JP6147602B2 - Profile measurement method for blast furnace interior - Google Patents

Description

  The present invention relates to a method for measuring the shape (profile) of the surface of a blast furnace interior.

  In general, blast furnaces in the production of pig iron are alternately charged with sintered ore or lump iron ore (hereinafter simply referred to as iron ore or ore) and coke as a charge from the top of the furnace. As a result, the ore layer and the coke layer are formed in the furnace. The iron ore is heated and reduced (indirect reduction) by the CO gas generated by the reaction between the hot air blown from the tuyere below the blast furnace and coke, and part of the iron ore is reduced directly by the coke and softened and fused. After forming the band, it becomes a droplet. The droplets, that is, the molten iron, pass between the coke layers and accumulate at the bottom of the furnace. The ore layer and coke layer formed in the furnace gradually descend in the furnace.

  In the above process, it is very important to adjust the charge distribution at the top of the furnace formed by the iron ore and coke charged in the blast furnace to obtain an appropriate gas distribution. The profile (surface shape) of the charge at the top of the furnace in the blast furnace is determined by the moving armor in the bell-type charging device and the fall trajectory of the charge through the distribution chute in the bell-less charging device. At the time of normal charging, the profile of the charge at the top of the furnace has a substantially inverted conical shape whose center is low with the center vertical direction (axial center) of the blast furnace as the axis. The profile of the blast furnace interior is important information for the operation of the blast furnace, and in recent years, the distribution control of the charge has been complicated in order to stabilize the operation at a low coke ratio. There is a growing need for measurement of profiles that achieves high measurement frequency and accuracy.

  Conventionally, as described in, for example, Patent Document 1 and the like, a measurement lance equipped with a microwave distance meter is inserted from the side surface of the furnace port of the furnace body toward the axis of the blast furnace, and the microwave is placed inside the blast furnace. There has been a method of transmitting to the entry and measuring the distance to the surface of the blast furnace interior entry. Although this method has the advantage that distance measurement is possible because of the small attenuation of microwaves even in high-concentration dust in the furnace, the apparatus is large and expensive, and the operation is complicated. In addition, during the measurement, it is necessary to wait for the raw material to be charged, and when the raw material is charged, the measurement lance must be withdrawn from the furnace body. Only the degree can be measured. In addition, since the measurement time is long, there is a problem that the amount of material drop during measurement is large, and it takes time to recover the material level after measurement.

  Thus, for example, Patent Document 2 and Patent Document 3 describe measurement methods that can maintain the advantages of microwaves and perform level measurement without stopping the charging of raw materials for a long time. These installed a profile measuring device equipped with a microwave rangefinder capable of transmitting and receiving microwaves and a scanning drive device that scans the microwave radiation direction at the top of the blast furnace above the raw material charging device, A microwave is scanned into the blast furnace, and the surface profile of the blast furnace interior is calculated by the data processing unit by combining the distance data input from the microwave rangefinder and the scanning angle data input from the scanning drive unit. is there.

Japanese Utility Model Publication No. 1-2216 JP 2010-174371 A Japanese Patent Application Laid-Open No. 2011-2241

  However, since the profile measurement methods described in Patent Documents 2 and 3 acquire data while rotating the microwave radiation direction at a constant angular velocity, the distance between measurement points of the profile varies. Therefore, in order to ensure the accuracy of the obtained profile, it is necessary to determine the rotational angular velocity based on the location of the shape where the accuracy is most difficult to obtain, but in this case, there is a problem that the measurement time becomes long.

  The profile measuring apparatus described in Patent Documents 2 and 3 can measure at any time because there is no interference with the charge distribution chute in the furnace, but it is sufficient if the measurement timing overlaps with the raw material charging. Accurate measurement accuracy cannot be obtained. Therefore, in order to measure accurately, it is desirable to wait for the raw material charging during the measurement of the profile. Therefore, if the measurement time is long, the operation of the blast furnace is hindered, as in the case of Patent Document 1, and the amount of material fall during measurement is large, and it takes time to recover the material level after measurement. The number of times is limited.

