CN105793734B - 用于探测光子的探测设备以及其方法 - Google Patents

用于探测光子的探测设备以及其方法 Download PDF

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CN105793734B
CN105793734B CN201480064601.7A CN201480064601A CN105793734B CN 105793734 B CN105793734 B CN 105793734B CN 201480064601 A CN201480064601 A CN 201480064601A CN 105793734 B CN105793734 B CN 105793734B
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CN105793734A (zh
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H·德尔
C·赫尔曼
F·贝格纳
R·斯特德曼布克
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Koninklijke Philips NV
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/24Measuring radiation intensity with semiconductor detectors
    • G01T1/247Detector read-out circuitry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/17Circuit arrangements not adapted to a particular type of detector
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/24Measuring radiation intensity with semiconductor detectors
    • G01T1/249Measuring radiation intensity with semiconductor detectors specially adapted for use in SPECT or PET

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
CN201480064601.7A 2013-11-27 2014-11-20 用于探测光子的探测设备以及其方法 Active CN105793734B (zh)

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EP13194618 2013-11-27
EP13194618.8 2013-11-27
PCT/EP2014/075065 WO2015078753A1 (en) 2013-11-27 2014-11-20 Detection device for detecting photons and method therefore

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CN105793734B true CN105793734B (zh) 2019-05-07

