JP5925422B2 - Joint terminal and manufacturing method thereof - Google Patents
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- JP5925422B2 JP5925422B2 JP2011072211A JP2011072211A JP5925422B2 JP 5925422 B2 JP5925422 B2 JP 5925422B2 JP 2011072211 A JP2011072211 A JP 2011072211A JP 2011072211 A JP2011072211 A JP 2011072211A JP 5925422 B2 JP5925422 B2 JP 5925422B2
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- 238000004519 manufacturing process Methods 0.000 title claims description 14
- 238000007747 plating Methods 0.000 claims description 62
- 239000000758 substrate Substances 0.000 claims description 55
- 239000000463 material Substances 0.000 claims description 21
- 238000005452 bending Methods 0.000 claims description 2
- 238000003825 pressing Methods 0.000 claims description 2
- 238000000034 method Methods 0.000 description 19
- 238000005476 soldering Methods 0.000 description 7
- 229910000679 solder Inorganic materials 0.000 description 6
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 4
- 229910000881 Cu alloy Inorganic materials 0.000 description 4
- 230000000052 comparative effect Effects 0.000 description 4
- 229910052802 copper Inorganic materials 0.000 description 4
- 239000010949 copper Substances 0.000 description 4
- 230000007423 decrease Effects 0.000 description 4
- 238000009826 distribution Methods 0.000 description 4
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 4
- 229910001369 Brass Inorganic materials 0.000 description 2
- 239000010951 brass Substances 0.000 description 2
- 150000001875 compounds Chemical class 0.000 description 2
- 238000005260 corrosion Methods 0.000 description 2
- 230000007797 corrosion Effects 0.000 description 2
- 238000005238 degreasing Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 230000003647 oxidation Effects 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
- 238000005554 pickling Methods 0.000 description 2
- 238000005498 polishing Methods 0.000 description 2
- 238000007781 pre-processing Methods 0.000 description 2
- 239000011347 resin Substances 0.000 description 2
- 229920005989 resin Polymers 0.000 description 2
- 238000005406 washing Methods 0.000 description 2
- 229910017755 Cu-Sn Inorganic materials 0.000 description 1
- -1 Cu-Sn compound Chemical class 0.000 description 1
- 229910017927 Cu—Sn Inorganic materials 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 238000009713 electroplating Methods 0.000 description 1
- LNOPIUAQISRISI-UHFFFAOYSA-N n'-hydroxy-2-propan-2-ylsulfonylethanimidamide Chemical compound CC(C)S(=O)(=O)CC(N)=NO LNOPIUAQISRISI-UHFFFAOYSA-N 0.000 description 1
- 150000007524 organic acids Chemical class 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 238000001878 scanning electron micrograph Methods 0.000 description 1
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- Coupling Device And Connection With Printed Circuit (AREA)
Description
本発明は、ジョイント端子およびその製造方法に関し、特に、表面実装技術によって電子部品を基板の表面に取り付ける際に使用するジョイント端子およびその製造方法に関する。 The present invention relates to a joint terminal and a manufacturing method thereof, and more particularly to a joint terminal used when an electronic component is attached to a surface of a substrate by a surface mounting technique and a manufacturing method thereof.
従来、電子部品を基板に取り付けるために、電子部品を基板の表面に直接はんだ付けする表面実装技術が知られている。この表面実装技術によって電子部品をプリント基板に取り付けるために、一対のジョイント端子の基板接続部(固定部)をプリント基板の表面にはんだ付けして固定した後、これらのジョイント端子の電子部品保持部(圧接部)によって電子部品を挟持して固定する方法が知られている。 Conventionally, in order to attach an electronic component to a substrate, a surface mounting technique for directly soldering the electronic component to the surface of the substrate is known. In order to attach electronic components to the printed circuit board by this surface mounting technology, the board connection parts (fixed parts) of a pair of joint terminals are soldered and fixed to the surface of the printed circuit board, and then the electronic part holding parts of these joint terminals A method is known in which an electronic component is sandwiched and fixed by a (pressure contact portion).
このようなジョイント端子の材料として、耐食性、接触信頼性、はんだ付け性および経済性などの観点から、銅や銅合金などの素材の最外層にSnめっきを施した安価なSnめっき材が広く使用されている。 As such joint terminal materials, inexpensive Sn plating materials in which Sn plating is applied to the outermost layer of materials such as copper and copper alloys are widely used from the viewpoints of corrosion resistance, contact reliability, solderability and economy. Has been.
