JP6093527B2 - Inspection device - Google Patents

Description

  The present invention relates to an inspection apparatus.

  Conventionally, an inspection apparatus that detects an abnormality of an inspection object from an image obtained by imaging a long inspection object is known (for example, Patent Document 1).

JP 2006-46941 A

  In this type of inspection apparatus, it has been desired to make it easier to detect abnormality in the outer shape.

  Therefore, as an example, an object of the present invention is to obtain an inspection apparatus that can more easily detect an abnormality in the outer shape.

In the inspection apparatus according to the embodiment of the present invention, the mirror object and the mirror part can be detected in such a manner that widths of a plurality of different parts in the circumferential direction can be detected in the elongated inspection object. And a plurality of image acquisition units having different width detection points of the inspection object for detecting the width imaged by the imaging unit, and the plurality of images A detection unit that detects an abnormality in the width of the inspection object using an image of the inspection object captured by the acquisition unit, and the plurality of imaging units are positioned with their optical axes shifted from parallel to each other. It was .

  According to the present invention, as an example, an inspection apparatus that can more easily detect an abnormality in the outer shape can be obtained.

FIG. 1 is a perspective view illustrating an example of an inspection apparatus according to an embodiment. Drawing 2 is a mimetic diagram which looked at an example of the image acquisition part located in the upper stream side of the inspection device concerning an embodiment from the diameter direction of the inspection subject. Drawing 3 is a mimetic diagram which looked at an example of the inspection device concerning an embodiment from the longitudinal direction of the inspection subject. FIG. 4 is a schematic diagram for explaining an imaging region of the inspection apparatus according to the embodiment. FIG. 5 is a schematic diagram illustrating an example of the first image, the second image, and the composite image captured by the inspection apparatus according to the embodiment. FIG. 6 is a schematic diagram illustrating an example of a first image (a two-dimensional image in which one-dimensional images are arranged) captured by an upstream image acquisition unit in the inspection apparatus according to the embodiment. FIG. 7 is a schematic diagram illustrating an example of a second image (a two-dimensional image in which one-dimensional images are arranged) captured by an upstream image acquisition unit in the inspection apparatus according to the embodiment. FIG. 8 is a schematic diagram illustrating an example of a first image captured by the downstream image acquisition unit in the inspection apparatus according to the embodiment. FIG. 9 is a schematic diagram illustrating an example of a second image captured by the downstream image acquisition unit in the inspection apparatus according to the embodiment. FIG. 10 is a schematic block diagram illustrating an example of the inspection apparatus according to the embodiment. FIG. 11 is a time chart illustrating an example of an inspection process performed by the control unit of the inspection apparatus according to the embodiment.

  In the present embodiment, as an example, the inspection apparatus 1 illustrated in FIG. 1 inspects the inspection object 100 based on an image obtained by imaging the inspection object 100. The inspection object 100 is, for example, a long and circular (or columnar) part (for example, a hose, a tube, a rod, etc.).

  In the present embodiment, as an example, as illustrated in FIG. 1, the inspection apparatus 1 includes a plurality of (in the present embodiment, two as an example) light sources 2U and 2D. Specifically, the light source 2U and the light source 2D are arranged apart from each other in the longitudinal direction (axial direction) of the inspection object 100. The light source 2U and the light source 2D are configured in an annular shape (for example, an annular shape) into which the inspection object 100 is inserted. The light source 2U and the light source 2D have a plurality of LEDs (light emitting diodes) arranged in an annular shape. The elongate inspection object 100 passes through the inside (for example, the center and the center) of the annular portions of the light source 2U and the light source 2D, and extends along the axial direction of the annular portion. Further, the light source 2U and the light source 2D are arranged in plane symmetry with respect to a plane orthogonal to the longitudinal direction (axial direction) of the inspection object 100.

