JP6080648B2 - 表面増強ラマン散乱ユニット - Google Patents

表面増強ラマン散乱ユニット Download PDF

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Publication number
JP6080648B2
JP6080648B2 JP2013073312A JP2013073312A JP6080648B2 JP 6080648 B2 JP6080648 B2 JP 6080648B2 JP 2013073312 A JP2013073312 A JP 2013073312A JP 2013073312 A JP2013073312 A JP 2013073312A JP 6080648 B2 JP6080648 B2 JP 6080648B2
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JP
Japan
Prior art keywords
raman scattering
enhanced raman
handling substrate
substrate
unit
Prior art date
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Active
Application number
JP2013073312A
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English (en)
Japanese (ja)
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JP2014196974A5 (enrdf_load_stackoverflow
JP2014196974A (ja
Inventor
将師 伊藤
将師 伊藤
柴山　勝己
勝己 柴山
敏光 川合
敏光 川合
和人 大藤
和人 大藤
泰生 大山
泰生 大山
芳弘 丸山
芳弘 丸山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
Original Assignee
Hamamatsu Photonics KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to JP2013073312A priority Critical patent/JP6080648B2/ja
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Priority to EP22162962.9A priority patent/EP4033222A1/en
Priority to PCT/JP2013/071707 priority patent/WO2014025037A1/ja
Priority to PCT/JP2013/071704 priority patent/WO2014025035A1/ja
Priority to EP13828081.3A priority patent/EP2884265A4/en
Priority to PCT/JP2013/071703 priority patent/WO2014025034A1/ja
Priority to US14/420,502 priority patent/US9863883B2/en
Priority to CN201380040609.5A priority patent/CN104508465B/zh
Priority to CN201380040860.1A priority patent/CN104508466B/zh
Priority to TW102128768A priority patent/TWI583939B/zh
Priority to TW102128717A priority patent/TWI604186B/zh
Priority to US14/420,483 priority patent/US10551322B2/en
Priority to EP13827352.9A priority patent/EP2884262B1/en
Priority to CN201811398924.6A priority patent/CN109342395B/zh
Priority to CN201380042452.XA priority patent/CN104520696B/zh
Priority to US14/420,510 priority patent/US9863884B2/en
Priority to EP13827643.1A priority patent/EP2884264B1/en
Publication of JP2014196974A publication Critical patent/JP2014196974A/ja
Publication of JP2014196974A5 publication Critical patent/JP2014196974A5/ja
Application granted granted Critical
Publication of JP6080648B2 publication Critical patent/JP6080648B2/ja
Active legal-status Critical Current
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  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
JP2013073312A 2012-08-10 2013-03-29 表面増強ラマン散乱ユニット Active JP6080648B2 (ja)

Priority Applications (17)