このSnめっきは、一般に、電気めっきによって行われており、Snめっき材の内部応力を除去してウイスカの発生を抑制するために、Snめっき後に(Snめっき材の表面を加熱してSnを溶融させる)リフロー処理が行われている(例えば、特許文献1参照)。 This Sn plating is generally performed by electroplating. In order to remove internal stress of the Sn plating material and suppress the generation of whiskers, after Sn plating (the surface of the Sn plating material is heated to melt Sn). Reflow processing is performed (see, for example, Patent Document 1).
このようにSnめっき後にリフロー処理を行うと、Snの一部が素材や下地成分に拡散して化合物層(例えば、銅または銅合金からなる素材の場合にはCu−Sn化合物層)を形成し、この化合物層の上に柔らかい溶融凝固組織になったSn層が形成される。この柔らかい溶融凝固組織になったSn層は、優れた接触信頼性、耐食性およびはんだ濡れ性を得るために極めて重要な役割を果たす。 When reflow treatment is performed after Sn plating in this way, a part of Sn diffuses into the material and the base component to form a compound layer (for example, a Cu-Sn compound layer in the case of a material made of copper or a copper alloy). An Sn layer having a soft melt-solidified structure is formed on this compound layer. The Sn layer that has become a soft melt-solidified structure plays an extremely important role in order to obtain excellent contact reliability, corrosion resistance, and solder wettability.
しかし、Snめっき後にリフロー処理を行うと、溶融したSnが表面張力によって素材の中央部に集まり、素材のエッジ部分においてSnめっき皮膜が薄くなって、はんだ濡れ性が低下するという問題がある。特に、リフロー処理を施したSnめっき材をジョイント端子の材料として使用する場合には、ジョイント端子のはんだ付けされる部分である基板接続部のエッジ部分のはんだ濡れ性の低下を抑制する必要がある。 However, when the reflow process is performed after Sn plating, there is a problem that molten Sn gathers at the center of the material due to surface tension, the Sn plating film becomes thin at the edge portion of the material, and solder wettability decreases. In particular, when using a Sn-plated material subjected to reflow treatment as a material for a joint terminal, it is necessary to suppress a decrease in solder wettability at the edge portion of the board connecting portion, which is a soldered portion of the joint terminal. .
したがって、本発明は、このような従来の問題点に鑑み、基板接続部のエッジ部分のはんだ濡れ性の低下を抑制することができる、ジョイント端子およびその製造方法を提供することを目的とする。 Therefore, in view of such a conventional problem, an object of the present invention is to provide a joint terminal and a method for manufacturing the joint terminal, which can suppress a decrease in solder wettability of the edge portion of the board connecting portion.
本発明者らは、上記課題を解決するために鋭意研究した結果、平板状の電子部品保持部とこの電子部品保持部の一端部から電子部品保持部に対して略垂直方向に延びる平板状の基板接続部とからなるジョイント端子の形状にした後、基板接続部の電子部品保持部と反対側の面である基板接続面に複数の微細溝を形成し、その後、Snめっきを施した後にリフロー処理を行うことによって、基板接続部のエッジ部分のはんだ濡れ性の低下を抑制することができることを見出し、本発明を完成するに至った。 As a result of diligent research to solve the above problems, the present inventors have found that a flat plate-like electronic component holding portion and a flat plate-like shape extending from one end of the electronic component holding portion in a substantially vertical direction to the electronic component holding portion. After forming the shape of the joint terminal composed of the substrate connection portion, a plurality of fine grooves are formed in the substrate connection surface on the opposite side of the electronic component holding portion of the substrate connection portion, and then reflow after Sn plating is performed. By performing the treatment, it was found that the decrease in solder wettability of the edge portion of the board connecting portion can be suppressed, and the present invention has been completed.
