JP6209683B2 - 光子を検出する検出デバイス及びそのための方法 - Google Patents

光子を検出する検出デバイス及びそのための方法 Download PDF

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JP6209683B2
JP6209683B2 JP2016533694A JP2016533694A JP6209683B2 JP 6209683 B2 JP6209683 B2 JP 6209683B2 JP 2016533694 A JP2016533694 A JP 2016533694A JP 2016533694 A JP2016533694 A JP 2016533694A JP 6209683 B2 JP6209683 B2 JP 6209683B2
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デル，ハイナー
ヘルマン，クリストフ
ベルクナー，フランク
ブッカー，ロジャー ステッドマン
ブッカー，ロジャー ステッドマン
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Koninklijke Philips NV
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/247—Detector read-out circuitry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/17—Circuit arrangements not adapted to a particular type of detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/249—Measuring radiation intensity with semiconductor detectors specially adapted for use in SPECT or PET

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
JP2016533694A 2013-11-27 2014-11-20 光子を検出する検出デバイス及びそのための方法 Active JP6209683B2 (ja)

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EP13194618.8 2013-11-27
EP13194618 2013-11-27
PCT/EP2014/075065 WO2015078753A1 (en) 2013-11-27 2014-11-20 Detection device for detecting photons and method therefore

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JP2016540208A JP2016540208A (ja) 2016-12-22
JP2016540208A5 JP2016540208A5 (https=) 2017-08-24
JP6209683B2 true JP6209683B2 (ja) 2017-10-04

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US (1) US9759822B2 (https=)
EP (1) EP3074791B1 (https=)
JP (1) JP6209683B2 (https=)
CN (1) CN105793734B (https=)
WO (1) WO2015078753A1 (https=)