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US (1) US9759822B2 (https=)
EP (1) EP3074791B1 (https=)
JP (1) JP6209683B2 (https=)
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Families Citing this family (45)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104812305B (zh) * 2012-12-27 2018-03-30 东芝医疗系统株式会社 X射线ct装置以及控制方法
CN105143918A (zh) * 2013-04-24 2015-12-09 皇家飞利浦有限公司 具有校正单元的脉冲处理电路
EP2871496B1 (en) 2013-11-12 2020-01-01 Samsung Electronics Co., Ltd Radiation detector and computed tomography apparatus using the same
JP2015180859A (ja) * 2014-03-05 2015-10-15 株式会社東芝 フォトンカウンティングct装置
US10159450B2 (en) * 2014-10-01 2018-12-25 Toshiba Medical Systems Corporation X-ray CT apparatus including a photon-counting detector, and an image processing apparatus and an image processing method for correcting detection signals detected by the photon-counting detector
BR112017002916A2 (pt) * 2014-12-05 2017-12-05 Koninklijke Philips Nv dispositivo detector de raios x para detecção de radiação de raio x a um ângulo inclinado em relação à radiação de raio x, sistema e método de imageamento por raios x, elemento de programa de computador para controlar um dispositivo ou um sistema, e mídia legível por computador
KR101725099B1 (ko) * 2014-12-05 2017-04-26 삼성전자주식회사 컴퓨터 단층 촬영장치 및 그 제어방법
RU2699307C2 (ru) * 2014-12-16 2019-09-04 Конинклейке Филипс Н.В. Определение смещения базовой линии детектора фотонов
US9757085B2 (en) * 2015-02-25 2017-09-12 Toshiba Medical Systems Corporation Method for identifying and processing detector polarization in photon-counting spectral X-ray detectors
US10098595B2 (en) * 2015-08-06 2018-10-16 Texas Instruments Incorporated Low power photon counting system
US10281596B2 (en) 2015-09-18 2019-05-07 Koninklijke Philips N.V. Correcting photon counts in a photon counting X-ray radiation detection system
US11099279B2 (en) 2015-09-18 2021-08-24 Koninklijke Philips N.V. Processing of a corrected X-ray detector signal
US10117626B2 (en) * 2015-09-29 2018-11-06 General Electric Company Apparatus and method for pile-up correction in photon-counting detector
WO2018044214A1 (en) * 2016-08-31 2018-03-08 Prismatic Sensors Ab Method and system for estimating the relative gain and offset of a converter
EP3532873B1 (en) * 2016-10-27 2021-06-23 Shenzhen Xpectvision Technology Co., Ltd. Dark noise compensation in a radiation detector
CN106656390B (zh) * 2016-11-15 2018-10-30 武汉中派科技有限责任公司 用于测量光子时间信息的装置及方法
EP3547665B1 (en) * 2016-11-25 2026-01-21 Hamamatsu Photonics K.K. Photon detector
US10162066B2 (en) * 2017-02-06 2018-12-25 General Electric Company Coincidence-enabling photon-counting detector
EP3385756A1 (en) * 2017-04-06 2018-10-10 Koninklijke Philips N.V. Pulse shaper
US10151845B1 (en) 2017-08-02 2018-12-11 Texas Instruments Incorporated Configurable analog-to-digital converter and processing for photon counting
US10024979B1 (en) 2017-11-01 2018-07-17 Texas Instruments Incorporated Photon counting with coincidence detection
US20190154852A1 (en) * 2017-11-16 2019-05-23 NueVue Solutions, Inc. Analog Direct Digital X-Ray Photon Counting Detector For Resolving Photon Energy In Spectral X-Ray CT
EP3567405A1 (en) * 2018-05-08 2019-11-13 Koninklijke Philips N.V. Photon counting spectral ct
EP3605151A1 (en) * 2018-08-01 2020-02-05 Koninklijke Philips N.V. Photon counting detector
CN109283569B (zh) * 2018-11-20 2022-05-17 中派科技(深圳)有限责任公司 用于测量光子信息的装置和光子测量设备
CN113614576B (zh) * 2018-11-29 2024-09-06 Oy直接转换有限公司 检测器电路
US10890674B2 (en) 2019-01-15 2021-01-12 Texas Instruments Incorporated Dynamic noise shaping in a photon counting system
EP3754368A1 (en) * 2019-06-19 2020-12-23 Integrated Device Technology, Inc. Amplifier system and method for operating an amplifier system, particularly for an optical receiver system of a light detection and ranging system
EP3832323B1 (en) * 2019-12-04 2024-03-20 Nxp B.V. A leakage compensation circuit for a capacitive or resistive measurement device
EP3842839A1 (en) * 2019-12-27 2021-06-30 Koninklijke Philips N.V. Compensation of polarization effects in photon counting detectors
US12468050B2 (en) * 2020-01-27 2025-11-11 The Johns Hopkins University Direct energy windowing for photon counting detectors
DE102020114906B4 (de) * 2020-06-04 2023-06-29 Bender Gmbh & Co. Kg Schutzkontaktsteckdose und Verfahren zur Isolationsfehlerlokalisierung in einem ungeerdeten Stromversorgungssystem mit Isolationsüberwachung
JP2021194354A (ja) * 2020-06-17 2021-12-27 株式会社日立製作所 放射線撮像装置
US12607758B2 (en) 2020-09-18 2026-04-21 Analog Devices, Inc. Delta modulated baseline restoration for photon counting computed tomography
WO2022122545A1 (en) * 2020-12-09 2022-06-16 Ams International Ag Electric circuitry for baseline extraction in a photon counting system
CN114822616B (zh) * 2021-01-18 2025-10-28 中芯国际集成电路制造(天津)有限公司 灵敏放大器、存储器以及存储器的工作方法
GB202105196D0 (en) * 2021-04-12 2021-05-26 Ams Int Ag Baseline restorer circuit
CN117677867A (zh) * 2021-05-03 2024-03-08 ams国际有限公司 用于电磁辐射传感器应用的前端电子电路
US12161498B2 (en) * 2021-05-11 2024-12-10 Analog Devices, Inc. Baseline restoration technique for photon counting computed tomography using active reference
US12287437B2 (en) 2022-01-19 2025-04-29 Analog Devices, Inc. Quantitative pulse selection for photon-counting computed tomography scanning systems
US12411253B1 (en) * 2022-11-14 2025-09-09 Ut-Battelle, Llc Pulse shape discrimination system for high density imaging
US12571923B2 (en) 2022-12-13 2026-03-10 Analog Devices, Inc. Timer-based amplitude correction method for photon counting computed tomography
EP4564063A1 (en) * 2023-11-30 2025-06-04 Teledyne Dalsa B.V. Detector pixel and energy-resolving photon counting detector
CN117854750B (zh) * 2023-12-13 2026-04-21 深圳大学 一种高时间分辨x光辐射流诊断系统
CN118944607B (zh) * 2024-10-12 2024-12-10 南京大学 复位式电荷灵敏放大电路、数据信号的放大及复位方法

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6028313A (en) * 1997-12-31 2000-02-22 Mcdaniel; David L. Direct conversion photon detector
US20040027183A1 (en) * 2003-04-17 2004-02-12 Concorde Microsystems, Inc. Amplitude and rise-time sensitive timing-shaping filters with built-in pulse-tail cancellation for high count-rate operation
CN101558325A (zh) * 2006-12-13 2009-10-14 皇家飞利浦电子股份有限公司 用于对x射线光子进行计数的装置、成像设备和方法
CN101680955A (zh) * 2007-06-19 2010-03-24 皇家飞利浦电子股份有限公司 谱光子计数探测器
CN101680956A (zh) * 2007-06-19 2010-03-24 皇家飞利浦电子股份有限公司 用于多谱光子计数读出电路的数字脉冲处理
CN101680954A (zh) * 2007-06-01 2010-03-24 皇家飞利浦电子股份有限公司 谱光子计数探测器
US20100172467A1 (en) * 2007-08-03 2010-07-08 Koninklijke Philips Electronics N.V. Apparatus and method for generating countable pulses from impinging x-ray photons; and corresponding imaging device
CN102016637A (zh) * 2008-04-30 2011-04-13 皇家飞利浦电子股份有限公司 计数探测器
WO2013057645A2 (en) * 2011-10-19 2013-04-25 Koninklijke Philips Electronics N.V. Photon counting detector
CN103109205A (zh) * 2011-07-07 2013-05-15 株式会社东芝 光子计数型图像检测器、x射线诊断装置、以及x射线计算机断层装置

