JP6099938B2 - マルチｘ線発生管及びそれを用いたｘ線撮影システム - Google Patents

マルチｘ線発生管及びそれを用いたｘ線撮影システム Download PDF

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Publication number
JP6099938B2
JP6099938B2 JP2012248965A JP2012248965A JP6099938B2 JP 6099938 B2 JP6099938 B2 JP 6099938B2 JP 2012248965 A JP2012248965 A JP 2012248965A JP 2012248965 A JP2012248965 A JP 2012248965A JP 6099938 B2 JP6099938 B2 JP 6099938B2
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JP
Japan
Prior art keywords
ray
electron emission
intermediate electrode
emission source
potential
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Expired - Fee Related
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JP2012248965A
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English (en)
Japanese (ja)
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JP2014099251A (ja
JP2014099251A5 (enExample
Inventor
一成 内海
一成 内海
和哉 辻野
和哉 辻野
上田　和幸
和幸 上田
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Canon Inc
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Canon Inc
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Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP2012248965A priority Critical patent/JP6099938B2/ja
Priority to US14/076,528 priority patent/US9116096B2/en
Publication of JP2014099251A publication Critical patent/JP2014099251A/ja
Publication of JP2014099251A5 publication Critical patent/JP2014099251A5/ja
Application granted granted Critical
Publication of JP6099938B2 publication Critical patent/JP6099938B2/ja
Expired - Fee Related legal-status Critical Current
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/70—Circuit arrangements for X-ray tubes with more than one anode; Circuit arrangements for apparatus comprising more than one X ray tube or more than one cathode
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/20—Sources of radiation
    • G01N2223/204—Sources of radiation source created from radiated target
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/16—Vessels; Containers; Shields associated therewith
    • H01J35/18—Windows
    • H01J35/186—Windows used as targets or X-ray converters

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  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Toxicology (AREA)
JP2012248965A 2012-11-13 2012-11-13 マルチｘ線発生管及びそれを用いたｘ線撮影システム Expired - Fee Related JP6099938B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2012248965A JP6099938B2 (ja) 2012-11-13 2012-11-13 マルチｘ線発生管及びそれを用いたｘ線撮影システム
US14/076,528 US9116096B2 (en) 2012-11-13 2013-11-11 Multi-radiation unit and radiation imaging system including the unit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012248965A JP6099938B2 (ja) 2012-11-13 2012-11-13 マルチｘ線発生管及びそれを用いたｘ線撮影システム

Publications (3)

Publication Number Publication Date
JP2014099251A JP2014099251A (ja) 2014-05-29
JP2014099251A5 JP2014099251A5 (enExample) 2015-11-05
JP6099938B2 true JP6099938B2 (ja) 2017-03-22

Family

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Family Applications (1)

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JP2012248965A Expired - Fee Related JP6099938B2 (ja) 2012-11-13 2012-11-13 マルチｘ線発生管及びそれを用いたｘ線撮影システム

Country Status (2)

Country Link
US (1) US9116096B2 (enExample)
JP (1) JP6099938B2 (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112567893B (zh) * 2018-05-25 2024-06-11 微-X有限公司 一种将波束成形信号处理应用于rf调制x射线的装置
CN109350097B (zh) * 2018-12-17 2021-11-05 深圳先进技术研究院 X射线源阵列、x射线断层扫描系统和方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1187206A (ja) * 1997-09-02 1999-03-30 Canon Inc 電子ビーム露光装置及び該装置を用いたデバイス製造方法
JP2002324507A (ja) * 2001-04-24 2002-11-08 Hitachi Medical Corp Ｘ線発生装置およびそれを用いたｘ線装置
US7825591B2 (en) * 2006-02-15 2010-11-02 Panasonic Corporation Mesh structure and field-emission electron source apparatus using the same
JP4878311B2 (ja) * 2006-03-03 2012-02-15 キヤノン株式会社 マルチｘ線発生装置
JP5550209B2 (ja) * 2007-12-25 2014-07-16 キヤノン株式会社 Ｘ線撮影装置
JP5294653B2 (ja) 2008-02-28 2013-09-18 キヤノン株式会社 マルチｘ線発生装置及びｘ線撮影装置
JP2011233363A (ja) * 2010-04-27 2011-11-17 Toshiba Corp Ｘ線管装置及びｘ線装置
JP5661368B2 (ja) 2010-08-04 2015-01-28 キヤノン株式会社 Ｘ線発生装置

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Publication number Publication date
JP2014099251A (ja) 2014-05-29
US20140133628A1 (en) 2014-05-15
US9116096B2 (en) 2015-08-25

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