Families Citing this family (44)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104812305B (zh) * 2012-12-27 2018-03-30 东芝医疗系统株式会社 X射线ct装置以及控制方法
JP2016522891A (ja) * 2013-04-24 2016-08-04 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 訂正手段を備えたパルス処理回路
EP2871496B1 (en) * 2013-11-12 2020-01-01 Samsung Electronics Co., Ltd Radiation detector and computed tomography apparatus using the same
JP2015180859A (ja) * 2014-03-05 2015-10-15 株式会社東芝 フォトンカウンティングｃｔ装置
US10159450B2 (en) * 2014-10-01 2018-12-25 Toshiba Medical Systems Corporation X-ray CT apparatus including a photon-counting detector, and an image processing apparatus and an image processing method for correcting detection signals detected by the photon-counting detector
KR101725099B1 (ko) * 2014-12-05 2017-04-26 삼성전자주식회사 컴퓨터 단층 촬영장치 및 그 제어방법
JP6262919B2 (ja) * 2014-12-05 2018-01-17 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 傾斜角度でｘ線放射線を検出するｘ線検出器装置
EP3234651B1 (en) * 2014-12-16 2019-09-11 Koninklijke Philips N.V. Baseline shift determination for a photon detector
US9757085B2 (en) * 2015-02-25 2017-09-12 Toshiba Medical Systems Corporation Method for identifying and processing detector polarization in photon-counting spectral X-ray detectors
US10098595B2 (en) * 2015-08-06 2018-10-16 Texas Instruments Incorporated Low power photon counting system
CN108027447B (zh) 2015-09-18 2022-03-11 皇家飞利浦有限公司 光子计数x射线辐射探测系统中的光子计数的校正
WO2017046289A1 (en) 2015-09-18 2017-03-23 Koninklijke Philips N.V. Processing of a corrected x-ray detector signal
US10117626B2 (en) * 2015-09-29 2018-11-06 General Electric Company Apparatus and method for pile-up correction in photon-counting detector
KR102605320B1 (ko) * 2016-08-31 2023-11-23 프리스매틱 센서즈 에이비 컨버터의 상대적인 이득 및 오프셋 추정을 위한 방법 및 시스템
CN109716165B (zh) * 2016-10-27 2022-09-30 深圳帧观德芯科技有限公司 辐射检测器中的暗噪音补偿
CN106656390B (zh) * 2016-11-15 2018-10-30 武汉中派科技有限责任公司 用于测量光子时间信息的装置及方法
EP3547665B1 (en) * 2016-11-25 2026-01-21 Hamamatsu Photonics K.K. Photon detector
US10162066B2 (en) * 2017-02-06 2018-12-25 General Electric Company Coincidence-enabling photon-counting detector
EP3385756A1 (en) * 2017-04-06 2018-10-10 Koninklijke Philips N.V. Pulse shaper
US10151845B1 (en) 2017-08-02 2018-12-11 Texas Instruments Incorporated Configurable analog-to-digital converter and processing for photon counting
US10024979B1 (en) 2017-11-01 2018-07-17 Texas Instruments Incorporated Photon counting with coincidence detection
US20190154852A1 (en) * 2017-11-16 2019-05-23 NueVue Solutions, Inc. Analog Direct Digital X-Ray Photon Counting Detector For Resolving Photon Energy In Spectral X-Ray CT
EP3567405A1 (en) 2018-05-08 2019-11-13 Koninklijke Philips N.V. Photon counting spectral ct
EP3605151A1 (en) * 2018-08-01 2020-02-05 Koninklijke Philips N.V. Photon counting detector
CN109283569B (zh) * 2018-11-20 2022-05-17 中派科技（深圳）有限责任公司 用于测量光子信息的装置和光子测量设备
WO2020109668A1 (en) * 2018-11-29 2020-06-04 Oy Ajat Ltd. Detector circuit
US10890674B2 (en) 2019-01-15 2021-01-12 Texas Instruments Incorporated Dynamic noise shaping in a photon counting system
EP3754368A1 (en) * 2019-06-19 2020-12-23 Integrated Device Technology, Inc. Amplifier system and method for operating an amplifier system, particularly for an optical receiver system of a light detection and ranging system
EP3832323B1 (en) * 2019-12-04 2024-03-20 Nxp B.V. A leakage compensation circuit for a capacitive or resistive measurement device
EP3842839A1 (en) * 2019-12-27 2021-06-30 Koninklijke Philips N.V. Compensation of polarization effects in photon counting detectors
US12468050B2 (en) * 2020-01-27 2025-11-11 The Johns Hopkins University Direct energy windowing for photon counting detectors
DE102020114906B4 (de) * 2020-06-04 2023-06-29 Bender Gmbh & Co. Kg Schutzkontaktsteckdose und Verfahren zur Isolationsfehlerlokalisierung in einem ungeerdeten Stromversorgungssystem mit Isolationsüberwachung
JP2021194354A (ja) * 2020-06-17 2021-12-27 株式会社日立製作所 放射線撮像装置
DE112021004892T5 (de) 2020-09-18 2023-08-17 Analog Devices, Inc. Deltamodulierte basislinienwiederherstellung für photonenzählcomputertomographie
CN114822616B (zh) * 2021-01-18 2025-10-28 中芯国际集成电路制造（天津）有限公司 灵敏放大器、存储器以及存储器的工作方法
GB202105196D0 (en) * 2021-04-12 2021-05-26 Ams Int Ag Baseline restorer circuit
JP7703045B2 (ja) * 2021-05-03 2025-07-04 アーエムエス インターナショナル アーゲー 電磁放射センサ応用例のためのフロントエンド電子回路
US12161498B2 (en) * 2021-05-11 2024-12-10 Analog Devices, Inc. Baseline restoration technique for photon counting computed tomography using active reference
US12287437B2 (en) 2022-01-19 2025-04-29 Analog Devices, Inc. Quantitative pulse selection for photon-counting computed tomography scanning systems
US12411253B1 (en) * 2022-11-14 2025-09-09 Ut-Battelle, Llc Pulse shape discrimination system for high density imaging
US12571923B2 (en) 2022-12-13 2026-03-10 Analog Devices, Inc. Timer-based amplitude correction method for photon counting computed tomography
EP4564063A1 (en) * 2023-11-30 2025-06-04 Teledyne Dalsa B.V. Detector pixel and energy-resolving photon counting detector
CN117854750B (zh) * 2023-12-13 2026-04-21 深圳大学 一种高时间分辨x光辐射流诊断系统
CN118944607B (zh) * 2024-10-12 2024-12-10 南京大学 复位式电荷灵敏放大电路、数据信号的放大及复位方法