  The objective of this invention is providing the measuring method which can measure the profile of the blast furnace interior inclusion of arbitrary shapes as highly accurately as possible without taking time.

In order to solve the above-mentioned problem, the present invention installs a profile measuring device that measures the distance to the measurement object by transmitting and receiving microwaves at the top of the blast furnace, and from the profile measuring device, the microwave radiation direction is The distance data to the charge is measured by scanning in the diameter direction passing through the central axis of the blast furnace on the surface of the blast furnace interior charge, and the distance data based on the scanning angle data of the microwave at the time of the distance data measurement In the profile measurement of the blast furnace interior input to calculate the surface profile of the blast furnace interior input, the microwave is scanned in the diameter direction of the furnace to measure the approximate profile of the blast furnace interior input, for the general profile, to calculate the curvature with respect to the furnace diameter direction of the coordinates, set the overall number of points during this measurement, Ho absolute value of the curvature is large Determine the measurement points so as to increase the distribution density of the measurement points, perform the main measurement by irradiating the measurement points with microwaves, and from the distance data measured in the main measurement and the scanning angle data of the microwave at that time The present invention provides a method for measuring the profile of a blast furnace interior, wherein a surface profile of the interior of the blast furnace interior is calculated.

In the profile measurement method, the microwave is radiated from an antenna, reflected by a reflector, and irradiated on the surface of the blast furnace interior, and the measurement is performed at the measurement points in the approximate profile for each measurement point. It is preferable that the angle of the reflecting plate is obtained from the coordinates and the reflecting plate is stopped at the angle from when the microwave is transmitted to when the reflected wave is received by the blast furnace interior.

  Further, two of the profile measuring devices are installed at symmetrical positions with respect to the central axis of the blast furnace, and the main measurement is performed at each measurement point with an incident angle of microwaves of the two profile measuring devices. Measurement may be performed with a profile measuring device closer to 90 °, and the profile of the blast furnace interior may be calculated by combining measurement data obtained by the respective profile measuring devices.

  Further, in each step during the operation of the blast furnace, when measuring the surface profile of the blast furnace interior multiple times continuously, the approximate profile is measured only at the first measurement, and the second and subsequent times are only at the first measurement. The outline profile may be measured, and after the second time, the measurement point of the main measurement may be determined using the profile obtained in the previous measurement as the outline profile.

  According to the present invention, by increasing the distribution density of measurement points at a place with a large curvature, the profile of a complex shape is measured with high accuracy, and by reducing the distribution density of the measurement points at a place with a small curvature, Measurement time can be shortened. That is, a highly accurate profile can be obtained without wasting time.

It is a longitudinal cross-sectional view which shows the example of the blast furnace top part provided with the profile measuring apparatus in the furnace top part. It is a block diagram which shows an example of a profile measuring apparatus. It is a flowchart which shows the example of the measurement procedure concerning this invention. It is a graph explaining the determination method of the measurement point concerning this invention in the case of normal charging, (a) is a rough profile, (b) is the curvature with respect to the x coordinate in a furnace of the rough profile of (a), (c). Is the distribution density of the measurement points with respect to the in-furnace x coordinate obtained from (b), (d) is the integration of the number of measurement points with respect to the in-furnace x coordinate, and (e) is the measurement point with respect to the in-furnace x coordinate. It is a graph explaining the determination method of the measuring point concerning this invention in the case of center insertion, (a) is a rough profile, (b) is the curvature with respect to the x coordinate in a furnace of the rough profile of (a), (c). Is the distribution density of the measurement points with respect to the in-furnace x coordinate obtained from (b), (d) is the integration of the number of measurement points with respect to the in-furnace x coordinate, and (e) is the measurement point with respect to the in-furnace x coordinate. It is a flowchart which shows the example from which the measurement procedure concerning this invention differs. It is explanatory drawing which shows the example of how to obtain | require the incident angle of a microwave. It is a graph which shows the example of the relationship between the x coordinate in a furnace and the incident angle of a microwave for every measuring apparatus at the time of measuring the profile of FIG. It is a graph which shows the example of the relationship between the x coordinate in a furnace for every measuring apparatus, and the incident angle of a microwave at the time of measuring the profile of FIG.

