JP6297759B2 - 蓄電回路の状態を導出する照明デバイス - Google Patents
蓄電回路の状態を導出する照明デバイス Download PDFInfo
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- JP6297759B2 JP6297759B2 JP2017541826A JP2017541826A JP6297759B2 JP 6297759 B2 JP6297759 B2 JP 6297759B2 JP 2017541826 A JP2017541826 A JP 2017541826A JP 2017541826 A JP2017541826 A JP 2017541826A JP 6297759 B2 JP6297759 B2 JP 6297759B2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2605—Measuring capacitance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2632—Circuits therefor for testing diodes
- G01R31/2635—Testing light-emitting diodes, laser diodes or photodiodes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/40—Testing power supplies
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/64—Testing of capacitors
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B41/00—Circuit arrangements or apparatus for igniting or operating discharge lamps
- H05B41/14—Circuit arrangements
- H05B41/26—Circuit arrangements in which the lamp is fed by power derived from dc by means of a converter, e.g. by high-voltage dc
- H05B41/28—Circuit arrangements in which the lamp is fed by power derived from dc by means of a converter, e.g. by high-voltage dc using static converters
- H05B41/288—Circuit arrangements in which the lamp is fed by power derived from dc by means of a converter, e.g. by high-voltage dc using static converters with semiconductor devices and specially adapted for lamps without preheating electrodes, e.g. for high-intensity discharge lamps, high-pressure mercury or sodium lamps or low-pressure sodium lamps
- H05B41/2885—Static converters especially adapted therefor; Control thereof
- H05B41/2886—Static converters especially adapted therefor; Control thereof comprising a controllable preconditioner, e.g. a booster
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B41/00—Circuit arrangements or apparatus for igniting or operating discharge lamps
- H05B41/14—Circuit arrangements
- H05B41/26—Circuit arrangements in which the lamp is fed by power derived from dc by means of a converter, e.g. by high-voltage dc
- H05B41/28—Circuit arrangements in which the lamp is fed by power derived from dc by means of a converter, e.g. by high-voltage dc using static converters
- H05B41/288—Circuit arrangements in which the lamp is fed by power derived from dc by means of a converter, e.g. by high-voltage dc using static converters with semiconductor devices and specially adapted for lamps without preheating electrodes, e.g. for high-intensity discharge lamps, high-pressure mercury or sodium lamps or low-pressure sodium lamps
- H05B41/292—Arrangements for protecting lamps or circuits against abnormal operating conditions
- H05B41/2921—Arrangements for protecting lamps or circuits against abnormal operating conditions for protecting the circuit against abnormal operating conditions
- H05B41/2923—Arrangements for protecting lamps or circuits against abnormal operating conditions for protecting the circuit against abnormal operating conditions against abnormal power supply conditions
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B41/00—Circuit arrangements or apparatus for igniting or operating discharge lamps
- H05B41/14—Circuit arrangements
- H05B41/26—Circuit arrangements in which the lamp is fed by power derived from dc by means of a converter, e.g. by high-voltage dc
- H05B41/28—Circuit arrangements in which the lamp is fed by power derived from dc by means of a converter, e.g. by high-voltage dc using static converters
