JP5971184B2 - イメージング質量分析データ処理方法及びイメージング質量分析装置 - Google Patents

イメージング質量分析データ処理方法及びイメージング質量分析装置 Download PDF

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JP5971184B2
JP5971184B2 JP2013089399A JP2013089399A JP5971184B2 JP 5971184 B2 JP5971184 B2 JP 5971184B2 JP 2013089399 A JP2013089399 A JP 2013089399A JP 2013089399 A JP2013089399 A JP 2013089399A JP 5971184 B2 JP5971184 B2 JP 5971184B2
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mass
data
imaging
charge ratio
mass spectrometry
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JP2014215043A5 (enExample
JP2014215043A (ja
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将弘 池上
将弘 池上
梶原　茂樹
茂樹 梶原
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Shimadzu Corp
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Shimadzu Corp
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Priority to JP2013089399A priority Critical patent/JP5971184B2/ja
Priority to US14/257,025 priority patent/US10312067B2/en
Priority to CN201610848369.7A priority patent/CN107068530B/zh
Priority to CN201410163234.8A priority patent/CN104112643B/zh
Priority to CN202010799402.8A priority patent/CN111952145B/zh
Priority to EP14165384.0A priority patent/EP2797104B1/en
Publication of JP2014215043A publication Critical patent/JP2014215043A/ja
Publication of JP2014215043A5 publication Critical patent/JP2014215043A5/ja
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0004—Imaging particle spectrometry
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H01J49/0036—Step by step routines describing the handling of the data generated during a measurement

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2013089399A 2013-04-22 2013-04-22 イメージング質量分析データ処理方法及びイメージング質量分析装置 Active JP5971184B2 (ja)

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Application Number Priority Date Filing Date Title
JP2013089399A JP5971184B2 (ja) 2013-04-22 2013-04-22 イメージング質量分析データ処理方法及びイメージング質量分析装置
US14/257,025 US10312067B2 (en) 2013-04-22 2014-04-21 Imaging mass analysis data processing method and imaging mass spectrometer
CN201410163234.8A CN104112643B (zh) 2013-04-22 2014-04-22 成像质量分析数据处理方法以及成像质量分析装置
CN202010799402.8A CN111952145B (zh) 2013-04-22 2014-04-22 成像质量分析数据处理方法以及成像质量分析装置
CN201610848369.7A CN107068530B (zh) 2013-04-22 2014-04-22 成像质量分析数据处理方法以及成像质量分析装置
EP14165384.0A EP2797104B1 (en) 2013-04-22 2014-04-22 Imaging mass analysis data processing method and imaging mass spectrometer

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JP2013089399A JP5971184B2 (ja) 2013-04-22 2013-04-22 イメージング質量分析データ処理方法及びイメージング質量分析装置

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JP2014215043A JP2014215043A (ja) 2014-11-17
JP2014215043A5 JP2014215043A5 (enExample) 2015-08-13
JP5971184B2 true JP5971184B2 (ja) 2016-08-17

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US (1) US10312067B2 (enExample)
EP (1) EP2797104B1 (enExample)
JP (1) JP5971184B2 (enExample)
CN (3) CN104112643B (enExample)

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JP6477878B2 (ja) * 2015-07-01 2019-03-06 株式会社島津製作所 データ処理装置
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JP6477833B2 (ja) * 2017-11-06 2019-03-06 株式会社島津製作所 データ処理装置
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JP2023102092A (ja) * 2022-01-11 2023-07-24 トヨタ自動車株式会社 データ解析システム、データ解析装置およびデータ解析プログラム

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Also Published As

Publication number Publication date
EP2797104A3 (en) 2016-04-27
EP2797104A2 (en) 2014-10-29
CN107068530A (zh) 2017-08-18
CN104112643B (zh) 2017-01-04
CN104112643A (zh) 2014-10-22
US10312067B2 (en) 2019-06-04
US20140316717A1 (en) 2014-10-23
JP2014215043A (ja) 2014-11-17
CN107068530B (zh) 2020-07-14
CN111952145B (zh) 2024-04-19
EP2797104B1 (en) 2019-11-20
CN111952145A (zh) 2020-11-17

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