すなわち、本発明によるジョイント端子の製造方法は、平板状の電子部品保持部とこの電子部品保持部の一端部から電子部品保持部に対して略垂直方向に延びる平板状の基板接続部とからなるジョイント端子の形状にした後、基板接続部の電子部品保持部と反対側の面である基板接続面に複数の微細溝を形成し、その後、Snめっきを施した後にリフロー処理を行うことを特徴とする。 In other words, the joint terminal manufacturing method according to the present invention includes a flat plate-like electronic component holding portion and a flat plate-like substrate connecting portion extending from one end of the electronic component holding portion in a direction substantially perpendicular to the electronic component holding portion. After forming the shape of the joint terminal, a plurality of fine grooves are formed on the substrate connection surface, which is the surface opposite to the electronic component holding portion of the substrate connection portion, and then reflow processing is performed after Sn plating is performed. And
このジョイント端子の製造方法において、ジョイント端子の形状が、素材としての板材をプレスおよび曲げ加工することにより形成された形状であるのが好ましい。また、複数の微細溝が、基板接続面の幅方向両側のエッジ部分に形成されるのが好ましく、基板接続面の長手方向一端部から他端部まで全長にわたって長手方向に延びるのが好ましい。また、複数の微細溝が、それぞれ幅20〜100μm、深さ0.1〜10μmの微細溝であり、ピッチ20〜150μmで離間して配置されるのが好ましい。さらに、Snめっきを施すことにより、厚さ2〜8μmのSnめっき皮膜を形成するのが好ましい。 In this joint terminal manufacturing method, the shape of the joint terminal is preferably a shape formed by pressing and bending a plate material as a material. The plurality of fine grooves are preferably formed at the edge portions on both sides in the width direction of the substrate connection surface, and preferably extend in the longitudinal direction over the entire length from one end portion to the other end portion in the longitudinal direction of the substrate connection surface. Moreover, it is preferable that the plurality of fine grooves are fine grooves each having a width of 20 to 100 μm and a depth of 0.1 to 10 μm, and spaced apart with a pitch of 20 to 150 μm. Furthermore, it is preferable to form a Sn plating film having a thickness of 2 to 8 μm by performing Sn plating.
また、本発明によるジョイント端子は、平板状の電子部品保持部とこの電子部品保持部の一端部から電子部品保持部に対して略垂直方向に延びる平板状の基板接続部とからなるジョイント端において、基板接続部の電子部品保持部と反対側の面である基板接続面に複数の微細溝が形成され、表面にSnめっき皮膜が形成された後にリフロー処理が施されていることを特徴とする。 Further, the joint terminal according to the present invention is a joint end composed of a flat plate-like electronic component holding portion and a flat plate-like board connecting portion extending from one end portion of the electronic component holding portion in a direction substantially perpendicular to the electronic component holding portion. A plurality of fine grooves are formed on the substrate connection surface, which is the surface opposite to the electronic component holding portion of the substrate connection portion, and a reflow process is performed after the Sn plating film is formed on the surface. .
このジョイント端子において、複数の微細溝が、基板接続面の幅方向両側のエッジ部分に形成されているのが好ましく、基板接続面の長手方向一端部から他端部まで全長にわたって長手方向に延びているのが好ましい。また、複数の微細溝が、それぞれ幅20〜100μm、深さ0.1〜10μmの微細溝であり、ピッチ20〜150μmで離間して配置されているのが好ましい。また、Snめっき皮膜の厚さが2〜8μmであるのが好ましい。 In this joint terminal, it is preferable that a plurality of fine grooves are formed at the edge portions on both sides in the width direction of the substrate connection surface, and extend in the longitudinal direction over the entire length from one end to the other end in the longitudinal direction of the substrate connection surface. It is preferable. Moreover, it is preferable that the plurality of fine grooves are fine grooves each having a width of 20 to 100 μm and a depth of 0.1 to 10 μm, and spaced apart with a pitch of 20 to 150 μm. Moreover, it is preferable that the thickness of Sn plating film is 2-8 micrometers.
本発明によれば、ジョイント端子の基板接続部のエッジ部分のはんだ濡れ性の低下を抑制することができる。 ADVANTAGE OF THE INVENTION According to this invention, the fall of the solder wettability of the edge part of the board | substrate connection part of a joint terminal can be suppressed.
以下、添付図面を参照して、本発明によるジョイント端子およびその製造方法の実施の形態について説明する。 Embodiments of a joint terminal and a method for manufacturing the joint terminal according to the present invention will be described below with reference to the accompanying drawings.
