JP5979829B2 - 試験測定装置及び測定方法 - Google Patents

試験測定装置及び測定方法 Download PDF

Info

Publication number
JP5979829B2
JP5979829B2 JP2011175800A JP2011175800A JP5979829B2 JP 5979829 B2 JP5979829 B2 JP 5979829B2 JP 2011175800 A JP2011175800 A JP 2011175800A JP 2011175800 A JP2011175800 A JP 2011175800A JP 5979829 B2 JP5979829 B2 JP 5979829B2
Authority
JP
Japan
Prior art keywords
trace
frequency
measurement
time domain
versus time
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2011175800A
Other languages
English (en)
Japanese (ja)
Other versions
JP2012042466A5 (enExample
JP2012042466A (ja
Inventor
ケネス・ピー・ドビンズ
ガリー・ジェイ・ワルドー
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Inc
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Publication of JP2012042466A publication Critical patent/JP2012042466A/ja
Publication of JP2012042466A5 publication Critical patent/JP2012042466A5/ja
Application granted granted Critical
Publication of JP5979829B2 publication Critical patent/JP5979829B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/02—Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form
    • G01R13/0218—Circuits therefor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)
  • Measuring Frequencies, Analyzing Spectra (AREA)
  • Digital Transmission Methods That Use Modulated Carrier Waves (AREA)
JP2011175800A 2010-08-13 2011-08-11 試験測定装置及び測定方法 Active JP5979829B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US12/856,483 2010-08-13
US12/856,483 US8461850B2 (en) 2010-08-13 2010-08-13 Time-domain measurements in a test and measurement instrument

Publications (3)

Publication Number Publication Date
JP2012042466A JP2012042466A (ja) 2012-03-01
JP2012042466A5 JP2012042466A5 (enExample) 2015-03-12
JP5979829B2 true JP5979829B2 (ja) 2016-08-31

Family

ID=44677773

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011175800A Active JP5979829B2 (ja) 2010-08-13 2011-08-11 試験測定装置及び測定方法

Country Status (4)

Country Link
US (1) US8461850B2 (enExample)
EP (1) EP2418497B1 (enExample)
JP (1) JP5979829B2 (enExample)
CN (1) CN102419389B (enExample)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8615382B2 (en) * 2011-01-27 2013-12-24 Tektronix, Inc. Test and measurement instrument with common presentation of time domain data
DE102011075669A1 (de) 2011-05-11 2012-11-15 Rohde & Schwarz Gmbh & Co. Kg Signalanalyse in Zeit und Frequenz
US20120306886A1 (en) * 2011-06-02 2012-12-06 Tektronix, Inc Continuous rf signal visualization with high resolution
US9207269B2 (en) * 2012-05-22 2015-12-08 Tektronix, Inc. Automatically detecting in-band but out-of-span power in a frequency-domain test and measurement instrument
US9134347B2 (en) * 2012-10-01 2015-09-15 Tektronix, Inc. Rare anomaly triggering in a test and measurement instrument
US9304148B2 (en) * 2012-10-23 2016-04-05 Tektronix, Inc. Internal chirp generator with time aligned acquisition in a mixed-domain oscilloscope
CN103837740A (zh) * 2013-12-25 2014-06-04 北京航天测控技术有限公司 一种高精度数字瞬时测频方法及装置
CN106443177A (zh) * 2016-08-15 2017-02-22 中国电子科技集团公司第四十研究所 一种宽带宽频率捷变信号测量仪器及测量方法
RU2622232C1 (ru) * 2016-08-30 2017-06-13 Федеральное государственное унитарное предприятие "18 Центральный научно-исследовательский институт" Министерства обороны Российской Федерации Двухканальное устройство измерения амплитудно-временных и частотных параметров сигналов
US10962575B2 (en) * 2017-08-25 2021-03-30 Rohde & Schwarz Gmbh & Co. Kg Multi-domain measurement system as well as use of a multi-domain measurement system
USD947693S1 (en) 2019-09-20 2022-04-05 Tektronix, Inc. Measurement probe head assembly
CN115112972A (zh) * 2022-06-17 2022-09-27 太仓市同维电子有限公司 基于labview编程实现自动化测试时域和频域信号间时序的方法
CN115856424A (zh) * 2023-03-01 2023-03-28 西安瀚博电子科技有限公司 基于峰邻比值的信号频率与幅度自适应提取方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5499391A (en) * 1994-06-30 1996-03-12 The United States Of America As Represented By The Secretary Of The Air Force Digital channelized IFM receiver
US6026418A (en) * 1996-10-28 2000-02-15 Mcdonnell Douglas Corporation Frequency measurement method and associated apparatus
JP3377391B2 (ja) * 1997-02-12 2003-02-17 日本テクトロニクス株式会社 リアルタイム信号アナライザ
JP4813774B2 (ja) * 2004-05-18 2011-11-09 テクトロニクス・インターナショナル・セールス・ゲーエムベーハー 周波数分析装置の表示方法
US7620509B2 (en) * 2005-11-03 2009-11-17 Tektronix, Inc. Detection of time-frequency codes using a spectrogram
US7298129B2 (en) * 2005-11-04 2007-11-20 Tektronix, Inc. Time arbitrary signal power statistics measurement device and method
JP5750213B2 (ja) * 2005-11-04 2015-07-15 テクトロニクス・インコーポレイテッドＴｅｋｔｒｏｎｉｘ，Ｉｎｃ． スペクトラム分析方法
US8233569B2 (en) * 2006-09-28 2012-07-31 Tektronix, Inc. Realtime spectrum trigger system on realtime oscilloscope
CN101520500A (zh) * 2008-02-27 2009-09-02 特克特朗尼克公司 用于执行外部校正的系统和方法