  In the present embodiment, as an example, the light source 2U (first light source) illuminates the inspection object 100 with light from one side in the longitudinal direction of the inspection object 100, and the light source 2D (second light source) The object 100 is illuminated with light from the other side in the longitudinal direction of the inspection object. Specifically, the imaging area A of the inspection object 100 is set between the light source 2U and the light source 2D (in the present embodiment, an intermediate position as an example). The light from the light source 2U is applied to the imaging region A from one side in the longitudinal direction (left side in FIG. 1) of the inspection object 100, and the light from the light source 2D is from the other side in the longitudinal direction (right side in FIG. 1). The imaging area A is irradiated.

  In the present embodiment, as an example, the inspection object 100 is transported in the longitudinal direction (axial direction) by the transport device 30 (see FIG. 10) during the inspection. That is, the imaging area A moves along the longitudinal direction of the inspection object 100 as the inspection object 100 moves. In the present embodiment, as an example, the inspection object 100 moves from the light source 2U side to the light source 2D side. That is, the light source 2U is positioned upstream in the transport direction with respect to the imaging region A, and the light source 2D is positioned downstream in the transport direction with respect to the imaging region A. The inspection apparatus 1 inspects the inspection object 100 that is transported and moved by the transport apparatus 30. At this time, the imaging unit 3 has an image (first image) of the inspection object 100 when illuminated by light from the light source 2U in a state where the inspection object 100 is conveyed in the longitudinal direction of the inspection object. ) And an image (second image) of the inspection object 100 when illuminated by the light from the light source 2D.

  In the present embodiment, as an example, the imaging unit 3 (for example, a camera or the like) is positioned on the radially outer side of the inspection target 100 and is an image of the surface 100a (outer surface, peripheral surface, side surface) of the inspection target 100. To get. That is, the imaging region A is a part of the surface 100a of the inspection target 100.

  In the present embodiment, as an example, the imaging unit 3 acquires an image of the imaging region A via the mirror unit 4 (optical component, optical system). In the present embodiment, as an example, the mirror unit 4 includes a plurality of (in the present embodiment, two as an example) mirrors 4R and 4L (optical components). Specifically, as illustrated in FIG. 3, the mirror unit 4 is located on the opposite side of the inspection object 100 from the imaging unit 3. The mirrors 4R and 4L are arranged in a V shape with a line of sight from the axial direction of the inspection object 100. The mirrors 4 </ b> R and 4 </ b> L are arranged in an attitude that is an angle of 120 ° with each other (an angle that is 60 ° on the opposite side with respect to the line L connecting the imaging unit 3 and the inspection object 100). Each of the mirrors 4R and 4L has a planar mirror surface 4a (reflection surface) facing (opposed) to the surface 100a of the inspection object 100. The mirror surface 4 a extends along a surface that is substantially orthogonal to the radial direction of the inspection object 100. The two mirror surfaces 4a face different directions. The two mirror surfaces 4a approach each other as they go away from the imaging unit 3 along the optical axis 3a of the imaging unit 3. Further, the mirrors 4R and 4L extend in a band shape along a plane orthogonal to the longitudinal direction (axial direction) of the inspection object 100. In such a configuration, the imaging area A is an area of about 70% facing the mirrors 4R and 4L in the entire circumference of the surface 100a of the inspection object 100. In the present embodiment, as an example, the adjacent mirrors 4R and 4L are integrated, but may be separated.

  In this embodiment, as an example, a plurality of image acquisition units 10 (10U, 10D) including the light sources 2U and 2D, the imaging unit 3, and the mirror unit 4 are provided (two in this embodiment as an example). ing. The plurality of image acquisition units 10 (10U, 10D) are positioned at intervals in the longitudinal direction (axial direction, conveyance direction) of the inspection object 100. In these image acquisition units 10, the arrangement of the imaging unit 3 and the mirror unit 4 is different. In the present embodiment, as an example, in the image acquisition unit 10U located on the upstream side in the transport direction (left side in FIG. 1), as shown in FIG. 3, the line of sight from the upstream side in the axial direction of the inspection object 100 The imaging unit 3 is positioned on the upper side, and the mirror unit 4 is positioned on the lower side. Therefore, the imaging unit 3 of the image acquisition unit 10U acquires an image of a region (imaging region A) including the lower side of FIG. On the other hand, in the image acquisition unit 10D located on the downstream side (right side in FIG. 1), as shown in FIG. 3, the imaging unit 3 is positioned on the lower right side with the line of sight from the upstream side in the axial direction of the inspection object 100. The mirror unit 4 is located on the upper left side. Therefore, the imaging unit 3 of the image acquisition unit 10D acquires an image of a region (imaging region A) including the upper left side of FIG. Each of the plurality of imaging units 3 images different regions (parts, positions) on the surface 100a of the inspection object 100. Note that the four mirror surfaces 4a included in the plurality (two in the present embodiment) of the image acquisition units 10U and 10D face different directions.

