JP6205733B2 - 自覚式眼屈折力測定装置 - Google Patents

自覚式眼屈折力測定装置 Download PDF

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Publication number
JP6205733B2
JP6205733B2 JP2013016260A JP2013016260A JP6205733B2 JP 6205733 B2 JP6205733 B2 JP 6205733B2 JP 2013016260 A JP2013016260 A JP 2013016260A JP 2013016260 A JP2013016260 A JP 2013016260A JP 6205733 B2 JP6205733 B2 JP 6205733B2
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eye
optical system
correction
refractive power
correction optical
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JP2013016260A
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Japanese (ja)
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JP2014147417A5 (enExample
JP2014147417A (ja
Inventor
俊洋 小林
俊洋 小林
細井　良晋
良晋 細井
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Nidek Co Ltd
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Nidek Co Ltd
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Priority to JP2013016260A priority Critical patent/JP6205733B2/ja
Priority to KR1020140010401A priority patent/KR102247988B1/ko
Priority to US14/167,368 priority patent/US9351636B2/en
Publication of JP2014147417A publication Critical patent/JP2014147417A/ja
Publication of JP2014147417A5 publication Critical patent/JP2014147417A5/ja
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JP2013016260A 2013-01-30 2013-01-30 自覚式眼屈折力測定装置 Active JP6205733B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2013016260A JP6205733B2 (ja) 2013-01-30 2013-01-30 自覚式眼屈折力測定装置
KR1020140010401A KR102247988B1 (ko) 2013-01-30 2014-01-28 자각식 안굴절력 측정 장치
US14/167,368 US9351636B2 (en) 2013-01-30 2014-01-29 Subjective eye refracting power measurement apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013016260A JP6205733B2 (ja) 2013-01-30 2013-01-30 自覚式眼屈折力測定装置

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JP2014147417A JP2014147417A (ja) 2014-08-21
JP2014147417A5 JP2014147417A5 (enExample) 2016-03-17
JP6205733B2 true JP6205733B2 (ja) 2017-10-04

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Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018047049A (ja) * 2016-09-21 2018-03-29 株式会社ニデック 自覚式検眼装置、及び自覚式検眼プログラム
KR101855013B1 (ko) 2016-12-28 2018-05-04 부산대학교 산학협력단 비축 거울과 회전 광학계를 이용한 고속 안구 추적장치
JP7390793B2 (ja) * 2019-02-07 2023-12-04 株式会社トプコン 眼科装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5985642A (ja) * 1982-11-06 1984-05-17 株式会社トプコン 自覚式屈折度測定装置
JP3256264B2 (ja) * 1992-02-21 2002-02-12 株式会社ニデック 検眼装置
JP2882997B2 (ja) * 1994-02-28 1999-04-19 株式会社ニデック 視力検査装置
JPH11225966A (ja) * 1998-02-19 1999-08-24 Topcon Corp 眼科測定装置
US6425665B2 (en) * 2000-03-31 2002-07-30 Nidek Co., Ltd. Visual acuity examination apparatus
JP4837968B2 (ja) * 2005-09-30 2011-12-14 株式会社ニデック 近用視標呈示装置

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