JP2010025566A - Foreign matter detection device of material for electrode - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To detect a foreign matter on the material surface for an electrode such as a lithium ion battery by using an optical method, and to determine quickly a shape or a size of the foreign matter. <P>SOLUTION: A material for an electrode conveyed by a roller is irradiated with light from the oblique upside from the conveyance direction upstream to a downstream direction by the first illumination device, to thereby acquire image data 1 of scattered light. Light is irradiated to the same measuring portion from the oblique upside from the conveyance direction downstream to an upstream direction by the second illumination device, to thereby acquire image data 2 of scattered light. In an image data processing device, since the kind of a shape of the foreign matter is determined by comparing an overall image data acquired by superimposing two kinds of acquired brightness distribution data with the image data 1, 2, the kind of the shape can be determined in a short time, to improve the accuracy of the foreign matter inspection of the material for the electrode conveyed at high speed. <P>COPYRIGHT: (C)2010,JPO&INPIT

Description

  The present invention relates to an apparatus for detecting the presence of foreign matter when the foreign matter is attached to an electrode material used for a lithium ion secondary battery or the like.

  An electrode material used for a lithium ion secondary battery, etc. is obtained by applying an active material paste obtained by kneading an active material powder and a binder into water or an organic solvent to a long metal foil current collector. It is manufactured by drying.

  If a foreign material such as a metal such as aluminum or SUS is mixed into an active material layer of an electrode material such as a lithium ion secondary battery, a micro short-circuit occurs and the battery performance deteriorates. In the manufacturing process, the electrode material is managed so that no foreign material is mixed in. However, in case the foreign material is mixed for some reason, the foreign material is detected by observing the surface of the manufactured electrode material. An inspection process is provided for collecting the electrode material from which foreign matter is detected.

  For surface observation, an imaging device such as a CCD (Charge Coupled Device) camera including an imaging device (image sensor) that converts received light into an electrical signal is used. Usually, an optical detection device is used that illuminates the inspection object, captures regular reflection light or scattered light (diffuse reflection light) obtained from the inspection object with an imaging device, and analyzes the obtained image data with a computer.

  In such an optical detection device, the amount of specularly reflected light and scattered light differs depending on the surface state of the object to be inspected and the shape and size of a foreign object to be detected. When light is illuminated on a smooth surface such as a mirror surface, the amount of specular reflection light increases. However, when light is illuminated on a surface with many irregularities such as paper, the amount of scattered light increases. . In addition, there is a case where the reflection direction of light changes due to the influence of wrinkles on the surface of the object to be inspected and it cannot be appropriately determined whether or not it is a detection target. Accordingly, it is necessary to appropriately adjust the inspection conditions such as the angle at which the illumination device illuminates the object to be inspected, the position of the imaging device, and the procedure of image processing and determination processing according to the object to be inspected.

  For example, in patent document 1, as shown in FIG. 6, the defective part of the copper foil 91 conveyed with the guide roller 92 is detected with an optical detection apparatus. The optical detection device includes a set of a light 93 and a CCD camera 96. The light 93 obliquely illuminates the copper foil 91 from the upstream side in the transport direction, and the CCD camera 96 captures the specularly reflected light from the copper foil 91. To do. Further, the light 94, the light 95, and the CCD camera 97 are provided. The light 94 obliquely illuminates the copper foil 91 from the upstream side in the transport direction, and at the same time, the light 95 obliquely illuminates the copper foil 91 from the downstream side in the transport direction. The scattered light obtained from the illumination range is imaged by the CCD camera 97.

In the optical detection device of Patent Document 1, image data obtained by the regular reflection light obtained by the CCD camera 96 is processed to identify a range in which the regular reflection light intensity is greater than a threshold value. Further, the image data based on the scattered light obtained by the CCD camera 97 is processed to specify a range where the scattered light intensity is smaller than the threshold value. In the optical detection device of Patent Document 1, a range in which the intensity of specular reflection light is larger than a threshold and the intensity of scattered light is smaller than the threshold is extracted. Thereby, it is said that a defective portion of the copper foil can be detected while suppressing erroneous detection caused by fine wrinkles on the copper foil.
Republished patent WO2003 / 054530

  If the surface of the electrode material is observed using the method disclosed in Patent Document 1, the scattered light intensity increases if foreign substances are mixed in. Therefore, the foreign objects are detected by detecting the scattered light intensity. It should be possible.