図1に示すように、本発明によるジョイント端子10の実施の形態は、略矩形の平板状の電子部品保持部(圧接部)12と、この電子部品保持部12の一端部を略垂直に曲げ加工して略L字形になるように形成された略矩形の平板状の基板接続部(固定部)14とからなる。電子部品保持部12の基板接続部14と反対側の面は、電子部品保持面(圧接面)12aになり、基板接続部14の電子部品保持部12と反対側の面は、基板接続面(固定面)14aになる。
As shown in FIG. 1, an embodiment of a
図2に示すように、基板接続部14の基板接続面14aの(長手方向および厚さ方向に対して垂直な)幅方向両側のエッジ部分(エッジから所定の幅の領域)には、基板接続面14aの長手方向一端部から他端部まで全長にわたって長手方向に延びる(幅20〜100μm、深さ0.1〜10μm、ピッチ20〜150μmの)複数の微細溝14bが形成されている。なお、これらの微細溝14bは、基板接続面14aのエッジ部分だけでなく、基板接続面14aの全面に形成してもよい。
As shown in FIG. 2, the board connection is made at the edge portions (regions having a predetermined width from the edge) on both sides in the width direction (perpendicular to the longitudinal direction and the thickness direction) of the
このように基板接続面14aに微細溝14bが形成されたジョイント端子10は、銅や銅合金などからなる素材上に、Niめっきにより厚さ0.5〜2.0μmのNiめっき皮膜が形成され、その上にSnめっきにより厚さ2〜8μmのSnめっき皮膜が形成された後に、リフロー処理が施されている。
In this way, the
図3に示すように、表面実装技術によって電子部品20を基板30に取り付ける場合には、一対のジョイント端子10基板接続部14を基板30の表面にはんだ付けして固定した後、これらのジョイント端子10の電子部品保持部12によって電子部品20を挟持して固定する。
As shown in FIG. 3, when the
本発明によるジョイント端子10の製造方法の実施の形態では、まず、素材として銅や銅合金などからなる板材を用意し、この板材をプレスおよび曲げ加工することにより、略矩形の平板状の基板接続部14が略矩形の平板状の電子部品保持部12の一端部から略垂直に立ち上がった略L字形のジョイント端子10の形状にする。
In the embodiment of the method for manufacturing the
次に、このジョイント端子10を固定し、ジョイント端子10の基板接続部14の底面である基板接続面14aの幅方向両側のエッジ部分(エッジから幅方向に0.2mmまでの領域)に、1〜10Nの荷重をかけながら金ヤスリを基板接続面14aの長手方向に1回または複数回(本実施の形態では5回以下)擦り合わせて、基板接続面14aの長手方向一端部から他端部まで全長にわたって長手方向に延びる(幅20〜100μm、深さ0.1〜10μm、ピッチ20〜150μm程度の)複数の微細溝14bを形成する。なお、これらの微細溝14bは、基板接続面14aのエッジ部分だけでなく、基板接続面14aの全面に形成してもよい。
Next, the
次に、微細溝14bを形成したジョイント端子10のめっきの前処理として脱脂および酸洗を行った後、Niめっきを行って厚さ0.5〜2.0μmのNiめっき皮膜を形成し、次いで、Snめっきを行って厚さ2〜8μmのSnめっき皮膜を形成する。
Next, after performing degreasing and pickling as pretreatment of plating of the
次に、これらのめっきを施したジョイント端子10の酸化防止処理および湯洗を行った後、エアブローなどにより乾燥させ、その後、大気中において温度500〜650℃の炉内に0.5〜2秒間保持することによってリフロー処理を行う。
Next, after performing the oxidation prevention treatment and hot water washing of the
なお、前処理、めっきおよび中間処理の各工程の間には水洗を行うのが好ましい。 In addition, it is preferable to wash with water between each process of pre-processing, plating, and an intermediate process.
以下、本発明によるジョイント端子およびその製造方法の実施例について詳細に説明する。 Hereinafter, embodiments of the joint terminal and the manufacturing method thereof according to the present invention will be described in detail.
[実施例]
まず、素材として厚さ0.5mmの黄銅板材を用意し、この黄銅板材をプレスおよび曲げ加工することにより、電子部品保持部(圧接部)の大きさが幅5mm×高さ6mmで、基板接続部(固定部)の底面である基板接続面(固定面)が1mm×5mmの大きさのジョイント端子の形状(図1に示す形状)にした。なお、ジョイント端子の基板接続部の底面である基板接続面のエッジ部分の面取り加工は行わなかった。
[Example]
First, a brass plate material having a thickness of 0.5 mm is prepared as a raw material, and this brass plate material is pressed and bent so that the size of the electronic component holding portion (pressure contact portion) is 5 mm wide × 6 mm high, and is connected to the board. The substrate connection surface (fixed surface), which is the bottom surface of the portion (fixed portion), was formed into a joint terminal shape (shape shown in FIG. 1) having a size of 1 mm × 5 mm. In addition, the chamfering process of the edge part of the board | substrate connection surface which is a bottom face of the board | substrate connection part of a joint terminal was not performed.