Application Number Priority Date Filing Date Title
JP2013073312A JP6080648B2 (ja) 2013-03-29 2013-03-29 表面増強ラマン散乱ユニット
US14/420,483 US10551322B2 (en) 2012-08-10 2013-08-09 Surface-enhanced Raman scattering unit including integrally formed handling board
PCT/JP2013/071704 WO2014025035A1 (ja) 2012-08-10 2013-08-09 表面増強ラマン散乱素子
EP13828081.3A EP2884265A4 (en) 2012-08-10 2013-08-09 SURFACE-REINFORCED RAM SPREADING ELEMENT
PCT/JP2013/071703 WO2014025034A1 (ja) 2012-08-10 2013-08-09 表面増強ラマン散乱ユニット
US14/420,502 US9863883B2 (en) 2012-08-10 2013-08-09 Surface-enhanced raman scattering element
CN201380040609.5A CN104508465B (zh) 2012-08-10 2013-08-09 表面增强拉曼散射单元
CN201380040860.1A CN104508466B (zh) 2012-08-10 2013-08-09 表面增强拉曼散射元件
TW102128768A TWI583939B (zh) 2012-08-10 2013-08-09 Surface - enhanced Raman scattering unit
CN201811398924.6A CN109342395B (zh) 2012-08-10 2013-08-09 表面增强拉曼散射单元
EP22162962.9A EP4033222A1 (en) 2012-08-10 2013-08-09 Surface-enhanced raman scattering unit
PCT/JP2013/071707 WO2014025037A1 (ja) 2012-08-10 2013-08-09 表面増強ラマン散乱素子及びその製造方法
TW102128717A TWI604186B (zh) 2012-08-10 2013-08-09 Surface Enhanced Raman Scattering Element
CN201380042452.XA CN104520696B (zh) 2012-08-10 2013-08-09 表面增强拉曼散射元件及其制造方法
US14/420,510 US9863884B2 (en) 2012-08-10 2013-08-09 Surface-enhanced Raman scattering element, and method for producing same
EP13827643.1A EP2884264B1 (en) 2012-08-10 2013-08-09 Surface-enhanced raman scattering element, and method for producing same
EP13827352.9A EP2884262B1 (en) 2012-08-10 2013-08-09 Surface-enhanced raman scattering unit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013073312A JP6080648B2 (ja) 2013-03-29 2013-03-29 表面増強ラマン散乱ユニット

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2017005996A Division JP6282762B2 (ja) 2017-01-17 2017-01-17 表面増強ラマン散乱ユニット

Publications (3)

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JP2014196974A JP2014196974A (ja) 2014-10-16
JP2014196974A5 JP2014196974A5 (enrdf_load_stackoverflow) 2016-06-30
JP6080648B2 true JP6080648B2 (ja) 2017-02-15

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013073312A Active JP6080648B2 (ja) 2012-08-10 2013-03-29 表面増強ラマン散乱ユニット

Country Status (1)

Country Link
JP (1) JP6080648B2 (enrdf_load_stackoverflow)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9863883B2 (en) 2012-08-10 2018-01-09 Hamamatsu Photonics K.K. Surface-enhanced raman scattering element
EP2884264B1 (en) 2012-08-10 2019-11-20 Hamamatsu Photonics K.K. Surface-enhanced raman scattering element, and method for producing same
JP6230250B2 (ja) * 2013-03-29 2017-11-15 浜松ホトニクス株式会社 表面増強ラマン散乱ユニット、及びラマン分光分析方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100357738C (zh) * 2004-03-26 2007-12-26 博奥生物有限公司 一种检测小分子化合物的方法
RU2361193C2 (ru) * 2004-05-19 2009-07-10 Вп Холдинг, Ллс Оптический датчик с многослойной плазмонной структурой для усовершенствованного обнаружения химических групп посредством sers
JP2005337771A (ja) * 2004-05-25 2005-12-08 National Institute For Materials Science ナノ構造を有する集積化ピラー構造光学素子
RU2482495C2 (ru) * 2006-10-12 2013-05-20 Конинклейке Филипс Электроникс Н.В. Быстрый биосенсор со слоем реагента
JP4980324B2 (ja) * 2008-09-30 2012-07-18 テルモ株式会社 成分測定装置
EP2352010B1 (en) * 2008-10-30 2016-01-13 Nippon Telegraph And Telephone Corporation Measuring chip installation/removal device, spr measurement system, and measuring chip installation/removal method
EP2419733A4 (en) * 2009-04-13 2013-12-25 Univ Leland Stanford Junior METHODS AND DEVICES FOR DETECTING THE PRESENCE OF AN ANALYTE IN A SAMPLE
US20110166045A1 (en) * 2009-12-01 2011-07-07 Anuj Dhawan Wafer scale plasmonics-active metallic nanostructures and methods of fabricating same
US8509868B2 (en) * 2011-04-12 2013-08-13 Panasonic Corporation Method for measuring a concentration of a biogenic substance contained in a living body

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Publication number Publication date
JP2014196974A (ja) 2014-10-16

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