  In the case of a device that detects foreign matter adhering to an electrode material, it is important not only to determine whether foreign matter is attached, but also to determine its shape when foreign matter is attached. This is because the generation of foreign matter or the cause of contamination can be narrowed down according to the shape of the foreign matter, and it becomes easy to devise a countermeasure for preventing the entry of foreign matter.

  The electrode material is long, and various processes are performed in the middle of rewinding from one roller to the other. As the manufacturing process speeds up, the traveling speed of the electrode material has increased. There is a demand to detect the presence or absence of foreign matter by observing the surface of the electrode material traveling at high speed, and to specify the shape of the foreign matter when the foreign matter is attached.

  However, there is currently no technology that can meet the demand. Even if the technique described in Patent Document 1 is used, it is not possible to meet the demand for specifying the shape of the foreign matter adhering to the electrode material.

  Therefore, in the present invention, it is detected whether or not a foreign substance is attached to the electrode material being conveyed, and when the foreign substance is detected, the foreign substance of the electrode material that provides information useful for specifying the shape of the foreign substance is detected. An object is to provide an inspection device.

The present invention is a detection device for foreign matter adhering to a long electrode material having an active material layer formed on a current collector, and includes a first illumination device, a first imaging device, a second illumination device, and a first illumination device. Provided is a foreign object detection device including two imaging devices and an image data processing device.
The first illuminating device illuminates, from one side (that is, the upstream side or the downstream side) in the traveling direction of the electrode material, a range that traverses the surface of the electrode material traveling along the length in the width direction.
The first imaging device images the illumination range of the first lighting device.
The second illumination device illuminates the illumination range of the first illumination device after a predetermined time has elapsed from the other side in the traveling direction of the electrode material. That is, when the first illumination device illuminates from the upstream side, the second illumination device illuminates from the downstream side, and when the first illumination device illuminates from the downstream side, the first illumination device illuminates from the upstream side.
The second imaging device images the illumination range of the second lighting device.
The image data processing device receives and stores image data of the first imaging device and image data of the second imaging device, and an image in which the image data of the first imaging device and the image data of the second imaging device are superimposed. A determination unit that compares the data and the image data of the first imaging device to determine the shape of the foreign matter is provided.
Assuming that the image data of the first imaging device is the first data and the image data of the second imaging device is the second data, the determination unit determines that “the first data and the second data are duplicated” and “first data”. Compare This is mathematically equivalent to comparing “data overlapping the first data and second data” with “second data” and comparing “first data” with “second data”.

  According to the present invention, image data illuminated from the upstream side of the electrode material and image data illuminated from the downstream side can be obtained separately. That is, image data illuminated from the reverse direction can be obtained separately. Thereby, information useful for specifying the shape of the foreign matter can be obtained.

  For example, the shape of the foreign object can be determined using a value of a ratio between a range of predetermined luminance or higher in “data overlapping the first data and second data” and a range of predetermined luminance or higher in “first data”. . Further, the ratio of the sum of the luminance values in the range where the predetermined luminance or higher in the “data overlapping the first data and the second data” to the total luminance value in the range where the predetermined luminance or higher in the “first data” is obtained. The shape of the foreign object can be determined using the value.

  More specifically, for example, the determination unit has a range that is equal to or higher than a predetermined luminance in the image data obtained by superimposing the image data of the first imaging device and the image data of the second imaging device, and a predetermined luminance in the image data of the first imaging device. If programmed to compare the above ranges, the shape of the foreign object can be determined to be spherical when the former is larger than the latter.

  If the foreign substance is spherical, the opposite side to the illumination direction is shaded, and high brightness cannot be obtained in the shaded part. As a result, the range in which the image data of the first imaging device is equal to or higher than the predetermined luminance is different from the range in which the image data of the second imaging device is equal to or higher than the predetermined luminance. The range where the predetermined luminance or higher in the image data on which the image data is superimposed is larger than the range where the predetermined luminance or higher in the image data of the first imaging device.