  Hereinafter, embodiments of the present invention will be described with reference to the drawings.

  FIG. 1 shows an example in which a profile measuring device is installed in a blast furnace. The two profile measuring devices A1 and A2 are installed on the outer side of the furnace body 3 in the vicinity of the top of the blast furnace 2 and at symmetrical positions with respect to the central axis of the furnace body 3. A bell-less charging device 5 is provided at the furnace port of the furnace body 3, and a charge 4 such as iron ore or coke is charged into the furnace through the distribution chute 6.

  FIG. 2 is an enlarged view showing an example of the configuration of the profile measuring apparatuses A1 and A2. As shown in FIG. 2, the profile measuring apparatuses A1 and A2 include an antenna 11 and a reflecting plate 12, a waveguide 13 that supports, drives, and controls the antenna 11 and the reflecting plate 12, respectively, a microwave transceiver 14, and a drive shaft. 15 and a reflector driving device 16. The antenna 11 and the reflection plate 12 are accommodated in the pressure resistant container 20. The pressure vessel 20 has an opening 21 on the bottom surface facing the inside of the furnace, and the opening 21 is provided with a partition plate 22 that can pass microwaves, a shutter 23, a protective net 24, and the like.

  The antenna 11 is a parabolic antenna having a diameter of about φ250 to φ360 mm, for example, and is connected to the microwave transceiver 14 via the waveguide 13. The microwave transmitter / receiver 14 generates a microwave whose frequency continuously changes in a certain range and can transmit and receive the microwave. A data processor 18 is connected to the microwave transceiver 14 by a signal line 19.

  The microwave generated in the microwave transmitter / receiver 14 and continuously changing in frequency is radiated from the antenna 11, reflected by the reflector 12, and irradiated on the surface of the charge 4 to be measured in the blast furnace 2. The The irradiated microwave is reflected by the surface of the charge 4, and this reflected wave is received and detected by the microwave transmitter / receiver 14 via the reflector 12. In the data processing unit 18, the round-trip time ΔT of the microwave from the antenna 11 to the measurement target (the surface of the charge 4) is obtained from the change in frequency ΔF from the emission to reception of the microwave at the antenna 11. The distance from the antenna 11 to the measurement target is calculated. This measurement is based on the FMCW (Frequency Modulated Continuous Wave) method (Frequency Modulated Continuous Wave method) that mixes and measures the electrical signal that emits the microwave and the electrical signal that is obtained by receiving the reflected wave from the charged surface. ). A commercially available apparatus may be used for the microwave distance meter of this type.

  The transmission frequency band of the microwave used for measurement is 10 GHz or more, preferably about 24 GHz. The higher the frequency, the smaller the antenna 11 can be made. By using the microwave, the profile in the blast furnace 2 can be accurately measured without being affected by the environment such as temperature and dust. Moreover, since the parabolic antenna has high directivity, microwaves can be radiated with high accuracy toward a desired position. Furthermore, since the spread of the microwave at the time of radiation | emission is suppressed, the opening part 21 toward the inside of a furnace can be made small.

