JP6039132B2 - 複合媒質からなる試片に対するx線ct画像の最小単位に存在する各純粋媒質の体積比の測定方法 - Google Patents
複合媒質からなる試片に対するx線ct画像の最小単位に存在する各純粋媒質の体積比の測定方法 Download PDFInfo
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- JP6039132B2 JP6039132B2 JP2016513856A JP2016513856A JP6039132B2 JP 6039132 B2 JP6039132 B2 JP 6039132B2 JP 2016513856 A JP2016513856 A JP 2016513856A JP 2016513856 A JP2016513856 A JP 2016513856A JP 6039132 B2 JP6039132 B2 JP 6039132B2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
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Description
Claims (2)
- 複数の種類の純粋媒質が混合されてなる複合媒質からなる試片に対するX線CT撮影において最小単位に該当するそれぞれのボクセルに対し、当該ボクセル内で各純粋媒質が占める体積比を算出する方法であって、
CT撮影装置にてX線を透過してCT撮影を実施することによって複合媒質からなる試片に対するX線ヒストグラムを入手するステップ;
CT撮影にて入手された複合媒質のX線ヒストグラムを代表するGF及びこれを構成する個別的なGFを演算装置で算出するステップ;
それぞれの純粋媒質に対するGFの平均値と、複合媒質のX線ヒストグラムを代表するGFを構成する複数のGFそれぞれの平均値の差(Li,j)を下記の式(3)によって演算し、算出されたLi,j値を用いて、下記の式(4)によって、それぞれのガウス関数でそれぞれの純粋媒質が占める体積比(PRi,j)を算定するステップ;及び
それぞれのボクセル大きさ単位における各純粋媒質の体積比(VF)を下記の式(5)によって算出するステップ;を含むことを特徴とするボクセル内における各純粋媒質の体積比の測定方法。
- 入手されたX線ヒストグラムを代表するGF及びこれを構成する個別的なGFを演算装置で算出するステップは、
入手された複合媒質のX線ヒストグラムの極大点の個数を計数し、各純粋媒質のX線ヒストグラムを代表するGFの平均値を読み取り;
追加の補助GFの個数を決めた後、各補助GFに対する平均値を決め、GF全体の和からなる複合媒質の仮GFを算出し;
算出された仮GFのうちの、CT撮影で入手したX線ヒストグラムとの複数の水平軸値に対する対応の垂直軸値の誤差が最小になるGFを、複合媒質のX線ヒストグラムを代表するGFとして採用することで実施されることを特徴とする請求項1に記載のボクセル内における各純粋媒質の体積比の測定方法。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR20130114407A KR101370496B1 (ko) | 2013-09-26 | 2013-09-26 | 복합매질로 이루어진 시편에 대한 X-ray CT 영상의 최소 단위에 존재하는 각 순수매질의 부피비 측정방법 |
KR10-2013-0114407 | 2013-09-26 | ||
PCT/KR2013/011794 WO2015046668A1 (ko) | 2013-09-26 | 2013-12-18 | 복합매질로 이루어진 시편에 대한 X-ray CT 영상의 최소 단위에 존재하는 각 순수매질의 부피비 측정방법 |
Publications (2)
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JP2016522720A JP2016522720A (ja) | 2016-08-04 |
JP6039132B2 true JP6039132B2 (ja) | 2016-12-07 |
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JP2016513856A Expired - Fee Related JP6039132B2 (ja) | 2013-09-26 | 2013-12-18 | 複合媒質からなる試片に対するx線ct画像の最小単位に存在する各純粋媒質の体積比の測定方法 |
Country Status (4)
Country | Link |
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US (1) | US20160011125A1 (ja) |
JP (1) | JP6039132B2 (ja) |
KR (1) | KR101370496B1 (ja) |
WO (1) | WO2015046668A1 (ja) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
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KR101646022B1 (ko) | 2014-06-10 | 2016-08-08 | 한국건설기술연구원 | 3D X-ray CT 촬영을 이용한 재료의 이방성 측정방법 |
JP6595910B2 (ja) * | 2015-12-28 | 2019-10-23 | キヤノン株式会社 | Ct装置、ct撮影方法及びプログラム |
JP6946935B2 (ja) * | 2017-10-30 | 2021-10-13 | 日本製鉄株式会社 | 気孔率推定方法及び気孔率推定装置 |
JP7234821B2 (ja) * | 2019-02-13 | 2023-03-08 | 住友金属鉱山株式会社 | 粉末試料の分析方法、x線ct測定用試料の作製方法およびx線ct測定用試料 |
KR102177448B1 (ko) * | 2019-08-13 | 2020-11-11 | 연세대학교 산학협력단 | X-선 ct 이미지 및 공극 크기 분포를 이용한 다공성 재료 또는 균열 재료의 3차원 유동 평가 방법 |
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US6343936B1 (en) | 1996-09-16 | 2002-02-05 | The Research Foundation Of State University Of New York | System and method for performing a three-dimensional virtual examination, navigation and visualization |
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JP3534009B2 (ja) * | 1999-09-24 | 2004-06-07 | 日本電気株式会社 | 輪郭抽出方法及び装置 |
JP3649328B2 (ja) * | 2002-04-10 | 2005-05-18 | 日本電気株式会社 | 画像領域抽出方法および装置 |
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WO2005010206A1 (ja) * | 2003-07-29 | 2005-02-03 | Nec Corporation | 染色体状態の評価方法および評価システム |
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- 2013-09-26 KR KR20130114407A patent/KR101370496B1/ko active IP Right Grant
- 2013-12-18 WO PCT/KR2013/011794 patent/WO2015046668A1/ko active Application Filing
- 2013-12-18 JP JP2016513856A patent/JP6039132B2/ja not_active Expired - Fee Related
- 2013-12-18 US US14/771,793 patent/US20160011125A1/en not_active Abandoned
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Publication number | Publication date |
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US20160011125A1 (en) | 2016-01-14 |
JP2016522720A (ja) | 2016-08-04 |
KR101370496B1 (ko) | 2014-03-06 |
WO2015046668A1 (ko) | 2015-04-02 |
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