JP6188470B2 - 放射線発生装置及びそれを用いた放射線撮影システム - Google Patents
放射線発生装置及びそれを用いた放射線撮影システム Download PDFInfo
- Publication number
- JP6188470B2 JP6188470B2 JP2013153198A JP2013153198A JP6188470B2 JP 6188470 B2 JP6188470 B2 JP 6188470B2 JP 2013153198 A JP2013153198 A JP 2013153198A JP 2013153198 A JP2013153198 A JP 2013153198A JP 6188470 B2 JP6188470 B2 JP 6188470B2
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- potential
- radiation
- cathode
- electron emission
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/02—Details
- H01J35/16—Vessels; Containers; Shields associated therewith
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/02—Details
- H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
- H01J35/045—Electrodes for controlling the current of the cathode ray, e.g. control grids
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/02—Details
- H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
- H01J35/06—Cathodes
- H01J35/065—Field emission, photo emission or secondary emission cathodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/02—Details
- H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
- H01J35/06—Cathodes
- H01J35/066—Details of electron optical components, e.g. cathode cups
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/02—Details
- H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
- H01J35/08—Anodes; Anti cathodes
- H01J35/112—Non-rotating anodes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2235/00—X-ray tubes
- H01J2235/16—Vessels
- H01J2235/163—Vessels shaped for a particular application
- H01J2235/164—Small cross-section, e.g. for entering in a body cavity
Landscapes
- X-Ray Techniques (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Analytical Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Physics & Mathematics (AREA)
- Toxicology (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013153198A JP6188470B2 (ja) | 2013-07-24 | 2013-07-24 | 放射線発生装置及びそれを用いた放射線撮影システム |
| US14/337,590 US9412552B2 (en) | 2013-07-24 | 2014-07-22 | Multi-source radiation generating apparatus and radiographic imaging system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013153198A JP6188470B2 (ja) | 2013-07-24 | 2013-07-24 | 放射線発生装置及びそれを用いた放射線撮影システム |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2015023013A JP2015023013A (ja) | 2015-02-02 |
| JP2015023013A5 JP2015023013A5 (enExample) | 2016-08-25 |
| JP6188470B2 true JP6188470B2 (ja) | 2017-08-30 |
Family
ID=52390537
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2013153198A Expired - Fee Related JP6188470B2 (ja) | 2013-07-24 | 2013-07-24 | 放射線発生装置及びそれを用いた放射線撮影システム |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US9412552B2 (enExample) |
| JP (1) | JP6188470B2 (enExample) |
Families Citing this family (32)
| Publication number | Priority date | Publication date | Assignee | Title |
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| US20150117599A1 (en) | 2013-10-31 | 2015-04-30 | Sigray, Inc. | X-ray interferometric imaging system |
| US10297359B2 (en) | 2013-09-19 | 2019-05-21 | Sigray, Inc. | X-ray illumination system with multiple target microstructures |
| US9448190B2 (en) | 2014-06-06 | 2016-09-20 | Sigray, Inc. | High brightness X-ray absorption spectroscopy system |
| US10269528B2 (en) | 2013-09-19 | 2019-04-23 | Sigray, Inc. | Diverging X-ray sources using linear accumulation |
| US10295485B2 (en) | 2013-12-05 | 2019-05-21 | Sigray, Inc. | X-ray transmission spectrometer system |
| US9449781B2 (en) | 2013-12-05 | 2016-09-20 | Sigray, Inc. | X-ray illuminators with high flux and high flux density |
| US9570265B1 (en) | 2013-12-05 | 2017-02-14 | Sigray, Inc. | X-ray fluorescence system with high flux and high flux density |
| US10304580B2 (en) | 2013-10-31 | 2019-05-28 | Sigray, Inc. | Talbot X-ray microscope |
| USRE48612E1 (en) | 2013-10-31 | 2021-06-29 | Sigray, Inc. | X-ray interferometric imaging system |
| US9823203B2 (en) | 2014-02-28 | 2017-11-21 | Sigray, Inc. | X-ray surface analysis and measurement apparatus |
| US9594036B2 (en) | 2014-02-28 | 2017-03-14 | Sigray, Inc. | X-ray surface analysis and measurement apparatus |
