入射面から前記光出射面に向かうに従って徐々に屈折率が高くなる第2メタマテリアル構造を有している、
ことを特徴とする請求項4に記載のレーザ励起光源。 - 前記光出射面は、前記凹面の一部に連続し、前記凹面の開口サイズよりも、小さな開口サイズを有する第2の凹面を含む、
ことを特徴とする請求項4又は5に記載のレーザ励起光源。 - メタマテリアル光学部材、媒体流路及び光検出器を備える計測装置であって、
前記メタマテリアル光学部材は、
光入射面と光出射面とを有し集光機能を有する集光光学部材と、
前記集光光学部材の光出射面に設けられた反射防止膜と、
を備え、
前記反射防止膜は、
光進行方向に沿って徐々に屈折率が低くなる第1メタマテリアル構造を有しており、
前記光出射面は、凹面を含み、
前記媒体流路は、
前記メタマテリアル光学部材の前記凹面の内部に配置され、
前記光検出器は、前記媒体流路からの光を検出する、
ことを特徴とする計測装置。 - 前記集光光学部材は、前記光入射面から前記光出射面に向かうに従って徐々に屈折率が高くなる第2メタマテリアル構造を有している、
ことを特徴とする請求項7に記載の計測装置。 - 前記光出射面は、前記凹面の一部に連続し、前記凹面の開口サイズよりも、小さな開口サイズを有する第2の凹面を含む、
ことを特徴とする請求項7又は8に記載の計測装置。 - 光入射面と光出射面とを有する光伝達部材と、
前記光伝達部材の前記光入射面に設けられた反射防止膜と、
を備え、
前記光伝達部材は、前記光入射面から前記光出射面に向かうに従って徐々に屈折率が低くなるメタマテリアル構造を有しており、
前記光入射面は、凹面を含み、前記凹面内に配置される媒体流路又はレーザ媒質からの光を受光する、
ことを特徴とするメタマテリアル光学部材。
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
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JP2014078820A JP6307328B2 (ja) | 2014-04-07 | 2014-04-07 | メタマテリアル光学部材、光検出装置、レーザ励起光源及び計測装置 |
PCT/JP2015/060651 WO2015156231A1 (ja) | 2014-04-07 | 2015-04-03 | メタマテリアル光学部材、光検出装置、レーザ励起光源及び計測装置 |
US15/301,764 US10161857B2 (en) | 2014-04-07 | 2015-04-03 | Metamaterial optical member, light detection device, laser excitation light source, and measuring device |
DE112015001707.0T DE112015001707T5 (de) | 2014-04-07 | 2015-04-03 | Optisches Metamaterial-Element, Lichterfassungsvorrichtung, Laseranregungslichtquelle und Messvorrichtung |
GBGB1617381.7A GB201617381D0 (en) | 2014-04-07 | 2015-04-03 | Metamaterial optical member, light detection device, laser excitation light source, and measuring device |
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JP2014078820A JP6307328B2 (ja) | 2014-04-07 | 2014-04-07 | メタマテリアル光学部材、光検出装置、レーザ励起光源及び計測装置 |
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US (1) | US10161857B2 (ja) |
JP (1) | JP6307328B2 (ja) |
DE (1) | DE112015001707T5 (ja) |
GB (1) | GB201617381D0 (ja) |
WO (1) | WO2015156231A1 (ja) |
Cited By (1)
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US11048025B2 (en) | 2018-09-07 | 2021-06-29 | Korea University Research And Business Foundation | Anti-reflection coating and method of forming the same |
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US11988600B2 (en) * | 2016-12-09 | 2024-05-21 | National University Of Singapore | Gas sensor MEMS structures and methods of fabrication thereof |
DE102017211431B4 (de) * | 2017-07-05 | 2024-04-25 | Robert Bosch Gmbh | Küvette zum Aufnehmen eines Fluids, Vorrichtung zum Analysieren des Fluids sowie Herstellungsverfahren |
CN108493567B (zh) * | 2018-02-13 | 2020-03-20 | 浙江大学 | 基于超结构的可调太赫兹谐振腔及其用于物质分析的方法 |
US11506586B2 (en) | 2020-08-17 | 2022-11-22 | Carrier Corporation | Photoelectric smoke sensor tube |