On the other hand, if the foreign object is a needle shape, a flat plate shape, or a horseshoe shape, the range in which the image data of the first imaging device has a predetermined luminance or higher overlaps the range in which the image data of the second imaging device has a predetermined luminance or higher. The range in which the image data of the first image pickup device and the image data of the second image pickup device are superimposed on the predetermined brightness or higher is almost equal to the range in which the image data of the first image pickup device is higher than the predetermined luminance.
In this way, it is possible to determine whether the foreign substance is spherical or other shape.

When the number of foreign objects is small, it is possible to provide information useful for determining the shape of the foreign object to the person, and finally a method in which the person determines the shape of the foreign object can be adopted.
The detection device in this case includes an image display device in addition to the first illumination device, the first imaging device, the second illumination device, and the second imaging device.
The image display device includes a storage unit that inputs and stores the image data of the first imaging device and the image data of the second imaging device, and at least the image data of the first imaging device and the image data of the second imaging device. An image based on one image and an image based on image data obtained by superimposing the image data of the first imaging device and the image data of the second imaging device are displayed so as to be able to be compared. Also in this case, the image data of the first imaging device and the image data of the second imaging device may be displayed so as to be able to be compared and observed. Eventually, the same information is displayed mathematically.

  In this case, a person determines the shape of a foreign object from an image displayed so as to be capable of comparative observation. For example, if a semicircle is displayed in one image and a circle is displayed in the other image, it is understood that a spherical foreign object is being imaged. If the shape displayed in one image is the same as the shape displayed in the other image, it is understood that a foreign object having a needle shape, a flat plate shape, or a horseshoe shape is being imaged.

  According to the foreign matter detection device of the present invention, the presence or absence of foreign matter can be accurately detected. When a foreign object exists, information useful for specifying the shape of the foreign object can be obtained. Therefore, it is possible to accurately detect the presence or absence of foreign matter and determine the shape of the long electrode material while traveling at high speed.

  According to the foreign matter detection device of the present invention, foreign matter contained in the entire long electrode material can be aggregated according to shape and size and displayed on a histogram or the like. It is possible to estimate the manufacturing process.

In the embodiment of the invention, the presence or absence of a foreign object is detected while running a long electrode material at high speed, and if a foreign object is detected, whether the foreign object is spherical, needle-shaped, flat plate-shaped, or horseshoe-shaped Is automatically detected.
The main features of the examples are listed.
(Characteristic 1) The illumination device is installed in an angle range in which the elevation angle is 0 ° or more and 20 ° or less with respect to the surface of the electrode material that is the inspection object.
(Characteristic 2) The electrode material is conveyed with the surface on which the active material layer is applied facing up, and passes under the foreign object detection device.
(Feature 3) The first lighting device illuminates the surface of the electrode material from the upstream side in the conveying direction of the electrode material, and the second lighting device illuminates the surface of the electrode material from the downstream side in the conveying direction of the electrode material. To do. When the surface of the electrode material is viewed in plan, the first lighting device and the second lighting device are arranged on the electrode material transport line.
(Feature 4) When at least one of the luminance values obtained from the two imaging devices exceeds a preset threshold value of the luminance value, it is detected as a foreign object.
(Characteristic 5) When detected as a foreign material, the fact that the foreign material has been detected is labeled on the electrode material to which the foreign material has adhered.

  FIG. 1 shows a system configuration diagram of a foreign object detection apparatus according to Embodiment 1 of the present invention. The electrode material 21 is coated with the active material layer 24 on the surface of the current collector 23, is long, and is conveyed by the feed roller 22 with the surface on which the active material layer 24 is formed facing up. The The foreign object detection device 1 is installed above the electrode material 21 and processes the image data transmitted from the optical inspection device 2 and the optical inspection device 2 for inspecting the upper surface of the electrode material 21 to determine whether or not it is a foreign material. The image data processing device 3 for determining the shape of the foreign material, the display device 4 for displaying the data output from the image data processing device 3, and the optical inspection device 2 in the transport direction downstream of the optical inspection device 2. It is comprised by the labeling apparatus 5 which labels the raw material 21 for electrodes which is a to-be-inspected object by methods, such as an inkjet, according to the output from the image data processing apparatus 3. FIG. In addition, the arrow of FIG. 1 has shown the traveling direction of the raw material for electrodes.