次に、このジョイント端子を固定し、図2に示すように、ジョイント端子の基板接続部の底面である基板接続面の幅方向両側のエッジ部分(エッジから幅方向に0.2mmまでの領域)に、1〜10Nの荷重をかけながら金ヤスリを基板接続面の長手方向に1回擦り合わせて、基板接続面の長手方向一端部から他端部まで全長にわたって基板接続面の長手方向に延びる微細溝をそれぞれ10本程度形成した。これらの微細溝の幅、深さおよびピッチを200倍の倍率でレーザー顕微鏡を用いて測定したところ、微細溝の幅は20〜100μm、深さは0.1〜10μm、ピッチは20〜150μmであった。 Next, the joint terminal is fixed, and as shown in FIG. 2, edge portions on both sides in the width direction of the board connection surface, which is the bottom surface of the board connection portion of the joint terminal (region from the edge to 0.2 mm in the width direction). In addition, the metal file is rubbed once in the longitudinal direction of the substrate connection surface while applying a load of 1 to 10 N, and the fineness extending in the longitudinal direction of the substrate connection surface over the entire length from one end to the other end in the longitudinal direction of the substrate connection surface About 10 grooves each were formed. When the width, depth and pitch of these fine grooves were measured with a laser microscope at a magnification of 200 times, the width of the fine grooves was 20 to 100 μm, the depth was 0.1 to 10 μm, and the pitch was 20 to 150 μm. there were.
次に、微細溝を形成したジョイント端子のめっきの前処理として脱脂および酸洗を行った後、スルファミン酸浴により電流密度5A/dm2でNiめっきを行って、厚さ1μmになるようにNiめっき皮膜を形成し、次いで、有機酸めっき浴により電流密度5A/dm2でSnめっきを行って、厚さ3.5μmになるようにSnめっき皮膜を形成した。なお、これらのめっきは、複数のジョイント端子をキャリアによって連結した状態でフープめっきによって行った。 Next, degreasing and pickling are performed as pretreatment for plating the joint terminals in which fine grooves are formed, and then Ni plating is performed with a sulfamic acid bath at a current density of 5 A / dm 2 so that the thickness becomes 1 μm. A plating film was formed, and then Sn plating was performed with an organic acid plating bath at a current density of 5 A / dm 2 to form a Sn plating film having a thickness of 3.5 μm. In addition, these plating was performed by the hoop plating in the state which connected the some joint terminal with the carrier.
このようにしてNiめっきとSnめっきを施したジョイント端子について、基板接続部の底面である基板接続面のNiめっき皮膜およびSnめっき皮膜の厚さを測定した。Niめっき皮膜の厚さは、蛍光X線膜厚計を用いて測定し、Snめっき皮膜の厚さは、ジョイント端子を樹脂に埋めて、ジョイント端子を樹脂とともに(基板接続面の)長手方向一端から1mmの位置で長手方向に対して垂直に切断し、切断面を湿式研磨(番号#80、#400、#1000および#2000をこの順で使用して研磨)およびバフ研磨(アルミナ研磨剤を用いて鏡面仕上げ)して走査型電子顕微鏡(SEM)により3000倍で観察し、そのSEM画像から直接厚さを測定した。その結果、下地のNiめっき皮膜の厚さは1μmであり、Snめっき皮膜の厚さは、エッジから幅方向に0.01mmの部分(エッジ部)では3.5μm、エッジから幅方向に0.5mmの部分(中央部)では3.5μmであった。 Thus, about the joint terminal which gave Ni plating and Sn plating, the thickness of the Ni plating film and Sn plating film of the board | substrate connection surface which is a bottom face of a board | substrate connection part was measured. The thickness of the Ni plating film is measured using a fluorescent X-ray film thickness meter, and the thickness of the Sn plating film is one end in the longitudinal direction (of the board connection surface) with the joint terminal embedded in the resin and the joint terminal together with the resin. And cut perpendicularly to the longitudinal direction at a position of 1 mm from the surface, and wet-polishing (polishing using numbers # 80, # 400, # 1000 and # 2000 in this order) and buffing (alumina abrasive) And mirror-finished) and observed with a scanning electron microscope (SEM) at a magnification of 3000, and the thickness was directly measured from the SEM image. As a result, the thickness of the underlying Ni plating film is 1 μm, and the thickness of the Sn plating film is 3.5 μm at the portion (edge portion) of 0.01 mm in the width direction from the edge, and is 0.00 μm in the width direction from the edge. It was 3.5 μm at the 5 mm portion (central portion).