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6609075B1 (en) 2001-06-04 2003-08-19 William K. Warburton Method and apparatus for baseline correction in x-ray and nuclear spectroscopy systems
US20090304149A1 (en) * 2005-07-22 2009-12-10 Christoph Herrmann X-ray detector imaging with polychromatic spectra
JP2007089922A (ja) * 2005-09-29 2007-04-12 Toshiba Corp X線画像診断装置、x線検出装置、及びx線投影データの補正方法
US8941076B2 (en) 2009-06-30 2015-01-27 Analogic Corporation Enhanced photon detection for scanner
FR2956216B1 (fr) * 2010-02-08 2012-04-20 Commissariat Energie Atomique Dispositif de detection de rayonnements photoniques, et procedes de dimensionnement et de fonctionnement d'un tel dispositif
EP2663879B1 (en) 2011-01-10 2017-08-02 Koninklijke Philips N.V. Detection device for detecting photons emitted by a radiation source
JP2013128698A (ja) * 2011-12-22 2013-07-04 Shimadzu Corp 二次元アレイx線検出器におけるゲイン補正方法およびx線撮影装置
US8907290B2 (en) * 2012-06-08 2014-12-09 General Electric Company Methods and systems for gain calibration of gamma ray detectors
CN104662444B (zh) * 2012-09-18 2017-12-12 皇家飞利浦有限公司 直接转换光子计数探测器
BR112015012779A2 (pt) * 2012-12-04 2017-07-11 Koninklijke Philips Nv método de correção de imagem das informações de imagens de raios x, aparelho para correção de imagem das informações de imagens de raios x, sistema de raios x, uso de um aparelho, meio legível por computador, e elemento de programa para correção de imagem das informações de imagens de raios x
BR112015013392A2 (pt) * 2012-12-12 2017-07-11 Koninklijke Philips Nv sistema de imagem, e método

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6028313A (en) * 1997-12-31 2000-02-22 Mcdaniel; David L. Direct conversion photon detector
US20040027183A1 (en) * 2003-04-17 2004-02-12 Concorde Microsystems, Inc. Amplitude and rise-time sensitive timing-shaping filters with built-in pulse-tail cancellation for high count-rate operation
CN101558325A (zh) * 2006-12-13 2009-10-14 皇家飞利浦电子股份有限公司 用于对x射线光子进行计数的装置、成像设备和方法
CN101680954A (zh) * 2007-06-01 2010-03-24 皇家飞利浦电子股份有限公司 谱光子计数探测器
CN101680955A (zh) * 2007-06-19 2010-03-24 皇家飞利浦电子股份有限公司 谱光子计数探测器
CN101680956A (zh) * 2007-06-19 2010-03-24 皇家飞利浦电子股份有限公司 用于多谱光子计数读出电路的数字脉冲处理
US20100172467A1 (en) * 2007-08-03 2010-07-08 Koninklijke Philips Electronics N.V. Apparatus and method for generating countable pulses from impinging x-ray photons; and corresponding imaging device
CN102016637A (zh) * 2008-04-30 2011-04-13 皇家飞利浦电子股份有限公司 计数探测器
CN103109205A (zh) * 2011-07-07 2013-05-15 株式会社东芝 光子计数型图像检测器、x射线诊断装置、以及x射线计算机断层装置
WO2013057645A2 (en) * 2011-10-19 2013-04-25 Koninklijke Philips Electronics N.V. Photon counting detector

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Publication number Publication date
JP2016540208A (ja) 2016-12-22
US9759822B2 (en) 2017-09-12
EP3074791A1 (en) 2016-10-05
CN105793734A (zh) 2016-07-20
WO2015078753A1 (en) 2015-06-04
EP3074791B1 (en) 2019-06-19
US20160377745A1 (en) 2016-12-29
JP6209683B2 (ja) 2017-10-04

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