  The optical inspection device 2 of the foreign object detection device 1 includes a first illumination device 6 and a first imaging device 8 installed on the upstream side with respect to the conveyance direction of the electrode material 21, and a second illumination device 7 installed on the downstream side. And the second imaging device 9. The first imaging device 8 and the second imaging device 9 are each connected to the image data processing device 3.

The first illumination device 6 illuminates the electrode material 21 with light from the upstream side to the downstream side in the transport direction. The illumination range of the first lighting device 6 crosses the surface of the electrode material 21 in the width direction.
The first imaging device 8 is installed vertically above the illumination range of the first illumination device 6 and receives scattered light from the illumination range of the first illumination device 6. The second illumination device 7 illuminates the electrode material 21 with light from the downstream side in the transport direction toward the upstream side. The illumination range of the second lighting device 7 crosses the surface of the electrode material 21 in the width direction. The illumination range of the first illumination device 6 becomes the illumination range of the second illumination device 7 after a predetermined time and is illuminated again. The second imaging device 9 is installed vertically above the illumination range of the first illumination device 6 and receives scattered light from the illumination range of the second illumination device 7.

  FIG. 2 is an installation view of the first lighting device 6 and the second lighting device 7. As shown in FIG. 2A, the first lighting device 6 and the second lighting device 7 are installed so as to illuminate the electrode material 21 at the same elevation angle θ. The intensity of the scattered light depends on the intensity of the illuminating light and the elevation angle θ. In this embodiment, in order to reduce the influence of scattered light from the surface of the normal electrode material without foreign matter, the elevation angle θ is set so that the illumination light is substantially parallel to the surface of the electrode material 21. It is set to 0 ° or more and 20 ° or less. Further, as shown in FIG. 2B, the first lighting device 6 is installed on the upstream side of the traveling direction of the long electrode material 21 so that the illumination light is directed from the upstream side to the downstream side, On the downstream side, the second lighting device 7 is arranged so that the illumination light is directed from the downstream side to the upstream side. In addition, in FIG.2 (b), the direction of the arrow has shown the direction where each illuminating device illuminates the raw material for electrodes. Instead of the present embodiment, the first lighting device arranged on the upstream side is installed so as to illuminate the upstream side from the downstream side, and the second lighting device is installed so as to illuminate the downstream side from the upstream side. May be.

  As the first illumination device 6 and the second illumination device 7, an LED (Light Emitting Diode) illumination device, an HID (High Intensity Discharged Lump) illumination device, a halogen lamp, or the like can be used. In the present embodiment, as shown in FIG. 2B, it is installed so as to illuminate with uniform intensity in the electrode width direction orthogonal to the traveling direction of the electrode material 21.

  As shown in FIG. 2A, the first imaging device 8 is installed vertically above the illumination range of the first illumination device 6. Similarly, the second imaging device 9 is installed vertically above the illumination range of the second illumination device 7. The first and second imaging devices 8 and 9 convert light received by a CCD (Charge Coupled Device) sensor, a CMOS (Complementary Metal Oxide Semiconductor) sensor, or the like into an electrical signal. An imaging device provided with an imaging element (image sensor) can be used. When measuring a long sheet-like inspection object as in this embodiment, a one-dimensional image sensor such as a CCD line scan camera capable of high-speed scanning can be suitably used. When the traveling speed of the object to be inspected is high as in the electrode material production line, it is preferable to use a high-sensitivity integral CCD camera having a TDI (Time Delay Integration) readout function. The TDI readout function matches the transport direction and speed with the charge movement direction and speed of the CCD camera, and blurring of the image and a decrease in signal luminance are suppressed, so that high-speed and high-precision detection can be performed.