| US10401309B2 (en) | 2014-05-15 | 2019-09-03 | Sigray, Inc. | X-ray techniques using structured illumination |
| JP6441015B2 (ja) * | 2014-10-06 | 2018-12-19 | キヤノンメディカルシステムズ株式会社 | X線診断装置及びx線管制御方法 |
| GB2536930B (en) | 2015-03-31 | 2020-03-25 | Teledyne E2V Uk Ltd | A modulator system |
| US10352880B2 (en) | 2015-04-29 | 2019-07-16 | Sigray, Inc. | Method and apparatus for x-ray microscopy |
| US10295486B2 (en) | 2015-08-18 | 2019-05-21 | Sigray, Inc. | Detector for X-rays with high spatial and high spectral resolution |
| JP6525941B2 (ja) * | 2016-10-28 | 2019-06-05 | キヤノン株式会社 | X線発生装置及び、x線撮影システム |
| DE102016222365B3 (de) * | 2016-11-15 | 2018-04-05 | Siemens Healthcare Gmbh | Verfahren, Computerprogrammprodukt, computerlesbares Medium und Vorrichtung zur Erzeugung von Röntgenpulsen bei einer Röntgenbildgebung |
| US10247683B2 (en) | 2016-12-03 | 2019-04-02 | Sigray, Inc. | Material measurement techniques using multiple X-ray micro-beams |
| WO2018175570A1 (en) | 2017-03-22 | 2018-09-27 | Sigray, Inc. | Method of performing x-ray spectroscopy and x-ray absorption spectrometer system |
| US10578566B2 (en) | 2018-04-03 | 2020-03-03 | Sigray, Inc. | X-ray emission spectrometer system |
| US20190341219A1 (en) | 2018-05-07 | 2019-11-07 | Washington University | Multi-pixel x-ray source with tungsten-diamond transmission target |
| CN112424591B (zh) | 2018-06-04 | 2024-05-24 | 斯格瑞公司 | 波长色散x射线光谱仪 |
| CN112470245B (zh) | 2018-07-26 | 2025-03-18 | 斯格瑞公司 | 高亮度x射线反射源 |
| US10656105B2 (en) | 2018-08-06 | 2020-05-19 | Sigray, Inc. | Talbot-lau x-ray source and interferometric system |
| DE112019004433B4 (de) | 2018-09-04 | 2024-09-12 | Sigray, Inc. | System und verfahren für röntgenstrahlfluoreszenz mit filterung |
| US11056308B2 (en) | 2018-09-07 | 2021-07-06 | Sigray, Inc. | System and method for depth-selectable x-ray analysis |
| US11020066B2 (en) * | 2018-12-10 | 2021-06-01 | KUB Technologies, Inc. | System and method for cabinet x-ray systems with stationary x-ray source array |
| US11152183B2 (en) | 2019-07-15 | 2021-10-19 | Sigray, Inc. | X-ray source with rotating anode at atmospheric pressure |
| US12278080B2 (en) | 2022-01-13 | 2025-04-15 | Sigray, Inc. | Microfocus x-ray source for generating high flux low energy x-rays |
| US12360067B2 (en) | 2022-03-02 | 2025-07-15 | Sigray, Inc. | X-ray fluorescence system and x-ray source with electrically insulative target material |
| US12181423B1 (en) | 2023-09-07 | 2024-12-31 | Sigray, Inc. | Secondary image removal using high resolution x-ray transmission sources |
Family Cites Families (43)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5968200A (ja) | 1982-10-08 | 1984-04-18 | Yokogawa Hokushin Electric Corp | X線ct装置 |
| FR2778757B1 (fr) * | 1998-05-12 | 2001-10-05 | Commissariat Energie Atomique | Systeme d'inscription d'informations sur un support sensible aux rayons x |
| JP4220589B2 (ja) * | 1998-05-26 | 2009-02-04 | 株式会社東芝 | X線撮影装置 |
| US6215850B1 (en) * | 1998-12-22 | 2001-04-10 | General Electric Company | X-ray beam control for an imaging system |
| US6456691B2 (en) * | 2000-03-06 | 2002-09-24 | Rigaku Corporation | X-ray generator |
| US7082182B2 (en) * | 2000-10-06 | 2006-07-25 | The University Of North Carolina At Chapel Hill | Computed tomography system for imaging of human and small animal |
| US7085351B2 (en) * | 2000-10-06 | 2006-08-01 | University Of North Carolina At Chapel Hill | Method and apparatus for controlling electron beam current |
| US7826595B2 (en) * | 2000-10-06 | 2010-11-02 | The University Of North Carolina | Micro-focus field emission x-ray sources and related methods |
| US6553096B1 (en) * | 2000-10-06 | 2003-04-22 | The University Of North Carolina Chapel Hill | X-ray generating mechanism using electron field emission cathode |
| CN1279795C (zh) * | 2001-08-29 | 2006-10-11 | 株式会社东芝 | X射线产生装置 |
| US7120222B2 (en) * | 2003-06-05 | 2006-10-10 | General Electric Company | CT imaging system with multiple peak x-ray source |
| JP2006086001A (ja) | 2004-09-15 | 2006-03-30 | Shimadzu Corp | X線管装置 |