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6028313A (en) * 1997-12-31 2000-02-22 Mcdaniel; David L. Direct conversion photon detector
US6609075B1 (en) 2001-06-04 2003-08-19 William K. Warburton Method and apparatus for baseline correction in x-ray and nuclear spectroscopy systems
US6822506B2 (en) 2003-04-17 2004-11-23 Concorde Microsystems, Inc. Amplitude and rise-time sensitive timing-shaping filters with built-in pulse-tail cancellation for high count-rate operation
US20090304149A1 (en) * 2005-07-22 2009-12-10 Christoph Herrmann X-ray detector imaging with polychromatic spectra
JP2007089922A (ja) * 2005-09-29 2007-04-12 Toshiba Corp Ｘ線画像診断装置、ｘ線検出装置、及びｘ線投影データの補正方法
US8237128B2 (en) * 2006-12-13 2012-08-07 Koninklijke Philips Electronics N.V. Apparatus, imaging device and method for counting X-ray photons
US20100193700A1 (en) * 2007-06-01 2010-08-05 Koninklijke Philips Electronics N.V. Spectral photon counting detector
US8338791B2 (en) * 2007-06-19 2012-12-25 Koninklijke Philips Electronics N.V. Digital pulse processing for multi-spectral photon counting readout circuits
US9335424B2 (en) * 2007-06-19 2016-05-10 Koninklijke Philips N.V. Spectral photon counting detector
EP2176684B1 (en) 2007-08-03 2015-04-29 Koninklijke Philips N.V. Apparatus and method for generating countable pulses from impinging x-ray photons, and corresponding imaging device
JP2011521212A (ja) * 2008-04-30 2011-07-21 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 計数検出器
WO2011002452A1 (en) 2009-06-30 2011-01-06 Analogic Corporation Enhanced photon detection for scanner
FR2956216B1 (fr) * 2010-02-08 2012-04-20 Commissariat Energie Atomique Dispositif de detection de rayonnements photoniques, et procedes de dimensionnement et de fonctionnement d'un tel dispositif
WO2012095710A2 (en) 2011-01-10 2012-07-19 Koninklijke Philips Electronics N.V. Detection device for detecting photons emitted by a radiation source
JP5875790B2 (ja) * 2011-07-07 2016-03-02 株式会社東芝 光子計数型画像検出器、ｘ線診断装置、及びｘ線コンピュータ断層装置
RU2594602C2 (ru) * 2011-10-19 2016-08-20 Конинклейке Филипс Н.В. Детектор для подсчета фотонов
JP2013128698A (ja) * 2011-12-22 2013-07-04 Shimadzu Corp 二次元アレイｘ線検出器におけるゲイン補正方法およびｘ線撮影装置
US8907290B2 (en) * 2012-06-08 2014-12-09 General Electric Company Methods and systems for gain calibration of gamma ray detectors
JP5932156B2 (ja) * 2012-09-18 2016-06-08 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 直接変換光子計数検出器、当該検出器を有するイメージングシステム又はコンピュータトモグラフィシステム、放射線光子検出方法
RU2015126606A (ru) * 2012-12-04 2017-01-12 Конинклейке Филипс Н.В. Способ и устройство для коррекции изображения относительно информации рентгеновского изображения
EP2932300B1 (en) * 2012-12-12 2018-04-11 Koninklijke Philips N.V. Adaptive persistent current compensation for photon counting detectors

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Publication number Publication date
EP3074791A1 (en) 2016-10-05
US20160377745A1 (en) 2016-12-29
WO2015078753A1 (en) 2015-06-04
US9759822B2 (en) 2017-09-12
CN105793734A (zh) 2016-07-20
JP2016540208A (ja) 2016-12-22
CN105793734B (zh) 2019-05-07
EP3074791B1 (en) 2019-06-19

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