  As shown in FIG. 2, a drive shaft 15 that connects the reflector 12 and the reflector driving device 16 is provided on an extension of the antenna 11 in the microwave transmission / reception direction (center axis direction). That is, the drive shaft 15 is provided so that the center axis of the drive shaft 15 coincides with the center axis of the antenna 11. As shown in FIG. 2, the reflector 12 is fixed to the drive shaft 15 at an angle of approximately 45 ° with respect to the central axis of the antenna 11. The reflector 12 is made of, for example, a stainless steel plate, and the area viewed from the front side of the antenna 11 is slightly larger than the antenna 11. Although the shape is not limited, a circular shape is preferable in terms of operability. By rotating the drive shaft 15 around its central axis by the reflector driving device 16, the microwave radiated from the antenna 11 toward the central axis is reflected by the reflector 12 toward the inside of the blast furnace 2. The blast furnace 2 is scanned in the diameter direction. The reflection direction of the microwaves by the reflecting plate 12 moves in a direction perpendicular to the paper surface of FIG. The reflector 12 is arranged so that the microwave passes through the central axis of the furnace.

  The opening 21 of the pressure vessel 20 communicates with the inside of the blast furnace 2 and is formed so that the microwave reflected by the reflecting plate 12 is irradiated to a predetermined range in the furnace.

  The inner surface of the pressure vessel 20 is covered with a radio wave absorber corresponding to the transmission frequency band except for the inner opening 21 of the furnace and the reflection surface side of the reflector 12, so that the microwave can be diffusely reflected and multiple reflected in the pressure vessel 20. It is preferable to suppress the measurement noise caused.

  Further, at the time of measuring the profile, for the purpose of preventing the gas or dust inside the blast furnace 2 from entering the pressure vessel 20 and further preventing the gas inside the blast furnace 2 from leaking to the outside through the pressure vessel 20. The pressure vessel 20 may be pressurized with an inert gas such as nitrogen gas so that the pressure is about 1.1 times the furnace pressure.

  When performing profile measurement using such a profile measuring device, in order to measure in a short time, if the reflector 12 that is a microwave transmission / reception unit for the charge 4 is measured while constantly rotating at a constant angular velocity, data is obtained. Since the response time of the distance detection by the FMCW calculation of the processing unit 18 and the response time of the scanning angle detector built in the reflector driving device 16 are different, the data acquisition time of the measured distance and the reflector scanning angle is determined. As a result, there is a deviation in the tying, which causes a problem in accuracy. That is, in order to carry out the profile measurement with high accuracy, it is necessary to temporarily stop the reflector 12 for each measurement point. For this reason, the more measurement points, the longer the measurement time.

  Therefore, in the present invention, the measurement time can be shortened while maintaining the measurement accuracy by changing the distribution density of the measurement points according to the profile shape. Hereinafter, an example of an embodiment of the present invention will be described based on the flowchart of FIG. 3 and FIGS. 4 and 5.

Outline profile measurement (S1)
First, a general profile is measured by scanning microwaves in the entire diameter direction in the blast furnace 2 by a conventional measurement method. That is, the microwave is transmitted from the microwave transmitter / receiver 14 with the direction of the reflector 12 of the profile measuring device directed to the initial position. The microwave is reflected by the reflecting plate 12 through the waveguide 13 and the antenna 11 and irradiated to the blast furnace interior entrance 4, and then the reflected wave from the charge 4 is converted to the micro wave through the reflector 12. It is received by the wave transceiver 14 and the distance to the charge 4 is measured. At that time, the reflecting plate 12 is rotated by the reflecting plate driving device 16 from one end side in the diameter direction of the furnace to the measurement position on the other end side. For each preset angle, the distance to the load 4 is measured, and the distance data is sent to the data processing unit 18 from the reflector driving device 16. The data processing unit 18 of the profile measuring device performs coordinate conversion into orthogonal coordinate system data based on the scanning angle data acquired in S1 and the distance data at that time. In the measurement of the rough profile, high accuracy is not required, so it is not necessary to stop the reflecting plate 12 for each measurement point, and the measurement can be performed in a short time while rotating at a constant angular velocity.