  FIG. 3 is a system configuration diagram of the image data processing apparatus 3. The image data processing device 3 stores the one-dimensional image data obtained by the first imaging device 8 and the second imaging device 9 together with the imaging position data, acquires the luminance distribution from the storage unit 31, and acquires the shape of the foreign matter. It is comprised by the determination part 33 which determines.

Next, the operation of this embodiment will be described. The electrode material 21 travels vertically below the first imaging device 8, and the first imaging device 8 receives the scattered light from the first illumination device 6. The first image pickup device 8 converts the electric charge obtained by the received scattered light into an electric signal, and uses the one-dimensional image data in the width direction of the electrode material 21 as the first image data Y ₁ of the image data processing device 3. The data is transmitted to the storage unit 31. After a predetermined time, the range illuminated by the first illumination device 6 passes below the second imaging device 9 and is illuminated from the second illumination device 7. The second imaging device 9 receives the scattered light from the second illumination device 7. The second imaging device 9 converts the electric charge obtained by the received scattered light into an electric signal, and uses the one-dimensional image data in the width direction of the electrode material 21 as the second image data Y ₂ , and the image data processing device 3. To the storage unit 31.

The processing executed by the image data processing device 3 will be described with reference to the flowchart of FIG. The foreign object detection apparatus inspects each roll of the long electrode material 21. In step S <b> ₁ , the luminance value is stored for each pixel in the storage unit 31 for the one-dimensional first image data Y <b> ₁ transmitted from the first imaging device 8. Similarly, the luminance value is stored for each pixel in the storage unit 31 for the one-dimensional second image data Y ₂ transmitted from the second imaging device 9. Each of the first image data Y ₁ and the second image data Y ₂ is stored in association with the position of the long electrode material 21 in the longitudinal direction.

In step S3, the luminance value stored in the storage unit 31, find out if it contains data to be the threshold value Y ₀ over a preset. When the luminance value to be Y ₀ or more is included, the process proceeds to step S5. When the luminance value to be Y ₀ over the entire length of the electrode material 21 subjected to the inspection is not included, the inspection is ended.

In step S5, by superimposing the first image data Y ₁ by adding the luminance values between the pixels corresponding to the same position of the electrode material 21 and the second image data Y _2, to obtain an overall image data Y. In step S5, the luminance value extracting range that is the Y ₀ or more in the total image data Y, extracts the outline, the number of pixels in the contour and S (Y), the sum of luminance values within the contour Is A (Y). Also carried on the first image data Y ₁ the same process. That is, a range in which the luminance value is equal to or greater than Y ₀ in the first image data Y ₁ is extracted, the contour line is extracted, the number of pixels in the contour is S (Y ₁ ), and the luminance value in the contour is Let the total be A (Y ₁ ).

In the present embodiment, the overall image data Y obtained in step S5, the first image data Y ₁ and at least one of the second image data Y _2, be output to comparison observable display device 4 Good. It is possible for a person to grasp the shape through comparative observation.

In step S7, the total image data Y number of pixels within the luminance value is in the Y ₀ or more in the S (Y), the size of foreign matter (area occupied on the surface of the electrode material 21) determines .

In step S9, the shape of the foreign matter is determined based on the ratio of S (Y ₁ ) and S (Y) obtained in step S7 and the value of the ratio of A (Y ₁ ) and A (Y). The determination unit 33 uses S (Y ₁ ) / S (Y) and A (Y ₁ ) / A (Y) for the types of shapes of foreign matters that are likely to be mixed into the electrode material 21. Judgment pattern is programmed. For example, in the case of a spherical foreign substance, as shown in FIG. 5A, since the first image data Y ₁ is a semicircle and the total image data Y is a circle, S (Y ₁ ) is S ( Y) of 50 to 60%.

On the other hand, if S (Y ₁ ) / S (Y)> 0.6, it is not spherical but in the case of the present embodiment, it is understood that the shape is either a needle shape, a flat plate shape, or a horseshoe shape. ing.

