JP6013370B2 - 適応性のあるデータインターフェイスおよび電源用インターフェイスを備えた電子デバイス - Google Patents

適応性のあるデータインターフェイスおよび電源用インターフェイスを備えた電子デバイス Download PDF

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JP6013370B2
JP6013370B2 JP2013552564A JP2013552564A JP6013370B2 JP 6013370 B2 JP6013370 B2 JP 6013370B2 JP 2013552564 A JP2013552564 A JP 2013552564A JP 2013552564 A JP2013552564 A JP 2013552564A JP 6013370 B2 JP6013370 B2 JP 6013370B2
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data
module
signal
predetermined
power supply
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Japanese (ja)
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JP2014504772A (ja
JP2014504772A5 (enExample
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ワーネック，ティモシー，ジェイ
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Semiconductor Components Industries LLC
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Semiconductor Components Industries LLC
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
    • G01D18/008—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00 with calibration coefficients stored in memory
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/04—Voltage dividers

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Power Sources (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
JP2013552564A 2011-02-04 2012-01-27 適応性のあるデータインターフェイスおよび電源用インターフェイスを備えた電子デバイス Active JP6013370B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201161439704P 2011-02-04 2011-02-04
US61/439,704 2011-02-04
US13/114,935 US9329063B2 (en) 2011-02-04 2011-05-24 Electronic device with flexible data and power interface
US13/114,935 2011-05-24
PCT/US2012/022991 WO2012106213A1 (en) 2011-02-04 2012-01-27 Electonic device with flexible data and power interface

Publications (3)

Publication Number Publication Date
JP2014504772A JP2014504772A (ja) 2014-02-24
JP2014504772A5 JP2014504772A5 (enExample) 2015-03-05
JP6013370B2 true JP6013370B2 (ja) 2016-10-25

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JP2013552564A Active JP6013370B2 (ja) 2011-02-04 2012-01-27 適応性のあるデータインターフェイスおよび電源用インターフェイスを備えた電子デバイス

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US (3) US9329063B2 (enExample)
EP (1) EP2671053B1 (enExample)
JP (1) JP6013370B2 (enExample)
CN (1) CN103339477B (enExample)
WO (1) WO2012106213A1 (enExample)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9329063B2 (en) * 2011-02-04 2016-05-03 Semiconductor Components Industries, Llc Electronic device with flexible data and power interface
US8878518B2 (en) 2012-08-03 2014-11-04 Panasonic Corporation Sensor device and sensor interface
DE102015215801A1 (de) * 2015-08-19 2017-02-23 Siemens Aktiengesellschaft Eigenversorgte Messvorrichtung und Messverfahren
DE102015221372A1 (de) * 2015-11-02 2017-05-04 Robert Bosch Gmbh Verfahren zur Aktivierung eines Konfigurationsmodus eines Geräts
JP6702413B2 (ja) * 2016-06-03 2020-06-03 富士電機株式会社 半導体装置
US10365304B2 (en) * 2017-10-06 2019-07-30 Ge Aviation Systems Llc Discrete input determining circuit and method
JP6750795B2 (ja) * 2018-03-14 2020-09-02 Ｎｅｃプラットフォームズ株式会社 時刻同期システム、時刻同期方法および時刻同期プログラム
CN109245756B (zh) * 2018-11-07 2023-10-03 深圳讯达微电子科技有限公司 一种减小电源域切换噪声的方法及芯片输出接口电路
CN109738690A (zh) * 2019-01-03 2019-05-10 展鹏科技股份有限公司 一种检测功率配置等级的方法和设备
CN115979322B (zh) * 2022-12-28 2025-09-09 湖南菲尔斯特传感器有限公司 模拟量传感器及其标定装置与标定方法
US20250087994A1 (en) * 2023-09-11 2025-03-13 Semiconductor Components Industries, Llc Surge protector and surge protection method

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US4224539A (en) * 1978-09-05 1980-09-23 Motorola, Inc. FET Voltage level detecting circuit
US4520488A (en) * 1981-03-02 1985-05-28 Honeywell, Inc. Communication system and method
US5805466A (en) 1996-11-27 1998-09-08 Motorola Inc. Device and method for calibrating a signal
JP4000629B2 (ja) * 1997-07-14 2007-10-31 松下電器産業株式会社 調整機能付きセンサ
WO1999004226A1 (en) * 1997-07-14 1999-01-28 Matsushita Electric Industrial Co., Ltd. Sensor provided with adjusting function
US6497146B1 (en) 2000-09-15 2002-12-24 Bei Technologies, Inc. Inertial rate sensor and method with built-in testing
JP4531959B2 (ja) * 2000-09-29 2010-08-25 三菱電機株式会社 電力線搬送通信装置
US7180798B2 (en) 2001-04-12 2007-02-20 Fuji Electric Co., Ltd. Semiconductor physical quantity sensing device
JP4764996B2 (ja) * 2001-04-12 2011-09-07 富士電機株式会社 半導体物理量センサ装置
US8421588B1 (en) * 2004-06-23 2013-04-16 Wireless Telematics Llc Combination wireless electrical apparatus controller and energy monitoring device and method of use
JP4244886B2 (ja) * 2004-08-31 2009-03-25 株式会社デンソー センサ回路
US7526693B1 (en) 2006-03-09 2009-04-28 Semiconductor Components Industries, Llc Initial decision-point circuit operation mode
JP2008257773A (ja) * 2007-04-02 2008-10-23 Toshiba Corp 不揮発性半導体記憶装置、不揮発性半導体記憶装置の制御方法、不揮発性半導体記憶システム、及びメモリカード
CN201188045Y (zh) * 2008-03-03 2009-01-28 中冶赛迪工程技术股份有限公司 一种用于多种传感器快速检测的便携式装置
CN201653448U (zh) * 2010-03-24 2010-11-24 国网电力科学研究院 一种具有人工比测功能的传感器自动采集装置
US9329063B2 (en) * 2011-02-04 2016-05-03 Semiconductor Components Industries, Llc Electronic device with flexible data and power interface

Also Published As

Publication number Publication date
US10215832B2 (en) 2019-02-26
CN103339477A (zh) 2013-10-02
US9329063B2 (en) 2016-05-03
US20160238687A1 (en) 2016-08-18
EP2671053A1 (en) 2013-12-11
US9921288B2 (en) 2018-03-20
US20180188345A1 (en) 2018-07-05
JP2014504772A (ja) 2014-02-24
WO2012106213A1 (en) 2012-08-09
US20120198908A1 (en) 2012-08-09
CN103339477B (zh) 2016-06-15
EP2671053B1 (en) 2016-03-16

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