- H05B41/288—Circuit arrangements in which the lamp is fed by power derived from dc by means of a converter, e.g. by high-voltage dc using static converters with semiconductor devices and specially adapted for lamps without preheating electrodes, e.g. for high-intensity discharge lamps, high-pressure mercury or sodium lamps or low-pressure sodium lamps
- H05B41/292—Arrangements for protecting lamps or circuits against abnormal operating conditions
- H05B41/2921—Arrangements for protecting lamps or circuits against abnormal operating conditions for protecting the circuit against abnormal operating conditions
- H05B41/2926—Arrangements for protecting lamps or circuits against abnormal operating conditions for protecting the circuit against abnormal operating conditions against internal abnormal circuit conditions
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B45/00—Circuit arrangements for operating light-emitting diodes [LED]
- H05B45/30—Driver circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2632—Circuits therefor for testing diodes
- G01R31/2633—Circuits therefor for testing diodes for measuring switching properties thereof
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Optics & Photonics (AREA)
- Circuit Arrangement For Electric Light Sources In General (AREA)
- Led Devices (AREA)
- Charge And Discharge Circuits For Batteries Or The Like (AREA)
Description
照明装置に結合され、コンデンサと、コンデンサと並列に置かれる抵抗器とを含む蓄電回路と、
照明装置が、電流伝導状態にあるか又は電流阻止状態にあるかを決定する第1の決定回路と、
照明装置の電流阻止状態において、蓄電回路の放電曲線の点を決定する第2の決定回路と、
放電曲線から、蓄電回路の状態を導出する導出回路とを含む。上記デバイスは更に、
コンデンサと並列の要素を切り替えるスイッチ回路を含み、
蓄電回路の放電曲線の点は、要素から切断され、要素なしで抵抗器を介して放電するコンデンサについて決定される蓄電回路の第1の放電曲線の第1の点を含み、
蓄電回路の放電曲線の点は、要素に接続され、抵抗器及び要素の両方を介して放電するコンデンサについて決定される蓄電回路の第2の放電曲線の第2の点を含む。
照明装置が、電流伝導状態にあるか又は電流阻止状態にあるかを決定するステップと、
照明装置の電流阻止状態において、蓄電回路の放電曲線の点を決定するステップと、
放電曲線から、蓄電回路の状態を導出するステップとを含む。
Claims (14)
- 発光する照明装置に給電するデバイスであって、前記照明装置は、電流伝導状態又は電流阻止状態にあるように構成され、前記デバイスは更に、
前記照明装置に結合され、コンデンサと、前記コンデンサと並列に置かれる抵抗器とを含む蓄電回路と、
前記照明装置が、前記電流伝導状態にあるか、又は、前記電流阻止状態にあるかを決定する第1の決定回路と、
前記照明装置の前記電流阻止状態において、前記蓄電回路の放電曲線の点を決定する第2の決定回路と、
前記放電曲線から、前記蓄電回路の状態を導出する導出回路と、
を含み、
前記デバイスは更に、
前記コンデンサと並列の要素を切り替えるスイッチ回路を含み、
前記蓄電回路の前記放電曲線の前記点は、前記要素から切断され、前記要素なしで前記抵抗器を介して放電する前記コンデンサについて決定される前記蓄電回路の第1の放電曲線の第1の点を含み、
前記蓄電回路の前記放電曲線の前記点は、前記要素に接続され、前記抵抗器及び前記要素の両方を介して放電する前記コンデンサについて決定される前記蓄電回路の第2の放電曲線の第2の点を含む、デバイス。 - 前記第1の点及び前記第2の点は、それぞれ、前記照明装置の少なくとも1つの電流伝導状態によって隔てられる前記照明装置のそれぞれの電流阻止状態において決定される、請求項1に記載のデバイス。
- 前記第1の点及び前記第2の点は、それぞれ、前記照明装置の同一の電流阻止状態において決定される、請求項1に記載のデバイス。
- 前記要素は、抵抗器、コンデンサ又はインダクタを含む、請求項1に記載のデバイス。
- 前記蓄電回路の状態は、前記コンデンサの状態を含み、
前記導出回路は、前記第1の放電曲線及び前記第2の放電曲線に応じて、前記コンデンサの容量値を計算する、請求項1に記載のデバイス。 - 前記蓄電回路の状態は、前記抵抗器の状態、又は、前記コンデンサ及び前記抵抗器の状態を含み、
前記導出回路は、
前記第1の放電曲線及び前記第2の放電曲線に応じて、前記抵抗器の抵抗値を計算するか、又は、
前記第1の放電曲線及び前記第2の放電曲線に応じて、前記コンデンサの容量値及び前記抵抗器の抵抗値を計算する、請求項1に記載のデバイス。 - 前記蓄電回路の状態は、前記蓄電回路が、良い状態にあるか又は悪い状態にあるかを分類する、請求項1に記載のデバイス。
- 前記蓄電回路の状態に依存して、人に前記蓄電回路の状態を示す指示信号を生成する指示回路を更に含む、請求項1に記載のデバイス。
- 前記照明装置は、前記電流伝導状態では、閾値以上の振幅値を有する入力信号を受信し、前記振幅値は、前記照明装置の前記電流阻止状態では、前記閾値よりも小さい、請求項1に記載のデバイス。
- 前記入力信号は、電圧信号を含み、前記閾値は、閾値電圧値を含む、請求項9に記載のデバイス。
- 前記第2の決定回路は、時間に応じた電圧振幅値の形の前記蓄電回路の前記放電曲線の前記点を決定する、請求項10に記載のデバイス。
- 前記照明装置は、発光ダイオード回路を含む、請求項1に記載のデバイス。
- 発光する照明装置を含む発光する装置であって、
前記照明装置は、電流伝導状態又は電流阻止状態にあるように構成され、前記発光する装置は更に、請求項1乃至12の何れか一項に記載のデバイスを含む、装置。 - 発光する照明装置に給電するデバイスを操作する方法であって、
前記照明装置は、電流伝導状態又は電流阻止状態にあるように構成され、前記デバイスは更に、前記照明装置に結合される蓄電回路を含み、前記蓄電回路は、コンデンサと、前記コンデンサと並列に置かれる抵抗器とを含み、前記方法は、
前記照明装置が、前記電流伝導状態にあるか又は前記電流阻止状態にあるかを決定するステップと、
前記照明装置の前記電流阻止状態において、前記蓄電回路の放電曲線の点を決定するステップと、
前記放電曲線から、前記蓄電回路の状態を導出するステップと、
を含み、
前記放電曲線の点を決定するステップは、
前記コンデンサが要素から切断され、前記要素なしで前記抵抗器を介して放電する場合に、前記蓄電回路の第1の放電曲線の第1の点を決定するステップと、
前記コンデンサが前記要素に接続され、前記抵抗器及び前記要素の両方を介して放電する場合に、前記蓄電回路の第2の放電曲線の第2の点を決定するステップと、
を含む、方法。
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2015072640 | 2015-02-10 | ||
CNPCT/CN2015/072640 | 2015-02-10 | ||