If a horseshoe shape, as shown in FIG. 5 (b), When it is horseshoe shape that is open to the downstream side in the transport direction, is first the image data Y ₁ dark imaging illuminated from the upstream side, from the downstream side It is second in the image data Y ₂ brightly imaging and illumination is known. That is, A (Y ₁ ) / A (Y) <0.4 when the horseshoe shape is open on the downstream side. Conversely, if it is horseshoe shape that is open to the upstream flow side in the transport direction, it is first the image data Y ₁ brightly imaging and illumination from the upstream side, is the second in the image data Y2 dark imaging illuminated from the downstream side I know that. That is, A (Y ₁ ) / A (Y)> 0.6 when the horseshoe shape is open on the upstream side. On the other hand, in the case of a needle-like or flat plate-like foreign matter, the areas of S (Y) and S (Y ₁ ) are almost the same. As shown in FIGS. 5C and 5D, the first image data Y ₁ and the second image data Y ₂ have substantially the same luminance distribution, and the value of A (Y ₁ ) / A (Y) is 0.5. It has values before and after.

Using the above relationship, in this embodiment, the shape is determined under the following conditions.
If S (Y ₁ ) / S (Y) ≦ 0.6, it is determined as a spherical foreign material.
If S (Y ₁ ) / S (Y)> 0.6 and A (Y ₁ ) / A (Y) <0.4, it is determined that the horseshoe shape is open downstream.
If S (Y ₁ ) / S (Y)> 0.6 and 0.4 ≦ A (Y ₁ ) / A (Y) ≦ 0.6, it is determined that the shape is needle-shaped or planar. To do.
If S (Y ₁ ) / S (Y)> 0.6 and A (Y ₁ ) / A (Y)> 0.6, it is determined that the horseshoe shape is open on the upstream side.

As for the needle-like and flat plate-like foreign matters, image recognition is further performed on the comprehensive image data Y, the shape is checked for slenderness, and the elongated one is determined to be needle-like and the other is determined to be flat plate-like. For example, by checking the circularity or complexity of the image data and the aspect ratio of the rectangle circumscribing the image data, the length of the shape can be known.
In this embodiment, the determination is made using the complexity C. When the circumferential length of the overall image data Y is L (Y), the complexity C (Y) of the overall image data Y is represented by C (Y) = (L (Y)) ² / S (Y). The larger C (Y), the longer the shape. For example, in the case of a square, C (Y) = 16, and in the case of a rectangle having a ratio of the long side to the short side of 9: 1, C (Y) ≈44.
In this embodiment, when the complexity C (Y) ≧ 25, the needle shape is determined. When the complexity C (Y) <25, it is determined that the shape is a flat plate.

  When the determination of the size and shape of the foreign matter is completed for the single electrode material 21, the process proceeds to step S11, and the image data processing device 3 collects data for each size and shape of the detected foreign matter and forms a histogram. Thus, a display signal is output to the display device 4. Further, the image data processing device 3 outputs an instruction to the labeling device 5 to label the type and size of the foreign material shape of the electrode material 21. The labeling device 5 labels the electrode material 21 by means such as inkjet.

  Thus, according to the present embodiment, the shape of the foreign object can be determined from the luminance value distribution obtained as the image data. Therefore, the time from when the foreign object is imaged until the shape determination is completed is reduced, and the vehicle travels at high speed. It is possible to accurately detect foreign matters and quickly identify the shape and size of the electrode material.

  According to the present embodiment, since data indicating the shape and size of a foreign object can be acquired, the size distribution for each shape is aggregated into a histogram, or the distribution of types of shapes according to size is aggregated into a histogram. It is possible to easily grasp how much and what kind of foreign material is mixed. In the manufacturing process of the electrode material, it is possible to estimate the manufacturing process that is the cause of the mixing depending on the type of the shape of the mixed foreign matter. For example, it can be estimated that spherical metal pieces are caused by spatter during welding. Based on this, the manufacturing process can be reviewed, which contributes to the improvement of yield.

  In this embodiment, the storage unit 31 of the image data processing device 3 stores in advance a database that associates the type of the foreign material shape of the electrode material 21 with the process that caused the foreign material contamination. Also good. The determination unit 33 in the image data processing device 3 may acquire the manufacturing process causing the contamination of the foreign matter from the database based on the shape type of the foreign matter and output the manufacturing process to the display device 4.