Also Published As

Publication number Publication date
EP2418497B1 (en) 2020-10-07
CN102419389A (zh) 2012-04-18
US8461850B2 (en) 2013-06-11
US20120038369A1 (en) 2012-02-16
EP2418497A3 (en) 2017-06-28
JP2012042466A (ja) 2012-03-01
CN102419389B (zh) 2016-08-03
EP2418497A2 (en) 2012-02-15

Similar Documents

Publication Publication Date Title
JP5979829B2 (ja) 試験測定装置及び測定方法
CN102411092B (zh) 测试和测量仪器中的时域触发
JP3942790B2 (ja) 信号分析装置
US8514919B2 (en) Synthetic instrument unit
EP2518518A2 (en) Method for automatically setting frequency span in a spectrum analyzer
JP5995450B2 (ja) 試験測定装置及び時間領域情報表示方法
JP6267409B2 (ja) 試験測定装置及びイベント検索方法
JP5189767B2 (ja) 周波数追跡を用いて電波干渉レベルを測定する方法および装置
JP2022173145A (ja) 試験測定装置及び波形サンプリング方法
US9851383B1 (en) Method and system for performing vector spectral measurements of a radio frequency (RF) signal having a repetitive waveform
US20130285673A1 (en) System and method for low voltage differential signaling test
US11255900B2 (en) System and method for measuring repetitive complex and pulse modulated RF signals
CN102932287B (zh) 测试和测量仪器中的时域搜索
US20240069081A1 (en) Signal analysis for computing a complementary cumulative distribution function
US20120053875A1 (en) Re-sampling acquired data to prevent coherent sampling artifacts
CN119395342A (zh) 数字示波器中复杂信号的多域同步实时分析显示方法
Hu et al. A remote automatic test system with high precision for AIS performance
Sarson et al. Group delay measurement of frequency down-converter devices using chirped RF modulated signal
Lecklider Transforming EMI measurements.
Lecklider Freedom of choice in the frequency domain.
Angrisani et al. A new digital-signal processing method for transmitter transient measurements
Lecklider Fast ADCs and PCs fuel instrument evolution.

Legal Events

Date Code Title Description
A625 Written request for application examination (by other person)

Free format text: JAPANESE INTERMEDIATE CODE: A625

Effective date: 20140801

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20150121

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20150521

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20150609

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20150908

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20151008

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20151106

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20151209

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20160607

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20160726

R150 Certificate of patent or registration of utility model

Ref document number: 5979829

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250