GB202113796D0 (en) * | 2021-09-27 | 2021-11-10 | Ams Ag | Minaturized particulate matter sensor |
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US4541439A (en) * | 1982-04-23 | 1985-09-17 | American Home Products Corporation (Del.) | Monitoring of capillary blood flow |
JPH07204158A (ja) * | 1994-01-24 | 1995-08-08 | Toshiba Corp | 内視鏡 |
JPH08234254A (ja) * | 1995-02-23 | 1996-09-13 | Asahi Glass Co Ltd | 高調波発生装置 |
US6794671B2 (en) * | 2002-07-17 | 2004-09-21 | Particle Sizing Systems, Inc. | Sensors and methods for high-sensitivity optical particle counting and sizing |
JP2005331784A (ja) * | 2004-05-20 | 2005-12-02 | Fuji Xerox Co Ltd | 光学レンズ系およびこれを用いた位置計測システム |
JP2009250825A (ja) * | 2008-04-08 | 2009-10-29 | Nippon Sheet Glass Co Ltd | 吸光度測定用プローブ及び吸光光度計 |
US8488247B2 (en) * | 2008-10-06 | 2013-07-16 | Purdue Research Foundation | System, method and apparatus for modifying the visibility properties of an object |
JP5864423B2 (ja) | 2009-10-06 | 2016-02-17 | デューク ユニバーシティ | 球面収差の無い屈折率分布型レンズと方法 |
US8708901B2 (en) * | 2009-12-30 | 2014-04-29 | University Of Seoul Industry Cooperation Foundation | Health monitoring system with a waveguide to guide a wave from a power source |
JP2011158665A (ja) * | 2010-01-29 | 2011-08-18 | Sony Corp | メタマテリアル部材の製造方法及びメタマテリアル部材 |
JP5617642B2 (ja) * | 2011-01-06 | 2014-11-05 | ソニー株式会社 | 赤外線光学系、赤外線撮像装置 |
JP5651088B2 (ja) | 2011-08-31 | 2015-01-07 | 富士フイルム株式会社 | レンズ装置 |
JP6164212B2 (ja) * | 2012-05-16 | 2017-07-19 | ソニー株式会社 | 撮像光学系、撮像装置 |
JP2014036152A (ja) * | 2012-08-09 | 2014-02-24 | Nikon Corp | ファイバレーザ、このファイバレーザを備えたレーザ装置、露光装置及び検査装置 |
EP3117204B1 (en) * | 2014-03-13 | 2021-06-16 | General Electric Company | Curved digital x-ray detector for weld inspection |
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- 2014-04-07 JP JP2014078820A patent/JP6307328B2/ja not_active Expired - Fee Related
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- 2015-04-03 US US15/301,764 patent/US10161857B2/en not_active Expired - Fee Related
- 2015-04-03 DE DE112015001707.0T patent/DE112015001707T5/de active Pending
- 2015-04-03 WO PCT/JP2015/060651 patent/WO2015156231A1/ja active Application Filing
- 2015-04-03 GB GBGB1617381.7A patent/GB201617381D0/en not_active Withdrawn
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US11048025B2 (en) | 2018-09-07 | 2021-06-29 | Korea University Research And Business Foundation | Anti-reflection coating and method of forming the same |
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US20170023466A1 (en) | 2017-01-26 |
WO2015156231A1 (ja) | 2015-10-15 |
JP2015200745A (ja) | 2015-11-12 |
GB2538930A (en) | 2016-11-30 |
GB201617381D0 (en) | 2016-11-30 |
US10161857B2 (en) | 2018-12-25 |
DE112015001707T5 (de) | 2016-12-29 |
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