The example of installation of the foreign material detection apparatus of an Example. FIG. 2A is a side view of the illumination device and the imaging device installed for the electrode material of the embodiment, and FIG. 2B is the illumination device installed for the electrode material of the embodiment. FIG. 1 is a block diagram of an image data processing apparatus according to an embodiment. 6 is a flowchart illustrating an image data processing method according to the embodiment. FIG. 5A is an example of spherical foreign matter image data obtained in the embodiment, FIG. 5B is an example of horseshoe-shaped foreign matter image data obtained in the embodiment, and FIG. FIG. 5D is an example of image data of a flat plate-like foreign material obtained in the example. The schematic block diagram of the surface inspection apparatus of a prior art example.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 Foreign object detection apparatus 2 Optical measuring apparatus 3 Image data processing apparatus 4 Display apparatus 5 Labeling apparatus 6 1st illumination apparatus 7 2nd illumination apparatus 8 1st imaging device 9 2nd imaging apparatus 15 Foreign material detection notification apparatus 21 Material 22 for electrodes Conveyance Roller 23 Current collector 24 Active material layer 91 Copper foil 92 Guide roller 93 Light 1
94 Light 2
95 Light 3
96 CCD sensor 1
97 CCD sensor 2

Claims (5)

It is a device for detecting foreign matter adhering to a long electrode material in which an active material layer is formed on a current collector,
A first illumination device, a first imaging device, a second illumination device, a second imaging device, and an image data processing device;
The first lighting device illuminates a range that crosses the surface of the electrode material running along the length in the width direction from one side in the running direction of the electrode material,
The first imaging device images an illumination range of the first lighting device;
The second illumination device illuminates the illumination range of the first illumination device after a lapse of a predetermined time from the other side of the traveling direction of the electrode material,
The second imaging device images an illumination range of the second illumination device,
The image data processing device receives and stores the image data of the first imaging device and the image data of the second imaging device, the image data of the first imaging device, and the image of the second imaging device. A foreign matter detection apparatus for an electrode material, comprising: a determination unit that compares image data superimposed with data and image data of the first imaging device to determine the shape of the foreign matter.   The determination unit has a range of a predetermined luminance or higher in the image data obtained by superimposing the image data of the first imaging device and the image data of the second imaging device, and a range of a predetermined luminance or higher in the image data of the first imaging device. The foreign material detection device for an electrode material according to claim 1, wherein the shape of the foreign material is determined by comparing the values of the former and the latter.   In the image data obtained by superimposing the image data of the first imaging device and the image data of the second imaging device, the determination unit includes a sum of luminance values in a range that is equal to or higher than a predetermined luminance, and the image data of the first imaging device. 2. The foreign material detection device for an electrode material according to claim 1, wherein a total of luminance values in a range exceeding a predetermined luminance is compared, and a shape of the foreign material is determined using a value of a ratio between the former and the latter.   The determination unit has a range of a predetermined luminance or higher in the image data obtained by superimposing the image data of the first imaging device and the image data of the second imaging device, and a range of a predetermined luminance or higher in the image data of the first imaging device. 3. The foreign material detection device for an electrode material according to claim 2, wherein the foreign material is determined to be spherical when the former is enlarged more than the latter. It is a device for detecting foreign matter adhering to a long electrode material in which an active material layer is formed on a current collector,
A first illumination device, a first imaging device, a second illumination device, a second imaging device, and an image display device;
The first lighting device illuminates a range that crosses the surface of the electrode material running along the length in the width direction from one side in the running direction of the electrode material,
The first imaging device images an illumination range of the first lighting device;
The second illumination device illuminates the illumination range of the first illumination device after a lapse of a predetermined time from the other side of the traveling direction of the electrode material,
The second imaging device images an illumination range of the second illumination device,
The image display device includes a storage unit that inputs and stores the image data of the first imaging device and the image data of the second imaging device, and the image data of the first imaging device and the second imaging device. An electrode material characterized in that an image based on at least one of the image data and an image based on image data obtained by superimposing the image data of the first imaging device and the image data of the second imaging device are displayed for comparison observation Foreign object detection device.

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