JP6167934B2 - 質量分析装置 - Google Patents
質量分析装置 Download PDFInfo
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- JP6167934B2 JP6167934B2 JP2014033574A JP2014033574A JP6167934B2 JP 6167934 B2 JP6167934 B2 JP 6167934B2 JP 2014033574 A JP2014033574 A JP 2014033574A JP 2014033574 A JP2014033574 A JP 2014033574A JP 6167934 B2 JP6167934 B2 JP 6167934B2
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- high voltage
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JP2014033574A JP6167934B2 (ja) | 2014-02-25 | 2014-02-25 | 質量分析装置 |
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JP2014033574A JP6167934B2 (ja) | 2014-02-25 | 2014-02-25 | 質量分析装置 |
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JP2015159051A JP2015159051A (ja) | 2015-09-03 |
JP2015159051A5 JP2015159051A5 (enrdf_load_stackoverflow) | 2016-06-23 |
JP6167934B2 true JP6167934B2 (ja) | 2017-07-26 |
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JP2014033574A Active JP6167934B2 (ja) | 2014-02-25 | 2014-02-25 | 質量分析装置 |
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Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
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JP6516062B2 (ja) * | 2016-02-26 | 2019-05-22 | 株式会社島津製作所 | 直流高圧電源装置 |
CN109791869B (zh) * | 2016-10-04 | 2021-07-13 | 株式会社岛津制作所 | 质谱分析装置 |
JP7156047B2 (ja) * | 2019-01-16 | 2022-10-19 | 株式会社島津製作所 | クロマトグラフ装置およびロードスイッチ回路 |
JP7294456B2 (ja) * | 2020-01-06 | 2023-06-20 | 株式会社島津製作所 | イオン化装置 |
CN115549652A (zh) * | 2022-11-29 | 2022-12-30 | 浙江迪谱诊断技术有限公司 | 一种自恢复高压脉冲驱动器 |
Family Cites Families (3)
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JPS60180322A (ja) * | 1984-02-28 | 1985-09-14 | Nec Corp | 高速度パルス電源装置 |
JP4497675B2 (ja) * | 1999-08-12 | 2010-07-07 | 日本バイリーン株式会社 | 非導電性成形体の表面処理装置及び表面処理方法 |
US7129714B2 (en) * | 2002-07-02 | 2006-10-31 | Baxter Larry K | Capacitive measurement system |
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JP2015159051A (ja) | 2015-09-03 |
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