次に、これらのめっきを施したジョイント端子の酸化防止処理および湯洗を行った後、エアブローにより乾燥させ、その後、大気中において温度550℃の炉内に1秒間保持することによってリフロー処理を行った。 Next, after oxidation treatment and hot water washing of these plated joint terminals, they were dried by air blow, and then reflow treatment was performed by holding them in a furnace at a temperature of 550 ° C. for 1 second in the atmosphere. It was.
なお、前処理、めっきおよび中間処理の各工程の間では水洗を行った。 In addition, it washed with water between each process of pre-processing, plating, and an intermediate process.
このようにしてリフロー処理を施したジョイント端子について、基板接続部の底面である基板接続面のSnめっき皮膜の厚さを上記と同様の方法で測定した。その結果、Snめっき皮膜の厚さは、エッジから幅方向に0.01mmの部分(エッジ部)では2.7μm、エッジから幅方向に0.5mmの部分(中央部)では3.7μmであり、膜厚分布の均一性の指標としての(エッジ部の厚さ)/(中央部の厚さ)の比は0.73であった。また、はんだ付け強度は非常に良好であった。 Thus, about the joint terminal which performed the reflow process, the thickness of the Sn plating film of the board | substrate connection surface which is a bottom face of a board | substrate connection part was measured by the method similar to the above. As a result, the thickness of the Sn plating film was 2.7 μm at the 0.01 mm portion (edge portion) in the width direction from the edge, and 3.7 μm at the 0.5 mm portion (center portion) from the edge in the width direction. The ratio of (thickness of the edge portion) / (thickness of the central portion) as an index of the uniformity of the film thickness distribution was 0.73. The soldering strength was very good.
[比較例1]
微細溝を形成しなかった以外は、実施例と同様の方法により、ジョイント端子を作製し、リフロー処理前後の基板接続部の底面である基板接続面のSnめっき皮膜の厚さを測定した。その結果、リフロー処理前のSnめっき皮膜の厚さは、エッジから幅方向に0.01mmの部分(エッジ部)では3.5μm、エッジから幅方向に0.5mmの部分(中央部)では3.5μmであり、リフロー処理後のSnめっき皮膜の厚さは、エッジから幅方向に0.01mmの部分(エッジ部)では0.4μm、エッジから幅方向に0.5mmの部分(中央部)では5.3μmであり、膜厚分布の均一性の指標としての(エッジ部の厚さ)/(中央部の厚さ)の比は0.08であった。また、はんだ付け強度は通常の強度であった。
[Comparative Example 1]
A joint terminal was prepared by the same method as in the example except that the fine groove was not formed, and the thickness of the Sn plating film on the substrate connection surface, which is the bottom surface of the substrate connection portion before and after the reflow treatment, was measured. As a result, the thickness of the Sn plating film before the reflow treatment was 3.5 μm at the 0.01 mm portion (edge portion) in the width direction from the edge, and 3 at the 0.5 mm portion (center portion) from the edge in the width direction. The thickness of the Sn plating film after the reflow treatment is 0.4 μm at the portion (edge portion) of 0.01 mm in the width direction from the edge, and the portion (center portion) of 0.5 mm in the width direction from the edge. Then, the ratio of (thickness of the edge portion) / (thickness of the central portion) as an index of the uniformity of the film thickness distribution was 0.08. The soldering strength was normal strength.