  In the present embodiment, as an example, as illustrated in FIG. 4, the mirror unit 4 (first mirror unit) of the image acquisition unit 10 </ b> U is circumferential in the elongated inspection object 100 (the center of the inspection object 100. The inspection object 100 is projected so that the widths of the plurality of mutually different portions B1 and B2 in the direction around the axis and the direction of the arrow R in FIG. 4 can be detected. Thereby, the imaging unit 3 of the image acquisition unit 10U images the inspection object 100 via the detection target unit 100 so that the widths of the plurality of portions B1 and B2 that are different from each other in the circumferential direction in the inspection object 100 can be detected. To do. The part B1 is a part of the inspection object 100 when the inspection object 100 is viewed (reflected) from the direction of the arrow D1 in the drawing, and the point C1 (point) and the point C2 in the circumferential direction of the inspection object 100 Is the area between. Part B1 includes points C3, C5, and C8. The part B2 is a part of the inspection object 100 when the inspection object 100 is viewed (reflected) from the direction of the arrow D2 in the drawing, and the points C3 and C4 in the circumferential direction of the inspection object 100 are point C4. Is the area between. Part B2 includes points C2, 5, and 7. As an example, the mirror 4L (first mirror) of the mirror unit 4 of the image acquisition unit 10U reflects the part B1 (first part) of the inspection object 100, and the mirror 4R (second second) of the mirror unit 4 of the image acquisition unit 10U. The mirror) reflects the part B2 (second part) of the inspection object 100. And the imaging part 3 (1st imaging part) of the image acquisition part 10U images the detection object part 100 reflected in the said mirror part 4. FIG. From the image thus captured, the distance (number of pixels) between the points C1 and C2 is detected as the width of the part B1, and the distance (number of pixels) between the points C3 and C4 is detected as the width of the part B2.

  On the other hand, the mirror unit 4 (second mirror unit) of the image acquisition unit 10D can detect the widths of a plurality of portions B3 and B4 that are different from each other in the circumferential direction in the long inspection object 100, and the inspection object 100. Is reflected. Thereby, the imaging unit 3 of the image acquisition unit 10D images the inspection object 100 via the mirror unit 4 so that the widths of the plurality of parts B3 and B4 that are different from each other in the circumferential direction in the inspection object 100 can be detected. . The part B3 is a part of the inspection object 100 when the inspection object 100 is viewed (reflected) from the direction of the arrow D3 in the figure, and between the point C5 and the point C6 in the circumferential direction of the inspection object 100 It is an area. Part B3 includes points C2, C4, and C7. The part B4 is a part of the inspection object 100 when the inspection object 100 is viewed (reflected) from the direction of the arrow D4 in the figure, and points C7 (points) and C8 in the circumferential direction of the inspection object 100 Is the area between. Part B2 includes points C1, C4, and C6. As an example, the mirror 4L (third mirror) of the mirror unit 4 of the image acquisition unit 10D reflects the part B3 (third part) of the inspection object 100, and the mirror 4R (fourth fourth) of the mirror unit 4 of the image acquisition unit 10D. The mirror) reflects the part B4 (fourth part) of the inspection object 100. And the imaging part 3 (2nd imaging part) of image acquisition part 10D images the detection target part 100 reflected in the said mirror part 4. FIG. From the image thus captured, the distance (number of pixels) between the points C5 and C6 is detected as the width of the part B1, and the distance (number of pixels) between the points C7 and C8 is detected as the width of the part B4. Adjacent points C1 to C8 are located at an interval of approximately 45 degrees. In the present embodiment, the points C1 to C8 (parts, points, edges, positions) are examples of width detection points of the inspection object 100 for detecting the widths of the parts B1 to B4 imaged by the imaging unit 3. The image acquisition units 10 are different from each other.