Abnormal point detection / removal (S2)
When an abnormal point is recognized due to an obstacle present in the furnace, it is preferable to remove the data. The detection of the abnormal point is, for example, when the amount of change in the incident angle of the microwave into the charge 4 or the distance between the measurement points exceeds a preset threshold value, the measurement data at the measurement point is abnormal. And the data is removed.

Descent correction (S3)
Furthermore, for the measured distance data, it is preferable to obtain a correction amount due to the fall of the charge for the reaction in the furnace. As a method of obtaining the descending speed, for example, it may be obtained assuming that the descending speed V is constant regardless of the position in the furnace. That is, at an arbitrary position such as a position where the microwave is directed directly below, from the first distance data D1 at the same scanning angle set in advance and the second distance data D2 measured after time T,
V = (D2-D1) / T
Ask for. The descending speed V can be obtained by any other method, and if it is continuously obtained in the diameter direction in the furnace, it can be obtained with higher accuracy.

Smoothing (S4)
About the measurement data obtained as described above, a process such as averaging is performed to obtain a smooth curve, where the coordinate in the furnace diameter direction is x, the coordinate in the furnace height direction is z, and the approximate profile z = h (x) Create FIG. 4 (a) is an example of a schematic profile of a substantially inverted conical shape with a low central portion at the time of normal charging as an example of the charging form of the charging. FIG. 5 (a) The example of the general | schematic profile which the center part raised at the time of center insertion as an example from which a form differs is shown.

  The approximate profile may be measured with only one of the two profile measuring devices A1 and A2 installed at symmetrical positions with respect to the central axis of the blast furnace 2, or with both measuring devices. May be. When measuring with both measuring apparatuses, for example, the profile may be obtained by synthesizing data by the method described in Patent Document 2 or 3.

Curvature calculation (S5)
Next, the absolute value f (x) of the curvature with respect to the diametrical coordinate x in the furnace is calculated for the approximate profile z = h (x).

When the rate of change of the approximate profile is dz / dx, the absolute value f (x) of the curvature is calculated by equation (1).

  4 (b) and 5 (b) are graphs showing the absolute value f (x) of the curvature with respect to the in-furnace x-coordinate for each of the schematic profiles in FIGS. 4 (a) and 5 (a), respectively. It is.

Measurement point determination (S6)
The measurement point is determined so as to increase the distribution density of the measurement point as the absolute value of the curvature increases. Here, the measurement points are determined so that the distribution density of the measurement points on the general profile is proportional to the curvature f (x) obtained in S5, and the angle of the reflector for measuring each measurement point is calculated.

When the distribution density of measurement points on the x axis is g (x) and the rate of change of the approximate profile is dz / dx, the distribution density g ′ (x) of the measurement points on the approximate profile z = h (x) is It is represented by (2).

全体の測定点数をＮとすると、

であり、測定点数Ｎを決めるとＣが求められて、ｇ（ｘ）が決定する。尚、ｘmin、ｘmaxは、炉内直径方向に対向する炉壁位置である。図４（ｃ）、図５（ｃ）は、それぞれ図４（ｂ）、図５（ｂ）に示す曲率ｆ（ｘ）に基づいて算出された、炉内ｘ座標に対するｇ（ｘ）をグラフに示したものである。ｘmin＝０、ｘmax＝１０の場合、測定点数ＮをそれぞれＮ＝５０、Ｎ＝８０とすると、測定点数の積算を示すグラフは図４（ｄ）、図５（ｄ）のようになる。 If the proportionality coefficient between g ′ (x) and f (x) is C,

If the total number of measurement points is N,

When the number N of measurement points is determined, C is obtained and g (x) is determined. Note that xmin and xmax are furnace wall positions facing each other in the diameter direction of the furnace. FIGS. 4C and 5C are graphs of g (x) with respect to the in-furnace x-coordinate calculated based on the curvature f (x) shown in FIGS. 4B and 5B, respectively. It is shown in. In the case of xmin = 0 and xmax = 10, assuming that the number N of measurement points is N = 50 and N = 80, respectively, graphs showing the integration of the number of measurement points are as shown in FIGS. 4 (d) and 5 (d).