[比較例2]
微細溝を形成せず、厚さ7.0μmになるようにSnめっき皮膜を形成した以外は、実施例と同様の方法により、ジョイント端子を作製し、リフロー処理前後の基板接続部の底面である基板接続面のSnめっき皮膜の厚さを測定した。その結果、リフロー処理前のSnめっき皮膜の厚さは、エッジから幅方向に0.01mmの部分(エッジ部)では7.0μm、エッジから幅方向に0.5mmの部分(中央部)では7.0μmであり、リフロー処理後のSnめっき皮膜の厚さは、エッジから幅方向に0.01mmの部分(エッジ部)では0.4μm、エッジから幅方向に0.5mmの部分(中央部)では10.0μmであり、膜厚分布の均一性の指標としての(エッジ部の厚さ)/(中央部の厚さ)の比は0.04であった。また、はんだ付け強度は通常の強度であった。
[Comparative Example 2]
A joint terminal is prepared by the same method as in the example except that the Sn plating film is formed so as to have a thickness of 7.0 μm without forming a fine groove, and is a bottom surface of the substrate connection part before and after the reflow process. The thickness of the Sn plating film on the substrate connection surface was measured. As a result, the thickness of the Sn plating film before the reflow treatment is 7.0 μm at the portion (edge portion) of 0.01 mm in the width direction from the edge, and is 7 at the portion (center portion) of 0.5 mm in the width direction from the edge. The thickness of the Sn plating film after the reflow treatment is 0.4 μm at the portion (edge portion) of 0.01 mm in the width direction from the edge, and the portion (center portion) of 0.5 mm in the width direction from the edge. Then, the ratio of (thickness of edge portion) / (thickness of center portion) as an index of uniformity of film thickness distribution was 0.04. The soldering strength was normal strength.
[比較例3]
微細溝を形成せず、リフロー処理を行わなかった以外は、実施例と同様の方法により、ジョイント端子を作製し、基板接続部の底面である基板接続面のSnめっき皮膜の厚さを測定した。その結果、Snめっき皮膜の厚さは、エッジから幅方向に0.01mmの部分(エッジ部)では3.5μm、エッジから幅方向に0.5mmの部分(中央部)では3.5μmであった。また、はんだ付け強度は非常に良好であった。
[Comparative Example 3]
A joint terminal was prepared by the same method as in the example except that the fine groove was not formed and the reflow treatment was not performed, and the thickness of the Sn plating film on the substrate connection surface, which is the bottom surface of the substrate connection portion, was measured. . As a result, the thickness of the Sn plating film was 3.5 μm at the 0.01 mm portion in the width direction (edge portion) from the edge, and 3.5 μm at the 0.5 mm portion (center portion) in the width direction from the edge. It was. The soldering strength was very good.
[比較例4]
基板接続面の幅方向両側のエッジから幅方向に0.02mmの部分に、幅50μm程度、深さ30μm程度の微細溝を1本ずつ形成した以外は、実施例と同様の方法により、ジョイント端子を作製し、リフロー処理前後の基板接続部の底面である基板接続面のSnめっき皮膜の厚さを測定した。その結果、リフロー処理前のSnめっき皮膜の厚さは、エッジから幅方向に0.01mmの部分(エッジ部)では3.5μm、エッジから幅方向に0.5mmの部分(中央部)では3.5μmであり、リフロー処理後のSnめっき皮膜の厚さは、エッジから幅方向に0.01mmの部分(エッジ部)では0.4μm、エッジから幅方向に0.5mmの部分(中央部)では4.6μmであり、膜厚分布の均一性の指標としての(エッジ部の厚さ)/(中央部の厚さ)の比は0.09であった。また、はんだ付け強度は通常の強度であった。
[Comparative Example 4]
A joint terminal is formed in the same manner as in the embodiment except that one fine groove having a width of about 50 μm and a depth of about 30 μm is formed in the 0.02 mm width portion from both edges in the width direction of the board connection surface. The thickness of the Sn plating film on the substrate connection surface, which is the bottom surface of the substrate connection portion before and after the reflow treatment, was measured. As a result, the thickness of the Sn plating film before the reflow treatment was 3.5 μm at the 0.01 mm portion (edge portion) in the width direction from the edge, and 3 at the 0.5 mm portion (center portion) from the edge in the width direction. The thickness of the Sn plating film after the reflow treatment is 0.4 μm at the portion (edge portion) of 0.01 mm in the width direction from the edge, and the portion (center portion) of 0.5 mm in the width direction from the edge. Was 4.6 μm, and the ratio of (thickness of edge portion) / (thickness of central portion) as an index of uniformity of film thickness distribution was 0.09. The soldering strength was normal strength.
10 ジョイント端子
12 電子部品保持部(圧接部)
12a 電子部品保持面(圧接面)
14 基板接続部(固定部)
14a 基板接続面(固定面)
14b 微細溝
20 電子部品
30 基板
10
12a Electronic component holding surface (pressure contact surface)
14 Board connection part (fixed part)
14a Board connection surface (fixed surface)
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