  As can be seen from the above, the parts B1 to B4 of the inspection object 100 reflected by each mirror unit 4 are a plurality of different parts. Moreover, a part of each site | part B1-B4 overlaps with a part of other site | part B1, B2, B3, or B4. Further, the entire circumference of the inspection object 100 is covered by the parts B1 to B4. Moreover, as an example, the interval (angle) between points C1 to C8 adjacent in the circumferential direction of the inspection object 100 (between points C6 and C1, between points C1 and C8,... Between points C4 and C6) is mutual. May be substantially the same. That is, the points C6, C1, C8, C3, C5, C2, C7, and C4 may be positioned at substantially equal intervals in the circumferential direction of the inspection object 100.

  In the present embodiment, as an example, the imaging unit 3 is configured as a line camera (line sensor). The imaging unit 3 has a plurality of photoelectric conversion elements (imaging elements, not shown) arranged in a line along the width direction of the inspection object 100. That is, the imaging unit 3 acquires a linear image (image data, luminance value data for each pixel corresponding to each photoelectric conversion element, luminance value data string) along the width direction of the inspection object 100. In each image sensor, luminance value data is acquired with, for example, 256 gradations. The imaging unit 3 acquires a one-dimensional image at each time (timing) when the imaging is performed. In the case of the monochrome (monochrome) imaging unit 3, one image data is acquired for each imaging device, and in the case of the color imaging unit 3, a plurality (for example, R (red) G (green) B (blue) is obtained for each imaging device. 3) of image data is acquired. As shown in FIG. 3, the plurality (two in the present embodiment) of the imaging units 3 have their optical axes 3 a shifted from parallel.

  Moreover, in this embodiment, as an example, the light irradiation to the inspection object 100 by the light sources 2U and 2D is executed alternately. Then, imaging (acquisition of images) by the imaging unit 3 and irradiation of light to the inspection object 100 by the light sources 2U and 2D (for example, light emission and switching of the light sources 2U and 2D) are synchronized. That is, in the present embodiment, as an example, as illustrated in FIG. 5, the imaging unit 3 includes a one-dimensional image IL1 (first image, first inspection object 100) that is illuminated with light from the light source 2U. A linear image, image data (denoted as “1” in FIG. 5), and a one-dimensional image IL2 (second image, linear image, Image data (denoted as “2” in FIG. 5) are obtained alternately. The control unit 20 (see FIG. 10) of the inspection object 100 arranges the images IL1 of the inspection object 100 when illuminated by the light from the light source 2U in the order of acquisition, and arranges the two-dimensional image IA1 (first image, image data). , Two-dimensionally arranged luminance value data group), and images IL2 of the inspection object 100 when illuminated by the light from the light source 2D are arranged in the order of acquisition to obtain a two-dimensional image IA2 (first Two images, image data, and a data group of luminance values arranged two-dimensionally).

  FIGS. 6 to 9 are exemplified by appropriately setting the irradiation (switching) of light from the light sources 2U and 2D, the imaging frequency by the imaging unit 3, the conveyance speed of the inspection object 100 by the conveyance device 30, and the like. Such images IA1 and IA2 are obtained. FIGS. 6 and 7 show examples of images IA1 and IA2 by the upstream image acquisition unit 10U, and FIGS. 8 and 9 show examples of images IA1 and IA2 by the downstream image acquisition unit 10D. Yes. The switching frequency of light from the light sources 2U and 2D, that is, the imaging frequency for each line by the imaging unit 3 is set to a relatively high value (for example, 6 kHz). Therefore, the images IA1 and IA2 can be made to be similar to an image captured by the area sensor (an imaging unit that captures a two-dimensional region) while the surface 100a (for half of the surface) of the inspection target 100 is stationary. Since the line sensor has a relatively high resolution and a relatively high response compared to the area sensor, the use of the line sensor may enable more accurate abnormality detection (inspection). In the images IA1 and IA2, the arrangement direction of data in the included images IL1 and IL2 (left and right directions in FIGS. 5 to 9) corresponds to the width direction (short direction) of the inspection object 100, and the images IA1 and IA2 Among them, the direction in which the images IL1 and IL2 are arranged (the vertical direction in FIGS. 5 to 9) corresponds to the longitudinal direction (axial direction) of the inspection object 100.