となるｘａをｘｎとすると、ｘｎは、測定点の分布密度ｇ（ｘ）を与える測定位置となる。図４（ｅ）、図５（ｅ）は、このようにして、図４（ａ）、図５（ａ）の各概略プロフィルから決定された、炉内ｘ座標に対する測定点を示す。すなわち、図４（ｅ）、図５（ｅ）において、測定点が１．００となる炉内ｘ座標の位置では測定を行い、０．００となる位置では測定を行わないことを示す。 And

Where xa is xn, xn is a measurement position that gives a distribution density g (x) of measurement points. FIGS. 4 (e) and 5 (e) show the measurement points for the in-furnace x-coordinate determined in this way from the schematic profiles of FIGS. 4 (a) and 5 (a). That is, in FIGS. 4 (e) and 5 (e), the measurement is performed at the position of the in-furnace x coordinate where the measurement point is 1.00, and the measurement is not performed at the position of 0.00.

である。尚、角度θｎは、ｘ軸方向を基準（０°）とし、反時計回りを正方向とする。角度θｎは、測定装置Ａ１から測定する場合、測定装置Ａ２から測定する場合のそれぞれについて計算できる。 When the coordinate position of the measuring device is (xs, zs) and the z coordinate of the approximate profile at xn is zn, the angle θn of the reflector when measuring each xn is

It is. The angle θn is based on the x-axis direction (0 °) and the counterclockwise direction is the positive direction. The angle θn can be calculated for each of the measurement from the measurement device A1 and the measurement from the measurement device A2.

Main measurement (S7)
This measurement is performed for the measurement points determined in S6. In this measurement, for each measurement point, by stopping the rotation of the reflecting plate 12 from the time of microwave transmission to the time of reception of the reflected wave by the charge 4 at the angle at each measurement point obtained in S6, It can measure with high accuracy. The data measured in this measurement is further subjected to data processing such as abnormal point removal, descent amount correction, smoothing, and the like as in S2 to S4, to calculate the profile of the blast furnace interior.

  Since the shape change of the profile is larger as the curvature is larger, if the measurement points are selected so that the distribution density of the measurement points on the approximate profile is proportional to the curvature f (x), the measurement location of the complicated portion of the profile shape can be obtained. Increased and can be measured with high accuracy. On the other hand, since the shape change is small in the portion where the curvature f (x) is small, even when the distribution density of the measurement points is lowered and the measurement point interval is increased, the measurement accuracy is hardly lowered. Since the number of measurement points can be reduced by reducing the number of measurement points with a small curvature f (x), the overall measurement time can be shortened even if the reflector is stopped at each measurement point. Can do. That is, the measurement time can be shortened without lowering the measurement accuracy by determining the measurement point by the above method according to the rotational speed and stop time of the reflecting plate 12, the target measurement time, and the like.

  FIG. 6 shows a different embodiment of the present invention, in which two profile measuring devices are installed at symmetrical positions with respect to the central axis of the blast furnace 2 as shown in FIG. The point is measured by one of the two profile measuring devices A1 and A2, and the profile of the charge is calculated by combining these measurement data.

  In this embodiment, the approximate profile is measured by two profile measuring devices, and in each profile measuring device, the procedure up to the approximate profile measurement (S1), the abnormal point removal (S2), and the descent amount correction (S3) is described above. Similar to the embodiment of FIG. Next, the measurement data of the approximate profile acquired by each profile measuring device is synthesized by, for example, the method described in Patent Document 3 described above, and smoothing is performed to obtain an approximate profile (S8). About the rough profile, curvature calculation (S9) and measurement point determination (S10) are performed in the same manner as in the embodiment of FIG. Note that the approximate profile may be measured using only one of the profile measuring devices.