| US7440547B2 (en) * | 2005-04-15 | 2008-10-21 | Kabushiki Kaisha Toshiba | CT scanner |
| WO2006116365A2 (en) * | 2005-04-25 | 2006-11-02 | The University Of North Carolina At Chapel Hill | X-ray imaging using temporal digital signal processing |
| WO2008020886A2 (en) * | 2006-02-09 | 2008-02-21 | L-3 Communications Security And Detection Systems, Inc. | Radiation scanning systems and methods |
| US20070189459A1 (en) * | 2006-02-16 | 2007-08-16 | Stellar Micro Devices, Inc. | Compact radiation source |
| JP4878311B2 (ja) * | 2006-03-03 | 2012-02-15 | キヤノン株式会社 | マルチx線発生装置 |
| JP2009534669A (ja) * | 2006-04-21 | 2009-09-24 | アメリカン サイエンス アンド エンジニアリング,インコーポレイテッド | 離散供給源のアレイおよび複数の平行ビームを用いた荷物および人間のx線画像化 |
| WO2007142999A2 (en) * | 2006-05-31 | 2007-12-13 | L-3 Communications Security And Detection Systems, Inc. | Dual energy x-ray source |
| US7852979B2 (en) * | 2007-04-05 | 2010-12-14 | General Electric Company | Dual-focus X-ray tube for resolution enhancement and energy sensitive CT |
| US7627087B2 (en) * | 2007-06-28 | 2009-12-01 | General Electric Company | One-dimensional grid mesh for a high-compression electron gun |
| US7496180B1 (en) * | 2007-08-29 | 2009-02-24 | General Electric Company | Focal spot temperature reduction using three-point deflection |
| US7646852B2 (en) * | 2007-12-31 | 2010-01-12 | Ge Security, Inc. | Method, a processor, and a system for tracking a focus of a beam |
| US7809114B2 (en) * | 2008-01-21 | 2010-10-05 | General Electric Company | Field emitter based electron source for multiple spot X-ray |
| US7826594B2 (en) * | 2008-01-21 | 2010-11-02 | General Electric Company | Virtual matrix control scheme for multiple spot X-ray source |
| JP4886713B2 (ja) * | 2008-02-13 | 2012-02-29 | キヤノン株式会社 | X線撮影装置及びその制御方法 |
| JP5294653B2 (ja) * | 2008-02-28 | 2013-09-18 | キヤノン株式会社 | マルチx線発生装置及びx線撮影装置 |
| US7801277B2 (en) | 2008-03-26 | 2010-09-21 | General Electric Company | Field emitter based electron source with minimized beam emittance growth |
| JP4693884B2 (ja) * | 2008-09-18 | 2011-06-01 | キヤノン株式会社 | マルチx線撮影装置及びその制御方法 |
| US7792241B2 (en) * | 2008-10-24 | 2010-09-07 | General Electric Company | System and method of fast KVP switching for dual energy CT |
| US8498380B2 (en) * | 2008-11-26 | 2013-07-30 | Koninklijke Philips N.V. | Auxiliary grid electrode for X-ray tubes |
| WO2010070554A1 (en) * | 2008-12-17 | 2010-06-24 | Koninklijke Philips Electronics N.V. | X-ray examination apparatus and method |
| JP5416426B2 (ja) * | 2009-02-03 | 2014-02-12 | 富士フイルム株式会社 | 放射線画像撮影装置 |
| DE102009007217B4 (de) * | 2009-02-03 | 2012-05-24 | Siemens Aktiengesellschaft | Röntgenröhre |
| DE102009037688B4 (de) * | 2009-08-17 | 2011-06-16 | Siemens Aktiengesellschaft | Vorrichtung und Verfahren zur Steuerung eines Elektronenstrahls für die Erzeugung von Röntgenstrahlung sowie Röntgenröhre |
| DE112011101007B4 (de) * | 2010-03-22 | 2024-02-29 | Nuray Technology Co., Ltd. | Mehrstrahl-Röntgenquelle mit intelligenten elektronischen Steuerungssystemen und Verfahren dafür |
| US8487534B2 (en) * | 2010-03-31 | 2013-07-16 | General Electric Company | Pierce gun and method of controlling thereof |
| US8396185B2 (en) * | 2010-05-12 | 2013-03-12 | General Electric Company | Method of fast current modulation in an X-ray tube and apparatus for implementing same |
| JP5661432B2 (ja) * | 2010-11-17 | 2015-01-28 | キヤノン株式会社 | X線発生装置 |
| JP5804777B2 (ja) * | 2011-06-01 | 2015-11-04 | キヤノン株式会社 | X線発生管及び、x線発生装置 |
| JP2013020792A (ja) * | 2011-07-11 | 2013-01-31 | Canon Inc | 放射線発生装置及びそれを用いた放射線撮影装置 |
| JP5791401B2 (ja) * | 2011-07-11 | 2015-10-07 | キヤノン株式会社 | 放射線発生装置及びそれを用いた放射線撮影装置 |
| JP5713832B2 (ja) * | 2011-08-03 | 2015-05-07 | キヤノン株式会社 | 放射線発生装置及びそれを用いた放射線撮影装置 |
-
2013
- 2013-07-24 JP JP2013153198A patent/JP6188470B2/ja not_active Expired - Fee Related
-
2014
- 2014-07-22 US US14/337,590 patent/US9412552B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JP2015023013A (ja) | 2015-02-02 |
| US9412552B2 (en) | 2016-08-09 |
| US20150030127A1 (en) | 2015-01-29 |
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