  As described above, the imaging unit 3 acquires images of the inspection object 100 via a plurality of (in this embodiment, two as an example) mirrors 4L and 4R, as shown in FIGS. The images IA1 and IA2 obtained by the inspection apparatus 1 configured as described above include a plurality (two) of images Ia and Ib of the inspection object 100, respectively. These images Ia and Ib are lines L (see FIG. 3) connecting the imaging unit 3 and the inspection object 100 on the opposite side of the inspection object 100 from the imaging unit 3 (the side where the mirrors 4L and 4R are located). It is the image seen from the position deviated from. The two-dimensional images IA1 and IA2 include an image In that does not pass through the mirrors 4L and 4R of the inspection target 100 between the image Ia and the image Ib. However, in the present embodiment, as an example, the focus of the imaging unit 3 is set corresponding to the images Ia and Ib, and thus the image In is blurred. That is, in this embodiment, as an example, the image In is not used for abnormality detection. The backgrounds of these images Ia, Ib, and In are set dark. The control unit 20 of the inspection apparatus 1 according to the present embodiment executes image processing based on the two-dimensional images IA1 and IA2 obtained in this manner, and the outer shape of the inspection object 100 (the outer shapes of the images Ia and Ib). For example, dimensions, sizes, intervals, distances, positional relationships, and the like) are detected, and an abnormality in the outer shape of the inspection object 100 is detected using the detection results. At this time, as an example, the outer shape to be detected by the inspection apparatus 1 includes the widths Wa and Wb of the inspection object 100 as shown in FIGS. In addition, the control unit 20 performs image processing based on the obtained two-dimensional images IA1 and IA2, and copes with an abnormality in the surface 100a of the inspection object 100 (an abnormality reflected in relation to the images Ia and Ib). ) Is detected. Examples of the abnormality to be detected by the inspection apparatus 1 include abnormalities such as wrinkles and scratches generated on the surface 100a of the inspection object 100, abnormalities such as protrusions (threads), and the like. The inspection apparatus 1 can also detect other abnormalities. The images IL1 and IL2 also include images Ia, Ib, and In (however, for one line). In the present embodiment, the control unit 20 is an example of a detection unit that detects an abnormality in the width of the inspection object 100 using images of the inspection object 100 captured by the plurality of image acquisition units 10U and 10D. As an example, the control unit 20 can detect an abnormality using a two-phase difference method including a binarization process for an acquired image.

  In this embodiment, as an example, as shown in FIG. 10, the inspection apparatus 1 includes a control unit 20 (for example, a CPU (central processing unit)), a ROM 21 (read only memory), a RAM 22 (random access memory), An SSD 23 (solid state drive), a light irradiation controller 24, an imaging controller 25, a transport controller 26, a display controller 27, an encoder controller 28, and the like can be provided. The light irradiation controller 24 controls light emission (ON, OFF) and the like of the light sources 2U and 2D based on a control signal from the control unit 20. Note that when a variable device such as a shutter that switches between opening and closing of light by switching between opening and closing is provided, the operation of the variable device is controlled. The imaging controller 25 controls imaging by the imaging unit 3 based on a control signal from the control unit 20. The transport controller 26 controls the transport device 30 based on the control signal received from the control unit 20 and controls transport (start, stop, speed, etc.) of the inspection object 100. The display controller 27 controls the display device 40 (for example, a liquid crystal display (LCD), an organic electroluminescent display (OELD), etc.) based on a control signal from the control unit 20. The encoder controller 28 inputs a signal from the encoder 50 (rotary encoder) to the control unit 20. Further, the control unit 20 reads and executes a program (application) installed in the ROM 21 or the SSD 23 as a nonvolatile storage unit. The RAM 22 temporarily stores various data used when the control unit 20 executes programs and executes various arithmetic processes. Note that the hardware configuration shown in FIG. 10 is merely an example, and can be implemented with various modifications such as a chip or a package. Various arithmetic processes can be performed in parallel, and the control unit 20 or the like can have a hardware configuration capable of parallel processing.