Determination of measuring device at each measuring point (S11)
For each measurement point on the general profile, it is determined which of the two profile measuring devices A1 and A2 is to be used for measurement. For example, the measurement apparatus is determined by comparing the incident angles of the microwaves when measured from the two profile measuring apparatuses A1 and A2 at each measurement point, and the incident angle of the microwave is close to 90 ° for each measurement point. And

  An example of how to determine the incident angle will be described. As shown in FIG. 7, it is assumed that the microwave irradiation positions of the profile measuring apparatuses A1 and A2 are Sm (m = 1, 2) and the measurement points are Pmn (n = 1, 2, 3, 4,...). m represents the A1 side (m = 1) or A2 side (m = 2) of the profile measuring apparatus. The coordinates of the measurement point Pmn are represented by (xmn, zmn), where the radial direction in the furnace is the x axis and the vertical direction is the z axis. The curve of the general profile is Lm, and the intersection of the curve Lm and the straight line SmPmn is Qmn. The curve Lm is differentiated to obtain the tangent line of the curve Lm at the intersection Qmn, and the angle (0 <θn <90 °) between the tangent line and the straight line SmPmn is defined as the microwave incident angle θmn. The method of obtaining the incident angle θmn is not limited to the above example, and may be, for example, an angle between a straight line P (mn−1) P (mn + 1) connecting the measurement points before and after the measurement point Pmn and the straight line SmPmn. .

  FIG. 8 is an example of a graph showing the relationship between the x-coordinate and the incident angle θ in the profile measurement during normal charging, and FIG. 9 shows the relationship between the x-coordinate and the incident angle θ in the profile measurement during central charging. It is an example of the graph to show. In the case of FIG. 8, since the incident angle is closer to 90 ° on the profile measuring device A1 side in the section a and the section c, the measurement is performed by the profile measuring apparatus A1, and the section b and the section d are measured on the measuring apparatus A2 side. Since the incident angle is closer to 90 °, the measurement is performed by the measuring apparatus A2. In the case of FIG. 9, the sections a, c, and e are measured on the measuring apparatus A1 side, and the sections b, d, and f are measured on the measuring apparatus A2 side.

  In the measuring apparatus that measures the distance using the microwave, when the incident angle of the microwave with respect to the charge 4 is small, the distribution range of the charge 4 included in the microwave irradiation range becomes wide, and the measurement result is Variation occurs. Further, when the incident angle is reduced, the intensity of the reflected wave is weakened, the measurement accuracy is lowered, and in some cases, measurement is impossible. For this reason, as in this embodiment, of the two profile measuring devices A1 and A2, the measurement device having the microwave incident angle close to 90 ° is used, and the measurement results are combined to obtain a more accurate profile. Can be obtained. Moreover, the measurement time can be further shortened by simultaneously measuring with the two profile measuring devices A1 and A2.

  In addition, the determination method of the measuring device that measures each measurement point may be other than the method of calculating the incident angle described above. For example, as described in Patent Document 2 and the like, it is opposite to the measuring device with the central axis of the blast furnace interposed therebetween. You may decide to measure the side.

Main measurement (S12)
For the measurement point determined in S10, the measurement is performed by the profile measuring device determined in S11. In this measurement, it is preferable to measure by stopping the reflector at an angle at each measurement point for each measurement point. About the data measured by this measurement, similarly to S2-S4 of FIG. 3, the data processing of abnormal point removal, descent | fall amount correction | amendment, smoothing, etc. is performed suitably, and the profile of a blast furnace interior entry is obtained.

  In the field, the charging of raw materials into the furnace is managed as one charge in multiple batches. For example, for one charge, before charging raw materials, after charging one batch of raw materials, charge two batches of raw materials. The profile may be measured continuously after charging, for example, after charging 3 batches of raw material. In such a case, the approximate profile is measured only at the first measurement. From the second time on, the profile obtained in the previous measurement is used as the approximate profile, and the main measurement is performed according to the measurement time set each time. A measurement point may be determined. Thus, by omitting the measurement of the approximate profile, the entire measurement time can be shortened.