EP15158726.8 | 2015-03-12 | ||
EP15158726 | 2015-03-12 | ||
PCT/EP2016/052746 WO2016128413A1 (en) | 2015-02-10 | 2016-02-09 | Light device deriving condition of storage circuit |
Publications (2)
Publication Number | Publication Date |
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JP2018504764A JP2018504764A (ja) | 2018-02-15 |
JP6297759B2 true JP6297759B2 (ja) | 2018-03-20 |
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JP2017541826A Expired - Fee Related JP6297759B2 (ja) | 2015-02-10 | 2016-02-09 | 蓄電回路の状態を導出する照明デバイス |
Country Status (5)
Country | Link |
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US (1) | US10123389B2 (ja) |
EP (1) | EP3257331A1 (ja) |
JP (1) | JP6297759B2 (ja) |
CN (1) | CN107251653B (ja) |
WO (1) | WO2016128413A1 (ja) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
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DE102016221741A1 (de) * | 2016-11-07 | 2018-05-09 | Tridonic Gmbh & Co Kg | Treiber für eine Leuchtdiode und Verfahren |
US10945324B2 (en) * | 2017-11-30 | 2021-03-09 | Osram Gmbh | External assessment device for a lighting system and method of assessing a lighting system |
WO2021053798A1 (ja) * | 2019-09-19 | 2021-03-25 | 三菱電機株式会社 | 電源装置及び寿命診断方法 |
US11764322B2 (en) * | 2020-03-20 | 2023-09-19 | Battelle Memorial Institute | Betavoltaics with absorber layer containing coated scintillating particles |
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FR2134112B1 (ja) * | 1971-04-20 | 1974-03-22 | Sodern | |
DE4116961A1 (de) * | 1991-05-24 | 1992-11-26 | Abb Patent Gmbh | Messschaltung zur messung einer kapazitaet |
JPH0919003A (ja) * | 1995-06-27 | 1997-01-17 | Honda Motor Co Ltd | 電動車両におけるコンデンサの劣化判定装置 |
DE10053279A1 (de) | 2000-10-27 | 2002-05-08 | Philips Corp Intellectual Pty | Verfahren zur Bestimmung der Ausgangskapazität einer Spannungsversorgungsvorrichtung |
JP4061965B2 (ja) * | 2002-05-14 | 2008-03-19 | ソニー株式会社 | 電池容量算出方法 |
JP4665480B2 (ja) | 2004-10-26 | 2011-04-06 | パナソニック電工株式会社 | 放電灯点灯装置、照明器具、および照明システム |
KR20090029333A (ko) | 2007-09-18 | 2009-03-23 | 삼성전자주식회사 | 평활용 전해콘덴서의 고장진단장치 및 그 방법 |
FI120280B (fi) | 2008-01-21 | 2009-08-31 | Switch High Power Converters O | Menetelmä tasajännitevälipiirin kondensaattorien kunnonvalvontaan |
KR20110062990A (ko) * | 2009-12-04 | 2011-06-10 | 삼성전기주식회사 | 커패시터의 평가 장치 및 방법 |
US8710995B2 (en) | 2010-05-20 | 2014-04-29 | Rohm Co., Ltd. | Lighting apparatus |
JP5733931B2 (ja) | 2010-09-10 | 2015-06-10 | 三菱電機株式会社 | 電源装置及び照明装置 |
WO2013110027A1 (en) * | 2012-01-20 | 2013-07-25 | Osram Sylvania Inc. | Techniques for assessing condition of leds and power supply |
JP2013233008A (ja) * | 2012-04-27 | 2013-11-14 | Nikon Corp | 電源装置 |
CN103592601A (zh) * | 2012-08-17 | 2014-02-19 | 上海斐讯数据通信技术有限公司 | 一种根据充放电曲线自动检测电池容量的测试系统 |
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2016
- 2016-02-09 CN CN201680009690.4A patent/CN107251653B/zh not_active Expired - Fee Related
- 2016-02-09 US US15/549,259 patent/US10123389B2/en not_active Expired - Fee Related
- 2016-02-09 WO PCT/EP2016/052746 patent/WO2016128413A1/en active Application Filing
- 2016-02-09 JP JP2017541826A patent/JP6297759B2/ja not_active Expired - Fee Related
- 2016-02-09 EP EP16704163.1A patent/EP3257331A1/en not_active Withdrawn
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Publication number | Publication date |
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US20180035511A1 (en) | 2018-02-01 |
CN107251653A (zh) | 2017-10-13 |
WO2016128413A1 (en) | 2016-08-18 |
EP3257331A1 (en) | 2017-12-20 |
CN107251653B (zh) | 2019-08-13 |
JP2018504764A (ja) | 2018-02-15 |
US10123389B2 (en) | 2018-11-06 |
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