  In the present embodiment, as an example, the control unit 20 functions (operates) as at least a part of the inspection apparatus 1 in cooperation with hardware and software (program).

  In addition, the inspection apparatus 1 according to the present embodiment can inspect the inspection object 100 having a spiral concave portion or convex portion on the outer periphery thereof. A spiral recess or projection (groove, protrusion, step, etc.) is likely to be formed when a spiral wound (eg, tape, ribbon, wire, etc., not shown) is included. There are some which are exposed to the outer periphery and some which are not exposed. When the wound product is not exposed to the outer periphery and a wound product (for example, a wire) is provided inside the outer wall (wall portion), the portion covering the wound product protrudes in a spiral shape.

  In the present embodiment, as an example, in the inspection process, the control unit 20 of the inspection apparatus 1 controls each unit using a time chart as shown in FIG. In a state where the inspection object 100 is moving at a constant speed, the control unit 20 responds to the input of the A-phase and B-phase pulse signals from the encoder 50, and the light source 2U (first light source in the drawing) and the light source 2D ( In the drawing, the second light source) and the imaging unit 3 are controlled to acquire the one-dimensional image IL1 and the image IL2 alternately. Next, the control unit 20 functions as an image processing unit, and arranges the two-dimensional images IA1 and IA2 by arranging a plurality of rows of images IL1 and IL2 in the order obtained in a predetermined period as described above. obtain. Then, the control unit 20 detects the edges of the images Ia and Ib. Here, the edge means ends (edges) on both sides in the width direction of the images Ia and Ib (the width direction of the inspection object 100, the left-right direction in FIGS. 6 to 9), and these are points C1 to C8. Equivalent to. Then, the control unit 20 calculates (acquires) the widths Wa and Wb of the images Ia and Ib. The values of the widths Wa and Wb can be calculated as the distance between two edges for each of the images Ia and Ib. Further, the values of the widths Wa and Wb are calculated every time (timing, time) when data is acquired, that is, at each position in the longitudinal direction of the images Ia and Ib. And the control part 20 determines whether the width | variety of the test object 100 has abnormality, and when there exists abnormality, it displays the said abnormality on the display screen of the display apparatus 40 as an example. At this time, the control unit 20 determines that it is abnormal when the widths Wa and Wb exceed the threshold values. Note that the control unit 20 does not detect an irregular shape (for example, a concave portion, a convex portion, a protrusion, a step, or the like) appearing at a boundary portion between the wound material in the images Ia and Ib as an abnormality.

  As described above, in the inspection apparatus 1 according to the present embodiment, as an example, in the image acquisition unit 10, the imaging unit 3 has a plurality of mutually different portions D1 and D2 in the circumferential direction in the inspection object 100. The inspection object 100 is imaged through the mirror unit 4 so that the widths of D2 and D4 can be detected. Further, the points C1 to C8 of the inspection object 100 for detecting the widths of the parts B1 to B4 imaged by the imaging unit 3 are different from each other in the plurality of image acquisition units 10. Therefore, it is possible for the control unit 20 to detect whether or not the widths of the parts D1 to D4 are abnormal. Therefore, according to the present embodiment, since the widths of a plurality of parts can be inspected from the imaging results of the respective image acquisition units 10, it is easier to detect an abnormality in the outer shape of the inspection object 100. In addition, when detecting the presence or absence of a flaw etc. in the perimeter of the test target object 100, as an example, the two image acquisition units 10 are arranged in opposite directions, and the image acquisition units 10 are arranged on the entire periphery of the test target object 100. About 70% of the images may be imaged, but in this case, the width detection positions are overlapped, and the number of width detections is reduced.

  Further, in the present embodiment, the plurality of imaging units 3 are positioned so that the mutual optical axes 3a are shifted from parallel. Therefore, according to the present embodiment, as an example, images of the plurality of parts D1 to D4 Can be obtained as a simpler configuration.