  As mentioned above, although preferred embodiment of this invention was described, this invention is not limited to this example. It is obvious for those skilled in the art that various changes or modifications can be conceived within the scope of the technical idea described in the claims. It is understood that it belongs to.

  For example, the measuring device for measuring the profile is not limited to the structure shown in FIG. 2, but includes a microwave distance meter, a horn-shaped antenna, and a scanning drive device for driving the antenna as described in Patent Document 2 above. A measuring device may be used.

  Moreover, the present invention is not limited to the normal charging and the central charging shown in FIGS. 4 and 5 in the charging mode of the blast furnace interior charging, and even when the charging is deposited in other shapes, the same applies. Can be implemented.

  In the present invention, it is preferable to stop the microwave transmission / reception unit (the reflection plate 12 in the above embodiment) for each measurement point during the main measurement. I do not care. Even in this case, since the distribution density of the measurement points is proportional to the curvature of the approximate profile, it is possible to accurately measure a profile having a complicated shape. Alternatively, measurement may be performed while rotating at a reduced speed without completely stopping.

  The present invention can be applied to the measurement of the surface shape of various shapes of deposits in a container.

2 Blast Furnace 3 Furnace 4 Charge 5 Bellless Charging Device 6 Distribution Chute 11 Antenna 12 Reflector 13 Waveguide 14 Microwave Transceiver 15 Drive Shaft 16 Reflector Drive 18 Data Processing Unit 20 Pressure Vessel 21 Opening A1, A2 Profile measuring device

Claims (4)

At the top of the blast furnace, a profile measuring device that measures the distance to the object to be measured by transmitting and receiving microwaves is installed. From the profile measuring device, the microwave radiation direction is set to the center of the blast furnace at the surface of the blast furnace interior entrance. Measure the distance data to the charge by scanning in the diameter direction passing through the axis, coordinate conversion of the distance data based on the microwave scan angle data at the time of the distance data measurement, the blast furnace interior In the blast furnace interior profile measurement to calculate the surface profile of
Scan the microwave in the diameter direction of the furnace, measure the approximate profile of the blast furnace interior,
For the approximate profile, calculate the curvature with respect to the coordinates in the furnace diameter direction,
Set the total number of measurement points at the time of the main measurement, and determine the measurement points to increase the distribution density of the measurement points as the absolute value of the curvature increases.
Perform the main measurement by irradiating the measurement point with microwaves,
A method for measuring a profile of a blast furnace interior, comprising calculating a surface profile of the blast furnace interior from distance data measured in the main measurement and microwave scanning angle data at that time. The microwave is radiated from the antenna and reflected by a reflector to irradiate the surface of the blast furnace interior,
Wherein this measurement, for each of the measuring points, the calculated angle of the reflecting plate from the coordinates of the measurement points in schematic profile, between the time the microwave transmitter until reception of the reflected wave by the blast furnace interior container, wherein The method for measuring a profile of a blast furnace interior entrance according to claim 1, wherein the reflector is stopped at the angle .   Two of the profile measuring devices are installed at symmetrical positions with respect to the central axis of the blast furnace, and the main measurement is performed at 90 ° for each measurement point. The blast furnace interior entry according to claim 1 or 2, wherein the profile of the blast furnace interior is calculated by combining the measurement data obtained by each of the profile measurement apparatuses, and measuring the profile of the blast furnace interior entrance by combining the measurement data obtained by the respective profile measurement apparatuses. Profile measurement method. In each step during the operation of the blast furnace, when continuously measuring the surface profile of the blast furnace interior, multiple times,
The said general | schematic profile is measured only at the time of the first measurement, and the measurement point of the said main measurement is determined using the profile obtained by the last measurement as a rough profile after the 2nd time. A method for measuring a profile of a blast furnace interior entry according to any one of the above.

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