  Moreover, in this embodiment, the mirror part 4 has the two mirror surfaces 4a which faced the mutually different direction, and the four mirror surfaces 4a contained in the some image acquisition part 10 have faced the mutually different direction. . Therefore, according to the present embodiment, as an example, a configuration for acquiring images of a plurality of portions D1 to D4 is easily obtained as a simpler configuration. Further, when the mirror unit 4 in which the two mirrors 4R and 4L are integrated is used, the mirrors 4R and 4L can be handled more easily during the manufacturing and maintenance of the inspection apparatus 1.

  As mentioned above, although embodiment of this invention was illustrated, the said embodiment is an example to the last. The embodiment can be implemented in various other forms, and various omissions, replacements, combinations, and changes can be made without departing from the scope of the invention. In addition, the configuration and shape of the embodiment can be partially replaced with other configurations and shapes. In addition, specifications (structure, type, direction, angle, shape, size, length, width, thickness, height, number, arrangement, position, material, etc.) of each configuration, shape, etc. are changed as appropriate. Can be implemented. For example, the inspection object may be other than an elongated part. Further, the inspection apparatus can detect an abnormality other than the abnormality described above by image processing. Further, the inspection apparatus may inspect with an image acquired in a stationary state. The optical component may be other than a mirror (for example, a lens, a prism, etc.). Further, three or more parts of the inspection object may be included in the image. Further, the imaging unit may acquire a linear image extending in a direction crossing the width direction (oblique direction).

DESCRIPTION OF SYMBOLS 1 ... Inspection apparatus, 3 ... Imaging part (1st light source, 2nd light source), 3a ... Optical axis, 4 ... Mirror part, 4a ... Mirror surface, 10 ... Image acquisition part, 20 ... Control part (detection part), 100 ... Inspection object, C1 to C8... Point (width detection point), D1 to D4.

Claims (10)

A mirror unit, and an imaging unit that images the inspection object through the mirror unit so that the widths of a plurality of different parts in the circumferential direction can be detected in the elongated inspection object, A plurality of image acquisition units having different width detection points of the inspection object for detecting the width imaged by the imaging unit;
A detection unit that detects an abnormality in the width of the inspection object using images of the inspection object captured by the plurality of image acquisition units;
Equipped with a,
The plurality of imaging units are inspection devices in which mutual optical axes are shifted from parallel .   The inspection apparatus according to claim 1, wherein a part of the part overlaps with a part of the other part. The mirror unit, the inspection apparatus according to claim 1 or 2 which is located on the opposite side to the imaging unit of the test object. The mirror part has two mirror surfaces facing different directions,
Wherein the plurality of four of said mirror surface that is included in the image acquisition unit, the inspection apparatus according to any one of claims 1 to 3 facing each other in different directions. The mirror part is located on the opposite side of the inspection object from the imaging part,
The mirror unit, the inspection apparatus according to claim 1 or 2 having two specular approaching each other as the heading in a direction away from the imaging unit along an optical axis of the imaging unit. The inspection apparatus according to any one of claims 1 to 5 , wherein the plurality of image acquisition units are spaced apart from each other in a longitudinal direction of the inspection object. Two image acquisition units each having an angle of 135 degrees between the optical axes of the imaging units,
4. The inspection apparatus according to claim 1, wherein each of the mirror units of the two image acquisition units has two mirror surfaces having an angle of 120 degrees with each other. 5. The image acquisition unit
A first light source that illuminates the inspection object from one side in the longitudinal direction of the inspection object; and
A second light source that illuminates the inspection object from the other side in the longitudinal direction;
Have
The imaging unit includes the first image of the inspection object and the second light source when illuminated by light from the first light source in a state where the inspection object is conveyed in the longitudinal direction. The inspection apparatus according to any one of claims 1 to 7, wherein a second image of the inspection object when illuminated with light is acquired. The inspection apparatus according to claim 8 , wherein the first light source and the second light source are annular in which the inspection object is inserted. The inspection Target material is circular tubular or cylindrical inspection apparatus according to any one of claims 1 to 9.